Anritsu Corporation

Japon

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Type PI
        Brevet 355
        Marque 25
Juridiction
        États-Unis 306
        International 74
Date
Nouveautés (dernières 4 semaines) 1
2024 avril (MACJ) 1
2024 mars 1
2024 février 5
2023 décembre 3
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Classe IPC
H04W 24/06 - Réalisation de tests en trafic simulé 51
H04B 17/00 - Surveillance; Tests 47
H04W 24/08 - Réalisation de tests en trafic réel 20
H04B 17/10 - Surveillance; Tests d’émetteurs 18
H04B 17/15 - Tests de performance 18
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Classe NICE
09 - Appareils et instruments scientifiques et électriques 25
42 - Services scientifiques, technologiques et industriels, recherche et conception 10
37 - Services de construction; extraction minière; installation et réparation 6
Statut
En Instance 55
Enregistré / En vigueur 325
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1.

ARTICLE INSPECTION SYSTEM

      
Numéro d'application 18478456
Statut En instance
Date de dépôt 2023-09-29
Date de la première publication 2024-04-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Asai, Eiji
  • Tsujimura, Eiji
  • Kikuchi, Toshiaki

Abrégé

There is provided an article inspection system including: an additional processing control unit that executes additional processing on an article determined to be defective among inspected articles, according to an inspection result of an article inspection unit, in which the additional processing control unit includes a quality state determination unit that determines which one of a plurality of preset quality states the inspection result corresponds to, and processing request selection means for selecting any one of first processing request information for requesting a working machine to perform first additional processing work by the working machine and second processing request information for requesting second manual additional processing work, according to a determination result of the quality state determination unit.

Classes IPC  ?

  • A22C 17/00 - Autres dispositifs pour le traitement de la viande ou des os
  • A22C 21/00 - Traitement de la volaille

2.

SIGNAL GENERATOR AND EMPHASIS SWITCHING METHOD USING SIGNAL GENERATOR

      
Numéro d'application 18335419
Statut En instance
Date de dépôt 2023-06-15
Date de la première publication 2024-03-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

There are provided a signal generator capable of flexibly increasing the number of taps while realizing high-speed emphasis switching and an emphasis switching method using the signal generator. A signal generator includes: an emphasis addition circuit including at least one finite impulse response (FIR) filter unit that generates an emphasis waveform pattern by adding an emphasis to a pattern of a pulse amplitude modulation (PAM) signal including multi-values which are two or more values; and a tap value setting unit that switches M tap values C(0), C(−1), . . . , and C(1−M) and sets the M tap values C(0), C(−1), . . . , and C(1−M) to each FIR filter unit according to an emphasis switching request from a DUT 100. The FIR filter unit is configured on an FPGA or an ASIC.

Classes IPC  ?

3.

X-RAY INSPECTION APPARATUS

      
Numéro d'application 18260983
Statut En instance
Date de dépôt 2022-01-06
Date de la première publication 2024-02-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yamazaki, Takeshi
  • Kanai, Takashi

Abrégé

An X-ray inspection apparatus includes: a transportation unit that transports an object through an inspection area; an X-ray generation source; an X-ray detection unit; an image data generation unit that generates image data from an output of the X-ray detection unit; a good or not determination unit that performs quality inspection of the object based on the generated image data and a predetermined criterion; and a control unit that controls the inspection, wherein the control unit switches between an inspection mode and a calibration mode in which calibration data for bringing into uniformity the brightness of the image is generated. The control unit includes a calibration data generation unit that generates calibration data based on image data generated before and after a calibration member is inspected in the calibration mode, and a correction unit that corrects the image data of the object, based on the calibration data.

Classes IPC  ?

  • G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux

4.

ARTICLE CONVEYING DEVICE

      
Numéro d'application 18455225
Statut En instance
Date de dépôt 2023-08-24
Date de la première publication 2024-02-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Suzuki, Takashi

Abrégé

A container conveying device includes a contact support portion which comes into contact with one side surface of a container, a star wheel, a contact support portion which comes into contact with the other side surface of the container, and a holding wheel provided to be relatively rotatable with respect to the star wheel. When the container is not located at a container inspection position, the container conveying device conveys the container while maintaining a posture of the container by bringing the contact support portion into contact with the container, and when the container is located at the container inspection position, the container conveying device separates the contact support portion which comes into contact with the surface of the container. The container is released from the contact support portion at the container inspection position while the star wheel is paused.

Classes IPC  ?

