A pressure sensor module and a dispensing apparatus improving accuracy of pressure measurement are provided. A pressure sensor module includes: a flow channel substrate in which a flow channel and a branch channel are formed; and a distortion detection unit configured to detect a pressure. The branch channel is branched from the flow channel and is connected to the distortion detection unit at one end of the branch channel. The distortion detection unit is disposed at least partially via a bond layer to block the one end of the branch channel. A protrusion is provided to surround the one end of the branch channel.
G01L 9/00 - Mesure de la pression permanente, ou quasi permanente d’un fluide ou d’un matériau solide fluent par des éléments électriques ou magnétiques sensibles à la pression; Transmission ou indication par des moyens électriques ou magnétiques du déplacement des éléments mécaniques sensibles à la pression, utilisés pour mesurer la pression permanente ou quasi permanente d’un fluide ou d’un matériau solide fluent
In order to provide an automatic analysis system with which it is possible to select an alarm notification at a prescribed time and select notification content for each user, the present invention has: an automatic analysis device for analyzing a patient sample; a storage unit for storing data pertaining to consumables of the automatic analysis device; a control unit for performing alarm control of the automatic analysis device and controlling data input/output processes into/from the storage unit; a display unit that issues a notification of an alarm upon receiving processing from the control unit; and an alarm setting unit that is capable of setting, for each user, an alarm notification timing.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G08B 25/00 - Systèmes d'alarme dans lesquels l'emplacement du lieu où existe la condition déclenchant l'alarme est signalé à une station centrale, p.ex. systèmes télégraphiques d'incendie ou de police
3.
ANALYSIS METHOD OF BASE SEQUENCE AND GENE ANALYZER
A gene analyzer that analyzes a base sequence of a sample manages an observation environment and mobility correction amount data for correcting a position in a time direction of time-series data of signal intensities of a plurality of bases, and executes the following processes including: a process of scaling the mobility correction amount data associated with the observation environment different from a first observation environment to generate default mobility correction amount data when the gene analyzer receives time-series data of signal intensities of a plurality of bases acquired by electrophoresing the sample in the first observation environment; a process of correcting the position in the time direction of the time-series data of the signal intensities of the plurality of bases using an optimization algorithm; and a process of identifying the base sequence of the sample using the corrected time-series data of the signal intensities of the plurality of bases.
A defect inspection device includes: an illumination optical system including a polarization element configured to switch polarization of irradiation light between first polarization and second polarization orthogonal to the first polarization; a polarization diffraction grating configured to emit diffraction light of a specific order of the irradiation light in a direction along a normal line of a sample stage surface, a diffraction efficiency of the specific order of the first polarization of the irradiation light is equal to or less than 20% of a diffraction efficiency of the specific order of the second polarization, the polarization diffraction grating being settable at a light collection position of the irradiation light on the sample stage surface and including an anisotropic pattern whose period is equal to or less than twice a wavelength of the irradiation light; a detection optical system.
The present invention relates to a method, a kit and an apparatus for pretreatment of bacterial test. More specifically, the present invention relates to a method, a kit, and an apparatus for continuously performing separation of blood cells and bacteria from a sample containing impurities such as blood cells, destruction of blood cells, and collection of bacteria.
Provided is a highly reliable optical filtering device used as a spatial filter for an optical inspection apparatus and configured to prevent a shutter from sticking to a wall surface of a shutter opening. The optical filtering device includes the shutter openable and closeable by voltage control and a substrate having the shutter opening serving as a movable range of the shutter, in which the substrate includes a sticking prevention part configured to prevent the shutter from sticking to the wall surface of the shutter opening when the shutter is opened.
In order to make it possible to improve the uniformity of plasma within a processing chamber of a plasma processing device, this plasma processing device comprises: a sample chamber 0112 that comprises, in the interior thereof, a sample stage where a substrate 0113 under processing is placed; a magnetic field production means 0116 that produces a magnetic field in the interior of the sample chamber; a microwave power source 0101 that produces microwave power; microwave power conveyance parts 0103, 0106 that convey the microwave power; and a microwave three-dimensional circuit part that supplies the conveyed microwave power to the interior of a processing chamber via a dielectric window, wherein the microwave three-dimensional circuit part is configured comprising a branch circuit 0202 that causes the microwave power which was conveyed by the microwave power conveyance parts to branch in a plurality of azimuth angle directions, a ring resonator 0201 that causes the microwave power, which the branch circuit has caused to branch in the plurality of azimuth angle directions, to resonate, and a coaxial passage part 0110 that supplies the microwave power, which the ring resonator has cause to resonate, into the interior of the processing chamber via the dielectric window.
Provided is a container storage device by which it is possible to reduce the load on a worker whose duties pertain to conveying in and conveying out a liquid. This container storage device comprises: a storage unit that stores a container that accommodates a liquid; and a control unit that controls the storage unit. The container storage device is characterized in that the control unit selects a container that is a candidate to be conveyed out, from among containers stored in the storage unit, when a new container is conveyed in, and conveys out the selected container while conveying in the new container.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
9.
LIQUID COLUMN SEPARATION DEVICE, SYSTEM, AND METHOD
A solid type nano-pore sequencer is arrayed easily. In a liquid column separation device including first and second base materials, a liquid feeding unit supplies fluids to a gap between the two base materials. Hydrophilic and hydrophobic regions are disposed on a surface of the second base material, and the hydrophilic region is disposed to oppose a predetermined position of the first base material where a substance to be measured is made to pass through. Also, a flow passage space includes at least one inlet and outlet through which fluids can flow in and out. A representative length of the hydrophilic region is made larger than a distance between the first and second base materials, and thereby a liquid column capable of connecting the first base material and the second base material is formed by making two or more immiscible fluids to flow by the liquid feed unit.
A sample inspection apparatus is provided. The invention is directed to a sample inspection apparatus 200 that includes an inspection means that is executed when a sample 11 is placed on a stage 8, the inspection means including the steps of (a) scanning a surface of the sample 11 with an electron beam EB1 with a probe 10a in contact with a conductor 11a and a probe 10b in contact with a conductor 11b, (b) measuring a differential value of a change in potential difference between the probes 10a and 10b while synchronizing with the scanning of the electron beam EB1, (c) acquiring a DI-EBAC image in which a fault spot 12 existing between the conductors 11a and 11b is shown as a bright part and a dark part based on the differential value of the change in the potential difference, and (d) specifying a direction of the fault spot 12 from the DI-EBAC image.
An automatic analysis system includes: a plurality of automatic analyzers; a conveyance line connected to the analyzers; and a computer configured to control the conveyance line to distribute a sample to the automatic analyzers. Each of the automatic analyzers includes a first component that is constantly used and a second component that is intermittently used. The computer is configured to compare a usage time of the first component of each automatic analyzer with a set time, select, when the usage time of the first component of any one of the plurality of automatic analyzers exceeds the set time, the automatic analyzer in which the usage time of the first component exceeds the set time as a prioritized device, and control the conveyance line such that a sample used for analysis in the second component is conveyed to the prioritized device in preference to another automatic analyzer.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
An automatic analyzer includes a dispensing mechanism having at least one horizontal drive shaft and one vertical drive shaft for moving the dispensing nozzle, a first mechanism having a stop position at which the dispensing nozzle is stopped, and a control section for positioning the dispensing nozzle with the stop position of the first mechanism. A member is disposed on the first mechanism to indicate predetermined first and second positions of the first mechanism so that the first and the second positions are detected by sensing the member using the dispensing nozzle. Based on the displacement between the first and the second positions indicating the displacement of the relative position between the dispensing mechanism and the first mechanism, the control section calculates a correction value for correcting the displacement of the stop position caused by fluctuation in a relative position between the dispensing mechanism and the first mechanism.
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
13.
Defect Classification Device and Defect Classification Program
An object of the present disclosure is to provide a defect classification device capable of easily grasping an appropriate recipe update timing of an imaging device when classification accuracy for classifying defects existing on a semiconductor wafer is decreased. The defect classification device according to the present disclosure calculates classification accuracy by further acquiring a result of a manual classification for defects spanning a plurality of classification spaces as a result of an automatic classification, and comparing the result of the automatic classification with the result of the manual classification (see FIG. 5).
G06V 10/764 - Dispositions pour la reconnaissance ou la compréhension d’images ou de vidéos utilisant la reconnaissance de formes ou l’apprentissage automatique utilisant la classification, p.ex. des objets vidéo
An object of the invention is to provide an electron microscope capable of obtaining a sufficient energy resolution without forming a long drift space and capable of attaining high energy discrimination detection performance with approximately the same device size as in the related art. The electron microscope according to the invention includes a pulsed electron emission mechanism configured to emit an electron beam in a pulsed manner, and discriminates energy of signal electrons by discriminating the signal electrons, which are emitted from a sample by irradiating the sample with the electron beam, according to a time of flight (see FIG. 2).
The present invention is a plasma processing method that provides a method that can build a self-limited process with excellent mass producibility in a cycle etching method that repeats an adsorption step for forming a reaction layer on the surface of a wafer to be etched and a desorption step for removing the formed reaction layer using a noble gas in a metastable state, characterized by having the adsorption step for forming the reaction layer on the film to be etched using plasma generated using reactive gas, and the desorption step for removing the reaction layer using the noble gas in a metastable state generated using plasma, the adsorption step and the desorption step being repeated, and the pressure in the adsorption step being higher than the pressure in the desorption step.
