Mitutoyo Corporation

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IPC Class
G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points 116
G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines 91
G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures 87
G01D 5/347 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infrared, visible or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales 87
G01B 5/20 - Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures 66
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NICE Class
09 - Scientific and electric apparatus and instruments 52
07 - Machines and machine tools 2
42 - Scientific, technological and industrial services, research and design 2
Status
Pending 65
Registered / In Force 1,155
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1.

SMALL-SIZED MEASURING DEVICE AND OPERATING METHOD OF THE SAME

      
Application Number 18488166
Status Pending
Filing Date 2023-10-16
First Publication Date 2024-04-25
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Kikuchi, Mao
  • Kurata, Tomoharu

Abstract

A small-sized measuring device includes a position detector that is provided on a main body and detects the position of an object to be measured, a photosensor, and a central control unit that controls overall operation. The photosensor is configured to function at least as an input device configured to accept a base-point setting instruction from the user. The central control unit, when accepting the base-point setting instruction from the user through the non-contact input sensor, performs a base-point setting step of setting the position of the object to be measured detected by the position detector as a base point, and performs a measurement step of measuring the position of the object to be measured as a relative position from the base point.

IPC Classes  ?

  • G01B 3/22 - Feeler-pin gauges, e.g. dial gauges
  • G06F 3/03 - Arrangements for converting the position or the displacement of a member into a coded form

2.

SMALL-SIZED MEASURING DEVICE AND OPERATING METHOD OF THE SAME

      
Application Number 18488214
Status Pending
Filing Date 2023-10-16
First Publication Date 2024-04-25
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Kikuchi, Mao
  • Kurata, Tomoharu

Abstract

A small-sized measuring device includes a position detector that is provided on a main body and detects the position of an object to be measured, a timer that measures time, and a central control unit that controls overall operation. The central control unit accepts a base-point setting standby time set by a user and stores the base-point setting standby time. The central control unit measures elapse of the base-point setting standby time after accepting an instruction to start measuring time from the user, performs a base-point setting step of setting the position of the object to be measured detected by the position detector as a base point after the base-point setting standby time has elapsed, and then measures the position of the object to be measured as a relative position from the base point.

IPC Classes  ?

  • G01B 3/22 - Feeler-pin gauges, e.g. dial gauges

3.

OPTICAL ENCODER

      
Application Number 18474331
Status Pending
Filing Date 2023-09-26
First Publication Date 2024-04-04
Owner Mitutoyo Corporation (Japan)
Inventor Kimura, Akihide

Abstract

An optical encoder is provided that can reduce the effects of unwanted diffracted light in a stable manner. The optical encoder 1 comprises a scale 2 and a detection head 3. The detection head 3 includes a light source 4 and light-receiving means 6 with a light-receiving surface 60. The light-receiving surface 60 has an element row 7 with multiple light-receiving elements 70 arranged along the measurement direction with the same period as that of the interference fringes. Here, an error included in detection signals generated from the interference fringes, with such error being caused by the fact that the number of light-receiving elements 70 is an odd number, will be referred to as a number-of-elements-induced error, and a predetermined allowable error will be referred to as an allowable error. The number of light-receiving elements 70 in the element row 7 is set to be a number where the number-of-elements-induced error is smaller than the allowable error. Such number-of-elements-induced error is caused when there is an odd total number of light-receiving elements 70 and such odd total number of light-receiving elements 70 are functional, or when there is an even total number of light-receiving elements 70 but one less than such even total number of light-receiving elements are functional.

IPC Classes  ?

  • G01D 5/347 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infrared, visible or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales

4.

Connection device for communication

      
Application Number 29770830
Grant Number D1020744
Status In Force
Filing Date 2021-02-17
First Publication Date 2024-04-02
Grant Date 2024-04-02
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iori, Keisuke
  • Shimizu, Aoi

5.

MICROMETER HEAD DISPLACEMENT SYSTEM UTILIZING IMAGING

      
Application Number 17955051
Status Pending
Filing Date 2022-09-28
First Publication Date 2024-03-28
Owner Mitutoyo Corporation (Japan)
Inventor Nahum, Michael

Abstract

A micrometer head displacement system includes a micrometer head and an imaging portion. The micrometer head includes a coarse scale and a fine scale. The system is configured to: acquire at least one image of the micrometer head from the imaging portion; determine a coarse measurement based at least in part on the at least one image wherein the coarse measurement corresponds to a coarse relative position between the coarse scale and a coarse fiducial line; determine a fine measurement based at least in part on the at least one image and based on calculating an interpolated position of the a fiducial line wherein the fine measurement corresponds to a fine relative position between the fine scale and the fine fiducial line; and determine a micrometer head displacement based at least in part on summing the coarse measurement with the fine measurement.

IPC Classes  ?

  • G01B 3/18 - Micrometers
  • G06T 7/13 - Edge detection
  • G06T 7/70 - Determining position or orientation of objects or cameras
  • H04N 5/232 - Devices for controlling television cameras, e.g. remote control

6.

ADJUSTABLE UPDATE RATE FOR MEASURING PROBE

      
Application Number 17939710
Status Pending
Filing Date 2022-09-07
First Publication Date 2024-03-07
Owner Mitutoyo Corporation (Japan)
Inventor
  • Harsila, Scott Allen
  • Jansson, Bjorn Erik Bertil
  • Kanamori, Hiroyuki

Abstract

A measuring system includes a measuring probe with a contact portion that contacts a workpiece to be measured. The measuring probe operates with a first update rate during at least part of a moving mode, wherein the moving mode includes movement of the measuring probe such that the contact portion is moved away from the workpiece and/or is moved at a distance from the workpiece that is equal to or greater than a threshold distance. The measuring probe operates with a second update rate (i.e., which is faster than the first update rate) during at least part of a measuring mode, wherein the measuring mode includes movement of the measuring probe such that the contact portion is moved toward the workpiece for obtaining a measurement. In various implementations, the combined use of the first and second update rates effectively reduces power-on drift of the measuring probe.

IPC Classes  ?

7.

ONE-DIMENSIONAL MEASURING MACHINE AND COMPUTER-READABLE NON-TRANSITORY MEDIUM

      
Application Number 18450544
Status Pending
Filing Date 2023-08-16
First Publication Date 2024-03-07
Owner MITUTOYO CORPORATION (Japan)
Inventor Yano, Ryunosuke

Abstract

A one dimensional measuring machine includes a scale having graduations, a mover that has a light source configured to emit light to the graduations of the scale and a light receiving element configured to receive the light having passed through the scale from the light source, and can move along the scale, a light amount information detector that detects information regarding a light amount of the light emitted to the scale from the light source while the mover moves along the scale, and a contamination detector that detects a degree of contamination of the scale, based the information regarding the light amount of the light detected by the light amount information detector.

IPC Classes  ?

  • G01B 3/00 - Measuring instruments characterised by the use of mechanical techniques

8.

INDUCTIVE POSITION ENCODER UTILIZING SLANTED SCALE PATTERN

      
Application Number 17900635
Status Pending
Filing Date 2022-08-31
First Publication Date 2024-02-29
Owner Mitutoyo Corporation (Japan)
Inventor Cook, Ted Staton

Abstract

An inductive type position encoder includes a scale, a detector portion and a signal processor. According to one aspect, field generating elements and sensing elements of the detector portion are provided on opposite sides of the scale such that at least part of the scale is between the field generating elements and the sensing elements (transmissive configuration). According to another aspect, the scale comprises a periodic scale pattern including signal modulating elements that are disposed along a scale direction, which is not parallel to a measuring axis direction of the encoder and is slanted at a scale angle relative to the measuring axis direction, such that there is a corresponding y-direction displacement for a given x-direction displacement of the encoder. These aspects of the disclosure make it possible to design a very compact inductive type position encoder, including one capable of indicating an absolute position along the scale.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
  • G01B 7/00 - Measuring arrangements characterised by the use of electric or magnetic techniques
  • G01D 5/249 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means generating pulses or pulse trains using pulse code

9.

INDUCTIVE POSITION ENCODER UTILIZING TRANSMISSIVE CONFIGURATION

      
Application Number 17900633
Status Pending
Filing Date 2022-08-31
First Publication Date 2024-02-29
Owner Mitutoyo Corporation (Japan)
Inventor Cook, Ted Staton

Abstract

An inductive type position encoder includes a scale, a detector portion and a signal processor. According to one aspect, field generating elements and sensing elements of the detector portion are provided on opposite sides of the scale such that at least part of the scale is between the field generating elements and the sensing elements (transmissive configuration). According to another aspect, the scale comprises a periodic scale pattern including signal modulating elements that are disposed along a scale direction, which is not parallel to a measuring axis direction of the encoder and is slanted at a scale angle relative to the measuring axis direction, such that there is a corresponding y-direction displacement for a given x-direction displacement of the encoder. These aspects of the disclosure make it possible to design a very compact inductive type position encoder, including one capable of indicating an absolute position along the scale.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
  • G01B 7/00 - Measuring arrangements characterised by the use of electric or magnetic techniques
  • G01D 5/249 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means generating pulses or pulse trains using pulse code

10.

DUSTPROOF SEAL STRUCTURE

      
Application Number 18365320
Status Pending
Filing Date 2023-08-04
First Publication Date 2024-02-22
Owner Mitutoyo Corporation (Japan)
Inventor
  • Sakai, Hisayoshi
  • Ugajin, Tsutomu

Abstract

A dustproof seal structure includes a rotor assembly and a stator assembly rotatably supporting the rotor assembly. The stator assembly forms a horizontal thrust aerostatic bearing between a lower surface of the thrust plate and an upper surface of the stator assembly when compressed air is supplied between the lower surface of the thrust plate and the upper surface of the stator assembly. The thrust plate and the stator assembly form a sealing portion through which the compressed air flows. The sealing portion includes an inclined flow path whose height increases from an outer peripheral surface of the thrust plate toward the inside in a radial direction.

IPC Classes  ?

  • H02K 5/10 - Casings or enclosures characterised by the shape, form or construction thereof with arrangements for protection from ingress, e.g. of water or fingers
  • F16C 17/04 - Sliding-contact bearings for exclusively rotary movement for axial load only
  • F16C 33/74 - Sealings of sliding-contact bearings

11.

Height gauge

      
Application Number 29834865
Grant Number D1013539
Status In Force
Filing Date 2022-04-14
First Publication Date 2024-02-06
Grant Date 2024-02-06
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Yamada, Keiji
  • Fujita, Kazuki
  • Yonezawa, Takayuki
  • Aoki, Shigemitsu

12.

AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAME

      
Application Number 18226968
Status Pending
Filing Date 2023-07-27
First Publication Date 2024-02-01
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ogawa, Keita
  • Hayashida, Shuji
  • Yamaji, Masashi

Abstract

An automatic measuring device includes a micrometer including a spindle that moves forward and backward to be brought into contact with or away from a workpiece and a displacement detector unit that detects displacement of the spindle, and an automatic operation unit that automates the forward and backward movement of the spindle by power. The automatic operation unit performs a first forward-movement step of moving the spindle forward to bring the spindle into contact with the workpiece, and a contact determination step of determining the contact between the spindle and the workpiece in the first forward-movement step. In the contact determination step, the spindle is determined to be in contact with the workpiece when a change in a position of the spindle detected by the displacement detector unit in the first forward-movement step becomes equal to or less than a predetermined contact determination threshold.

IPC Classes  ?

  • G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
  • G01B 3/18 - Micrometers
  • G01B 3/00 - Measuring instruments characterised by the use of mechanical techniques

13.

Height gauge

      
Application Number 29834861
Grant Number D1012740
Status In Force
Filing Date 2022-04-14
First Publication Date 2024-01-30
Grant Date 2024-01-30
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Yamada, Keiji
  • Fujita, Kazuki
  • Yonezawa, Takayuki
  • Aoki, Shigemitsu

14.

