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2022
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Invention
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Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency v... |
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Invention
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Second-harmonic generation for critical dimensional metrology.
Systems and methods are disclosed... |
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|
Invention
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Second-harmonic generation for critical dimensional metrology. Systems and methods are disclosed ... |
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|
Invention
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Wafer metrology technologies.
Various approaches can be used to interrogate a surface such as a ... |
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2021
|
Invention
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Systems for parsing material properties from within shg signals.
Semiconductor metrology systems... |
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Invention
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Pump and probe type second harmonic generation metrology.
Various approaches to can be used to i... |
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2020
|
Invention
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Pump and probe type second harmonic generation metrology. Various approaches to can be used to in... |
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Invention
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Wafer metrology technologies. Various approaches can be used to interrogate a surface such as a s... |
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2019
|
Invention
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Systems for parsing material properties from within shg signals. Semiconductor metrology systems ... |
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|
Invention
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Field-biased second harmonic generation metrology. Various approaches can be used to interrogate ... |
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|
Invention
|
Second harmonic generation (shg) optical inspection system designs.
Second Harmonic Generation (... |
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|
Invention
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Second harmonic generation (shg) optical inspection system designs. Second Harmonic Generation (S... |
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|
Invention
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Systems and methods for determining characteristics of semiconductor devices.
Second Harmonic Ge... |
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Invention
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Field-biased nonlinear optical metrology using corona discharge source.
Various approaches can b... |
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Invention
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Field-biased nonlinear optical metrology using corona discharge source. Various approaches can be... |
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|
Invention
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Systems and methods for determining characteristics of semiconductor devices. Second Harmonic Gen... |
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2018
|
Invention
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Charge decay measurement systems and methods.
Various approaches to can be used to interrogate a... |
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2015
|
Invention
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Field-biased second harmonic generation metrology.
Various approaches can be used to interrogate... |
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|
Invention
|
Wafer metrology techonologies.
Various approaches can be used to interrogate a surface such as a... |
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|
Invention
|
Wafer metrology technologies. Various approached to can be used to interrogate a surface such as ... |
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2000
|
Invention
|
Apparatus and method for collecting and detecting chemicals. An apparatus (10) for detecting chem... |
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1999
|
Invention
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Chemical sensor array. A device for detecting chemical substances includes a plurality of sensors... |
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Invention
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Pulsed air sampler. A device samples chemicals adsorbed to a surface by applying a pulse of fluid... |