A surface inspecting device (1) according to the present invention comprises: a plate-shaped sample holding member (3) capable of holding a sample (2); a rotation drive unit (19) for rotating the sample holding member (3); a supporting member (21) that is fixed to the sample holding member (3) and the rotation drive unit (19) and supports the sample holding member (3); and a sample drive unit (11) that displaces the sample holding member (3) in the height direction relative to the rotation drive unit (19). The supporting member (21) comprises a first supporting member (22) and a plurality of second supporting members (23) that support the first supporting member (22). The first supporting member (22) is a plate-shaped member positioned between the sample holding member (3) and the rotation drive unit (19), and is displaceable in the height direction relative to the sample holding member (3) and the rotation drive unit (19). A part of the plurality of second supporting members (23) is fixed to the sample holding member (3), while the remainder are fixed to the rotation drive unit (19).
The present invention is provided with an electrolyte measurement unit 11, a second measurement unit for performing measurement of a different measurement item to the electrolyte measurement unit 11, a sampling mechanism 5 for dispensing a sample to the electrolyte measurement unit 11 or the second measurement unit, and a control unit 13 for controlling the operation of respective devices. When the sample is dispensed to the second measurement unit by the sampling mechanism 5 or measurement of the sample is performed by the second measurement unit, the control unit 13 measures the potential in a state in which ion-selective electrodes 104, 105, and 106 are filled with an internal standard liquid, and determines, on the basis of measured data, whether or not there is an abnormality in the electrolyte measurement unit 11. An electrolyte analysis device capable of sensing an unstable state at an early stage, and a method for determining an abnormality in an electrolyte concentration measurement unit, are thereby provided.
G01N 21/78 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé en observant l'effet sur un réactif chimique produisant un changement de couleur
G01N 27/27 - Association de plusieurs systèmes ou cellules de mesure, chacun mesurant un paramètre différent, dans laquelle les résultats des mesures peuvent être, soit utilisès indépendamment, les systèmes ou les cellules étant physiquement associés, soit combin
G01N 27/333 - Electrodes ou membranes sélectives à l'égard des ions
18.
Battery Management Device, and Electric Power System
The objective of the present invention is to provide a technology capable of estimating a battery condition in conjunction with charging/discharging operations of a battery, without employing dedicated equipment for estimating the condition of the battery. A battery management device according to the present invention identifies a first period and a subsequent second period in a rest period after a battery finishes discharging or charging, and uses an output voltage difference in the second period to estimate the condition of the battery (see FIG. 1).
G01R 31/3835 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p.ex. état de charge ne faisant intervenir que des mesures de tension
H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries
19.
Inspection System and Non-Transitory Computer-Readable Medium
The present disclosure proposes a system for detecting a foreign material adhering to or a scratch formed on a bevel at an edge of a semiconductor wafer in order to detect the foreign material or defect on the bevel without using a reference image and including a learning device (905) that outputs information on the foreign material adhering to or the scratch formed on the bevel as a learning result, in which the learning device performs learning in advance by using image data acquired by an image acquisition tool and the information on the foreign material or the scratch on the bevel included in the image data, and the foreign material or the scratch is detected by inputting the image data obtained by the image acquisition tool to the learning device (refer to FIG. 9).
G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
The purpose of the present invention is to inhibit condensation in unintended locations, even in an automatic analysis device provided with a water-cooled reagent cold storage, by cooling and drying external air in an efficient manner before the external air is discharged into an interior space. Therefore, the present invention is an automatic analysis device provided with a reagent cold storage (1) for keeping a reagent cold, wherein the reagent cold storage (1) has a cooling water channel that feeds cooling water to the outside of an inner wall demarcating a space in which a reagent container is stored and that cools the inner wall, and an air channel (10, 13) that feeds air to the inside of the inner wall and creates a positive pressure in the space, a cooling water inflow port (8a) is formed at a prescribed position on the lower surface of the cooling water channel disposed below the bottom surface of the space, and a part of the air channel (10, 13) disposed on the upper surface of the inner wall demarcating the bottom surface of the space is located on the vertical projection of the cooling water inflow port (8a).
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
[Problem] To provide a control method of avoiding drop of a throughput by solvent substitution and of avoiding increase of a solvent consumption amount in a control method for an automatic analyzer including a liquid chromatograph that includes plural analysis flow passages arranged to be parallel to each other.
[Problem] To provide a control method of avoiding drop of a throughput by solvent substitution and of avoiding increase of a solvent consumption amount in a control method for an automatic analyzer including a liquid chromatograph that includes plural analysis flow passages arranged to be parallel to each other.
[Solution] Which one of plural analysis flow passages 105 to 107 is to be used is determined in introducing plural separation processes using solvents whose kind is different from each other with a time lag relative to one another, and a solvent used in a next separation process executed at timing after starting the plural separation processes determined to be introduced with a time lag relative to one another and each of the solvents used in the plural separation processes determined to be introduced with a time lag relative to one another are compared. Whether or not a solvent substitution process is required for the analysis flow passages 105 to 107 used in the plural separation processes is determined, an analysis flow passage used in the next separation process out of the plural analysis flow passages 105 to 107 is determined according to the determination, and an analysis schedule is prepared.
G01N 30/46 - Modèles d'écoulement utilisant plus d'une colonne
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
In order to improve the processing reproducibility, an ion milling device 100 includes a sample chamber 107, a sample stage 102 that is disposed in the sample chamber on which a sample is placed, an ion source 101 that emits an unfocused ion beam toward the sample, a control unit 112 that controls an output of the ion beam, an oscillator 104 that is disposed in the sample chamber, and an oscillation circuit 111 that oscillates the oscillator and outputs an oscillation signal to the control unit, in which the control unit controls the output of the ion beam such that a vibrational frequency change amount of the oscillator per unit time due to deposition of sputtered particles generated by irradiating the sample with the ion beam on the oscillator is kept within a predetermined range.
Provided is a technique for reducing false positives and false negatives in a microbial test. A centrifugal filtration cartridge of the present disclosure includes: a filter cup including a filter that captures a microorganism and a nozzle that discharges a liquid that has passed through the filter; and a contamination prevention box connectable to the filter cup and internally storing a measurement container configured to store the liquid discharged from the nozzle. The contamination prevention box includes a partition wall disposed between the filter cup and an opening surface of the measurement container. The partition wall has an opening through which the nozzle can pass. The nozzle has a length in which a tip of the nozzle is located below a lower end of the opening and enters inside of the measurement container when the contamination prevention box is connected to the filter cup.
There is provided an automatic analyzer and a control method of the automatic analyzer capable of coping with various operational environments. A storage unit 127 of an automatic analyzer 101 stores information on a priority of dispensing among various samples and information on a constraint condition of the priority of dispensing of the various samples. A control unit 128 controls, based on the information on the priority and the information on the constraint condition, an operation of a sample disk 102 and a sample dispensing mechanism 104 such that the samples are sequentially dispensed from a sample of a type having a highest priority while following the constraint condition.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
A surface inspection device (1) according to the present invention comprises: a plate-shaped sample holding member (3) which can hold a sample (2); a spindle motor (4) for rotating the sample holding member (3); a turntable (5) which is fixed to the spindle motor (4) and rotated by the spindle motor (4); a frame (6) to which the spindle motor (4) is fixed; a plurality of support members (12) each having one end fixed to the sample holding member (3) and the other end fixed to the turntable (5), the support members supporting the sample holding member (3) such that the sample holding member is displaceable in a focus direction which is the height direction with respect to the turntable (5); and a sample drive unit (11) which displaces the sample holding member (3) in the focus direction with respect to the turntable (5). This surface inspection device (1) can accurately drive the sample (2) in the focus direction.
An image processing device includes: an image reception unit for receiving an input image; an image generation unit for generating an image for extracting a feature from the input image; a feature extraction unit for extracting a feature from the generation image generated by the image generation unit; an identification unit for identifying an object in the image using the feature output from the feature extraction unit; an output unit for outputting an identification result output from the identification unit; and a feature map generation unit for instructing the image generation unit generating a new generation image based on the feature output from the feature extraction unit, and generating a feature map indicating a feature extraction condition for the new generation image and output the generated feature map to the feature extraction unit. With this configuration, a target object in the image is identified quickly and accurately.
G06V 10/44 - Extraction de caractéristiques locales par analyse des parties du motif, p.ex. par détection d’arêtes, de contours, de boucles, d’angles, de barres ou d’intersections; Analyse de connectivité, p.ex. de composantes connectées
G06V 10/771 - Sélection de caractéristiques, p.ex. sélection des caractéristiques représentatives à partir d’un espace multidimensionnel de caractéristiques
27.
AUTOMATED ANALYZING DEVICE, AND METHOD FOR OPERATING AUTOMATED ANALYZING DEVICE
This automated analyzing device comprises: a diluent flow passage 1033 and an internal standard solution flow passage 1043 from a diluent accommodating bottle 1032 and an internal standard solution accommodating bottle 1042 to a dilution tank 1010; a measurement solution suction nozzle 1052 from the dilution tank 1010 to an analyzing unit 1092; a first temperature regulating unit 1091 which performs temperature regulation of the dilution tank 1010, the measurement solution suction nozzle 1052 and the analyzing unit 1092; a second temperature regulating unit 1036 which is controlled for temperature regulation independently of the first temperature regulating unit 1091, and which performs temperature regulation of the diluent flow passage 1033 and the internal standard solution flow passage 1043; and a thermal insulation mechanism 1037, 1095 provided between the first temperature regulating unit 1091 and the second temperature regulating unit 1036. The present invention thereby provides an automated analyzing device and a method for operating an automated analyzing device with which it is possible for a temperature regulation state of a measuring system to be improved in comparison with a conventional example.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
28.