LIGHTING CONFIGURATION FOR METROLOGY SYSTEM WITH IMAGES ACQUIRED AT DIFFERENT FOCUS POSITIONS

      
Application Number 17850485
Status Pending
Filing Date 2022-06-27
First Publication Date 2023-12-28
Owner Mitutoyo Corporation (Japan)
Inventor Hamner, Christopher Richard

Abstract

A lighting configuration is provided for utilization with a metrology system. The metrology system includes a camera that provides images of a workpiece at different focus positions (e.g., through operation of a variable focal length lens). The lighting configuration includes a plurality of lighting portions which illuminate the workpiece for the imaging. The lighting portions are distributed in an arrangement (e.g., an annular arrangement) in which an imaging lens portion of each lighting portion directs light toward a central volume (e.g., for which illumination in the central volume may be relatively uniform in X, Y and Z axis directions). Each imaging lens portion may include at least two lenses in a telecentric arrangement. Each lighting portion may comprise an optical homogenizer. The camera acquires a stack of images of the workpiece, from which focus curve data may be determined which indicates 3 dimensional positions of surface points on the workpiece.

IPC Classes  ?

  • H04N 5/235 - Circuitry for compensating for variation in the brightness of the object
  • G06T 7/00 - Image analysis
  • G06T 7/80 - Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration

15.

Microscope unit

      
Application Number 29816956
Grant Number D1009113
Status In Force
Filing Date 2021-11-26
First Publication Date 2023-12-26
Grant Date 2023-12-26
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iwamoto, Kenji
  • Fukumoto, Yasushi
  • Honma, Takashi

16.

Height gauge

      
Application Number 29818730
Grant Number D1008057
Status In Force
Filing Date 2021-12-10
First Publication Date 2023-12-19
Grant Date 2023-12-19
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iwamoto, Kenji
  • Kikuchi, Yuichi
  • Seki, Masanori

17.

GRATING PART AND MANUFACTURING METHOD THEREOF

      
Application Number 18233012
Status Pending
Filing Date 2023-08-11
First Publication Date 2023-11-30
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Aoki, Toshihiko
  • Miyake, Kosaku

Abstract

A grating part includes a first transparent substrate having an optical grating on a surface thereof, a second transparent substrate having an optical grating on a surface thereof, and a spacer positioned between the first transparent substrate and the second transparent substrate, the spacer bonding the first transparent substrate and the second transparent substrate.

IPC Classes  ?

18.

Image measuring device

      
Application Number 29806814
Grant Number D1001657
Status In Force
Filing Date 2021-09-07
First Publication Date 2023-10-17
Grant Date 2023-10-17
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iwamoto, Kenji
  • Kanno, Ryohei
  • Hattori, Atsushi
  • Yasuno, Junsuke
  • Imura, Takaharu

19.

INSIDE-DIAMETER MEASURING UNIT, FLOATING JOINT MECHANISM UNIT, AND MEASURING UNIT

      
Application Number 18124928
Status Pending
Filing Date 2023-03-22
First Publication Date 2023-10-12
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Yamaji, Masashi
  • Takatsu, Yuhei
  • Yamamoto, Chihiro

Abstract

There is provided an inside-diameter measuring unit capable of automating inside-diameter measurement and a control method for automatic inside-diameter measurement. An inside-diameter measuring part is supported by a support frame part via a floating joint part. The floating joint part includes a rotation-allowing mechanism part and a translation-allowing mechanism part. A measuring head part of the inside-diameter measuring part is inserted into a hole by a robot arm part. The inside-diameter measuring part adjusts its position and posture autonomously by the reaction force when a contact point pushes against the inner wall of the hole to align the axis of the inside-diameter measuring part with the axis of the hole. An electric inside-diameter measuring unit can automatically measure the inside diameter of a hole.

IPC Classes  ?

  • B25J 13/08 - Controls for manipulators by means of sensing devices, e.g. viewing or touching devices
  • G01B 5/12 - Measuring arrangements characterised by the use of mechanical techniques for measuring diameters internal diameters

20.

MEASUREMENT METHOD OF SURFACE SHAPE AND SURFACE SHAPE MEASUREMENT DEVICE

      
Application Number 18120696
Status Pending
Filing Date 2023-03-13
First Publication Date 2023-10-12
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Mori, Yumiko
  • Kato, Yoshiaki

Abstract

A measurement method of a surface shape and a surface shape measurement device uses an interferometer optical head that acquires an interference fringe image generated by a light path difference between the reference light and the measurement light, acquires N interference fringe images by scanning from a start point to an end point in the Z-axis direction, and measures the surface shape of the measurement target surface based on the interference fringe images. For a common position in the N interference fringe images, regarding an interference signal including values of N points that indicates a change in the interference light intensity along the Z-axis direction, a phase of an interference fringe produced by the light of a predetermined analysis wavelength is determined, and the relative position in the Z-axis direction of the measurement target surface within the range of the analysis wavelength is determined based on the phase.---

IPC Classes  ?

  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
  • G06T 7/55 - Depth or shape recovery from multiple images
  • G06T 7/60 - Analysis of geometric attributes
  • G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods

21.

RADAR METROLOGY SYSTEM INCLUDING CALIBRATION

      
Application Number 17710622
Status Pending
Filing Date 2022-03-31
First Publication Date 2023-10-05
Owner Mitutoyo Corporation (Japan)
Inventor Hartmann, Nick

Abstract

A radar metrology system is provided for use with a movement system (e.g., a robot arm) that moves an end tool, and includes mobile and stationary radar configurations. The mobile radar configuration includes mobile radar components that are coupled to the end tool or an end tool mounting configuration. The stationary radar configuration includes stationary radar components (e.g., that surround a volume in which the end tool is moved). As part of a calibration process, the mobile radar configuration is moved to a plurality of calibration positions, and received radar signals are utilized to determine distances between stationary radar components and one or more mobile radar components. The radar signals are either transmitted from stationary radar components and received by mobile radar components, or vice versa. The locations (e.g., coordinates) of the stationary radar components are determined based at least in part on the determined distances.

IPC Classes  ?

  • G01S 7/40 - Means for monitoring or calibrating
  • G01S 13/87 - Combinations of radar systems, e.g. primary radar and secondary radar
  • G01S 13/88 - Radar or analogous systems, specially adapted for specific applications

22.

RADAR METROLOGY SYSTEM

      
Application Number 17710607
Status Pending
Filing Date 2022-03-31
First Publication Date 2023-10-05
Owner Mitutoyo Corporation (Japan)
Inventor
  • Hartmann, Nick
  • Cook, Ted Staton

Abstract

A radar metrology system is provided for use with a movement system (e.g., a robot arm) that moves an end tool, and includes mobile and stationary radar configurations. The mobile radar configuration includes mobile radar components that are coupled to the end tool or an end tool mounting configuration. The stationary radar configuration includes stationary radar components (e.g., which define a metrology frame volume that surrounds a movement volume in which the end tool is moved). Distances are determined between stationary radar components and mobile radar components based at least in part on radar signals, wherein the distances indicate (e.g., and may be utilized to determine) a position and orientation (e.g., of the mobile radar configuration and/or end tool). The radar signals are either transmitted from stationary radar components and received by mobile radar components, or transmitted from mobile radar components and received by stationary radar components.

IPC Classes  ?

  • G01S 13/87 - Combinations of radar systems, e.g. primary radar and secondary radar
  • G01S 13/72 - Radar-tracking systems; Analogous systems for two-dimensional tracking, e.g. combination of angle and range tracking, track-while-scan radar
  • G01S 13/88 - Radar or analogous systems, specially adapted for specific applications

23.

MEASUREMENT METHOD OF SURFACE SHAPE AND SURFACE SHAPE MEASUREMENT DEVICE

      
Application Number 18120581
Status Pending
Filing Date 2023-03-13
First Publication Date 2023-09-28
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Mori, Yumiko
  • Kato, Yoshiaki

Abstract

A measurement method of a surface shape includes combining N stacked images captured while scanning the measuring head. For a position in the N stacked images, from an integral curve including values of N points, which is obtained by integrating square values or absolute values of the interference signal including values at N points: a start-point-side noise part straight line that approximates a start-point-side noise part, which corresponds to a range where the slope is smaller than the slope in the vicinity of the measurement target surface at the start-point-side than the measurement target surface; an end-point-side noise part straight line that approximates an end-point-side noise part, which corresponds to a range where the slope is smaller than the slope in the vicinity of the measurement target surface at the end-point-side than the measurement target surface; and a surface proximity straight line that approximates surface proximity part.

IPC Classes  ?

  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01B 11/25 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. moiré fringes, on the object
  • G01B 9/0209 - Low-coherence interferometers
  • G06T 7/521 - Depth or shape recovery from the projection of structured light
  • G06T 7/55 - Depth or shape recovery from multiple images

24.

INSIDE-DIAMETER MEASURING UNIT, FLOATING JOINT MECHANISM UNIT, AND MEASURING UNIT

      
Application Number 18124918
Status Pending
Filing Date 2023-03-22
First Publication Date 2023-09-28
Owner MITUTOYO CORPORATION (Japan)
Inventor Yamaji, Masashi

Abstract

There is provided an inside-diameter measuring unit capable of automating inside-diameter measurement and a control method for automatic inside-diameter measurement. An inside-diameter measuring part is supported by a support frame part via a floating joint part. The floating joint part includes a rotation-allowing mechanism part and a translation-allowing mechanism part. A measuring head part of the inside-diameter measuring part is inserted into a hole by a robot arm part. The inside-diameter measuring part adjusts its position and posture autonomously by the reaction force when a contact point pushes against the inner wall of the hole to align the axis of the inside-diameter measuring part with the axis of the hole. An electric inside-diameter measuring unit can automatically measure the inside diameter of a hole.

IPC Classes  ?

  • G01B 5/12 - Measuring arrangements characterised by the use of mechanical techniques for measuring diameters internal diameters

25.

CONTROL METHOD OF AN AUTOMATIC INSIDE-DIAMETER MEASURING APPARATUS AND AN AUTOMATIC MEASURING APPARATUS

      
Application Number 18124942
Status Pending
Filing Date 2023-03-22
First Publication Date 2023-09-28
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ogawa, Keita
  • Yamaji, Masashi
  • Takatsu, Yuhei
  • Yamamoto, Chihiro

Abstract

There is provided an inside-diameter measuring unit capable of automating inside-diameter measurement and a control method for automatic inside-diameter measurement. An inside-diameter measuring part is supported by a support frame part via a floating joint part. The floating joint part includes a rotation-allowing mechanism part and a translation-allowing mechanism part. A measuring head part of the inside-diameter measuring part is inserted into a hole by a robot arm part. The inside-diameter measuring part adjusts its position and posture autonomously by the reaction force when a contact point pushes against the inner wall of the hole to align the axis of the inside-diameter measuring part with the axis of the hole. An electric inside-diameter measuring unit can automatically measure the inside diameter of a hole.

IPC Classes  ?

26.

SURFACE SHAPE MEASUREMENT DEVICE

      
Application Number JP2023006557
Publication Number 2023/171396
Status In Force
Filing Date 2023-02-22
Publication Date 2023-09-14
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Tanabe Tetsuro
  • Nishio Akira
  • Mawatari Toshiyuki

Abstract

The present invention enables quick and accurate measurement of the surface shape of an object to be measured comprising a so-called rotating body or a substantially rotating body. This surface shape measurement device measures, by an optical cutting method, the three-dimensional shape of a measurement surface of an object to be measured comprising a rotating body or a substantially rotating body. The surface shape measurement device comprises: a rotation table that rotates an object to be measured which has been placed thereon in the circumferential direction; an encoder that sequentially outputs signals according to the rotation angle of the rotation table; an optical cutting sensor that irradiates the measurement surface with a band-shaped or line-shaped light, and that sequentially images, upon being triggered by the output of the signals from the encoder, an optical cutting line which is formed by the band-shaped or line-shaped light and moves on the measurement surface as the rotation table rotates, thereby obtaining a plurality of optical cutting line image data items; and an image processing unit that generates an image showing the surface shape of the measurement surface by sequentially arranging the optical cutting line image data items respectively according to the corresponding rotation angle.