  • B65G 47/84 - Roues en forme d'étoiles ou dispositifs à courroies ou chaînes sans fin, les roues ou dispositifs étant dotés d'éléments venant en prise avec les objets

5.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18318283
Statut En instance
Date de dépôt 2023-05-16
Date de la première publication 2024-02-08
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measurement apparatus includes an operation display unit and a display control unit. Displays a measurement result when the matrix scan function is executed. The display control unit displays a first coefficient value in a selectable manner by tabs of a number corresponding to the Full Swing value, uses each one of combinations of the first coefficient value, each second coefficient value, and each third coefficient value on the selected table as the cell, displays an error count value and the bit error rate for each cell, which are obtained by the matrix scan function on a display screen in a matrix, and identifies and displays the bit error rate for each cell on the display screen according to an error degree.

Classes IPC  ?

  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p.ex. essais de mise en route
  • G06F 11/273 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G06F 11/32 - Surveillance du fonctionnement avec indication visuelle du fonctionnement de la machine

6.

ERROR RATE MEASUREMENT APPARATUS AND ERROR RATE MEASUREMENT METHOD

      
Numéro d'application 18318396
Statut En instance
Date de dépôt 2023-05-16
Date de la première publication 2024-02-08
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measurement apparatus includes a display control unit, an operation display unit, and a control unit. The display control unit displays a firsts coefficient value in a selectable manner by tabs of a number corresponding to a Full Swing value, performs matrix display on a display screen by using each one of combinations of each second coefficient value and each third coefficient value in the first coefficient value on the selected tab, and displays each coefficient value on the display screen in a three-dimensional bird-eye view by using each second coefficient value and each third coefficient value as a combination of a horizontal direction coordinate axis and a vertical direction coordinate axis and using the first coefficient value as a depth direction coordinate axis. The operation display unit selects a range including at least one cell as a scanning target in the matrix display or a bird-eye display.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie

7.

MOBILE TERMINAL TESTING DEVICE AND METHOD FOR DISPLAYING EVM MEASUREMENT RESULT OF SRS USING SAME

      
Numéro d'application 18308808
Statut En instance
Date de dépôt 2023-04-28
Date de la première publication 2024-02-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Inoue, Naoki

Abrégé

To provide a mobile terminal testing device capable of easily referring to an EVM measurement result of an SRS by automatically calculating an allocation position of the SRS. The mobile terminal testing device includes: a pseudo base station unit 2 that transmits and receives an RF signal to and from a mobile terminal 10; a scenario processing unit 3 that transmits notification information to the pseudo base station unit 2 and executes a communication sequence with the mobile terminal 10, based on a scenario of a test; and a control unit 6 that calculates an allocation position of an SRS based on a set parameter, and displays an EVM measurement result such that the allocation position of the SRS is recognized.

Classes IPC  ?

8.

SIGNAL GENERATION DEVICE AND SIGNAL GENERATION METHOD

      
Numéro d'application 18333858
Statut En instance
Date de dépôt 2023-06-13
Date de la première publication 2024-02-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yoshioka, Hironori
  • Iwai, Tatsuya

Abrégé

A signal generation device includes m transceivers, a usage amount determination unit that executes a usage amount determination process that determines the usage amount of the FIFO of each transceiver, and a phase adjustment unit that adjusts the phase of the read clock signal for the FIFO. The signal generation device performs the second usage amount determination process on the condition that the count that the usage amount of the FIFO of each transceiver is determined to be less than the usage amount threshold by the first usage amount determination process consecutively reaches the first determination count, and terminates the adjustment of the phase of the read clock signal on the condition that the count that the usage amount of the FIFO of each transceiver is determined by the second usage amount determination process to be greater than the usage amount threshold consecutively reaches the second determination count.

Classes IPC  ?

  • H04L 7/00 - Dispositions pour synchroniser le récepteur avec l'émetteur
  • H04B 1/04 - Circuits
  • H04L 7/02 - Commande de vitesse ou de phase au moyen des signaux de code reçus, les signaux ne contenant aucune information de synchronisation particulière

9.

MOBILE TERMINAL TESTING DEVICE AND MCS SET VALUE SEARCHING METHOD THEREFOR

      
Numéro d'application 18296053
Statut En instance
Date de dépôt 2023-04-05
Date de la première publication 2024-02-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Hosoya, Takahiro

Abrégé

Provided is a mobile terminal testing device that can improve efficiency of test by automatically searching for a set value that satisfies a predetermined condition according to a set parameter. A mobile terminal testing device includes: a pseudo base station unit 2 that transmits and receives an RF signal to and from a mobile terminal 10; a scenario processing unit 3 that causes the pseudo base station unit 2 to transmit notification information or to execute a communication sequence with the mobile terminal 10, based on a scenario of a test; and a control unit 6 that searches for and presents a set value of an MCS that satisfies a predetermined condition according to a parameter set to simulate a base station.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

10.