AUTOMATIC ANALYSIS DEVICE AND METHOD FOR CLEANING PROBE
The purpose of the present invention is to provide: an automatic analysis device that reduces the frequency of manual cleaning of a probe and that has a higher analysis efficiency; and a method for cleaning a probe. For this purpose, an automatic analysis device according to the present invention comprises: a probe that dispenses a liquid; and a clogging detection unit that detects clogging of the probe. When the clogging detection unit detects clogging of the probe, the probe is cleaned with a liquid having an adjusted temperature. In addition, a method for cleaning a probe that dispenses a liquid according to the present invention involves cleaning the probe with a liquid having an adjusted temperature when a clogging detection unit detects clogging of the probe.
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
A charged particle microscope includes an electron gun provided inside a barrel and a stage 20. In the stage 20, a sample holder 30 holding a sample SAM can be installed. The stage 20 includes an annular rough movement stage member 21a and an annular fine movement stage member 21b. An X rough movement actuator 22a and a Y rough movement actuator 23a are connected to the rough movement stage member 21a. An X fine movement actuator 22b and a Y fine movement actuator 23b are connected to the fine movement stage member 21b. Here, a first movable range in which the X rough movement actuator 22a and the Y rough movement actuator 23a are able to move the rough movement stage member 21a is broader than a second movable range in which the X fine movement actuator 22b and the Y fine movement actuator 23b are able to move the fine movement stage member 21b. Accordingly, it is possible to improve performance of the charged particle microscope.
A decrease in output power due to a foreign matter present on a base at the time of forming a thin film solid electrolyte layer is limited, and an increase in yield even when an area of a fuel battery cell is increased, is obtained. The fuel battery cell has a membrane electrode assembly including a lower electrode layer, first and second solid electrolyte layers, and an upper electrode layer formed on a support substrate. An interface between the first and second solid electrolyte layers is flat as compared with an interface between the lower electrode layer and the solid electrolyte layer, and the second solid electrolyte layer has a thickness at which a leakage current between the first solid electrolyte layer and the second solid electrolyte layer is less than an allowable value even when an output voltage of the fuel battery cell is generated.
H01M 8/1226 - PROCÉDÉS OU MOYENS POUR LA CONVERSION DIRECTE DE L'ÉNERGIE CHIMIQUE EN ÉNERGIE ÉLECTRIQUE, p.ex. BATTERIES Éléments à combustible; Leur fabrication Éléments à combustible avec électrolytes solides fonctionnant à haute température, p.ex. avec un électrolyte en ZrO2 stabilisé caractérisés par la combinaison électrode/électrolyte ou par le matériau de support caractérisés par la couche de support
H01M 8/1246 - PROCÉDÉS OU MOYENS POUR LA CONVERSION DIRECTE DE L'ÉNERGIE CHIMIQUE EN ÉNERGIE ÉLECTRIQUE, p.ex. BATTERIES Éléments à combustible; Leur fabrication Éléments à combustible avec électrolytes solides fonctionnant à haute température, p.ex. avec un électrolyte en ZrO2 stabilisé caractérisés par le procédé de fabrication ou par le matériau de l’électrolyte l'électrolyte étant constitué d’oxydes
31.
IMAGE DIAGNOSIS SUPPORT DEVICE, IMAGE DIAGNOSIS SUPPORT METHOD, REMOTE DIAGNOSIS SUPPORT SYSTEM, AND NET CONTRACT SERVICE SYSTEM
An image diagnosis support device according to the invention executes a processing of inputting an image, a processing of extracting a feature of an object from a target image to be processed, a processing of extracting a feature of a training image and creating a feature dictionary, a processing of classifying the target image based on the feature and calculating an classification value, a processing of classifying a feature similarity of the target image using the feature dictionary and calculating a feature similarity classification value, and a processing of determining presence or absence of the object and a likelihood of the object for the target image using the classification value and the feature similarity classification value.
G06V 10/44 - Extraction de caractéristiques locales par analyse des parties du motif, p.ex. par détection d’arêtes, de contours, de boucles, d’angles, de barres ou d’intersections; Analyse de connectivité, p.ex. de composantes connectées
G06V 10/764 - Dispositions pour la reconnaissance ou la compréhension d’images ou de vidéos utilisant la reconnaissance de formes ou l’apprentissage automatique utilisant la classification, p.ex. des objets vidéo
32.
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
An electron beam emitted from a photoexcited electron gun is increased in luminance. An electron gun 15 includes: a photocathode 1 including a substrate 11 and a photoelectric film 10; a light source 7 that emits pulsed excitation light; a condenser lens 2 that focuses the pulsed excitation light toward the photocathode; and an extractor electrode 3 that faces the photocathode and that accelerates an electron beam generated from the photoelectric film by focusing the pulsed excitation light by the condenser lens, transmitting the pulsed excitation light through the substrate of the photocathode, and causing the pulsed excitation light to be incident on the photocathode. The pulsed excitation light is condensed at different timings at different positions on the photoelectric film of the photocathode.
The purpose of the present invention is to provide a dispensing device and probe state confirmation method which make it possible to ascertain a suitable replacement period for the probe, while suppressing a lowering of dispensing accuracy. In order to achieve this, the present invention provides a dispensing device comprising: a probe that suctions and discharges a liquid; a sensor that detects the contact of a tip of the probe; a drive unit that drives the probe in the vertical direction; and a control unit that controls the drive unit, wherein the control unit performs a confirmation operation for a length change of the probe by lowering the probe via the drive unit until contact with a prescribed reference surface forming a portion of the dispensing device is detected.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
The objective of the present invention is to provide an automated analyzing device with which it is easy for a user to understand a current usage status and a replacement time of a limited-life member. To this end, according to the present invention, an automated analyzing device for analyzing an analysis target in a sample comprises a limited-life member used to perform the analysis, a control unit for estimating the remaining service life of the limited-life member, and a display unit capable of using different methods to display the remaining service life, wherein, if the remaining service life of the limited-life member has reached a predefined reference value, the control unit switches the method for displaying the remaining service life that is to be displayed on the display unit.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 21/00 - Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c. à d. en utilisant des ondes submillimétriques, de la lumière infrarouge, visible ou ultraviolette
35.
Semiconductor Observation System and Overlay Measurement Method
An image to be measured of a sample that is captured by a microscope is acquired, a first degree that indicates a degree in which the second layer (upper layer) of the sample transmits the first layer (lower layer) is acquired, a first layer template image and a second layer template image indicating pattern shapes of the first layer and the second layer are acquired, pattern matching processing of the second layer is performed based on the second layer template image and the image to be measured to acquire a second position deviation amount related to the second layer and an area recognized as the second layer on the image to be measured, a consideration range of the image to be measured in pattern matching processing of the first layer is determined based on the first degree and the area recognized as the second layer, pattern matching processing of the first layer is performed based on the first layer consideration range, the first layer template image, and the image to be measured to acquire a first position deviation amount related to the first layer and an area recognized as the first layer on the image to be measured, and an overlay is measured based on the second position deviation amount and the first position deviation amount.
G06T 5/50 - Amélioration ou restauration d'image en utilisant plusieurs images, p.ex. moyenne, soustraction
G06T 7/50 - Récupération de la profondeur ou de la forme
G06T 11/20 - Traçage à partir d'éléments de base, p.ex. de lignes ou de cercles
G06V 10/60 - Extraction de caractéristiques d’images ou de vidéos relative aux propriétés luminescentes, p.ex. utilisant un modèle de réflectance ou d’éclairage
G06V 10/74 - Appariement de motifs d’image ou de vidéo; Mesures de proximité dans les espaces de caractéristiques
A capillary array includes N analysis capillaries filled with a separation medium having a refractive index of n3 and used for electrophoretic analysis and N±1 lens capillaries filled with a medium having a refractive index of n4 and not used for the electrophoretic analysis, in which the N analysis capillaries and the N±1 lens capillaries are alternately arranged on the same array plane. When an outer diameter is defined as 2R, an inner diameter is defined as 2r, a refractive index of a medium of an outside is n1, and a refractive index of a material is defined as n2 for each of the N analysis capillaries and the N±1 lens capillaries, and when a refractive index n3 takes any value within the range of 1.33≤n3≤1.42, R, r, n1, n2, n3, and n4 satisfy a predetermined relationship, whereby the N analysis capillaries are efficiently simultaneously irradiated with the laser beam incident from a side of the array plane.
A deterioration prediction system for a semiconductor manufacturing equipment or a semiconductor inspection equipment, including: an input device receiving, as an input, time series data indicating a state of the equipment; a deterioration prediction device having an estimation unit discriminating fluctuation in the time series data into fluctuation caused by changing setting of the equipment and fluctuation caused by deterioration of the equipment and estimating a time point when the setting is changed, a division unit dividing the time series data into the plurality of periods bounded by the time points, a discrimination unit discriminating at least a trend component from the fluctuation in the time series data in the period, and a prediction unit predicting the deterioration of the equipment based on at least the trend component; and an output device outputting a result of the prediction.