IPC Classes  ?

  • G01B 11/25 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. moiré fringes, on the object

27.

POSITION SPECIFYING METHOD AND PROGRAM

      
Application Number 18299905
Status Pending
Filing Date 2023-04-13
First Publication Date 2023-08-10
Owner Mitutoyo Corporation (Japan)
Inventor
  • Cho, Gyokubu
  • Komatsu, Koichi
  • Ishiyama, Hiraku

Abstract

A method for specifying a position through touch input in a screen displayed on a touch panel display. The position is specified by acquiring an initial contact position with the touch panel display, displaying a position displaying cursor in a position according to the initial contact position, displaying the position displaying cursor in the position according to the initial contact position during the period for which the contact position sensing continues until the distance from the initial contact position to the contact position reaches a predetermined distance and terminating the display of the position displaying cursor where the contact position sensing is terminated before the distance reaches the predetermined distance, and displaying the position displaying cursor in such a way that the position displaying cursor follows movement of the contact position after the distance reaches the predetermined distance.

IPC Classes  ?

  • G06F 3/04812 - Interaction techniques based on cursor appearance or behaviour, e.g. being affected by the presence of displayed objects
  • G06T 7/13 - Edge detection
  • G06F 3/04817 - Interaction techniques based on graphical user interfaces [GUI] based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance using icons
  • G06F 3/04842 - Selection of displayed objects or displayed text elements
  • G06F 3/04883 - Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures for inputting data by handwriting, e.g. gesture or text

28.

MEASUREMENT PROGRAM SELECTION ASSISTING APPARATUS AND MEASUREMENT CONTROL APPARATUS

      
Application Number 18181051
Status Pending
Filing Date 2023-03-09
First Publication Date 2023-07-06
Owner Mitutoyo Corporation (Japan)
Inventor
  • Abe, Shinsaku
  • Nuka, Kuniyuki

Abstract

The present invention provides a measurement program selection assisting apparatus capable of visually confirming whether a selected measurement program is suitable for an object to be measured. One aspect of the present invention is a measurement program selection assisting apparatus comprising: a measurement program database storing a measurement program related to measurement of an object and superimposed display information corresponding to a three-dimensional shape of the object in association with each other; a display unit capable of displaying information defined in a virtual space superimposed on the real space; and a display control unit for acquiring the superimposed display information corresponding to a selected measurement program from the measurement program database and displaying the acquired superimposed display information in a mixed reality on the display unit

IPC Classes  ?

  • G06F 3/04815 - Interaction with a metaphor-based environment or interaction object displayed as three-dimensional, e.g. changing the user viewpoint with respect to the environment or object
  • G05B 19/4069 - Simulating machining process on screen
  • G06T 19/00 - Manipulating 3D models or images for computer graphics
  • G06T 7/00 - Image analysis
  • G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods
  • G06T 7/579 - Depth or shape recovery from multiple images from motion
  • G06F 3/04817 - Interaction techniques based on graphical user interfaces [GUI] based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance using icons
  • G06F 30/20 - Design optimisation, verification or simulation
  • G06V 20/20 - Scenes; Scene-specific elements in augmented reality scenes
  • G06V 20/64 - Three-dimensional objects
  • G06V 40/10 - Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands

29.

METROLOGY SYSTEM WITH POSITION AND ORIENTATION TRACKING UTILIZING LIGHT BEAMS

      
Application Number 17562704
Status Pending
Filing Date 2021-12-27
First Publication Date 2023-06-29
Owner Mitutoyo Corporation (Japan)
Inventor
  • Tobiason, Joseph Daniel
  • Nahum, Michael
  • Laman, Norman
  • Cook, Ted Staton

Abstract

A metrology system is provided for use with a movement system that moves an end tool (e.g., a probe). The metrology system includes a sensor configuration, a light beam source configuration and a processing portion. The sensor configuration comprises a plurality of light beam sensors. The light beam source configuration directs light beams to the light beam sensors of the sensor configuration. One of the light beam source configuration or the sensor configuration is coupled to the end tool and/or an end tool mounting configuration of the movement system which moves the end tool. The light beams that are directed to the light beam sensors cause the light beam sensors to produce corresponding measurement signals. A processing portion processes the measurement signals from the light beam sensors which indicate the position and orientation of the end tool.

IPC Classes  ?

  • G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
  • G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

30.

Modular configuration for coordinate measuring machine probe

      
Application Number 17559554
Grant Number 11733021
Status In Force
Filing Date 2021-12-22
First Publication Date 2023-06-22
Grant Date 2023-08-22
Owner Mitutoyo Corporation (Japan)
Inventor
  • Keehnel, Dawn Alisa
  • Hamner, Christopher Richard
  • Hemmings, Scott Ellis
  • Harsila, Scott Allen

Abstract

A modular configuration for a scanning probe for a coordinate measuring machine include a stylus suspension module, a stylus position detection module, and a signal processing and control circuitry module. The stylus position detection module is configured to be assembled separately from the stylus suspension module before mounting to the stylus suspension module. The signal processing and control circuitry module is configured to be assembled separately from the stylus position detection module and the stylus suspension module before rigidly coupling to the stylus position detection module as part of assembling the scanning probe.

IPC Classes  ?

  • G01B 7/016 - Constructional details of contacts
  • G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
  • G01B 5/016 - Constructional details of contacts

31.

Shielding for sensor configuration and alignment of coordinate measuring machine probe

      
Application Number 17559611
Grant Number 11713956
Status In Force
Filing Date 2021-12-22
First Publication Date 2023-06-22
Grant Date 2023-08-01
Owner Mitutoyo Corporation (Japan)
Inventor
  • Keehnel, Dawn Alisa
  • Hamner, Christopher Richard
  • Hemmings, Scott Ellis
  • Harsila, Scott Allen

Abstract

A scanning probe for a coordinate measurement machine includes a stylus suspension module, a stylus position detection module, a disruptor configuration, and a signal processing and control circuitry module. The stylus position detection module includes a sensor configuration, which comprises various coils, and a shield configuration that is located around the sensor configuration and comprises electrically conductive material for shielding the sensor configuration. The stylus position detection module is mounted to the stylus suspension module utilizing a module mounting configuration, which enables the relative position of the sensor configuration to be adjusted for alignment during the assembly of the scanning probe.

IPC Classes  ?

  • G01B 5/012 - Contact-making feeler heads therefor

32.

MANUFACTURING METHOD OF CONDUCTIVE PATTERN

      
Application Number 18075979
Status Pending
Filing Date 2022-12-06
First Publication Date 2023-06-15
Owner MITUTOYO CORPORATION (Japan)
Inventor Miyake, Kosaku

Abstract

A manufacturing method of a conductor pattern includes, preparing a substrate provided with a conductor on one main surface thereof, forming an outline of the conductor pattern on the conductor with a short-pulse laser, and removing at least a part of the conductor other than the conductor pattern by etching.

IPC Classes  ?

  • B23K 26/0622 - Shaping the laser beam, e.g. by masks or multi-focusing by direct control of the laser beam by shaping pulses
  • B23K 26/364 - Laser etching for making a groove or trench, e.g. for scribing a break initiation groove

33.

Metrology system configured to measure apertures of workpieces

      
Application Number 17538774
Grant Number 11714051
Status In Force
Filing Date 2021-11-30
First Publication Date 2023-06-01
Grant Date 2023-08-01
Owner Mitutoyo Corporation (Japan)
Inventor
  • Gladnick, Paul Gerard
  • Tobiason, Joseph Daniel

Abstract

A metrology system includes front and back vision components portions. The front vision components portion includes a light source, camera, variable focal length (VFL) lens, and objective lens defining an optical axis. The back vision components portion may include a reflective surface and a polarization altering component. A workpiece with apertures is located between the front and back vision components portions. For each aperture of the workpiece, the system adjusts a relative position between the front vision components portion and the workpiece to align its optical axis with each aperture such that light from the light source passes through the aperture and is reflected by the reflective surface of the back vision components portion. The system uses the VFL lens and camera to acquire an image stack including images of the aperture, and analyzes the image stack to determine a measurement related to a workpiece feature of the aperture.

IPC Classes  ?

  • G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
  • G01N 21/88 - Investigating the presence of flaws, defects or contamination

34.

Image measuring device

      
Application Number 29806791
Grant Number D0986075
Status In Force
Filing Date 2021-09-07
First Publication Date 2023-05-16
Grant Date 2023-05-16
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iwamoto, Kenji
  • Kanno, Ryohei
  • Hattori, Atsushi
  • Yasuno, Junsuke
  • Imura, Takaharu

35.

NON-CONTACT PROBE AND PROFILE MEASUREMENT APPARATUS

      
Application Number 17974224
Status Pending
Filing Date 2022-10-26
First Publication Date 2023-05-04
Owner MITUTOYO CORPORATION (Japan)
Inventor Takai, Toshihisa

Abstract

A non-contact probe includes an irradiating part that radiates a laser beam, an irradiating mirror that reflects the laser beam from the irradiating part toward a workpiece, a light-receiving mirror that reflects the reflected light from the workpiece, and a galvano motor capable of swinging both the irradiating mirror and the light-receiving mirror. The irradiating mirror is provided at one axial end of the motor shaft that extends on both ends of the galvano motor, and the light-receiving mirror is provided at the other axial end of the motor shaft.

IPC Classes  ?

  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01S 7/481 - Constructional features, e.g. arrangements of optical elements

36.

THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION GAUGES, THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION METHODS AND THREE-DIMENSIONAL MEASURING APPARATUSES

      
Application Number 17974698
Status Pending
Filing Date 2022-10-27
First Publication Date 2023-05-04
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Inoue, Yuto
  • Nara, Masayuki

Abstract

A three-dimensional-measuring-apparatus inspection gauge includes a plurality of targets to be measured with which a tip of a probe of a three-dimensional measuring apparatus comes into contact; and a frame member that supports the plurality of targets. The plurality of targets are arranged in positions corresponding to each vertex of a triangular prism.

IPC Classes  ?

  • G01B 5/012 - Contact-making feeler heads therefor
  • G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

37.

METHOD OF ESTIMATING UNCERTAINTY OF COORDINATE MEASUREMENT

      
Application Number 17967128
Status Pending
Filing Date 2022-10-17
First Publication Date 2023-04-27
Owner MITUTOYO CORPORATION (Japan)
Inventor Hagino, Takeshi

Abstract

An uncertainty estimation method including: acquiring first variable values, which are a plurality of variable values included in a function indicating a relationship between a measurement dimension and a maximum permissible length measurement error when a predetermined measurement condition value of a coordinate measuring machine is a first value, and second variable values, which are the plurality of variable values occurring when the measurement condition value is a second value; calculating a maximum permissible length measurement error corresponding to a third value by calculating the variable values occurring when the measurement condition value is the third value on the basis of the plurality of first variable values and the plurality of second variable values; and estimating the measurement uncertainty of the coordinate measuring machine on the basis of the calculated maximum permissible length measurement error.

IPC Classes  ?

  • G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

38.

Inspection gauge for coordinate measuring machine

      
Application Number 29783792
Grant Number D0984288
Status In Force
Filing Date 2021-05-14
First Publication Date 2023-04-25
Grant Date 2023-04-25
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Hidaka, Tetsuro
  • Hirata, Kengo
  • Kiyotani, Shingo
  • Kobayashi, Kanae
  • Fukuda, Mitsuru

39.