EVENT DETECTION DEVICE AND EVENT DETECTION METHOD

      
Numéro d'application 18323516
Statut En instance
Date de dépôt 2023-05-25
Date de la première publication 2023-12-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi

Abrégé

An object of the present disclosure is to improve an SN ratio while maintaining a distance resolution and to accurately detect an event occurrence location. An event detection device according to the present disclosure includes: an OTDR waveform acquisition unit that acquires an OTDR waveform of an optical fiber to be measured; a feature quantity extraction unit that performs wavelet transform on the OTDR waveform and generates a scalogram with each wavelet coefficient as a feature quantity; a peak extraction unit that calculates a noise threshold value from the OTDR waveform, and extracts a peak from the feature quantity on the scalogram based on the noise threshold value to generate a peak graph; and an event identification unit that identifies an event in the optical fiber to be measured from the peak graph.

Classes IPC  ?

  • G01M 11/00 - Test des appareils optiques; Test des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs
  • H04B 10/071 - Dispositions pour la surveillance ou le test de systèmes de transmission; Dispositions pour la mesure des défauts de systèmes de transmission utilisant un signal réfléchi, p.ex. utilisant des réflectomètres optiques temporels [OTDR]

11.

OPTICAL PULSE TEST DEVICE AND OPTICAL PULSE TEST METHOD

      
Numéro d'application 18330044
Statut En instance
Date de dépôt 2023-06-06
Date de la première publication 2023-12-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi
  • Ishida, Kodai

Abrégé

According to the present disclosure, an optical pulse test device includes an OTDR waveform measurement unit that measures an OTDR waveform with a plurality of pulse widths, an event analysis unit that calculates a level, a loss, and a return loss at a start point of each event, and an analysis result integration unit that calculates a cumulative loss at the start point and an end point of each event from the level, the loss, and the return loss at the start point of each event, determines a pulse width that enables securing of a required SN ratio or more for each of the start point and the end point of each event, integrates the cumulative loss at each of the start point and the end point of each event with the determined pulse width, and sets the integrated cumulative loss as an analysis result.

Classes IPC  ?

  • G01M 11/00 - Test des appareils optiques; Test des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs

12.

LOSS ANALYSIS DEVICE AND LOSS ANALYSIS METHOD

      
Numéro d'application 18332085
Statut En instance
Date de dépôt 2023-06-09
Date de la première publication 2023-12-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi

Abrégé

An object of the present disclosure is to provide a loss analysis device and a loss analysis method of detecting an event with high reproducibility when an SN ratio is small or when an event interval is short. According to the present disclosure, a loss analysis device includes an OTDR waveform acquisition unit that acquires an OTDR waveform of a measurement target optical fiber, and a calculation unit that performs nonlinear fitting of an event model function to the OTDR waveform and calculates a position of a start point of each event included in the OTDR waveform, a level at the start point of each event, a loss of each event, and a return loss of each event, the event model function using the position, the level, the loss, and the return loss as parameters.

Classes IPC  ?

  • G01D 5/353 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensible; Moyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminé; Transducteurs non spécialement adaptés à une variable particulière utilisant des moyens optiques, c. à d. utilisant de la lumière infrarouge, visible ou ultraviolette avec atténuation ou obturation complète ou partielle des rayons lumineux les rayons lumineux étant détectés par des cellules photo-électriques en modifiant les caractéristiques de transmission d'une fibre optique

13.

MOBILE TERMINAL TESTING DEVICE AND MOBILE TERMINAL TESTING METHOD

      
Numéro d'application 18297189
Statut En instance
Date de dépôt 2023-04-07
Date de la première publication 2023-11-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Wu, Zhihui

Abrégé

A reception sensitivity test control unit 18 provided in a measurement device 1 and configured to execute a reception sensitivity test by repeatedly transmitting and receiving a test signal to a mobile terminal includes a test condition setting unit 18a that initially sets a test condition including an initial step level SL0 and a starting output level OL0 of the test signal at a start of the reception sensitivity test, and an AI prediction test condition change setting unit 18b that sets an AI prediction output level OL01, which is AI-predicted in advance by an AI prediction model based on the test condition set by the test condition setting unit 18a, as a first output level instead of the output level OL0.

Classes IPC  ?

14.

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD

      
Numéro d'application 18245200
Statut En instance
Date de dépôt 2021-09-13
Date de la première publication 2023-11-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Ishida, Masaru

Abrégé

An X-ray inspection apparatus includes an X-ray generator; an X-ray detector; and a determination unit determining a quality state of an inspection object, based on an X-ray detection signal. The apparatus has an X-ray image storing unit storing a first inspection image, corresponding to the X-ray detection signal outputted from the X-ray detector, whose observation direction is the direction in which the X-rays transmits the inspection object; a pseudo three-dimensional information generation model generating pseudo three-dimensional information regarding a type of object to be learned; and an inspection image generation unit creating a second inspection image regarding the type of object to be learned having an observation direction different from the first inspection image, based on the first inspection image regarding the type of object to be learned. The determination unit performs the determination based on at least the second inspection image created by the inspection image generation unit.