G05B 13/04 - Systèmes de commande adaptatifs, c. à d. systèmes se réglant eux-mêmes automatiquement pour obtenir un rendement optimal suivant un critère prédéterminé électriques impliquant l'usage de modèles ou de simulateurs
38.
SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM AND MANUFACTURING METHOD
To provide a semiconductor device manufacturing system and a semiconductor device manufacturing method having an improved processing yield, the semiconductor manufacturing system comprises a semiconductor device manufacturing device and a wafer temperature calculation system. The semiconductor device manufacturing device includes a wafer stage in which a wafer is placed on an upper surface, a plurality of heaters disposed in an interior of this wafer stage, below a plurality of regions of the upper surface, and a controller that adjusts outputs of a plurality of heater power supplies supplied to the plurality of heaters, the semiconductor device manufacturing device being configured to process the wafer. The wafer temperature calculation system determines whether first output values of the plurality of heater power supplies calculated in advance to realize a target temperature during processing of the wafer are within a permissible range, and if said values are outside the permissible range, calculates second output values obtained by correcting all of the first output values to values within the permissible range.
The present invention has: a first step for reading defect candidate images used for training deep learning models; a second step for assigning labels to a portion of the defect candidate images to create teaching images and evaluation images; a third step for, after updating the parameters for each of a plurality of the deep learning models using teaching images, evaluating the classification accuracy using the evaluation images, and selecting the best model with the highest classification accuracy among the plurality of deep learning models; and a fourth step for classifying defect candidate images that have not been assigned a label using the best model, and select a portion of the defect candidate images for assigning labels on the basis of the DOI-likeness according to the best model, and executes the second step and the third step again after execution of the fourth step.
The present invention creates a charging plan for a plurality of batteries to be deployed at a station. Provided is a charging plan creation method for creating a charging plan for a plurality of batteries at one or a plurality of stations linked by one or a plurality of power contracts, the charging plan creation method comprising: receiving the power usage amount at a station, the planned power consumption amounts to be consumed by the plurality of batteries, and the charging-availability times during which the plurality of batteries can be charged (S901); setting the peak for power to be used at the station on the basis of the usage amount (S902); and creating, in accordance with the charging-availability times, a peak control charging plan for each battery for charging the respective power consumption amount, so as not to surpass the set peak (S903).
H02J 7/02 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries pour la charge des batteries par réseaux à courant alternatif au moyen de convertisseurs
41.
DISTANCE MEASUREMENT METHOD, DISTANCE MEASUREMENT DEVICE, AND DISTANCE MEASUREMENT SYSTEM
The present invention provides a distance measurement device and a distance measurement method that can reduce a distance error caused by polarization. The distance measurement method splits light generated in a laser light source to a reference optical system and a measurement optical system, detects a reference optical path measurement beat signal from reference light having passed through the reference optical system, detects a measurement optical path measurement beat signal from measurement light having routed through an object of measurement in the measurement optical system, and measures a distance to the object of measurement on the basis of the measurement optical path measurement beat signal and the reference optical path measurement beat signal, the distance measurement method being characterized in that a polarization-caused distance error reduction element is installed in one or both of the reference optical system and the measurement optical system.
G01C 3/06 - Utilisation de moyens électriques pour obtenir une indication finale
G01B 9/02004 - Interféromètres caractérisés par la commande ou la génération des propriétés intrinsèques du rayonnement utilisant plusieurs fréquences utilisant le balayage des fréquences
G01B 9/02015 - Interféromètres caractérisés par la configuration du parcours du faisceau
Provided is an automated analyzing device capable of avoiding a light intensity drift accompanying a temperature change caused by the start of energization of a light source, and capable of shortening a stabilization waiting time. An automated analyzing device 50 comprises: a light source 39 which illuminates a reaction vessel 2 accommodating a mixed solution of a sample and a reagent with light for measuring the sample; a temperature regulating mechanism 27 for performing temperature regulation of the light source 39 by means of a temperature regulating medium; a reaction tank 5 for performing temperature regulation of the reaction vessel 2 by means of the temperature regulating medium; circulating pumps 30, 35 for delivering the temperature regulating medium; an analyzing unit 42 for analyzing the sample; and an operation control unit 43. When transitioning from a sample non-measurement state to a measurable state via a measurement preparation state, the operation control unit 43, in the measurement preparation state, increases a current or a voltage applied to the light source 39, increases a flow rate of the temperature regulating medium for a fixed time period, and returns the flow rate of the temperature regulating medium to the flow rate prior to the increase, and then migrates to the measurable state and causes the sample to be measured.
G01N 21/75 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
The objective of the present invention is to provide an analysis device capable of using a light source effectively by appropriately controlling a temperature of the light source. The analyzing device according to the present invention comprises an in-housing temperature regulating mechanism for regulating a temperature inside a light source housing, a base for supporting a board on which a light emitting element is mounted, and a base temperature regulating mechanism for regulating a temperature of the base, wherein the base temperature regulating mechanism is covered such that the base is not exposed to outside air (see Fig. 2).
G01N 21/75 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
A gas supply control device that supplies a gas to a processing chamber in which a workpiece is processed, includes: a first port connected to a gas source of a purge gas; a second port to which a gas source of a processing gas is connected; a collective pipe in which each of the purge gas and the processing gas supplied from the first port and the second port merges, respectively, and flow; a first flow rate controller provided between the first port and the collective pipe; and a second flow rate controller provided between the second port and the collective pipe. A gas flow path through which the purge gas flows is provided from an output side of the first flow rate controller to an input side of the second flow rate controller.
G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
F16K 31/06 - Moyens de fonctionnement; Dispositifs de retour à la position de repos magnétiques utilisant un aimant
F16K 37/00 - Moyens particuliers portés par ou sur les soupapes ou autres dispositifs d'obturation pour repérer ou enregistrer leur fonctionnement ou pour permettre de donner l'alarme
H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitement; Appareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants
45.
INSPECTION METHOD AND CHARGED PARTICLE BEAM DEVICE
Provided is an inspection method for inspecting the electrical characteristics of a pattern on a sample where a pattern 102 comprising a conductor or a semiconductor has been formed in a dielectric region 101. A secondary electron image is acquired by scanning a charged particle beam on the sample. A feature amount is calculated on the basis of a luminance value of a third region 113, which is higher in luminance than a second region, that spreads toward a first region 111 side from a boundary between the first region 111 corresponding to a dielectric region in the secondary electron image and a second region 112 corresponding to the pattern. The electrical characteristics of the pattern are inspected on the basis of the feature amount.
G01N 23/2251 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p.ex. la microscopie électronique à balayage [SEM]
H01L 21/66 - Test ou mesure durant la fabrication ou le traitement
The present invention improves the cooling performance of a container storage device in which electric heating devices are used. This container storage device includes: a storage part for storing a container that accommodates a liquid; and a cooling part that cools air suctioned out from the storage part and supplies the cooled air to the storage part, wherein the cooling section comprises a plurality of fins that are disposed along the flow of the air, and electric heating devices that are respectively connected to the fins.
F25D 11/00 - Dispositifs autonomes déplaçables associés à des machines frigorifiques, p.ex. réfrigérateurs ménagers
F25D 17/08 - Dispositions pour la circulation des fluides de refroidissement; Dispositions pour la circulation de gaz, p.ex. d'air, dans les enceintes refroidies pour la circulation de gaz, p.ex. convection naturelle par circulation d'air forcée en utilisant des conduits
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
F25B 21/02 - Machines, installations ou systèmes utilisant des effets électriques ou magnétiques utilisant l'effet Nernst-Ettinghausen
An automated analysis device 1 comprises a B/F separating unit 104, a reaction solution suction nozzle 106, and a substitution liquid discharge nozzle 108, the B/F separating unit 104 being configured to be movable in a vertical direction and a horizontal direction, or the automated analysis device 1 comprises the B/F separating unit 104, the reaction solution suction nozzle 106, the substitution liquid discharge nozzle 108, a photometric unit 134, a measurement flow passage introduction nozzle 130, a washing solution storage container 122, and a buffer solution storage container 120, wherein the B/F separating unit 104, the washing solution storage container 122 and the buffer solution storage container 120 are mounted on a turntable 102. As a result, the present invention provides an automated analysis device having fewer movable axes than in the past.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 1/10 - Dispositifs pour prélever des échantillons à l'état liquide ou fluide
A chute 305 for guiding a reaction vessel 116a from a conveying portion 117 to a waste storage unit 202 comprises a reaction vessel disposal hole 113 for accepting the reaction vessel 116a dropped from the conveying portion 117 into the chute 305, a first passage 411 that extends a first distance in a vertical direction from the reaction vessel disposal hole 113, and a second passage 421 that extends a second distance from a first end portion 412 of the first passage 411 on the opposite side to the reaction vessel disposal hole 113, in a state inclined through a first angle, wherein, in the second passage 421, a second end portion 423 on the opposite side to first end portions 412 and 422 is inclined through a second angle such that the chute 305 is directed toward the waste storage unit 202. As a result, the present invention provides an automated analysis device with which it is possible to achieve a reduction, compared with the past, in splashing of a residual liquid in the reaction vessel in the course of disposing of the reaction vessel.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
49.