CHROMATIC RANGE SENSOR SYSTEM WITH SPHERICAL CALIBRATION OBJECT AND METHOD

      
Application Number 17500782
Status Pending
Filing Date 2021-10-13
First Publication Date 2023-04-13
Owner Mitutoyo Corporation (Japan)
Inventor Nagornykh, Pavel Ivanovich

Abstract

A method provides distance calibration data for a chromatic range sensor system with a chromatic range sensor optical pen configured to focus different wavelengths at different distances along a distance measurement axis. The chromatic range sensor optical pen is arranged in a relationship relative to a spherical calibration object that has a nominally spherical calibration surface. Relative movement of the chromatic range sensor optical pen in relation to the nominally spherical calibration surface is controlled so as to perform a spiral scan of a portion of the nominally spherical calibration surface. Distance indicating data is determined as corresponding to the distances between the chromatic range sensor optical pen and surface points on the nominally spherical calibration surface as the spiral scan is performed. Distance calibration data for the chromatic range sensor system is determined based on the distance indicating data.

IPC Classes  ?

  • G01B 11/00 - Measuring arrangements characterised by the use of optical techniques

40.

MULTIPLE-DEGREE-OF-FREEDOM DISPLACEMENT MEASUREMENT DEVICE AND MULTIPLE-DEGREE-OF-FREEDOM DISPLACEMENT MEASUREMENT METHOD

      
Application Number JP2022036519
Publication Number 2023/054613
Status In Force
Filing Date 2022-09-29
Publication Date 2023-04-06
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Kato, Yoshiaki
  • Ono, Kimitoshi
  • Tanaka, Shunsuke

Abstract

This multiple-degree-of-freedom displacement measurement device is provided with: a rotary scale disposed around a first rotation axis, the rotary scale having a scale pattern formed by arranging a plurality of patterns around the circumferential direction; a detection head group including a plurality of detection heads disposed in an installation plane that extends around the first rotation axis and that faces the rotary scale, each of the detection heads reading a pattern from the scale pattern; and a computation unit. On the basis of detection values acquired by the plurality of detection heads, the computation unit calculates a relative rotation angle about the first rotation axis, and calculates, in addition to the relative rotation angle about the first rotation axis, an amount of relative movement in a direction along the first rotation axis, and/or an amount of relative movement in a direction along a second rotation axis orthogonal to the first rotation axis.

IPC Classes  ?

  • G01D 5/12 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature

41.

Image measuring device

      
Application Number 29806866
Grant Number D0981879
Status In Force
Filing Date 2021-09-07
First Publication Date 2023-03-28
Grant Date 2023-03-28
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iwamoto, Kenji
  • Kanno, Ryohei
  • Hattori, Atsushi
  • Yasuno, Junsuke
  • Imura, Takaharu

42.

ANGLE DETECTOR AND POSITION MEASURING DEVICE

      
Application Number 17895267
Status Pending
Filing Date 2022-08-25
First Publication Date 2023-03-16
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Tanaka, Shunsuke
  • Kato, Yoshiaki
  • Mizutani, Miyako

Abstract

An angle detector includes a rotary scale having a scale pattern in which a plurality of patterns are arrayed along a circumference direction of the rotary scale, and a plurality of detection heads, each of which detects the plurality of patterns from the scale pattern. The plurality of detection heads are shifted from each other in the circumference direction of the rotary scale and are shifted from each other in a radial direction of the rotary scale.

IPC Classes  ?

  • G01B 7/30 - Measuring arrangements characterised by the use of electric or magnetic techniques for testing the alignment of axes
  • G01B 11/26 - Measuring arrangements characterised by the use of optical techniques for testing the alignment of axes
  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature

43.

Workpiece inspection and defect detection system utilizing color channels

      
Application Number 17476378
Grant Number 11756186
Status In Force
Filing Date 2021-09-15
First Publication Date 2023-03-16
Grant Date 2023-09-12
Owner Mitutoyo Corporation (Japan)
Inventor Delaney, Mark Lawrence

Abstract

A workpiece inspection and defect detection system includes a light source configuration, a lens configuration, and a camera configuration for imaging workpieces. The system acquires training and run mode workpiece images for acquiring corresponding sets of training and run mode workpiece image data. Each set of image data includes at least first and second color channel workpiece image data corresponding to first and second color channels (e.g., for which ratios between the first and second color channel workpiece image data may be determined as part of synthetic image data to improve the ability of the system to detect defects). The defect detection portion is trained based at least in part on the image data, and is utilized to perform analysis to determine defect images that include workpieces with defects (e.g., for which metrology operations may be performed for measuring dimensions of defects, etc.).

IPC Classes  ?

  • G06T 7/00 - Image analysis
  • H04N 23/74 - Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means

44.

STRATO

      
Application Number 1717561
Status Registered
Filing Date 2023-01-17
Registration Date 2023-01-17
Owner MITUTOYO CORPORATION (Japan)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Measuring apparatus and instruments.

45.

MEASURING TOOL ATTACHMENT COVER

      
Application Number 17903534
Status Pending
Filing Date 2022-09-06
First Publication Date 2023-03-09
Owner MITUTOYO CORPORATION (Japan)
Inventor Aoki, Toshihiko

Abstract

There is provided a measuring tool attachment cover that combines ease of holding and performance (for example, heat insulation). An attachment cover includes a front face layer 110, a rear face layer 120 and an intermediate layer 130. The front face layer 110 and the rear face layer 120 are compact layers with low porosity, and the intermediate layer 130 is a hollow structural layer with higher porosity than the front face layer 110 and the rear face layer 120. The hollow structural layer includes two or more layers with different porosity, and a layer of the two or more layers closer to the front face has higher porosity than a layer closer to the rear face. A direction from the rear face layer 120 to the front face layer 110 is a thickness direction, and a direction orthogonal to the thickness direction is a width direction. The hollow structural layer has elastic modulus distribution in the width direction, and an elastic modulus of a certain area is different from an elastic modulus of an area surrounding the certain area.

IPC Classes  ?

  • G01B 3/20 - Slide gauges
  • G01B 3/00 - Measuring instruments characterised by the use of mechanical techniques

46.

MEASUREMENT SYSTEM, MEASUREMENT METHOD AND NON-TRANSITORY STORAGE MEDIUM

      
Application Number 17893791
Status Pending
Filing Date 2022-08-23
First Publication Date 2023-03-02
Owner MITUTOYO CORPORATION (Japan)
Inventor Mitsutani, Naoki

Abstract

A measurement system includes a multi-axis robot, a measurement unit coupled to the multi-axis robot, and a data processing apparatus, wherein the measurement unit includes one or more imaging devices movable with respect to a reference position of the multi-axis robot, and a position specification device for specifying a position of one or more of the imaging devices with respect to the reference position, wherein the data processing apparatus includes an acquisition part for acquiring a plurality of pieces of captured image data generated by having one or more of the imaging devices capture images at two or more positions, and a measurement part for measuring a distance between the plurality of feature points in a workpiece on the basis of a position of the feature point of the workpiece included in the plurality of pieces of captured image data.

IPC Classes  ?

  • B25J 9/16 - Programme controls
  • B25J 19/02 - Sensing devices
  • G06T 7/60 - Analysis of geometric attributes
  • G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods

47.

HETERODYNE LIGHT SOURCE FOR USE IN METROLOGY SYSTEM

      
Application Number 17460993
Status Pending
Filing Date 2021-08-30
First Publication Date 2023-03-02
Owner Mitutoyo Corporation (Japan)
Inventor Hartmann, Nick

Abstract

A metrology system including a heterodyne light source is provided. The heterodyne light source includes a first light source, an acousto-optic modulator and a source optical arrangement. The acousto-optic modulator receives at least one wavelength laser beam from the first light source and generates at least one corresponding frequency shifted laser beam (e.g., with orthogonal polarization). The source optical arrangement includes a receiving optical element portion and a birefringent optical element portion. The receiving optical element portion receives the wavelength laser beam(s) and the corresponding frequency shifted laser beam(s) and directs the beams along an optical path toward the birefringent optical element portion. The birefringent optical element portion combines the beams to output a combined beam (e.g., which may be utilized as part of a measurement process to determine at least one measurement distance to at least one surface point on a workpiece, etc.).

IPC Classes  ?

48.

POLARIZING FIZEAU INTERFEROMETER

      
Application Number 17878318
Status Pending
Filing Date 2022-08-01
First Publication Date 2023-03-02
Owner Mitutoyo Corporation (Japan)
Inventor Matsuura, Shimpei

Abstract

The invention relates to the field of interferometry, in particular to Fizeau interferometers for improving a contrast of an interferogram. The Fizeau interferometer comprises a light source, a reference surface, a test surface positioned in on a support of the Fizeau interferometer and an imaging system. The Fizeau interferometer utilizes a polarizing reference surface to improve the contrast of the interferogram. The invention further relates to a method for using the Fizeau interferometer of the invention for improving contrast of an interferogram obtained by the Fizeau interferometer.

IPC Classes  ?

  • G01B 9/02056 - Passive reduction of errors
  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

49.

OPTICAL DEVICE

      
Application Number 17896428
Status Pending
Filing Date 2022-08-26
First Publication Date 2023-03-02
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Tanaka, Yuki
  • Motohashi, Ken

Abstract

An optical device provided with an optical parts position adjusting and fixing device for adjusting and fixing the position of the optical parts moving in an optical axis direction, wherein the position adjusting and fixing device is provided with a long slotted hole extended in the optical axis direction formed on a side surface of the optical parts; a fixing means which is mounted on an object to be fixed of the optical parts and which is movable along the long slotted hole; a non-penetrating screw hole formed in the fixing means and which is divided by a slit; and a screw which is screwed into the screw hole and spreads the slit when screwed into the screw hole so as to press the outer surface of the fixing means against the inner surface of the long slotted hole.

IPC Classes  ?

  • G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
  • G02B 17/08 - Catadioptric systems

50.

DIGITAL HOLOGRAPHY METROLOGY SYSTEM

      
Application Number 17461027
Status Pending
Filing Date 2021-08-30
First Publication Date 2023-03-02
Owner Mitutoyo Corporation (Japan)
Inventor Hartmann, Nick

Abstract

A digital holography metrology system is provided including a heterodyne light source, an interferometric optical arrangement and a sensor arrangement. The heterodyne light source provides combined laser beams of different corresponding frequencies and wavelengths (e.g., for which each combined beam may include a corresponding wavelength laser beam and a corresponding frequency shifted laser beam, which may be orthogonally polarized). The interferometric optical arrangement utilizes the combined beams for providing an output for imaging a workpiece, for which the output includes interference beams. The sensor arrangement includes dichroic components which separate the interference beams to be directed to respective time of flight sensors. The outputs from the time of flight sensors are utilized to determine measurements (e.g., the outputs of the time of flight sensors may be utilized to determine a measurement distance to a surface point on a workpiece, etc.).

IPC Classes  ?

  • G01S 7/4865 - Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak
  • G03H 1/06 - Processes or apparatus for producing holograms using incoherent light
  • G02B 27/10 - Beam splitting or combining systems

51.

Encoder

      
Application Number 17407761
Grant Number 11774270
Status In Force
Filing Date 2021-08-20
First Publication Date 2023-02-23
Grant Date 2023-10-03
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Laman, Norman
  • Tobiason, Joseph Daniel
  • Hirata, Shu
  • Mukuta, Tatsuhiko
  • Kimura, Akihide

Abstract

An encoder includes scale and detection head. The detection head includes light source (transmitting unit) and light-receiving unit (receiving unit). The light-receiving unit includes light-receiving surface (receiving surface) and converts light received at the light-receiving surface 50 into differential detection signals with two phases and outputs the same. The light-receiving surface includes element array group including four element arrays provided in a parallel manner along an orthogonal direction, with each element array including a plurality of light-receiving elements (receiving elements). The plurality of element arrays in the element array group are disposed at positions where the sum of: (i) a distance in the orthogonal direction from a reference position to a positive phase signal element array; and (ii) a distance in the orthogonal direction from the reference position to the negative phase signal element array, is the same for all the phases of the at least two phases.