Classes IPC  ?

  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

15.

MOBILE TERMINAL TEST APPARATUS AND CONTROL MESSAGE TRANSMISSION METHOD THEREOF

      
Numéro d'application 18052742
Statut En instance
Date de dépôt 2022-11-04
Date de la première publication 2023-11-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Morita, Atsuki
  • Kano, Daiki
  • Nakamura, Takumi
  • Arayama, Masahiro
  • Shimakawa, Nobuaki
  • Nakagawa, Daisuke

Abrégé

There is provided a mobile terminal test apparatus capable of efficiently performing a test by collectively processing control messages. There is included a control unit 6 that switches, as a mode for transmitting a control message to a mobile terminal 10, between an Automatic mode in which by a setting of a parameter by a user, the control message is transmitted to the mobile terminal 10 when it becomes necessary to transmit the control message to the mobile terminal 10, and a Manual mode in which change information on the parameter by the setting of the parameter by the user is held, and the control message corresponding to the held change information is transmitted to the mobile terminal 10 when a parameter application instruction is given by the user.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

16.

MOBILE TERMINAL TEST SYSTEM AND MOBILE TERMINAL TEST METHOD

      
Numéro d'application 18186603
Statut En instance
Date de dépôt 2023-03-20
Date de la première publication 2023-10-12
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kato, Seiya
  • Chinbe, Ryota

Abrégé

There is provided a mobile terminal test system and a mobile terminal test method capable of greatly reducing a time required to a setting of a parameter for a plurality of test cases. A common parameter extraction unit that extracts parameters of the same type among a plurality of parameters included in a plurality of test cases selected by an operation unit as a plurality of common parameters, a display control unit that displays a list of plurality of common parameters extracted by the common parameter extraction unit on a display unit, a common parameter setting unit that collectively sets respective change values input by the operation unit to the plurality of common parameters, and a test execution unit that executes a test of the plurality of test cases by using the plurality of common parameters set by the common parameter setting unit are included.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

17.

MEASUREMENT DEVICE AND MEASUREMENT METHOD

      
Numéro d'application 18163933
Statut En instance
Date de dépôt 2023-02-03
Date de la première publication 2023-10-05
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kasagi, Takahiro
  • Inoue, Koichi
  • Tanikage, Hiroyuki

Abrégé

A measurement device includes: a display unit that displays information related to a test; a device control unit group that includes a plurality of device control units controlling control target devices of a control target device group, respectively, the control target device group including the control target devices that each simulate the component of the component group, respectively; a measurement target setting unit that sets a component selected from the component group as a measurement target device; a test case creation unit that creates a test case by displaying a use order of device control units to be used for the test of the measurement target device among the device control unit group on the display unit in a user-settable manner; and a test case execution unit that executes the test case as to the device control units to be used for the test in the set use order.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 80/04 - Protocoles de couche réseau, p.ex. protocole Internet mobile [IP Internet Protocol]

18.

SIGNAL GENERATION APPARATUS, LEVEL CORRECTION VALUE CALCULATION SYSTEM, AND LEVEL CORRECTION VALUE CALCULATION METHOD

      
Numéro d'application 18069401
Statut En instance
Date de dépôt 2022-12-21
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji
  • Ito, Shinichi

Abrégé

A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, a switch 48 that switches between an Internal path through which the signal attenuated by the variable attenuator 40, 42, 44, and 46 is transmitted to the measurement unit 6 and an External path through which the signal attenuated by the variable attenuator 40, 42, 44, and 46 is output from an output terminal 10, and a control unit 7 that obtains a correction value of an attenuation amount of the variable attenuators 40, 42, and 44 with the Internal path and obtains a correction value of an attenuation amount of the variable attenuator 46 with the External path.

Classes IPC  ?

  • H03H 7/25 - Affaiblisseurs indépendants de la fréquence comprenant un élément commandé par une variable électrique ou magnétique
  • H03G 1/00 - RÉGLAGE DE L'AMPLIFICATION - Détails des dispositions pour le réglage de l'amplification

19.

MOBILE TERMINAL TEST APPARATUS AND POSITION CORRECTION METHOD OF MOBILE TERMINAL

      
Numéro d'application 18187054
Statut En instance
Date de dépôt 2023-03-21
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Osone, Dan
  • Chinbe, Ryota
  • Kasai, Ryuso

Abrégé

The mobile terminal test apparatus includes a positioner that adjusts a position of UE, a camera that captures an image of a state of the position of the UE controlled by the positioner, and a control unit that sets the position of the positioner with data on a Peak point of a transmission radio wave in a database, and then compares the current image data of the UE obtained by image capturing of the camera and image data of the Peak point of a transmission radio wave in the database, and displays the current image data of the UE obtained by image capturing of the camera and the image data of the Peak point of the transmission radio wave in the database when an error is greater than a predetermined threshold value.