SAMPLE CONVEYING DEVICE AND SAMPLE CONVEYANCE METHOD
There are provided a sample conveying device and a sample conveyance method capable of determining a cause of an abnormality in a conveyance speed more quickly than in the related art. In a conveying device 501, a general conveyance speed of a conveying container 102 is obtained from a position of the conveying container 102 detected by a position detection unit 110 to determine whether the general conveyance speed is abnormal, and when it is determined that the general conveyance speed is abnormal, an inspection conveying container 105 is conveyed, and the cause of the abnormality in the general conveyance speed is determined based on the conveyance speed of the inspection conveying container 105.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
50.
Container Holder, Analyzer, and Method for Manufacturing Container Holder
The purpose of the present invention is to provide a container holder with which it is possible to hold a container in a non-tilted manner and which has a draft angle for smoothly extracting a die used when manufacturing the container holder through injection-molding. A hole in which the container holder according to the present invention accommodates a container has a first wall section and a second wall section, the first wall section having a shape such that the hole widens from an opening section toward a bottom section, and the second wall section having a shape such that the hole widens from the bottom section toward the opening section (refer to FIG. 4).
To provide an automatic analyzer which stabilizes light quantity before measurement in a short period while prolonging a long life of light source. An automatic analyzer of the present invention includes a light source with two or more LED elements each having a different wavelength, an analysis section for executing analysis based on light radiated to a reaction vessel, and a current adjustment section for adjusting quantity of current supplied to each of the LED elements. The current adjustment section reduces the quantity of current to each of the LED elements in a non-analytical state individually to be smaller than the quantity of current in an analytical state.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 21/01 - Dispositions ou appareils pour faciliter la recherche optique
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
The performance of a power supply module is to be improved. The occurrence of discharge in the power supply module is to be prevented, and the size of the power supply module is to be reduced. In a power supply module, substrates are provided being stacked in a planar view. A low voltage circuit and a high voltage circuit are formed on a first substrate such that a distance is kept for preventing surface discharge, and a low voltage circuit is formed on a second substrate. A distance between a component of a high voltage alternating current circuit on the high voltage circuit and a component of the low voltage circuit is three times a shortest distance, at which space discharge does not occurs, between a component that constitutes a high voltage direct current circuit on the high voltage circuit and a component that constitutes the low voltage circuit.
In substrate inspection devices, the size of defects and foreign matter which need to be detected has decreased, and use of a high-power deep ultraviolet laser light source to form a beam spot with high precision has increased detection sensitivity. Thus, there is a need to further increase the stability of size and position of a beam spot. Furthermore, it is important that variations in focus position does are not caused when there is a change in ambient temperature during device operation. To this end, provided is a lighting optical system that flexibly changes the beam spot diameter of lighting light in accordance with inspection conditions and stage movement, while also maintaining high-precision focus performance which can handle changes in ambient temperature. More specifically, suppression of variations in focus position is made possible by optimizing the arrangement and materials of an optical element of a transparent optical system constituting a device (see fig. 1).
MTWTMTMTMTMT, wherein the upper limit of the measurement dynamic range for a fluorescent signal of the electrophoresis device is equal to or greater than a predetermined value.
This automated analysis device comprises an analyzing unit 40 for analyzing a sample, and a control device 20 for controlling operations of each mechanism of the analyzing unit 40, wherein the control device 20 calculates a waiting time that a user should wait until the sample or a consumable required to analyze the sample is replaced, on the basis of a time at which the sample or the consumable is to be used last, in an analysis schedule created at a time point at which a replacement request for the sample or the consumable is accepted. By this means, the present invention provides an automated analysis device, and a method for operating the automated analysis device, capable of improving work efficiency.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
56.
FLOW PATH WASHING METHOD OF AUTO SAMPLER AND FLOW PATH WASHING APPARATUS OF AUTO SAMPLER
A flow path washing method and apparatus for an auto sampler in which, when a cleaning fluid supplied to a flow path which is switched between a first flow path including a nozzle for aspirating a sample and a sample loop for holding the aspirated sample, and a second flow path including a washing tub for washing at least an outer wall of the nozzle, a control unit changes a flow velocity of the cleaning fluid supplied between measurement of a first measurement item and measurement of a second measurement item based on washing information showing washing patterns corresponding to measurement items of the sample, including at least one of first washing information showing a washing pattern corresponding to the first measurement item of the sample and second washing information showing a washing pattern corresponding to the second measurement item to be measured subsequent to the first measurement item.
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
B08B 9/032 - Nettoyage de conduites ou de tubes ou des systèmes de conduites ou de tubes Élimination des bouchons par l'action mécanique d'un fluide en mouvement, p.ex. par effet de chasse d'eau
In an automatic analyzer, an influence due to a disturbance component on a measurement result can be appropriately prevented. An automatic analyzer 1 includes: a first light source 102 configured to emit light toward a sample 44; a drive circuit 101 configured to supply a first drive current I3 whose frequency changes from f1 to f2 intermittently or continuously to the first light source 102; a light receiver 113 configured to output a light detection signal IR based on the light transmitted through the sample 44; and a signal processing circuit 111 configured to demodulate the light detection signal IR in accordance with the frequency f1 to f2 of the first drive current I3 and output a measurement signal VL based on a demodulation result.
G01N 21/77 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé en observant l'effet sur un réactif chimique
The present invention provides a mobile robot that can simultaneously absorb an impact received from an uneven road surface while moving and estimate the position or orientation of the mobile robot while functioning. The mobile robot according to the present invention has an operation mechanism having a multi-jointed arm, and a movement mechanism that causes the operation mechanism to move, the mobile robot being characterized in that: the movement mechanism has a first support part and a second support part, which support the weight of the movement mechanism; and the second support part is installed at a position that is nearer to an outer peripheral section, in terms of the movement direction of the movement mechanism, than is the installation position of the first support part.
B60G 17/016 - Suspensions élastiques permettant d'ajuster les caractéristiques des ressorts ou des amortisseurs de vibrations, de réguler la distance entre la surface porteuse et la partie suspendue du véhicule ou de bloquer la suspension pendant l'utilisation pou les moyens de régulation comportant des éléments électriques ou électroniques caractérisés par leur réponse à un mouvement ou une condition donnés ou à l'action du conducteur, lors du déplacement du véhicule
B25J 5/00 - Manipulateurs montés sur roues ou sur support mobile
B60G 3/00 - Suspensions élastiques pour une seule roue
A defect inspection device in which an optical axis of a detection optical system is inclined with respect to a surface of a sample, and an imaging sensor is inclined with respect to the optical axis, a height variation amount of an illumination spot in a normal direction of the surface of the sample is calculated based on an output of a height measuring unit, a deviation amount of the focusing position with respect to the light receiving surface in an optical axis direction of the detection optical system is calculated based on the height variation amount of the illumination spot, the deviation amount of the focusing position being generated accompanying a height variation of the illumination spot, and the focus actuator is controlled based on the deviation amount of the focusing position, and scattered light intensities at the same coordinates of the sample are added.
H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitement; Appareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants
G01N 21/95 - Recherche de la présence de criques, de défauts ou de souillures caractérisée par le matériau ou la forme de l'objet à analyser
Provided are a sample collection call time prediction system and a sample collection call time prediction method, with which it is possible to improve the accuracy of predicting the time at which a patient is called for sample collection. This call time prediction system includes a first processor that predicts, by machine learning, the time at which a patient is called for sample collection, the prediction being made on the basis of at least one of reception time information indicating the reception time for a patient from whom a sample is to be collected, sample type information indicating the type of the sample to be collected from the patient, a reception number indicating the order of reception of the patient, inpatient/outpatient classification information indicating whether the patient is an inpatient or an outpatient, and the number of waiting patients waiting to be called for sample collection at the reception time.
The purpose of the present invention is to uniformly suppress dew condensation in each housing chamber when multiple housing chambers each house a specimen container. The specimen analysis device according to the present invention comprises two or more openings, wherein warm air is supplied from each of the openings to each housing chamber, and the volume of the air supplied from each of the openings is uniformed by a first air volume adjusting material (see FIG. 2).
Provided is an optical device in which a two-dimensionally distributed sample, a single condenser lens, a dichroic mirror array in which a plurality of dichroic mirrors are arranged, and an area sensor are arranged in this order along the optical axis of the condenser lens, the direction in which the plurality of dichroic mirrors are arranged is perpendicular to the optical axis, and an image of a measurement area on the sample is measured by dividing the image into a plurality of images having different wavelength components on the area sensor. The dichroic mirror array is closer to the area sensor in comparison to the condenser lens.
In order to execute stable processing by suppressing plasma diffusion and non-stationary discharge generation, there is provided a plasma processing device which includes a processing chamber in which a sample stage is provided for placing a sample thereon, an exhaust unit for evacuating the processing chamber, a magnetic field forming mechanism for forming a magnetic field in the processing chamber, and a power supply unit that supplies radio frequency power for generating plasma to the inside of the processing chamber evacuated by the exhaust unit and has the magnetic field formed by the magnetic field forming mechanism. The processing chamber includes a shielding section which divides an inner part of the processing chamber into a first area at a side for supplying the radio frequency power from the power supply unit and a second area at a side where the sample stage is disposed. The shielding section includes a first shielding plate disposed at the side that faces the first area, in which a first opening is formed, a second shielding plate disposed at the side that faces the second area, in which a second opening is formed at the center, and a third shielding plate disposed between the first and the second shielding plates.