IPC Classes  ?

  • G01D 5/347 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infrared, visible or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
  • G01D 5/244 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means generating pulses or pulse trains
  • G01D 5/241 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by relative movement of capacitor electrodes

52.

ROUNDNESS MEASURING MACHINE

      
Application Number 17872778
Status Pending
Filing Date 2022-07-25
First Publication Date 2023-02-02
Owner MITUTOYO CORPORATION (Japan)
Inventor Yasuno, Junsuke

Abstract

A roundness measuring machine includes: a turntable on which a workpiece is to be placed; a displacement detector detecting a displacement of a stylus; a column provided on a base shared with the turntable; a Z-axis slider supported by the column and movable in a Z-axis direction extending vertically; an X-axis slider supported by the Z-axis slider and movable in an X-axis direction intersecting the Z-axis direction; and an attitude adjusting mechanism provided to the X-axis slider and supporting the displacement detector such that an attitude of the displacement detector is adjustable. The attitude adjusting mechanism includes: a Y-axis slider supported by the X-axis slider and movable in a Y-axis direction intersecting the Z-axis and the X-axis directions; and a detector holder supported by the Y-axis slider and supporting the displacement detector such that the displacement detector is turnable around the X-axis direction.

IPC Classes  ?

  • G01B 5/20 - Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures

53.

CHROMATIC RANGE SENSOR SYSTEM INCLUDING CAMERA

      
Application Number 17389013
Status Pending
Filing Date 2021-07-29
First Publication Date 2023-02-02
Owner Mitutoyo Corporation (Japan)
Inventor Laman, Norman

Abstract

A chromatic range sensor (CRS) system is configured to provide an in-focus image of a workpiece surface including a measurement spot usable as a guide light. The system includes an optical pen having a chromatically dispersive lens configuration providing axial chromatic dispersion, and a reflected light dividing configuration (e.g., a beamsplitter) arranged to receive and divide reflected light from the workpiece surface into a measurement portion and an imaging portion. The optical pen includes a narrowband spectral filter and a camera. The CRS system includes a processing portion configured to measure a distance from the optical pen to the workpiece surface, and to make an adjustment so that the distance corresponds to a focus distance at which the workpiece surface is in focus when imaged by the light that passes through the narrowband spectral filter.

IPC Classes  ?

  • G01B 11/02 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness
  • G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
  • G01S 7/481 - Constructional features, e.g. arrangements of optical elements

54.

Inspection gauge for coordinate measuring apparatus and abnormality determination method

      
Application Number 17864012
Grant Number 11774227
Status In Force
Filing Date 2022-07-13
First Publication Date 2023-01-26
Grant Date 2023-10-03
Owner MITUTOYO CORPORATION (Japan)
Inventor Kiyotani, Shingo

Abstract

The inspection gauge is an inspection gauge for a coordinate measuring apparatus having a triangular pyramid shape, and includes a plurality of support members in which first ends are provided at positions corresponding to vertexes of the triangular pyramid and second ends are connected to each other in a region inside the triangular pyramid, and a plurality of spheres provided at positions corresponding to the vertexes of the triangular pyramid on the plurality of support members, and at least three support members of the plurality of support members have mutually different shapes.

IPC Classes  ?

  • G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
  • G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques

55.

Sensing winding configuration for inductive position encoder

      
Application Number 17364529
Grant Number 11713983
Status In Force
Filing Date 2021-06-30
First Publication Date 2023-01-05
Grant Date 2023-08-01
Owner Mitutoyo Corporation (Japan)
Inventor Cook, Ted Staton

Abstract

An inductive position encoder includes a scale, a detector and a signal processor. The scale includes a periodic pattern of signal modulating elements (SME) arranged along a measuring axis (MA) with a spatial wavelength W1. The detector comprises sensing elements and a field generating coil that generates a changing magnetic flux. The sensing elements comprise conductive loops that provide detector signals responsive to a local effect on the changing magnetic flux provided by adjacent SME's. Some or all of the conductive loops are configured according to an intra-loop shift relationship wherein equal “shifted proportions” of a loop are shifted in opposite directions by W1/4K. K is an odd integer. The intra-loop shift relationship can be used to suppress Kth spatial harmonic components in the detector signals, while also overcoming longstanding detrimental layout problems. It combines easily with “loop width” spatial filtering techniques that filter other spatial harmonic signal components.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
  • G01B 3/20 - Slide gauges
  • G01B 3/18 - Micrometers

56.

OPTICAL SENSOR AND GEOMETRY MEASUREMENT APPARATUS

      
Application Number 17744220
Status Pending
Filing Date 2022-05-13
First Publication Date 2022-12-29
Owner Mitutoyo Corporation (Japan)
Inventor Ono, Kimitoshi

Abstract

An optical sensor includes a radiation part that irradiates an object to be measured with line shaped light; and an imaging part that receives line shaped light reflected by the object to be measured and captures an image of the object to be measured in a predetermined exposure time. The radiation part includes a light generation part that generates the line shaped light, and a light vibration part that irradiates the object to be measured with the line shaped light generated by the light generation part while vibrating the line shaped light in a length direction during the exposure time.

IPC Classes  ?

  • G01B 11/03 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness by measuring coordinates of points
  • G02B 26/10 - Scanning systems

57.

SHAPE RECONSTRUCTION METHOD AND IMAGE MEASUREMENT DEVICE

      
Application Number 17780735
Status Pending
Filing Date 2020-11-26
First Publication Date 2022-12-29
Owner
  • Machine Vision Lighting Inc. (Japan)
  • MITUTOYO CORPORATION (Japan)
Inventor
  • Masumura, Shigeki
  • Takahama, Yasuhiro
  • Miyakura, Jyota
  • Yamagata, Masaoki

Abstract

An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.

IPC Classes  ?

  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01N 21/88 - Investigating the presence of flaws, defects or contamination
  • G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined

58.

Optical sensor and geometry measurement apparatus

      
Application Number 17721858
Grant Number 11965733
Status In Force
Filing Date 2022-04-15
First Publication Date 2022-12-22
Grant Date 2024-04-23
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Watanabe, Takamitsu
  • Nemoto, Kentaro
  • Sugita, Yoshihiko

Abstract

An optical sensor includes a radiation part that irradiates an object to be measured with laser light, an imaging part that receives laser light reflected by the object to be measured and captures an image of the object to be measured, a first driving part that moves the radiation part in a radiation direction of laser light to the object to be measured, and a second driving part that moves the imaging part in a reflection direction of laser light from the object to be measured and an orthogonal direction to the reflection direction.

IPC Classes  ?

  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

59.

Illuminator

      
Application Number 17839091
Grant Number 11924938
Status In Force
Filing Date 2022-06-13
First Publication Date 2022-12-15
Grant Date 2024-03-05
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Yamazaki, Tadashi
  • Konno, Yuto
  • Morita, Hideki
  • Kaneko, Nobuya
  • Hirasawa, Satoru

Abstract

An illuminator includes: a light emitter including a light-emitting diode; a temperature sensor configured to detect a current temperature of the light emitter; and an illumination controller configured to adjust a drive voltage being supplied to the light emitter in accordance with the current temperature. The illumination controller includes a reference temperature storage in which a reference temperature is stored in advance and is configured to adjust the drive voltage by detecting the current temperature from the temperature sensor on a constant time cycle and comparing the current temperature with the reference temperature.

IPC Classes  ?

  • H05B 45/34 - Voltage stabilisation; Maintaining constant voltage
  • H05B 45/18 - Controlling the intensity of the light using temperature feedback
  • H05B 45/56 - Circuit arrangements for operating light-emitting diodes [LED] responsive to LED life; Protective circuits involving measures to prevent abnormal temperature of the LEDs

60.

Probe unit correction method

      
Application Number 17831975
Grant Number 11761759
Status In Force
Filing Date 2022-06-03
First Publication Date 2022-12-08
Grant Date 2023-09-19
Owner MITUTOYO CORPORATION (Japan)
Inventor Kasahara, Kohju

Abstract

There is provided a probe unit correction method for correcting linear expansion of a probe unit to obtain an accurate measurement value. First, a probe offset value is calculated as a model. Then, a probe unit correction method includes a temperature data acquisition step of acquiring a temperature difference between a temperature at a time of calibration and a temperature of a current measurement environment, a reference tip coordinate correction step of calculating, as a reference tip correction coordinate value, a correction value of a reference tip coordinate value to which linear expansion is added, and a probe offset correction step of calculating, as a probe offset correction value, a correction value of a probe offset value to which the linear expansion is added.

IPC Classes  ?

  • G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
  • G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
  • G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques

61.

MICROSCOPE UNIT

      
Application Number 17752278
Status Pending
Filing Date 2022-05-24
First Publication Date 2022-12-01
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Iwamoto, Kenji
  • Fukumoto, Yasushi
  • Honma, Takashi

Abstract

A microscope unit comprises: a main lens barrel of an imaging optical system, the main lens barrel being configured capable of being fitted with an imaging sensor and an objective lens; and an illumination lens barrel of an illumination optical system, the illumination lens barrel being connected to the main lens barrel and configured capable of being fitted with a light source, the illumination lens barrel having: a first lens barrel configured capable of being fitted with the light source; and an intermediate lens barrel connecting the main lens barrel and the first lens barrel, and a field stop of light irradiated from the light source being disposed more inwardly than an outer peripheral surface of the intermediate lens barrel is.

IPC Classes  ?

62.

MICROSCOPE UNIT

      
Application Number 17752304
Status Pending
Filing Date 2022-05-24
First Publication Date 2022-12-01
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Honma, Takashi
  • Fukumoto, Yasushi

Abstract

A microscope unit comprises: a main lens barrel of an imaging optical system; and an illumination lens barrel of an illumination optical system connected to the main lens barrel, the illumination optical system having: a collector lens that collects light that has been irradiated from a light source; a fly-eye lens allowing to be transmitted therethrough light from the collector lens; a first relay lens having lenses that relay light from the fly-eye lens; a field stop that stops down a range of light from the first relay lens; a second relay lens that relays to a beam splitter light from the first relay lens; and the beam splitter guiding at least a part of light incident thereon to the objective lens and allowing to be transmitted therethrough to a side of an imaging sensor at least a part of light incident thereon from the objective lens.

IPC Classes  ?

63.

POSITION DETECTION SYSTEM, POSITION DETECTION METHOD, AND THREE-DIMENSIONAL GEOMETRY MEASUREMENT SYSTEM

      
Application Number 17747034
Status Pending
Filing Date 2022-05-18
First Publication Date 2022-12-01
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Kiire, Tomohiro
  • Hidaka, Kazuhiko

Abstract

A position detection system includes: a plurality of distance detection apparatuses that generate distance data indicating distances to a plurality of positions on the object by detecting light reflected by the object in a predetermined three-dimensional space; an object identification part that identifies the object included in one or more pieces of distance data among a plurality of pieces of the distance data generated by the plurality of distance detection apparatuses; and a position identification part that identifies a position of the object in the three-dimensional space on the basis of (i) a position in the three-dimensional space of the distance detection apparatus that generated the distance data with which the object identification part identified the object and (ii) a position of the object in the distance data.

IPC Classes  ?

  • G06V 20/58 - Recognition of moving objects or obstacles, e.g. vehicles or pedestrians; Recognition of traffic objects, e.g. traffic signs, traffic lights or roads
  • B60W 60/00 - Drive control systems specially adapted for autonomous road vehicles

64.