Classes IPC  ?

  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04W 24/04 - Configurations pour maintenir l'état de fonctionnement
  • H04W 64/00 - Localisation d'utilisateurs ou de terminaux pour la gestion du réseau, p.ex. gestion de la mobilité

20.

MOBILE TERMINAL TEST SYSTEM AND MOBILE TERMINAL TEST METHOD

      
Numéro d'application 18187232
Statut En instance
Date de dépôt 2023-03-21
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Gao, Wujie
  • Chinbe, Ryota

Abrégé

A parameter calculation unit that calculates, according to one or more input values of a parameter, a value of another parameter, a standard conformance determination unit that determines whether or not the input value of the parameter and the value of the parameter calculated by the parameter calculation unit conform with a 3GPP standard, a parameter adjustment unit that adjusts a value of a parameter, which does not conform with the 3GPP standard, to a value in conformity with the 3GPP standard, and a conformance and nonconformance determination criterion value calculation unit that calculates a conformance and nonconformance determination criterion value of a test case by using at least one of a parameter having a value determined to conform with the 3GPP standard by the standard conformance determination unit and a parameter having a value adjusted by the parameter adjustment unit are included.

Classes IPC  ?

  • H04W 24/00 - Dispositions de supervision, de contrôle ou de test
  • H04W 8/22 - Traitement ou transfert des données du terminal, p.ex. statut ou capacités physiques

21.

ARTICLE INSPECTION VERIFICATION SYSTEM

      
Numéro d'application 18187913
Statut En instance
Date de dépôt 2023-03-22
Date de la première publication 2023-09-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Asai, Eiji
  • Kikuchi, Toshiaki
  • Ito, Takamasa
  • Ozawa, Mami
  • Inagaki, Tatsuya

Abrégé

There is provided an article inspection verification system provided in an article inspection line including a plurality of article inspection devices that determine whether an inspection target article is a non-defective product or a defective product. The article inspection verification system includes physical effect generators that generate a physical effect that causes the inspection target article to be determined to be the defective product while the inspection target article passes through inspection sections corresponding each of article inspection devices, and a physical effect control unit that stores generation conditions of the physical effect by the physical effect generators and drives the physical effect generators in accordance with the generation conditions during an operation of the article inspection line.

Classes IPC  ?

  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
  • G01V 3/10 - Prospection ou détection électrique ou magnétique; Mesure des caractéristiques du champ magnétique de la terre, p.ex. de la déclinaison ou de la déviation fonctionnant au moyen de champs magnétiques ou électriques produits ou modifiés par les objets ou les structures géologiques, ou par les dispositifs de détection en utilisant des cadres inducteurs
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers
  • B07C 5/18 - Tri selon le poids utilisant un seul mécanisme fixe de pesée
  • B07C 5/344 - Tri en fonction d'autres propriétés particulières selon les propriétés électriques ou magnétiques
  • B07C 5/34 - Tri en fonction d'autres propriétés particulières

22.

LOCAL 5G MONITORING SYSTEM USING WIRELESS TERMINAL

      
Numéro d'application 18067339
Statut En instance
Date de dépôt 2022-12-16
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes the wireless terminals that measure radio waves from a base station of a local 5G system, a first server device that belongs to the same wireless local area network (wireless LAN) as the wireless terminals, collects measurement data from the wireless terminals, and is connected to the Internet, and a second server device that is connected to the first server device via the Internet, and is configured to be referred to by a user, in which the first server device uses the measurement data from the wireless terminals when installation of the local 5G system is completed, as reference information, and determines and notifies the user that an abnormal state occurs, when the measurement data from the wireless terminals during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 24/10 - Planification des comptes-rendus de mesures

23.

LOCAL 5G MONITORING SYSTEM

      
Numéro d'application 18068810
Statut En instance
Date de dépôt 2022-12-20
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes a measuring device that measures radio waves from a base station of a local 5G system, wireless terminals, a first server device that belongs to the same wireless local area network (wireless LAN) as the measuring device and the wireless terminals, collects measurement data from the wireless terminals, belongs to the same local area network (LAN) as the measuring device, and is connected to the Internet, and a second server device that is connected to the first server device via the Internet, and is configured to be referred to by a user, in which the first server device uses the measurement data when installation of the local 5G system is completed, as reference information, and determines and notifies the user that an abnormal state occurs, when the measurement data during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 24/10 - Planification des comptes-rendus de mesures

24.

