Goods & Services

Downloadable computer (simulation) software for identifying stochastic defects in semiconductor wafers; Downloadable computer software for use in predicting stochastic failures in integrated circuit layouts; Downloadable computer software for ranking the severity of stochastic defects in integrated circuit layouts; Downloadable computer software for simulating stochastic effectivity in integrated circuit layouts Computer software (simulation) services for identifying stochastic defects in semiconductor wafers; Computer software services for use in predicting stochastic failures in integrated circuit layouts; Computer software services for ranking the severity of stochastic defects in integrated circuit layouts; Computer software services for simulating stochastic effectivity in integrated circuit layouts; Software as a service featuring software for identifying stochastic defects in semiconductor wafers; Software as a service featuring software for use in predicting stochastic failures in integrated circuit layouts; Software as a service featuring software for ranking the severity of stochastic defects in integrated circuit layouts; Software as a service featuring software for simulating stochastic effectivity in integrated circuit layouts

Goods & Services

Server hardware and computer hardware that utilizes various model-based and model-less machine learning approaches to provide thickness, critical dimensions, material properties, and other key measurements based on raw signals collected from optical and X-ray metrology tools to enable on-demand, manual, and automatic recipe tuning, recipe import and export, and recipe database management

Goods & Services

Apparatus and instruments for recording, transmitting, reproducing or processing sound, images or data; recorded and downloadable digital media, namely, pre-recorded dvds, downloadable audio and video recordings, and CDs in the field of surface data analysis, surface visualization, and report generation; downloadable computer software for surface data analysis, namely, 2D and 3D surface data analysis, surface visualization, and report generation; blank digital or analogue recording and storage in the field of surface data analysis, namely, 2D/3D surface data analysis, surface visualization, report generation; Calculating devices, namely, calculators; Computers; Computer peripheral devices; Scaling and measuring instruments, namely, surface roughness testing machines and instruments, namely, profilometers and profilers; Measuring apparatus and measuring instruments, namely, stylus profilometers and stylus profilers for use in identifying and measuring physical and surface topography properties and for use in research and development regarding same; Electronic and optical instruments for measuring surfaces and for use in research and development regarding same; Surface roughness testing machines and instruments; Instruments for testing and inspecting physical and electrical properties of semiconductors, compound semiconductor, solar components, light emitting diodes, micro-electro-mechanical systems, medical devices, automotive components and data storage and for use in research and development regarding same; Computer hardware and downloadable software used for testing and inspecting physical and electrical properties of semiconductors, compound semiconductor, solar components, Light emitting diodes, Micro-electro-mechanical systems, medical devices, automotive components and data storage and for use in research and development regarding same

Goods & Services

Data analytics computer hardware and prerecorded and downloadable computer software for correcting process issues and achieving higher yield for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer hardware and prerecorded and downloadable computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer hardware and downloadable and prerecorded computer software for use in detecting imperfections and faults in semiconductors, integrated circuits, microelectronics, and wafers

Goods & Services

Downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer hardware and downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; computer hardware and downloadable and prerecorded computer software for use in detecting imperfections and faults in semiconductor electronic components, integrated circuits, microelectronics, and wafers

Goods & Services

Scientific, electrical and measuring apparatus and instruments for determining and analyzing physical properties of materials, namely, for testing and performing measurements on solids and thin films to determine physical and mechanical properties for hardness, fracture toughness, hardness, strain-rate sensitivity, creep, stress relaxation, adhesion, interfacial friction, yield strength, residual stress, fracture toughness, and bonding; computer hardware and downloadable and prerecorded software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; electrical and scientific instruments for testing, inspecting, and characterizing physical properties of semiconductors, integrated circuits, microelectronics, and wafers

Goods & Services

Computer hardware and downloadable and prerecorded computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer hardware and downloadable and prerecorded computer software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and wafers; computer hardware and downloadable and prerecorded computer software for use in detecting imperfections and faults in semiconductor electronic components, integrated circuits, microelectronics, and wafers

Goods & Services

Computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; imaging metrology tools, namely, scientific and electronic imaging instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and downloadable and prerecorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits

Goods & Services

Computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; imaging metrology tools, namely, scientific and electronic imaging instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and downloadable and prerecorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits

Goods & Services

Downloadable computer simulation software used for monitoring, controlling, accelerating and improving semiconductor and integrated circuit manufacturing processes; downloadable computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; downloadable computer software used for event prediction in the manufacturing of semiconductors and integrated circuits; recorded computer simulation software used for monitoring, controlling, accelerating and improving semiconductor and integrated circuit manufacturing processes; recorded computer software for use in managing and controlling the manufacturing process and yield of semiconductors and integrated circuits in the semiconductor, integrated circuit and related microelectronics manufacturing industries; recorded computer software used for event prediction in the manufacturing of semiconductors and integrated circuits

Goods & Services

Computer hardware, namely, computer server blade units to be used in integrated circuits manufacturing and testing; computer hardware and downloadable and prerecorded computer software all for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; electronic and scientific instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits

Goods & Services

Inspection system comprised of a laser, recorded computer software, and computer hardware for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; computer hardware and recorded software used for testing, inspecting, and characterizing physical properties of semiconductor wafers and integrated circuits, namely, critical defects; all of the aforesaid not including any software relating to or connected with managing real estate, property management, property construction and development and performing of related accounting functions

Goods & Services

instruments for testing, inspecting, and characterizing physical properties of reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of reticles

Goods & Services

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Goods & Services

Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control

Goods & Services

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Goods & Services

Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Goods & Services

computer hardware and software used for testing, inspecting, characterizing, and predicting physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits

Goods & Services

instruments for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductor wafers, integrated circuits, and reticles; computer hardware and software used for monitoring and controlling semiconductor wafer, integrated circuit, and reticle manufacturing processes; computer hardware and software used for providing feedback about device parameters used in the manufacturing of semiconductor wafers, integrated circuits, and reticles

Goods & Services

metrology system comprised of computer software and computer hardware for testing and characterizing physical properties of semiconductors and integrated circuits, namely, critical dimension and shape; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer hardware and software used for monitoring and controlling semiconductor manufacturing processes; computer hardware and software used for providing feedback about device parameters to semiconductor and integrated circuit manufacturers

Goods & Services

Computer hardware; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing in the automotive industry; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in detecting defective semiconductor electronic components

Goods & Services

photomask blank inspection tool in the nature of testing equipment comprised of computer hardware, computer software, lasers, and optical inspectors for use in the manufacturing, testing and inspection of photomask blanks; computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and photomask blanks; computer software for use in process control and yield management for the photomask blanks, semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits, microelectronics, and photomask blanks; computer software for providing analytic data on the performance of inspection and metrology tools

Goods & Services

Computer hardware; semiconductor and wafer defect inspection systems; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; a feature of semiconductor and wafer defect inspection systems for improving the detection of defects on advanced logic and memory IC devices across a broad range of process layers

Goods & Services

Scientific instrumentation for mechanical property testing, namely, nanoindentation testing of thin films and bulk materials to determine hardness, modulus, and other material properties; computer software for mechanical property testing Scientific and technological services, namely, contract laboratory testing of mechanical properties

Goods & Services

Computer hardware for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics

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Nanomechanical laboratory testing instruments, namely, nanoindentation testing instruments having probes, transducers and controllers with and without in-situ testing capability and operating computer software and/or operating computer firmware therefor

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Scientific instrumentation for measuring mechanical properties

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Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuits and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools

Goods & Services

Software for controlling nanomechanical instrumentation platforms, data acquisition for nanomechanical experiments, and image generation in support of nanomechanical experiments

Goods & Services

Computer hardware, software and user manuals sold as a unit, and equipment, namely, inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

Goods & Services

Computer hardware and software for inspecting and characterizing the surfaces of semiconductor wafers, discs, and flat panel displays

Goods & Services

Computer hardware, software and user manuals sold as a unit, and equipment consisting of inspection, metrology and testing hardware, all for inspection, metrology and testing of materials and surfaces

Goods & Services

Semiconductor topography equipment, namely, high resolution surface profiling hardware, software, styli and user manuals sold as a unit, all for enhanced semiconductor manufacture and inspection purposes that are sold only to chipmakers

Goods & Services

Computer hardware, software and user manuals sold as a unit, and equipment, namely, inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing

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Computer hardware and software and equipment consisting of inspection, metrology and testing hardware, all for inspection and testing of semiconductors during manufacturing and processing

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computer hardware and software for inspection and metrology characterization of data storage and semiconductor devices

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Electron microscopes and computer hardware and related computer software for use with testing, inspection, and metrology in the field of semiconductor manufacturing

Goods & Services

Computer hardware, software and user manuals sold as a unit, all for analysis of inspection, metrology and testing data of materials and surfaces