SURFACE TEXTURE MEASURING MACHINE AND SURFACE TEXTURE JUDGMENT METHOD

      
Application Number 17750939
Status Pending
Filing Date 2022-05-23
First Publication Date 2022-11-24
Owner MITUTOYO CORPORATION (Japan)
Inventor Honda, Hiroomi

Abstract

A surface texture measuring machine includes: a parameter setting unit configured to set one or more parameters related to a surface texture of a workpiece; a measurement unit configured to calculate a measurement value corresponding to each of the parameters on the basis of displacement measurement data obtainable by scanning a surface of the workpiece or a master workpiece; a judgment value calculation unit configured to calculate a judgment value corresponding to each of the parameters with an assumption that the measurement value of the master workpiece is defined as a reference value and a value having a predetermined ratio relative to the reference value is defined as a tolerance; and a judgment unit configured to compare the measurement value of the workpiece and the judgment value for each of the parameters.

IPC Classes  ?

  • G01B 5/28 - Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces

65.

ABNORMALITY DETERMINATION APPARATUS, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION SYSTEM

      
Application Number 17719618
Status Pending
Filing Date 2022-04-13
First Publication Date 2022-11-03
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Terashita, Yo
  • Karasawa, Yuuto
  • Takada, Akira
  • Hashimoto, Shinji
  • Komada, Takuya

Abstract

An abnormality determination apparatus includes a data acquisition part that acquires position data indicating a plurality of positions to be measured of a standard gage used in a coordinate measuring apparatus, in association with apparatus identification information for identifying the coordinate measuring apparatus, a generation part that generates distance data indicating a distance to be measured that is a distance between the plurality of positions to be measured indicated by the position data, a storage that stores an appropriate range in which the distance data is determined to be appropriate, and a determination part that determines whether there is an abnormality in the coordinate measuring apparatus on the basis of whether or not the distance to be measured indicated by the distance data is included in the appropriate range, and outputs a determination result in association with the apparatus identification information.

IPC Classes  ?

  • G01B 5/00 - Measuring arrangements characterised by the use of mechanical techniques
  • G01B 5/012 - Contact-making feeler heads therefor

66.

Workpiece holder for utilization in metrology system for measuring workpiece in different orientations

      
Application Number 17246531
Grant Number 11635291
Status In Force
Filing Date 2021-04-30
First Publication Date 2022-11-03
Grant Date 2023-04-25
Owner Mitutoyo Corporation (Japan)
Inventor
  • Harsila, Scott Allen
  • Perkins, Maxwell James

Abstract

A workpiece holder is configured to hold a workpiece and is utilized in a metrology system which includes a sensing configuration for obtaining 3-dimensional surface data for the workpiece. The workpiece holder includes at least three reference features (e.g., spherical reference features extending from sides) that are configured to be sensed by the sensing configuration when the workpiece holder is in different orientations (e.g., as rotated 180 degrees between first and second orientations for presenting front and back sides of the workpiece towards the sensing configuration). A determination of 3-dimensional positions of the reference features for each orientation enables a combining (e.g., in a common coordinate system) of 3-dimensional surface data that is acquired for the workpiece in each orientation. Interchangeable workpiece holding portions may be provided that fit within the workpiece holder for holding workpieces with different characteristics (e.g., having different sizes and/or shapes).

IPC Classes  ?

  • G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
  • G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
  • G01M 11/02 - Testing optical properties

67.

TEST INDICATOR

      
Application Number 17660219
Status Pending
Filing Date 2022-04-22
First Publication Date 2022-10-27
Owner MITUTOYO CORPORATION (Japan)
Inventor Terautchi, Tatsushi

Abstract

There is provided a test indicator 100 capable of replacing a stylus 210 with another stylus 210 having a different length to increase a reaching range of the stylus 210, and of increasing a rotation angle of the stylus 210 to display an accurate measurement value in a wide measurement range. There is provided a test indicator 100 capable of replacing a stylus 210 with another stylus 210 having a different length to increase a reaching range of the stylus 210, and of increasing a rotation angle of the stylus 210 to display an accurate measurement value in a wide measurement range. A calculation unit 400 of the test indicator 100 includes a stylus-length storage unit 420 that sets and stores a length of the stylus 210, and a stylus-length correction calculation unit 400 that changes, according to the length of the stylus 210, a conversion ratio for converting a detection value by an encoder 340 into a measurement value to correct the measurement value. The calculation unit 400 further includes a rotation-angle calculation unit 410 that calculates a rotation angle αs[rad] of the stylus 210 based on the detection value by the encoder 340 and an arc-chord error correction calculation unit 400 that multiplies a sine value using the rotation angle αs calculated by the rotation-angle calculation unit 410 as an argument to correct the measurement value.

IPC Classes  ?

  • G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
  • G01B 3/00 - Measuring instruments characterised by the use of mechanical techniques
  • G06F 3/0354 - Pointing devices displaced or positioned by the user; Accessories therefor with detection of 2D relative movements between the device, or an operating part thereof, and a plane or surface, e.g. 2D mice, trackballs, pens or pucks

68.

Calibration method

      
Application Number 17693845
Grant Number 11656074
Status In Force
Filing Date 2022-03-14
First Publication Date 2022-10-20
Grant Date 2023-05-23
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Inoue, Yuto
  • Nara, Masayuki

Abstract

A calibration method includes: measuring, with a CMM, a ball-to-ball distance of a plurality of edges of an inspection gauge installed in a first posture, a second posture and a third posture, and calculating a calibration value calibrating a ball-to-ball distance between two balls at respective ends of a plurality of edges of the inspection gauge by solving simultaneous equations including the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the first posture, the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the second posture, the ball-to-ball distance of the plurality of edges of the inspection gauge installed in the third posture, and a measurement error of the CMM at the measurement position.

IPC Classes  ?

  • G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
  • G01B 5/008 - Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines

69.

Housing unit

      
Application Number 17721842
Grant Number 11781935
Status In Force
Filing Date 2022-04-15
First Publication Date 2022-10-20
Grant Date 2023-10-10
Owner Mitutoyo Corporation (Japan)
Inventor Hayashi, Hiroyuki

Abstract

There is provided a housing unit having an immersion detection function, as a housing of an electronic device requiring waterproofing. A housing unit includes a casing liquid-tightly defining an internal housing space and housing an internal device in the housing space, and an immersion detector that detects whether liquid leak into the housing space of the casing. The casing includes a sealing means for waterproofing a joint, an entryway, or an opening. The immersion detector includes an electrolyte salt and a continuity detector that detects a change in conductivity when the liquid comes into contact with the electrolyte salt. The electrolyte salt is arranged inside the casing and further inside the casing than the sealing means.

IPC Classes  ?

  • G01M 3/16 - Investigating fluid tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using electric detection means
  • G01B 21/22 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for testing the alignment of axes

70.

Measurement control apparatus, measurement system and program

      
Application Number 17711672
Grant Number 11823006
Status In Force
Filing Date 2022-04-01
First Publication Date 2022-10-06
Grant Date 2023-11-21
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ishioka, Takayuki
  • Fujioka, Kenta

Abstract

Facilitate the work of setting the part program used in the measuring device for each object to be measured. A measurement control apparatus of the present invention includes a code reader that reads a code containing at least a part program identification information, and a measurement information providing unit that, when the code is read by the code reader, sends a start command of a part program corresponding to the part program identification information recorded in the code to a measuring device, and causes the measuring device to execute processing according to the part program prepared in advance.

IPC Classes  ?

  • G06K 7/14 - Methods or arrangements for sensing record carriers by corpuscular radiation using light without selection of wavelength, e.g. sensing reflected white light
  • G01D 21/00 - Measuring or testing not otherwise provided for
  • G06F 3/0484 - Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range

71.

FRONT-END CIRCUIT AND ENCODER

      
Application Number 17698417
Status Pending
Filing Date 2022-03-18
First Publication Date 2022-09-29
Owner Mitutoyo Corporation (Japan)
Inventor
  • Hirata, Shu
  • Tahara, Tomohiro
  • Kawai, Akio
  • Mugikura, Shun

Abstract

A preamplifier amplifies signals input to first and second input terminals. A first switching circuit receives first and second input signals and outputs those to the first and second input terminals. A switched capacitor circuit samples two signals amplified by the preamplifier. Differential signals sampled by the switched capacitor circuit are respectively input to third and fourth input terminals of an integration circuit, and the integration circuit outputs differential signals obtained by those input signals to first and second output terminals. A second switching circuit switches a connection relationship between the switched capacitor circuit and the integration circuit. Each time the cycle changes, the first and second switching circuits switch the connection relationships to cause the signals amplified by the preamplifier to be sampled by double correlation sampling.

IPC Classes  ?

72.

FRONT-END CIRCUIT AND ENCODER

      
Application Number 17698406
Status Pending
Filing Date 2022-03-18
First Publication Date 2022-09-29
Owner Mitutoyo Corporation (Japan)
Inventor
  • Hirata, Shu
  • Tahara, Tomohiro
  • Kawai, Akio
  • Mugikura, Shun

Abstract

A preamplifier amplifies signals input to first and second input terminals. A first switching circuit receives first and second input signals and respectively outputs those signals to the first and second input terminals. A switched capacitor circuit samples two signals amplified by the preamplifier. An integration circuit includes a fully differential operational amplifier outputting amplifying differential signals input between third and fourth input terminals between second and first output terminals, and first and second integration capacitors. A second switching circuit switches a connection relationship between the switched capacitor circuit, and the first and second integration capacitors. A third switching circuit switches a connection relationship between the first and second integration capacitors, and third and fourth output terminals. A cycle including sampling and signal integration is performed twice, and the first to third switching circuits switch the connection relationships each time the cycle changes.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
  • H03F 3/45 - Differential amplifiers
  • H03K 17/51 - Electronic switching or gating, i.e. not by contact-making and -breaking characterised by the use of specified components
  • H04B 1/04 - Circuits

73.

COORDINATE MEASURING APPARATUS

      
Application Number 17687271
Status Pending
Filing Date 2022-03-04
First Publication Date 2022-09-15
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ichimura, Tsutomu
  • Hidaka, Kazuhiko
  • Yamagata, Masaoki

Abstract

A coordinate measuring apparatus includes a measuring part that measures a workpiece, three or more access points that are provided at positions away from the measuring part and perform wireless communication with the measuring part using radio waves, a laser tracker that irradiates a reflection part provided in each access point with a laser beam and receives the laser beam reflected by the reflection part, and a control part that obtains a first coordinate of the each access point by the laser tracker receiving the laser beam reflected by the reflection part, obtains a second coordinate of the measuring part on the basis of the wireless communication between the access point and the measuring part, causes the measuring part to measure a third coordinate of the workpiece, and obtains a spatial coordinate of the workpiece on the basis of the first coordinate, the second coordinate, and the third coordinate.

IPC Classes  ?

  • G01B 11/00 - Measuring arrangements characterised by the use of optical techniques
  • G01S 17/42 - Simultaneous measurement of distance and other coordinates

74.

Resistor

      
Application Number 29737944
Grant Number D0962869
Status In Force
Filing Date 2020-06-12
First Publication Date 2022-09-06
Grant Date 2022-09-06
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ohtani, Shigeru
  • Yonezawa, Takayuki
  • Arai, Rie
  • Osaki, Motohiro

75.

Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method

      
Application Number 17740763
Grant Number 11636614
Status In Force
Filing Date 2022-05-10
First Publication Date 2022-08-25
Grant Date 2023-04-25
Owner MITUTOYO CORPORATION (Japan)
Inventor Miyata, Kaoru

Abstract

A three-dimensional geometry measurement apparatus including: a relationship identification part that identifies a combination of a first imaging pixel and a projection pixel of a projection image; a determination part that determines, for the combination of the first imaging pixel and the projection pixel, whether or not the combination includes a defective pixel on the basis of a distance between (i) a second imaging pixel corresponding to the same projection coordinate as a projection coordinate corresponding to the first imaging pixel and (ii) a second imaging pixel corresponding to the projection coordinate of the projection pixel and located on an epipolar line of a second captured image corresponding to the projection coordinate; and a geometry measurement part that measures a geometry of an object to be measured using at least one of the first imaging pixel excluding the defective pixel or the second imaging pixel excluding the defective pixel.

IPC Classes  ?

  • G06T 7/521 - Depth or shape recovery from the projection of structured light
  • G06T 7/60 - Analysis of geometric attributes
  • G06T 7/593 - Depth or shape recovery from multiple images from stereo images

76.

Scale and manufacturing method of the same

      
Application Number 17668055
Grant Number 11747173
Status In Force
Filing Date 2022-02-09
First Publication Date 2022-08-25
Grant Date 2023-09-05
Owner MITUTOYO CORPORATION (Japan)
Inventor Aoki, Toshihiko

Abstract

A scale includes a base material, an intermediate layer of soft magnetic material formed on one surface of the base material and roughened on face thereof opposite to the base material, and a scale pattern of a conductor formed on the intermediate layer.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature

77.

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

      
Application Number 17674111
Status Pending
Filing Date 2022-02-17
First Publication Date 2022-08-25
Owner Mitutoyo Corporation (Japan)
Inventor Ujihara, Hiroki

Abstract

A measurement apparatus including a laser apparatus that outputs a frequency-modulated laser beam with a plurality of modes of a main lobe, branch that splits the frequency-modulated laser beam into a reference light, a measurement light, and a monitor light, beat signal generator that generates a beat signal by mixing the reference light and a reflected light that is reflected by radiating the measurement light onto an object to be measured, extraction circuitry that extracts a signal component including a plurality of self-beat signals based on the main lobe from the monitor light, identification circuitry that identifies a cavity frequency of the optical cavity on the basis of the signal component, and calculation circuitry that calculates a difference between propagation distances between the reference light and the measurement light on the basis of the cavity frequency and the beat signal.

IPC Classes  ?

  • G01S 17/34 - Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated using transmission of continuous, frequency-modulated waves while heterodyning the received signal, or a signal derived therefrom, with a locally-generated signal related to the contemporaneously transmitted signal
  • G01S 7/48 - RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES - Details of systems according to groups , , of systems according to group

78.

DISPLACEMENT MEASURING APPARATUS

      
Application Number 17589019
Status Pending
Filing Date 2022-01-31
First Publication Date 2022-08-11
Owner MITUTOYO CORPORATION (Japan)
Inventor Yamamuro, Masataka

Abstract

There is provided a displacement measuring apparatus capable of being used in a vacuum environment. The displacement measuring apparatus includes a scale and a detection head part disposed in such a manner as to be relatively displaceable to the scale and as to face the scale with a predetermined gap. The detection head part detects a displacement or position relative to the scale. The scale is disposed in a vacuum. The detection head part is housed in a housing holder separating an atmospheric environment side from a vacuum environment side. In a gap between the detection head part and the scale, the housing holder includes a relay means for passing a detection signal between the detection head part and the scale,

IPC Classes  ?

  • G01D 11/24 - Housings
  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
  • G01D 5/347 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infrared, visible or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
  • G01D 5/24 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance

79.

IMAGE DETECTION DEVICE AND IMAGE DETECTION METHOD

      
Application Number 17569256
Status Pending
Filing Date 2022-01-05
First Publication Date 2022-07-21
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Sha, Aimin
  • Igasaki, Shiro

Abstract

An image detection device includes an image detection optical system including a liquid resonant lens; an image detector configured to detect an image corresponding to a detection phase of a drive signal through the image detection optical system; a range determination unit configured to determine a first half or a second half of a cycle of the drive signal as a designated allowable range of the detection phase based on whether a phase delay shown by a variation waveform of a focus position is positive or negative; a detection phase setting unit configured to set the detection phase in the designated allowable range; and a detection control unit configured to control an image-detection timing by the image detector to a timing offset from the detection phase by an angle corresponding to the phase delay.

IPC Classes  ?

  • G02B 3/14 - Fluid-filled or evacuated lenses of variable focal length

80.

Optical measurement head for coordinate measurement

      
Application Number 29751499
Grant Number D0957960
Status In Force
Filing Date 2020-09-22
First Publication Date 2022-07-19
Grant Date 2022-07-19
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Nemoto, Kentaro
  • Sugita, Yoshihiko
  • Sugai, Yu
  • Odake, Jun

81.

Optical measurement head for coordinate measurement

      
Application Number 29769336
Grant Number D0957961
Status In Force
Filing Date 2021-02-04
First Publication Date 2022-07-19
Grant Date 2022-07-19
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Nemoto, Kentaro
  • Sugita, Yoshihiko
  • Odake, Jun
  • Shimizu, Aoi

82.

Position specifying method and program

      
Application Number 17705936
Grant Number 11656733
Status In Force
Filing Date 2022-03-28
First Publication Date 2022-07-14
Grant Date 2023-05-23
Owner Mitutoyo Corporation (Japan)
Inventor
  • Cho, Gyokubu
  • Komatsu, Koichi
  • Ishiyama, Hiraku

Abstract

The present invention relates to a position specifying method for specifying a position through touch input in a screen displayed on a touch panel display. The position is specified by the steps of acquiring an initial contact position that is a contact position at the start of sensing of a position where contact is made with the touch panel display, displaying a position displaying cursor in a position according to the initial contact position, displaying the position displaying cursor in the position according to the initial contact position during the period for which the contact position sensing continues until the distance from the initial contact position to the contact position reaches a predetermined distance and terminating the display of the position displaying cursor with no position specifying operation performed in a case where the contact position sensing is terminated before the distance from the initial contact position to the contact position reaches the predetermined distance, and displaying the position displaying cursor in such a way that the position displaying cursor follows movement of the contact position after the distance from the initial contact position to the contact position reaches the predetermined distance so that the relative positional relationship between the position displaying cursor and the contact position at the point of time when the distance from the initial contact position to the contact position reaches the predetermined distance is maintained during the period for which the contact position sensing continues and setting, when position-specifying-operation finalizing operation is sensed after the distance from the initial contact position to the contact position reaches the predetermined distance, the position where the position displaying cursor is displayed when the position-specifying-operation finalizing operation is sensed to be a specified position.

IPC Classes  ?

  • G06F 3/048 - Interaction techniques based on graphical user interfaces [GUI]
  • G06F 3/04812 - Interaction techniques based on cursor appearance or behaviour, e.g. being affected by the presence of displayed objects
  • G06T 7/13 - Edge detection
  • G06F 3/04817 - Interaction techniques based on graphical user interfaces [GUI] based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance using icons
  • G06F 3/04842 - Selection of displayed objects or displayed text elements
  • G06F 3/04883 - Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures for inputting data by handwriting, e.g. gesture or text

83.

SENSING WINDING CONFIGURATION FOR INDUCTIVE POSITION ENCODER

      
Application Number 17364573
Status Pending
Filing Date 2021-06-30
First Publication Date 2022-06-30
Owner Mitutoyo Corporation (Japan)
Inventor Cook, Ted Staton

Abstract

An inductive position encoder includes a scale, detector, and signal processor. The scale includes a periodic pattern of signal modulating elements (SME) arranged along a measuring axis (MA) with spatial wavelength W1. The detector comprises sensing elements and a field generating coil that generates changing magnetic flux. The sensing elements comprise conductive loops that provide detector signals responsive to a local effect on the magnetic flux provided by adjacent SME's. The conductive loops have an average MA dimension that spatially filters a 3rd spatial harmonic signal component and are located along the MA according to an “inter-loop” shift relationship wherein first and second equal numbers of positive and negative polarity loops, are shifted in opposite directions by W1/4K (K=3, 5, 7, 9). Third and Kth spatial harmonic components are both reduced in the detector signals while using a novel “layout friendly” loop arrangement to solve longstanding detrimental layout problems.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature

84.

Inductive position sensor signal gain control for coordinate measuring machine probe

      
Application Number 17139592
Grant Number 11644299
Status In Force
Filing Date 2020-12-31
First Publication Date 2022-06-30
Grant Date 2023-05-09
Owner Mitutoyo Corporation (Japan)
Inventor
  • Hamner, Christopher Richard
  • Harsila, Scott Allen
  • Hemmings, Scott Ellis
  • Patzwald, Andrew Michael

Abstract

A scanning probe for a coordinate measuring machine with inductive position sensor signal gain control is provided. The scanning probe includes a stylus position detection portion with field generating and sensing coils, and for which corresponding output signals are indicative of a position of the probe tip of the stylus. Signal processing and control circuitry is configured to implement different operating regions, such as a central high gain operating region which corresponds to a central probe tip position range, as well as other lower gain operating regions, and for which transition operations may be performed for adjusting the gain. In various implementations, transition operations for adjusting a gain may include operations such as: adjusting power to a field generating coil configuration; adjusting a gain of a front end amplifier; altering characteristics of sensing coils; adjusting an input range of an analog to digital converter, etc.

IPC Classes  ?

  • G01B 7/012 - Contact-making feeler heads therefor
  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature

85.

SENSING WINDING CONFIGURATION FOR INDUCTIVE POSITION ENCODER

      
Application Number 17139596
Status Pending
Filing Date 2020-12-31
First Publication Date 2022-06-30
Owner Mitutoyo Corporation (Japan)
Inventor Cook, Ted Staton

Abstract

An inductive type position encoder includes a scale, a detector portion and a signal processor. The scale includes a periodic pattern of signal modulating elements (SME) arranged along a measuring axis with a spatial wavelength W1. The SME in the pattern comprise similar conductive plates or loops. The detector portion comprises sensing elements and a field generating coil that generates a changing magnetic flux. The sensing elements may comprise conductive loop portions arranged along the measuring axis and configured to provide detector signals which respond to a local effect on the changing magnetic flux provided by adjacent SME's. In various implementations, SMEs having an average dimension DSME along the measuring axis direction that is at least 0.55*W1 and at most 0.8*W1 are combined with sensing elements having an average dimension along the measuring axis direction that is at least 0.285*W1 and at most 0.315*W1, which improves detector signal accuracy.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
  • G01B 7/02 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width, or thickness
  • G01B 3/00 - Measuring instruments characterised by the use of mechanical techniques
  • G01B 3/20 - Slide gauges

86.

Chromatic range sensor system for measuring workpiece thickness

      
Application Number 17126191
Grant Number 11486694
Status In Force
Filing Date 2020-12-18
First Publication Date 2022-06-23
Grant Date 2022-11-01
Owner Mitutoyo Corporation (Japan)
Inventor Laman, Norman

Abstract

A chromatic range sensor (CRS) system is provided that determines a workpiece thickness and includes an optical pen, an illumination source, a wavelength detector and a processing portion. The optical pen includes an optics portion providing axial chromatic dispersion, the illumination source is configured to generate multi-wavelength light and the wavelength detector includes a plurality of pixels distributed along a measurement axis. In operation, the optical pen inputs a spectral profile from the illumination source and outputs corresponding radiation to first and second workpiece surfaces of a workpiece (e.g., which may be transparent) and outputs reflected radiation to the wavelength detector which provides output spectral profile data. The processing portion processes the output spectral profile data to determine a thickness of the workpiece. In various implementations, the processing to determine the thickness may not rely on determining a distance to the workpiece and/or may utilize transform processing, etc.

IPC Classes  ?

  • G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
  • G02B 21/00 - Microscopes

87.

Display plate for measurement

      
Application Number 29715780
Grant Number D0954578
Status In Force
Filing Date 2019-12-04
First Publication Date 2022-06-14
Grant Date 2022-06-14
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Hayashi, Nobuyuki
  • Kiwada, Takefumi
  • Ohtani, Shigeru

88.