LOCAL 5G MONITORING SYSTEM AND MEASUREMENT DATA PROVIDING METHOD THEREOF

      
Numéro d'application 18068850
Statut En instance
Date de dépôt 2022-12-20
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes measuring devices that measure radio waves from a base station of the local 5G system, a first server device that belongs to the same local area network (LAN) as the measuring devices, and collects measurement data from the measuring devices, and a second server device that is connected to the first server device via the Internet, and is configured to be referred to by a user, in which the first server device uses the measurement data from the measuring devices when installation of the local 5G system is completed, as reference information, and determines and notifies the user that an abnormal state occurs, when the measurement data from the measuring devices during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 24/10 - Planification des comptes-rendus de mesures

25.

LOCAL 5G MONITORING SYSTEM AND ABNORMAL STATE DETECTION METHOD THEREOF

      
Numéro d'application 18067200
Statut En instance
Date de dépôt 2022-12-16
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes measuring devices that measure radio waves from a base station of a local 5G system, and a server device that collects measurement data from the measuring devices, in which the server device uses the measurement data from the measuring devices when installation of the local 5G system is completed, as reference information, and determines that an abnormal state occurs, when the measurement data from the measuring devices during an operation of the local 5G system exceeds a threshold from the reference information.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04W 16/18 - Outils de planification de réseau

26.

LOCAL 5G MONITORING SYSTEM AND STATE DISPLAY METHOD THEREOF

      
Numéro d'application 18068893
Statut En instance
Date de dépôt 2022-12-20
Date de la première publication 2023-09-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Usuba, Mitsuhiro
  • Furuki, Atsushi
  • Fukagawa, Yoshihiro
  • Sasaki, Satoshi

Abrégé

The local 5G monitoring system includes measuring devices that measure radio waves from a base station of the local 5G system, and a server device that belongs to the same local area network (LAN) as the measuring devices, or is connected to the Internet, and collects measurement data from the measuring devices, in which the server device generates, based on the measurement data measured by the measuring devices at predetermined time intervals, a heat map showing a distribution of states of the measurement data, and displays the heat map at a time designated by a user, from the generated heat map.

Classes IPC  ?

  • H04L 43/045 - Traitement des données de surveillance capturées, p.ex. pour la génération de fichiers journaux pour la visualisation graphique des données de surveillance

27.

INSPECTION DEVICE, LEARNED MODEL GENERATION METHOD, AND INSPECTION METHOD

      
Numéro d'application 18160778
Statut En instance
Date de dépôt 2023-01-27
Date de la première publication 2023-08-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tsunoda, Koetsu
  • Yamazaki, Takeshi

Abrégé

To improve accuracy of inspecting a quality state of an inspection object. An inspection device 1 includes: an image storage unit 21 that captures a plurality of images having different input channels for an inspection object W under an imaging condition corresponding to each input channel, and stores multiple inspection images obtained by the capturing and combining the plurality of images of the inspection object W; and a determination unit 24 that obtains a defective quality degree for the multiple inspection images stored in the image storage unit 21 based on a learned model 22 created in advance by learning using an image having a same imaging condition as the multiple inspection images, and determines a quality state of the inspection object W by comparison between the defective quality degree and a preset threshold.

Classes IPC  ?

  • G06T 7/00 - Analyse d'image
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X

28.

RADIO TERMINAL TEST APPARATUS AND RADIO TERMINAL TEST METHOD

      
Numéro d'application 18154979
Statut En instance
Date de dépôt 2023-01-16
Date de la première publication 2023-08-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ikebe, Takasumi
  • Hikino, Nozomu

Abrégé

A radio terminal test apparatus that tests radio communication performance of a radio terminal, the apparatus including: a radio signal processing unit that performs measurement processing on a radio signal transmitted from the radio terminal and acquires measurement data; a communication control unit that transmits and receives data to and from the radio signal processing unit; and a bus that connects the radio signal processing unit and the communication control unit. The radio signal processing unit includes a division determination unit that determines necessity of division of the measurement data, and, when the division determination unit determines that the measurement data needs to be divided, the measurement data is divided, and divided pieces of the measurement data are division-transmitted a plurality of times from the radio signal processing unit to the communication control unit via the bus.

Classes IPC  ?

29.

INSPECTION DEVICE, LEARNED MODEL GENERATION METHOD, AND INSPECTION METHOD

      
Numéro d'application 18162202
Statut En instance
Date de dépôt 2023-01-31
Date de la première publication 2023-08-10
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tsunoda, Koetsu
  • Yamazaki, Takeshi

Abrégé

To improve accuracy of inspecting a quality state of an inspection object. An inspection device 1 includes: an image storage unit 21 that stores, as pseudo RGB images, three inspection images for an inspection object W, which have different transmission characteristics and are obtained by capturing a predetermined type of the inspection object W; and a determination unit 24 that obtains a defective quality degree for the pseudo RGB image stored in the image storage unit 21 based on a learned model 22 created in advance by learning using an image having a same format as the pseudo RGB image, and determines a quality state of the inspection object W by comparison between the defective quality degree and a preset threshold.