Goods & Services

Reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology

Goods & Services

Computer hardware, software and user manuals sold as a unit, and equipment consisting of inspection, metrology and testing hardware, all for inspection, metrology and testing of materials and surfaces

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system for storing, managing and analyzing semiconductor manufacturing data that is comprised of computer hardware, computer software for managing and analyzing semiconductor manufacturing data, and blank magnetic and electro-optical data storage carriers

Goods & Services

AUTONOMOUS SPATIALLY RESOLVED ELECTRONIC OR MECHANICAL SENSORS FOR SEMICONDUCTOR MANUFACTURING APPLICATIONS

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Device for the characterizing a substrate namely, non-contact optical imaging comprised of a coherent light source, light detector and substrate analysis, computer hardware and software for characterizing semiconductor surface data

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computer software for yield management in semiconductor manufacturing

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Computer software used to provide central recipe storage and to create, edit, and save recipe files regarding semiconductor wafer data and to manage multiple machine configurations

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OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF

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OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF

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OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF

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OPTICAL INSPECTION EQUIPMENT, COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF

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optical inspection equipment particularly suited for semiconductor evaluation

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instruments for testing and inspecting physical and electrical properties of semiconductors; computer hardware and software used for testing and inspecting physical and electrical properties of semiconductors

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stylus instruments and computer software for inspecting and characterizing surfaces, including surfaces of semiconductor wafers, discs, flat panel displays and other finished surfaces including machine finished surfaces

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stylus apparatus for inspecting and characterizing surfaces, including surfaces of semiconductor wafers, discs and flat panel displays and other finished surfaces including machine finished surfaces

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instrument hardware and computer software for inspecting and characterizing surfaces, namely surfaces of semiconductor wafers, discs, and flat panel displays

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electronic test system, comprising a computer, waferhandlilng robotics, and current and voltage instruments that tests semiconductors in their fabrication stages

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wafer calibration equipment, namely, instrument wafers, and thermocouple scanners and monitors

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computer software for displaying thermal data from an instrumented wafer in a wafer fabrication system and software user guides and reference manuals packaged as a unit used in the field of semiconductor manufacturing liquid crystal display manufacturing and hard disk drive manufacturing

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measuring and gauging equipment and instruments for physical, optical and/or electrical properties applications in industrial and commercial settings; and computer hardware and software for use with measuring and gauging equipment

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house mark for instruments and systems for the measurement and/or modification of physical, optical and/or electrical properties of objects such as semiconductor wafers, computer disks, tires, precision motion assemblies, machined parts, etc; associated hardware and software for system control, data acquisition, processing, display and communication; associated material handling subsystems and services related to customized design thereof

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semiconductor wafer measurement stations for the measurement of semiconductor wafer flatness, shape, thickness, conductivity type and secondary flat location, and associated computerized controllers for control and data acquisition

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scientific, electrical and measuring apparatus and instruments for determining and analyzing physical properties of materials; specifically, equipment for testing and performing measurements on solids and thin films to determine such physical or mechanical properties as Young's modulus, hardness, strain-rate sensitivity, creep, stress relaxation, adhesion, interfacial friction, yield strength, residual stress, fracture toughness, bonding and the like

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optical measuring device for characterizing parameters of a sample and particularly semi-conductor wafers

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measurement device for evaluating dielectric films

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SURFACE DEFECT DETECTORS

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COMPUTER PROGRAMS FOR USE IN STATISTICAL ANALYSIS OF PROCESS FLOW

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SEMICONDUCTOR WAFER RESISTIVITY MAPPING SYSTEM COMPRISED OF SOME OR ALL OF THE FOLLOWING: PROGRAMMABLE COMPUTER, GRAPHICS TERMINAL, GRAPHICS PRINTER, INSTRUMENTATION INTERFACE, AND RESISTIVITY TEST UNITS

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Computer-Based System for Evaluating the Performance of Semiconductor Wafer Processing Equipment Comprised of Resistivity Test and Mapping Systems and Lithography Characterization Systems Comprised of Some or All of the Following: Programmable Computer, Instrumentation Interface, Graphics Terminal, Graphics Printer, Resistivity Test Unit, and Programmable x-y Prober with Optics and Probe Card

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METROLOGY INSTRUMENTS-NAMELY, INSTRUMENTS FOR MAPPING VERTICAL PROFILES OF SEMICONDUCTOR WAFERS, THIN FILMS, AND THE LIKE

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NON-CONTACT DIMENSIONAL GAGING APPARATUS