The present invention controls liquid shaking during transportation while maintaining high-precision with respect to the stopping position of a specimen at the time of device start-up. This specimen carrying device includes a plurality of coils that transport a transportation container of a specimen, a coil drive unit, and a control unit, wherein: the control unit includes a liquid shaking determination unit that determines liquid shaking of the specimen from a velocity fluctuation of the specimen; the control unit sets, near a stopping coil 3 that is nearest to the stopping position of the specimen, a first section S1 on a side separated from the stopping coil 3 and a second section S2 on a side nearer to the stopping coil 3 than the first section S1, and sets a first current as a current that energizes the stopping coil 3 when the specimen is in the first section S1 and a second current as a current that energizes the stopping coil 3 when the specimen is in the second section S2; and the first current is set, on the basis of determination information of the liquid shaking determination unit 65, to a magnitude whereby the liquid shaking of the specimen is controlled, and the second current is set to a current value larger than that of the first current.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
There is provided an automatic analyzer that stops a back-flowing waste fluid from reaching a cleaning tank when bubbles are produced in a waste fluid pipe. An automatic analyzer includes: a cleaning tank in which cleaning using a detergent is performed with analysis operation of a specimen; and a waste fluid pipe through which a waste fluid flowing from the cleaning tank is discharged. The waste fluid pipe has an upward pipe branched upward. At a tip end of the upward pipe, opening is provided. The opening is disposed blow from the cleaning tank.
B08B 9/032 - Nettoyage de conduites ou de tubes ou des systèmes de conduites ou de tubes Élimination des bouchons par l'action mécanique d'un fluide en mouvement, p.ex. par effet de chasse d'eau
B08B 9/08 - Nettoyage de récipients, p.ex. de réservoirs
B08B 17/04 - Procédés pour empêcher la salissure pour empêcher le dépôt de crasses ou de poussières par l'emploi de couvertures amovibles
Problem
Provided is an electrolyte analyzer that allows reducing a load of a user in a replacement work compared with conventional one.
Problem
Provided is an electrolyte analyzer that allows reducing a load of a user in a replacement work compared with conventional one.
Solution
An electrolyte analyzer includes an ISE electrode 1 that includes at least one electrode, a reference electrode 2 that includes at least one electrode different from the ISE electrode 1, and a housing 200 that houses the electrodes of the ISE electrode 1 and the reference electrode 2. The housing 200 includes a pressing unit that presses the electrodes to one another, a first press switching unit 210 that switches the ISE electrode 1 between a secured state and a released state, and a second press switching unit 215 that switches the reference electrode 2 between a secured state and a released state. The ISE electrode 1 and the reference electrode 2 are each switched between the secured state and the released state. Selected Drawing: FIG. 3
G01N 27/411 - Cellules et sondes avec des électrolytes solides pour la recherche ou l'analyse de métaux liquides
G01N 27/30 - Composants de cellules électrolytiques Électrodes, p.ex. électrodes pour tests; Demi-cellules
G01N 27/42 - Mesure du dépôt ou de la libération de matériaux d'un électrolyte; Coulométrie, c. à d. mesure de l'équivalent de Coulomb du matériau dans un électrolyte
The purpose of the present invention is to precisely control the temperature in each storage chamber of a specimen analysis device in which a plurality of storage chambers store specimen containers, respectively. The specimen analysis device according to the present invention generates cold air (see fig. 2) such that the temperature at the bottom of the specimen container is lower than the temperature at a lid of the specimen container.
The present invention makes it possible to identify, at a glance, the presence/absence of an abnormality and a cause thereof, in relation to a sample that is transported into an automatic analysis device. This automatic analysis device comprises an analysis unit 101 that performs measurement of a sample accommodated in a sample container 105, a display unit 104 that displays the result of the measurement by the analysis unit, a transportation unit 107 that transports the sample container to the analysis unit, and a camera 108 that images the sample container being transported to the analysis unit. The automatic analysis device analyzes an image of the sample container that is captured by the camera, and causes the display unit to collectively display, in relation to the sample for which the measurement result is displayed, one or more icons that are based on the result of analyzing the image of the sample container in which the sample is accommodated.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
An analysis system includes an analyzer configured to separate a sample including a plurality of components labeled with any of M kinds of fluorescent substances by chromatography and acquire first time-series data of fluorescence signals detected in N kinds (M>N) of wavelength bands in a state in which at least a part of the plurality of components is not completely separated; and a computer configured to compare the first time-series data with the second time-series data, and determine which kind of fluorescent substance of M kinds of fluorescent substances individually labels each of the plurality of components.
This observation assistance device for a sample comprises: an observation position display unit that displays, in association with an image display unit, the positions of a plurality of captured images in which a sample is image-captured by a charged particle beam device; a display processing unit that controls the observation position display unit; and a representative image selection processing unit that selects a representative image on the basis of the plurality of captured images. According to a change in the magnification of the image display unit, the display processing unit controls the representative image to a size that is easily visible and displays the representative image on the observation position display unit.
A multidispenser 100 comprises: a plurality of syringes 103 which are each constituted by a plunger 101 and a housing 102; a drive motor 104 which drives at least one plunger 101; tip end parts 106 to which dispensing tips 105 are attached; and tubes 107A, 107B which connect the syringes 103 and the tip end parts 106, wherein the outer diameter 109 of each housing 102 is greater than the pitch distance 108 of the dispensing tips 105, and the plurality of syringes 103 are arranged in a plurality of rows. Thus, it is possible to increase plunger diameter as compared to the prior art, and to perform dispensation in amounts ranging from minute to large.
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
72.
BATTERY MANAGEMENT DEVICE, BATTERY MANAGEMENT METHOD, AND BATTERY MANAGEMENT PROGRAM
The purpose of the present invention is to provide technology that enables a degree of wear of a battery to be accurately estimated in a short time. A battery management device according to the present invention estimates, on the basis of temporal change of battery voltage in a rest period of the battery, a deterioration mode of the battery, selects the Eyring plot corresponding to the deterioration mode that is estimated, and diagnoses a state of the battery on the basis of the plot that is selected (see Fig. 8).
G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p.ex. état de santé
G01R 31/367 - Logiciels à cet effet, p.ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
G01R 31/3828 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p.ex. état de charge utilisant l’intégration du courant
G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
G01R 31/396 - Acquisition ou traitement de données pour le test ou la surveillance d’éléments particuliers ou de groupes particuliers d’éléments dans une batterie
H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p.ex. le niveau ou la densité de l'électrolyte
H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries
73.
FILTER DEVICE, FILTER FIXING TOOL, AND FILTERING METHOD
The present invention enables easy fitting or removal of a filter container with a small force while keeping airtightness between the filter container and an elastic body through division of a part for achieving airtightness between the the filter container and the elastic body and a part for fixing the filter container. This filter device comprises: a funnel 10 having an inlet 11 through which a liquid sample is inputted and an outlet 12 having an opening area smaller than that of the inlet 11; a filter container 20 which has a filter 23 for capturing an object included in the liquid sample and into which a tip having the outlet 12 of the funnel 10 is inserted; a rubber plug 40 having a through-hole 41 which serves as a flow channel of the liquid sample that passed through the filter 23; and a filter fixing tool 30 that abuts against the filter container 20 to support the filter container 20, and presses the filter container 20 to the rubber plug 40.
B01D 29/01 - Filtres à éléments filtrants stationnaires pendant la filtration, p.ex. filtres à aspiration ou à pression, non couverts par les groupes ; Leurs éléments filtrants avec des éléments filtrants plats
G01N 1/10 - Dispositifs pour prélever des échantillons à l'état liquide ou fluide
74.
CONTAINER STORAGE DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND METHOD FOR RETRIEVING SAMPLE CONTAINER
Provided is a container storage device 101 that is connected to an automatic analysis device via a transport path through which a rack is transported, wherein: the container storage device has a storage chamber 204 in which sample containers are stored, a container transport mechanism 208 that moves the sample containers between the storage chamber and a rack 203, and a control unit; the transport path allows transport of the rack in a direction from the container storage device toward the automatic analysis device; the rack is provided with a plurality of placement positions at which the sample containers are placed; and once a plurality of sample containers to be carried out that accommodate samples for which a measurement request was issued from the automatic analysis device can be carried out, the control unit determines a carry-out priority for the plurality of sample containers to be carried out and performs control such that sample containers to be carried out that have higher degrees of carry-out priority are mounted at container placement positions on the rack that are farther toward the transport direction of the transport path. This reduces a sample-loading-related burden on a user and improves the efficiency of measurement by the automatic analysis device.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
The present invention reduces the operation time of an automatic analysis device and improves the convenience of the automatic analysis device. For this purpose, this automatic analysis device is configured to be able to display, on a display device, an operation menu screen 400 that displays a hierarchically defined operation menu for the automatic analysis device, and a shortcut screen 600 in which a plurality of shortcut buttons for performing specific operations included in the operation menu are arranged. When a shortcut button for performing a predetermined operation is selected on the shortcut screen, the predetermined operation included in the operation menu screen is performed. The arrangement of the shortcut buttons in the shortcut screen is determined by the user.
G06F 3/0482 - Interaction avec des listes d’éléments sélectionnables, p.ex. des menus
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
There is provided an automatic analyzer that keeps a temperature of alight emitting element of alight source constant and has high accuracy analysis performance. A light source for an automatic analyzer includes: a substrate including a light source; a temperature adjustment unit configured to adjust a temperature of the light source; a first optical element configured to emit light from the light source to an outside; and a member configured to cover the light source, in which the temperature adjustment unit, the substrate, the member, and the first optical element are arranged in this order, the optical element is assembled so as to be accommodated in the member, and the temperature adjustment unit puts the light source, the member, and the optical element under the same temperature control.