Classes IPC  ?

  • G06T 7/00 - Analyse d'image
  • G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
  • G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

30.

SIGNAL GENERATION APPARATUS, LEVEL CORRECTION VALUE CALCULATION SYSTEM, AND LEVEL CORRECTION VALUE CALCULATION METHOD

      
Numéro d'application 18069435
Statut En instance
Date de dépôt 2022-12-21
Date de la première publication 2023-08-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji
  • Ito, Shinichi

Abrégé

A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46 that attenuate an analog signal converted by the DA converter 3, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, and a control unit 7 that obtains a value of a step error, which is a correction value of an attenuation amount of the variable attenuators 40, 42, 44, and 46 in each of a plurality of steps obtained by dividing a maximum value of the attenuation amount of the variable attenuators 40, 42, 44, and 46 by a variation amount, which is a predetermined attenuation amount are included.

Classes IPC  ?

  • H04B 17/13 - Surveillance; Tests d’émetteurs pour l’étalonnage d’amplificateurs de puissance, p.ex. de gain ou de non-linéarité
  • H04B 1/04 - Circuits
  • H04B 17/10 - Surveillance; Tests d’émetteurs

31.

INSPECTION APPARATUS

      
Numéro d'application 18155310
Statut En instance
Date de dépôt 2023-01-17
Date de la première publication 2023-08-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ishida, Masaru
  • Nakajima, Hiroki
  • Shibukawa, Mikio

Abrégé

To provide an inspection apparatus capable of simultaneously picking up images of one side and the other side of an inspection item with an image pickup device. An inspection apparatus 1 includes a first conveyance unit 31 and a second conveyance unit 32 arranged with a predetermined gap G and inspects a workpiece W when the workpiece W passes over the predetermined gap G. The inspection apparatus 1 includes a first image pickup device 11 provided on one side with the predetermined gap G in a direction intersecting with a conveyance direction of the workpiece W, a second image pickup device 12 provided on the other side, a first light emission device 21 disposed at a position facing the first image pickup device 11, and a second light emission device 22 disposed at a position facing the second image pickup device 12.

Classes IPC  ?

  • H04N 23/90 - Agencement de caméras ou de modules de caméras, p. ex. de plusieurs caméras dans des studios de télévision ou des stades de sport
  • H04N 23/56 - Caméras ou modules de caméras comprenant des capteurs d'images électroniques; Leur commande munis de moyens d'éclairage

32.

ARTICLE ORIENTATION CHANGE DEVICE

      
Numéro d'application 18159849
Statut En instance
Date de dépôt 2023-01-26
Date de la première publication 2023-08-03
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Suzuki, Takashi

Abrégé

An article orientation change device 30 includes a flap 11 is provided so as to be vertically swingable about a swing shaft 13 as a fulcrum, a conveying member 25 that pushes out a tablet W to a predetermined position on the placement surface 11a, and a pressing member 12 that presses the tablet W against the wall portion 1A, in which a tapered surface 25A is provided on a facing surface of the conveying member 25, the conveying member 25 conveys the tablet W to the placement surface 11a to push out the tablet W to the predetermined position in a state where the tablet W maintains the first orientation, and the pressing member 12 moves in a direction approaching the wall portion 1A to change an orientation of the tablet W on the placement surface 11a from the first orientation to a second orientation.

Classes IPC  ?

  • G01N 3/40 - Recherche de la dureté ou de la dureté au rebondissement
  • G01N 3/06 - Adaptations particulières des moyens d'indication ou d'enregistrement

33.

Signal generation apparatus, level correction value calculation system, and level correction value calculation method

      
Numéro d'application 18069457
Numéro de brevet 11689192
Statut Délivré - en vigueur
Date de dépôt 2022-12-21
Date de la première publication 2023-06-27
Date d'octroi 2023-06-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ono, Hirofumi
  • Yamashita, Koji
  • Ito, Shinichi

Abrégé

A signal generation unit 2, a DA converter 3, variable attenuators 40, 42, 44, and 46 that attenuate the analog signal converted by the DA converter 3, a measurement unit 6 that detects a level of the signal attenuated by the variable attenuators 40, 42, 44, and 46 and passed through one or more semiconductor components, and a control unit 7 that obtains a value of a step error, which is a correction value of an attenuation amount of the variable attenuators 40, 42, 44, and 46 in each of a plurality of steps obtained by dividing a maximum value of the attenuation amount of the variable attenuators 40, 42, 44, and 46 by a variation amount, which is a predetermined attenuation amount are included.

