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2023
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Invention
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Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency v... |
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Invention
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Method and apparatus for main detector synchronization of optically based second harmonic generat... |
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Invention
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Method and apparatus for separation of the second harmonic generation components, through variati... |
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Invention
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Apparatus and method of increasing precision control of charge deposition onto a semiconductor wa... |
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Invention
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Method and apparatus for non-invasive, non-intrusive, and un-grounded, simultaneous corona deposi... |
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Invention
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Method and apparatus for non-invasive semiconductor technique for measuring dielectric/semiconduc... |
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Invention
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Method and apparatus for non-invasive, non-intrusive, and ungrounded, simultaneous corona deposit... |
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Invention
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Dimensional metrology using non-linear optics.
Systems and methods are disclosed for using secon... |
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Invention
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Dimensional metrology using non-linear optics. Systems and methods are disclosed for using second... |
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2022
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Invention
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Second-harmonic generation for critical dimensional metrology.
Systems and methods are disclosed... |
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Invention
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Second-harmonic generation for critical dimensional metrology. Systems and methods are disclosed ... |
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P/S
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Optical frequency metrology devices |
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Invention
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Wafer metrology technologies.
Various approaches can be used to interrogate a surface such as a ... |
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2021
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Invention
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Systems for parsing material properties from within shg signals.
Semiconductor metrology systems... |
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Invention
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Pump and probe type second harmonic generation metrology. Various approaches to can be used to in... |
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2020
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Invention
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Wafer metrology technologies. Various approaches can be used to interrogate a surface such as a s... |
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2019
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Invention
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Systems for parsing material properties from within shg signals. Semiconductor metrology systems ... |
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Invention
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Field-biased second harmonic generation metrology. Various approaches can be used to interrogate ... |
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Invention
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Second harmonic generation (shg) optical inspection system designs. Second Harmonic Generation (S... |
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Invention
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Systems and methods for determining characteristics of semiconductor devices.
Second Harmonic Ge... |
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Invention
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Field-biased nonlinear optical metrology using corona discharge source.
Various approaches can b... |
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Invention
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Field-biased nonlinear optical metrology using corona discharge source. Various approaches can be... |
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Invention
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Systems and methods for determining characteristics of semiconductor devices. Second Harmonic Gen... |
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2018
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Invention
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Charge decay measurement systems and methods.
Various approaches to can be used to interrogate a... |
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2015
|
Invention
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Field-biased second harmonic generation metrology.
Various approaches can be used to interrogate... |
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Invention
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Pump and probe type second harmonic generation metrology.
Various approaches to can be used to i... |
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Invention
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Wafer metrology techonologies.
Various approaches can be used to interrogate a surface such as a... |
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Invention
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Wafer metrology technologies. Various approached to can be used to interrogate a surface such as ... |
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2000
|
Invention
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Apparatus and method for collecting and detecting chemicals. An apparatus (10) for detecting chem... |
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1999
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Invention
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Chemical sensor array. A device for detecting chemical substances includes a plurality of sensors... |
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Invention
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Pulsed air sampler. A device samples chemicals adsorbed to a surface by applying a pulse of fluid... |