G01N 21/01 - Dispositions ou appareils pour faciliter la recherche optique
G01N 21/31 - Couleur; Propriétés spectrales, c. à d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p.ex. spectrométrie d'absorption atomique
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
77.
Thin Film Damage Detection Function and Charged Particle Beam Device
National Institute of advanced Industrial Science and Technology (Japon)
Inventeur(s)
Hatano, Michio
Nakamura, Mitsuhiro
Ogura, Toshihiko
Abrégé
A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holder 101 holding a sample includes: a sample chamber including a first insulating thin film 110 and a second insulating thin film 111 that sandwich and hold the sample 200 in a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrode 820 disposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unit 50 connected to the detection electrode. Before the surrounding atmosphere of the sample holder is evacuated from an atmospheric pressure to a vacuum, the charged particle beam device receives a detection signal from the signal detection unit via a connector and detects an abnormality of the sample chamber based on the detection signal.
G01N 23/2204 - Supports d’échantillons à cet effet; Moyens de transport des échantillons à cet effet
G01N 23/2251 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p.ex. la microscopie électronique à balayage [SEM]
Provided is a dimension measurement system or the like which uses a method in which a human inputs and sets some information while making it possible to reduce the manual operation time or burden for the human. This dimension measurement system involves: displaying, for a user, a screen which includes an image and a graphical user interface (GUI), designating a reference line (interface reference line) for identifying part of a region of a structure to be subjected to dimension measurement, on the basis of a manual user operation, on an image on the screen, and designating a reference point (region reference point) within said region, said point being for identifying the region of the structure to be subjected to the dimension measurement (step 3); detecting an outline or an edge of the region of the structure to be subjected to a dimension measurement in the image by using the reference line and the reference point (step 4); and measuring a dimension of the structure to be subjected to a dimension measurement in the image by using the detected outline or edge information (step 5).
G06T 1/00 - Traitement de données d'image, d'application générale
G01B 21/02 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la longueur, la largeur ou l'épaisseur
80.
ION MILLING DEVICE, SECTION MILLING PROCESSING METHOD, AND SECTION MILLING HOLDER
An ion milling device has: a sample stage (2) on which is installed a section milling holder that holds a sample (2) and a shielding plate (3); an ion gun (4) that emits a non-convergent ion beam toward the sample; and a shielding plate driving unit (8) that changes the adhesion of the sample and the shielding plate and the position of the shielding plate with respect to the sample in an edge direction along a border between the sample and the shielding plate held by the section milling holder.
This ion milling device comprises: a specimen stage (103) on which a specimen is to be placed; a specimen table (102) and a shielding-plate-fixing part (106) which are supported by the specimen stage; a shielding plate (105) fixed to the shielding-plate-fixing part; an ion source (101) which emits an unfocused ion beam toward the specimen; and a temperature regulation unit (108) which is connected to the shielding-plate-fixing part by a heat transfer cable (107) and which regulates the temperature of the shielding-plate-fixing part. The specimen is sandwiched between the shielding plate and the specimen table and held thereby, and the amount in which the specimen protrudes from the shielding plate is regulated in accordance with temperatures of the shielding-plate-fixing part which are set by the temperature regulation unit.
There is provided a housing box that prevents breakage of a rod-shaped member like a nozzle use for an automatic analyzer at the time of transportation. A housing box in which a rod-shaped member used for an automatic analyzer is housed, the housing box includes: a base provided with a housing part in a groove shape on which the rod-shaped member is placed; and a cover put on the base, wherein the housing part has a step on which a projection is caught, the projection being provided on a bottom of the rod-shaped member, the projection projecting in a radial direction, and a space between a tip end and an inner wall of the rod-shaped member.
B65D 85/38 - Réceptacles, éléments d'emballage ou paquets spécialement adaptés à des objets ou à des matériaux particuliers pour objets particulièrement sensibles aux dommages par chocs ou compression pour appareils optiques de mesure, de calcul ou de commande délicats
B65D 1/36 - Plateaux ou réceptacles analogues peu profonds avec compartiments ou cases moulées
B65D 43/16 - Couvercles ou chapeaux inamovibles s'ouvrant à charnières vers le haut ou vers le bas
B65D 51/26 - Fermetures non prévues ailleurs combinées avec dispositifs auxiliaires pour des buts autres que la fermeture avec des moyens pour maintenir en place le contenu, p.ex. avec des moyens élastiques
B65D 81/05 - Réceptacles, éléments d'emballage ou paquets pour contenus présentant des problèmes particuliers de stockage ou de transport ou adaptés pour servir à d'autres fins que l'emballage après avoir été vidés de leur contenu spécialement adaptés pour protéger leur contenu des dommages mécaniques maintenant le contenu en position éloignée des parois de l'emballage ou des autres pièces du contenu
B65D 85/24 - Réceptacles, éléments d'emballage ou paquets spécialement adaptés à des objets ou à des matériaux particuliers pour objets incompressibles ou rigides en forme de baguette ou tubulaires pour aiguilles, clous ou petits objets de forme allongée similaires
83.
Microscope Slide and Method for Selecting the Same
Provided is an efficient method for attaching a tissue section. In the invention, one of problems is solved by changing attachment conditions of the tissue section depending on an organ from which the tissue section is derived. A technique of achieving good adhesiveness between a microscope slide and a section by introducing unevenness on a front surface of the microscope slide using reactive ion etching as one of the attachment conditions is provided. Further, a technique of optimizing the attachment of the section using a machine learning technique or the like is provided.
In order to provide an electrophoresis device in which it is possible to reduce a noise signal caused by foreign matter surrounding an excitation-light-irradiated part of a capillary array, the present invention provides an electrophoresis device comprising a capillary array in which capillaries used in electrophoresis of a sample are arranged in a planar form, an excitation light source that irradiates the capillary array with excitation light, and a fluorescence measurement unit that measures fluorescence induced from the capillary array, the electrophoresis device characterized in that the capillary array has a hermetic structure in which the surroundings of an excitation-light-irradiated part are filled with air, the excitation-light-irradiated part being the location irradiated with the excitation light.
A liquid atomizing device that continuously atomizes liquid samples of a plurality of types which are continuously supplied thereto, wherein different liquid samples are prevented from mixing with one another. This liquid atomizing device comprises: a liquid supply part that has a liquid passage; and an ultrasonic wave vibration unit that is positioned so as to be in contact with the liquid supply part, wherein the liquid supply part has a fine hole communicating the interior and the exterior of the liquid passage, the ultrasonic wave vibration unit is configured so as to apply vibrations to a liquid flowing through the liquid passage, and the liquid is discharged as fine droplets from the fine hole.
G01N 27/62 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant les décharges électriques, p.ex. l'émission cathodique
86.
PLASMA PROCESSING DEVICE, INTERNAL MEMBER OF PLASMA PROCESSING DEVICE, AND METHOD FOR MANUFACTURING INTERNAL MEMBER OF PLASMA PROCESSING DEVICE
In order to provide a plasma processing device with increased processing yield, an internal member thereof, or a method for manufacturing those, the present invention comprises a processing chamber which is disposed inside a vacuum chamber and in which plasma is formed and a member which is disposed inside the processing chamber and a surface of which faces the plasma. The member is configured to include, on the surface, a film composed of a material containing at least one of yttrium oxide, yttrium fluoride, and yttrium oxyfluoride and an element that becomes a +4-valent or +6-valent ion having a smaller ionic radius than that of a +3-valent yttrium ion, the material containing, on average, 1.5 times or more as much oxygen in molar ratio as yttrium and 1 times or more, preferably 1.4 times or more as much fluorine in molar ratio as yttrium.
National Institute of Advanced Industrial Science and Technology (Japon)
Inventeur(s)
Hatano, Michio
Nakamura, Mitsuhiro
Ogura, Toshihiko
Abrégé
A sample holder reliably holds a liquid or gel sample, and the yield of observation with a charged particle beam device is improved. A sample holder 101 includes a first member 102 that has a lid member 111 and a first chip 105 provided with a first window 123 where a laminated film including a first insulating thin film 104 is formed, and a second member 103 that has a base material 127 having a first bottom seal surface 203 and a second bottom seal surface 200, an electrode 108 disposed on the base material, and a second chip 107 provided with a second window 124 where a second insulating thin film 106 is formed and held on the second bottom seal surface via a second seal material 119 such that the second window faces the electrode, in which a region inside a first seal material is maintained airtightly from a region outside the first seal material by the first member and the second member being combined and the first seal material being crushed between the first bottom seal surface and an upper seal surface of the lid member.
The purpose of the present invention is to provide a capillary electrophoresis device that can confirm optical performance without performing a specialized task, and an optical performance diagnostic method for the capillary electrophoresis device. In order to achieve said purpose, the present invention is a capillary electrophoresis device comprising: a capillary array formed by a plurality of capillaries; a light source that oscillates laser light; a detector that detects light emitted when the capillary array is irradiated with the laser light; and a control unit that performs prescribed processing on the basis of signals from the detector. The control unit extracts a prescribed absolute value related to an optical index on the basis of an image captured by the detector, and calculates the optical index by comparing the extracted absolute value and a predetermined reference value.