MEASUREMENT SYSTEM AND PROGRAM

      
Application Number 17522132
Status Pending
Filing Date 2021-11-09
First Publication Date 2022-06-09
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Asamizu, Takanori
  • Shimizu, Masaaki

Abstract

A measurement system includes: measurement target information database that stores measurement point information, including measurement conditions and guidance information for each measurement point, associated with the type of the measurement target; a measuring instrument that performs measurements on the measurement target; an image capturing unit that captures an image of a subject; a display unit; a measurement target identification unit that identifies the type of the measurement target based on the image captured by the image capturing unit; a measurement target information obtaining unit for obtaining the measurement point information corresponding to the type of the measurement target identified by the measurement target identification unit from the measurement target information database; and a setting unit that displays the guidance information included in the measurement point information obtained by the measurement target information obtaining unit on the display unit and sets the measurement conditions on the measuring instrument.

IPC Classes  ?

  • G06K 9/00 - Methods or arrangements for reading or recognising printed or written characters or for recognising patterns, e.g. fingerprints
  • G06F 16/22 - Indexing; Data structures therefor; Storage structures

89.

Photoelectric rotary encoder

      
Application Number 17529476
Grant Number 11506518
Status In Force
Filing Date 2021-11-18
First Publication Date 2022-06-02
Grant Date 2022-11-22
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Kato, Yoshiaki
  • Mizutani, Miyako

Abstract

The photoelectric rotary encoder includes: a generally disk-shaped scale with a grating-like pattern formed with a predetermined period along a measurement direction, the measurement direction being a direction of rotation of a measurement target that rotates on a predetermined axis, the scale being plate-like and centered on an axis of rotation; and a head that detect, from the scale, the amount of displacement caused by the rotation of the measurement target. The head includes a light source, a diffraction unit with grating parts, and a light-receiving unit with light-receiving elements. The grating parts of the diffraction unit are formed as deformed grating parts that spread cut wide, from the center on the axis of rotation, along the grating-like pattern of the scale. The light-receiving elements are formed as linear grating parts.

IPC Classes  ?

  • G01D 5/34 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infrared, visible or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
  • G01D 5/347 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infrared, visible or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales

90.

Surface reference detecting mechanism and hardness tester

      
Application Number 17530957
Grant Number 11719610
Status In Force
Filing Date 2021-11-19
First Publication Date 2022-06-02
Grant Date 2023-08-08
Owner MITUTOYO CORPORATION (Japan)
Inventor Kawakubo, Yu

Abstract

An indenter reference that is brought into contact with an axial second side surface of a sample which is arranged further toward an axial first side than an indenter, the indenter reference serving as a position reference for the indenter; a holder that detachably holds the indenter reference and is coupled with the indenter reference; an indenter position detector that couples with the holder and detects a relative position of the indenter with respect to the indenter reference; a regulator that allows displacement between a first position that regulates movement of the indenter reference with respect to the holder and a second position where the indenter reference can be removed from the holder; and a biasing portion that biases the regulator to be kept at the first position.

IPC Classes  ?

  • G01N 3/42 - Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid

91.

Displacement sensor and profile measurement apparatus

      
Application Number 17518954
Grant Number 11686570
Status In Force
Filing Date 2021-11-04
First Publication Date 2022-05-26
Grant Date 2023-06-27
Owner MITUTOYO CORPORATION (Japan)
Inventor Kimura, Akihide

Abstract

A displacement sensor includes a radiation part that irradiates a workpiece displaceable in a predetermined displacement direction with light, a light receiving part that receives a reflected light generated when the light radiated by the radiation part is reflected on the workpiece, and a fringe generation part that includes a generation means for generating fringes on a light receiving surface of the light receiving part when the light receiving part receives the reflected light from the workpiece. The fringe generation part and the light receiving part are arranged such that the fringe generation part and the light receiving part are parallel to the displacement direction, or parallel to a virtual image of the displacement direction.

IPC Classes  ?

  • G01B 11/02 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness
  • G01B 9/02 - Interferometers
  • G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

92.

MEASUREMENT APPARATUS, CONTROL APPARATUS, AND CONTROL METHOD

      
Application Number 17517903
Status Pending
Filing Date 2021-11-03
First Publication Date 2022-05-19
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Hidaka, Kazuhiko
  • Kiire, Tomohiro
  • Mishima, Hideki
  • Miyazaki, Tomoyuki
  • Mitsutani, Naoki
  • Shirakawa, Yoshinori
  • Ichimura, Tsutomu

Abstract

A measurement apparatus includes a sensor that measures a workpiece, a multi-axis robot that moves the sensor in a three-dimensional space, a position determination part that determines i) a plurality of measurement positions that are positions along a normal direction at each of a plurality of positions to be measured on the workpiece and ii) a direction of the sensor at each of the plurality of measurement positions on the basis of at least either design data or captured image data indicating the geometry of the workpiece, a moving control part that sequentially moves the sensor to the plurality of measurement positions by controlling the robot, and a measurement control part that outputs measured data indicating a result that the sensor measured at each of the plurality of measurement positions in association with the plurality of positions to be measured.

IPC Classes  ?

  • G01B 21/16 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring distance or clearance between spaced objects
  • G06T 7/579 - Depth or shape recovery from multiple images from motion

93.

FIXING DEVICE

      
Application Number 17525633
Status Pending
Filing Date 2021-11-12
First Publication Date 2022-05-19
Owner Mitutoyo Corporation (Japan)
Inventor Sano, Hidekazu

Abstract

To provide a fixing device improved in fixation of an annular member to a cylindrical member. The fixing device for fixing the annular member to the cylindrical member that includes a first fixing portion and a second fixing portion. The first fixing portion includes an annular portion and an adjustment portion. The annular portion covers an outer peripheral surface of the cylindrical member from outward in a radial direction. A circumferential length of the annular portion is adjustable with the adjustment portion. The second fixing portion is fixed to the first fixing portion and fixed to the annular member.

IPC Classes  ?

94.

Form measuring instrument and method of detecting abnormality

      
Application Number 17508106
Grant Number 11555683
Status In Force
Filing Date 2021-10-22
First Publication Date 2022-05-12
Grant Date 2023-01-17
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Yoshitani, Satoshi
  • Miyazaki, Tomoyuki

Abstract

A form measuring instrument includes: a contact tip configured to contact with a workpiece; a movement mechanism configured to cause relative movement of the contact tip with respect to the workpiece; a movement controlling unit configured to control the movement mechanism; a contact sensor configured to detect a contact amount of the contact tip with the workpiece and output a detection signal corresponding to the contact amount; and an abnormality determining unit configured to determine an abnormality of sensitivity of the contact sensor based on a change in the detection signal outputted from the contact sensor during an operation of the movement mechanism in which the contact tip is pressed against the workpiece.

IPC Classes  ?

  • G01B 5/012 - Contact-making feeler heads therefor
  • G01B 5/20 - Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures

95.

Metrology system with projected pattern for points-from-focus type processes

      
Application Number 17085700
Grant Number 11587246
Status In Force
Filing Date 2020-10-30
First Publication Date 2022-05-05
Grant Date 2023-02-21
Owner Mitutoyo Corporation (Japan)
Inventor
  • Campbell, Shannon Roy
  • Redlarski, Lukasz

Abstract

A metrology system is provided including a projected pattern for points-from-focus type processes. The metrology system includes an objective lens portion, a light source, a pattern projection portion and a camera. Different lenses (e.g., objective lenses) having different magnifications and cutoff frequencies may be utilized in the system. The pattern projection portion includes a pattern component with a pattern. At least a majority of the area of the pattern includes pattern portions that are not recurring at regular intervals across the pattern (e.g., as corresponding to a diverse spectrum of spatial frequencies that result in a relatively flat power spectrum over a desired range and with which different lenses with different cutoff frequencies may be utilized). The pattern is projected on a workpiece surface (e.g., for producing contrast) and an image stack is acquired, from which focus curve data is determined that indicates 3 dimensional positions of workpiece surface points.

IPC Classes  ?

  • G06T 7/571 - Depth or shape recovery from multiple images from focus
  • H04N 5/225 - Television cameras
  • G06T 7/521 - Depth or shape recovery from the projection of structured light
  • H04N 5/232 - Devices for controlling television cameras, e.g. remote control
  • G01B 11/25 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. moiré fringes, on the object
  • G02B 21/02 - Objectives

96.

Data output interface

      
Application Number 29737880
Grant Number D0949852
Status In Force
Filing Date 2020-06-12
First Publication Date 2022-04-26
Grant Date 2022-04-26
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ohtani, Shigeru
  • Yonezawa, Takayuki
  • Arai, Rie
  • Osaki, Motohiro

97.

Data output interface

      
Application Number 29737906
Grant Number D0949853
Status In Force
Filing Date 2020-06-12
First Publication Date 2022-04-26
Grant Date 2022-04-26
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ohtani, Shigeru
  • Yonezawa, Takayuki
  • Arai, Rie
  • Osaki, Motohiro

98.

Data reader

      
Application Number 29737873
Grant Number D0949851
Status In Force
Filing Date 2020-06-12
First Publication Date 2022-04-26
Grant Date 2022-04-26
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Ohtani, Shigeru
  • Yonezawa, Takayuki
  • Arai, Rie
  • Osaki, Motohiro

99.

Panel module unit

      
Application Number 17451023
Grant Number 11690186
Status In Force
Filing Date 2021-10-15
First Publication Date 2022-04-21
Grant Date 2023-06-27
Owner MITUTOYO CORPORATION (Japan)
Inventor
  • Takatsu, Yuhei
  • Niwano, Atsuya

Abstract

There is provided a display panel module unit having a narrow frame suitable for a display unit of a small-sized measuring apparatus. A panel module unit includes a first panel part, a second panel part, and an intermediate cover housed in a housing part in order from a front side to a rear side. The housing part includes an annular side wall and at least one fixing means attached on an inner peripheral surface of the side wall, and the fixing means is a means for fixing a position of the intermediate cover in the housing part. The second panel part is housed between the first panel part and the intermediate cover, and a position of the second panel part is indirectly fixed by the intermediate cover. The second panel part is provided with a biasing means for biasing the first panel part from the rear side toward the front side.

IPC Classes  ?

  • H05K 5/02 - Casings, cabinets or drawers for electric apparatus - Details
  • H05K 5/00 - Casings, cabinets or drawers for electric apparatus

100.

Electromagnetic inductive encoder

      
Application Number 17496350
Grant Number 11486735
Status In Force
Filing Date 2021-10-07
First Publication Date 2022-04-14
Grant Date 2022-11-01
Owner MITUTOYO CORPORATION (Japan)
Inventor Mizutani, Miyako

Abstract

An electromagnetic inductive encoder that can suppress the effect of changes in magnetic flux received by the receiver section and maintain the accuracy of measurement results is provided. The electromagnetic inductive encoder 1 includes a scale 2 and a head 3 that is provided to face the scale 2 and moves relative to the scale 2. The head 3 includes a transmitter section 4 and a receiver section 5 with a plurality of receiving coils 500. The receiver section 5 has a first receiver section 51 with at least one receiving coil 500, a second receiver section 52 that is provided apart from the first receiver section 51 and has at least one receiving coil 500 different from the first receiver section 51, and connection wiring 53 that connects the first receiver section 51 and second receiver section 52. The first receiver section 51 and the second receiver section 52 are arranged linearly symmetrically with the axis L1 of the Y-direction, which is orthogonal to the X-direction (measurement direction) in the plane 30 where the receiving coils 500 are arranged, and are arranged in the same number.

IPC Classes  ?

  • G01D 5/20 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying inductance, e.g. by a movable armature
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