Provided is a new ion source that produces microdroplets from a liquid sample continuously supplied from a liquid chromatograph or the like, electrically charges the microdroplets, executes a series of treatments for vaporizing a solvent at a low gas flow rate, and introduces ions of a solute component contained in the liquid sample into an analysis block. This ion source is for supplying, to an analysis block for analyzing a liquid sample containing a solute component, ions of the solute component, the ion source comprising: a droplet production unit that produces droplets of the liquid sample; a heated and pressure-adjusted gas supply block that heats a carrier gas that flows therein from the droplet production unit together with the droplets; and an electrically charging unit that electrically charges the solute component and ionizes the same. The heated and pressure-adjusted gas supply block includes: a sample transport tube path that is arranged between the analysis block and the droplet production unit; a heated and pressure-adjusted gas reservoir unit that is configured to be in contact with the sample transport tube path so that heat can be transferred therebetween; a gas-heating unit that heats a prescribed gas to a prescribed temperature; and a pressure-adjusting unit that maintains the pressure of the prescribed gas in a prescribed range. The droplets and the carrier gas are heated by the heated prescribed gas. The droplets and the carrier gas are supplied from the droplet production unit to the sample transport tube path. The heated prescribed gas is introduced from the heated and pressure-adjusted gas reservoir unit into the sample transport tube path.
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p.ex. fermetures étanches au vide; Dispositions pour le réglage externe des composants électronoptiques ou ionoptiques
90.
ELECTRIC VEHICLE CHARGING MANAGEMENT DEVICE, ELECTRIC VEHICLE CHARGING MANAGEMENT METHOD, AND PROGRAM
The present invention suppresses concentrated charging for a plurality of electric vehicles (EVs) to achieve even charging. The present invention provides an electric vehicle charging management device 10 that manages the charging of a plurality of EVs 40 and comprises a charging time slot information creation unit 121 that uses delivery course information 1001 and vehicle information 1003 to create charging time slot information 1007 indicating a schedule for charging each of the plurality of EVs 40, a used power amount calculation unit 122 that calculates used-power-amount-by-time-slot information 1008 indicating a used power amount including an executed charging amount in each of a plurality of time slots, and a charging time slot information changing unit 123 that changes the charging time slot information 1007 by changing the charging of a change target electric vehicle EV in a maximum time slot which is among the plurality of time slots and has the highest used power amount among used power amounts.
G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p.ex. état de santé
G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p.ex. état de charge
G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p.ex. le niveau ou la densité de l'électrolyte
H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries
92.
EVAPORATION CONCENTRATION MECHANISM AND METHOD FOR CONTROLLING SAME
An evaporation concentration mechanism is realized that can control a depressurization rate by an inexpensive and simple mechanism to inhibit bumping at the time of evaporation and concentration. The evaporation concentration mechanism includes a reaction vessel that holds a sample solution, a depressurization channel connected to the reaction vessel, and a depressurization source that is connected to the reaction vessel via the depressurization channel and depressurizes the inside of the reaction vessel. The evaporation concentration mechanism further includes at least one of solenoid valves provided in the depressurization channel, and a control unit 8 that controls an operation of the solenoid valves. The control unit 8 intermittently opens and closes the solenoid valves during a depressurization period in which the inside of the reaction vessel is depressurized by the depressurization source.
There are provided a sample conveyance system and a sample conveyance method capable of conveying a sample in a more stable manner than in the related art corresponding to a conveyance method using an electromagnetic actuator. A driving unit 208 applies a first voltage to a first coil 207a located on a front side in a traveling direction of a holder 202, which is selected to attract or repel the holder 202, to excite the first coil 207a and applies a second voltage having a polarity opposite to a polarity of the first voltage to at least one or more of second coils 207b among coils 207 adjacent to the first coil 207a except for the coils 207 in the front side in the traveling direction to excite the second coil 207b, and a control unit 210A estimates a position of the holder 202 based on a value of a current flowing through a winding 206 of the first coil 207a.
B65G 54/02 - Transporteurs non mécaniques, non prévus ailleurs électrostatiques, électriques ou magnétiques
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
94.
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR MANUFACTURING DEVICE
The purpose of the present invention is to provide semiconductor device manufacturing method and a semiconductor manufacturing device that, without requiring a complex gas supply system, can ensure processing efficiency and suppress contamination by foreign bodies. A representative example of this semiconductor device manufacturing method comprises: a step in which the quantity of fabrication residue of a film subjected to processing that has been formed on a semiconductor wafer is compared with a threshold value; a step in which the semiconductor wafer is heated while an organic gas that includes a substance having, in a molecule thereof, at least two substituents having a lone electron pair is supplied, to form a compound of the film subjected to processing and the organic gas; and a step in which, on the basis of the result of the comparison, after the step in which the compound is formed, the wafer is further heated, raising the temperature thereof to a prescribed temperature, to detach the compound from the surface of the semiconductor wafer.
The purpose of the present invention is to provide an automatic analysis device that makes it possible to more accurately find the time required for a pre-operation from the reception of an analysis instruction to the start of analysis. This automatic analysis device comprises: an analysis module that analyzes a sample; a control unit that controls the analysis module; and a display unit that displays a state of the analysis module, the automatic analysis device being characterized in that the control unit calculates the remaining time until a pre-operation ends, on the basis of the time required for an operation confirmation of each type of mechanism of the analysis module, and causes the display unit to display the remaining time.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
96.
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS SYSTEM
Provided is an automatic analysis device in which safety is ensured, and operability is improved. The automatic analysis device includes: an operation unit that receives voice input from a microphone or a mobile device; and a measurement unit that analyzes a sample. The operation unit has: an equipment state acquisition unit that acquires equipment state data for the measurement unit; a voice detection/recognition unit that acquires voice data and converts the voice data into voice instruction text; and a unit for determining device operability that, in cases in which the voice instruction text includes operation instructions for the measurement unit, determines the executability of the operation instructions included in the voice instruction text, on the basis of the equipment state data for the measurement unit acquired by the equipment state acquisition unit, and on the basis of the accuracy of the voice instruction text.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G10L 15/22 - Procédures utilisées pendant le processus de reconnaissance de la parole, p.ex. dialogue homme-machine
To provide an automatic analyzer with no need to control a residual amount of a quality control sample. An automatic analyzer includes an input unit which receives a container including a specimen and a quality control sample, an ID reader which reads ID attached to the container, a control unit which assigns measurement items to the ID and controls each unit, and an analysis unit which dispenses the specimen and the quality control sample from the container and performs analysis based on the measurement items, in which when a liquid amount of a first container including the quality control sample is not enough, the control unit assigns measurement items not yet performed, of measurement items assigned to ID of the first container, to ID of a second container including the quality control sample and controls the analysis unit to perform analysis.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
98.
COMPUTER SYSTEM, DIMENSION MEASUREMENT METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM
Provided is a computer system that provides a function for extracting, from image data, coordinate information of base points for measuring dimensions of a desired portion of a pattern of the image data, and measuring the dimensions using the coordinate information of the base points, the computer system comprising a preprocessing unit that, even when a learning data set to be used for a learning machine contains both samples for which all base point coordinates are provided and samples for which only some of base point coordinates are provided, allows the learning machine to learn all the samples together by setting, for each of the samples for which only some of the base point coordinate values are provided, a missing base point as a missing measurement portion in annotation data, and by masking the missing measurement portion in the image data. The preprocessing unit includes the learning machine in which a posture estimation model is implemented that outputs the coordinate information of at least two of the base points as learning results. The leaning machine is pre-trained using learning data containing the image data as an input and the coordinate information of the at least two base points as an output. The preprocessing unit extracts the dimensions and the coordinate information of the at least two base points with respect to new image data inputted to the learning machine.
G01B 15/00 - Dispositions pour la mesure caractérisées par l'utilisation d'ondes électromagnétiques ou de radiations de particules, p.ex. par l'utilisation de micro-ondes, de rayons X, de rayons gamma ou d'électrons
G01B 11/03 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur en mesurant les coordonnées de points
99.
BATTERY MANAGEMENT DEVICE AND BATTERY MANAGEMENT METHOD
The purpose of the present invention is to provide a technology capable of diagnosing the deterioration speed of a battery in a short time. A battery management device according to the present invention specifies a first period during an idle period and a second period after the first period, and estimates the deterioration speed of a battery dependent on the battery temperature, on the basis of a ratio between a first change portion of a voltage during the first period and a second change portion of the voltage during the second period (see fig. 5).
G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p.ex. état de santé
G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p.ex. état de charge
G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p.ex. le niveau ou la densité de l'électrolyte
H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries
This automatic analysis device comprises an analysis unit that analyzes a specimen and a treatment unit that pre-treats the specimen before the analysis, wherein the treatment unit is provided with a temperature adjustment unit that heats or cools the air in the treatment unit, the temperature adjustment unit includes a first reagent temperature adjustment unit and a second reagent temperature adjustment unit, the first reagent temperature adjustment unit is configured to heat or cool a first reagent through contact heat transfer, the second reagent temperature adjustment unit is configured to heat or cool a second reagent through contact heat transfer or forced convection heat transfer, and the first reagent temperature adjustment unit is configured to have a heat exchange rate greater than that of the second reagent temperature adjustment unit. Thus, a plurality of reagents can be adjusted to appropriate temperatures irrespective of the ambient temperature around the automatic analysis device.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