Classes IPC  ?

  • H03K 5/02 - Mise en forme d'impulsions par amplification
  • G01R 19/252 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique utilisant des convertisseurs analogiques/numériques du type à conversion de la tension ou du courant en fréquence et mesure de cette fréquence
  • H03H 11/24 - Atténuateurs indépendants de la fréquence

34.

MOBILE TERMINAL TEST DEVICE AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 18055468
Statut En instance
Date de dépôt 2022-11-15
Date de la première publication 2023-06-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nakagawa, Daisuke
  • Kano, Daiki
  • Nakamura, Takumi
  • Morita, Atsuki
  • Arayama, Masahiro

Abrégé

To provide a mobile terminal test device capable of efficiently performing a test by facilitating switching of parameter settings when switching a simulated base station. The mobile terminal test device includes a control unit 6 that, when a test is performed by simulating a plurality of base stations, retains a parameter common to the plurality of simulated base stations and a parameter individual for each of the plurality of simulated base stations, as the parameters for simulating the base stations, and sets the parameter common to the simulated base stations as it is, and switches and sets the parameter individual for each of the simulated base stations.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé
  • H04W 72/04 - Affectation de ressources sans fil

35.

MOBILE TERMINAL TEST APPARATUS AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 18062101
Statut En instance
Date de dépôt 2022-12-06
Date de la première publication 2023-06-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Shimakawa, Nobuaki
  • Morita, Atsuki
  • Arayama, Masahiro
  • Kano, Daiki
  • Nakagawa, Daisuke
  • Nakamura, Takumi

Abrégé

There is provided a mobile terminal test apparatus capable of easily assigning and setting a frequency of each CC in the same frequency band of carrier aggregation. An operation unit 4 that accepts an operation input from a user, a display unit 5 that displays an image, and a control unit 6 that sets a contiguousness relationship of the plurality of component carriers and sets a predetermined premise parameter of the component carrier, and then automatically sets the parameter of the component carrier defined by a predetermined communication standard, by designating a type of the contiguousness relationship and a predetermined designation parameter are included.

Classes IPC  ?

36.

WAVEGUIDE CONNECTION STRUCTURE, DETERMINATION METHOD THEREOF, MANUFACTURING METHOD THEREOF, AND WAVEGUIDE SWITCH USING SAME

      
Numéro d'application 18055993
Statut En instance
Date de dépôt 2022-11-16
Date de la première publication 2023-06-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takemoto, Yusa
  • Mattori, Shigenori

Abrégé

Provided is a waveguide connection structure 1 in which two waveguides 10 and 20 respectively formed with waveguide paths 11 and 21 face each other, in which a choke groove 25 having a depth corresponding to a leakage prevention target frequency is provided, at the end face 20a of the waveguide 20, in a band-shaped region whose center is a center of the waveguide path 21, and which is bounded by an inner ellipse and an outer ellipse, the minor radius of the outer ellipse is longer than the minor radius of the inner ellipse by a length corresponding, and the choke groove 25 includes two groove portions 25a and 25b that are in contact with the inner ellipse and the outer ellipse and are located on the longer side of the rectangle, in the band-shaped region.

Classes IPC  ?

  • H01P 3/12 - Guides d'ondes creux
  • H01P 1/10 - Dispositifs commutateurs ou interrupteurs
  • H01P 11/00 - Appareils ou procédés spécialement adaptés à la fabrication de guides d'ondes, résonateurs, lignes ou autres dispositifs du type guide d'ondes

37.

Mobile terminal test device and band filter setting method thereof

      
Numéro d'application 18047809
Numéro de brevet 11799566
Statut Délivré - en vigueur
Date de dépôt 2022-10-19
Date de la première publication 2023-05-18
Date d'octroi 2023-10-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Arayama, Masahiro
  • Morita, Atsuki
  • Shimakawa, Nobuaki
  • Kano, Daiki
  • Nakagawa, Daisuke
  • Nakamura, Takumi

Abrégé

To provide a mobile terminal test device capable of performing a test with high efficiency by automatically setting a Band filter. A mobile terminal test device includes a simulated base station unit 2 that performs 5G NR communication with a mobile terminal 10 in accordance with the 5G NR standard, a scenario processing unit 3 that reads a stored scenario and causes the simulated base station unit 2 to transmit notification information or execute a communication sequence with the mobile terminal 10, based on the scenario, and a control unit 6 that, when being connected to the mobile terminal 10, sets, as a Band filter, a band set as a communicable frequency band and transmits the set band to the mobile terminal 10.

Classes IPC  ?

38.

MOBILE TERMINAL TESTING SYSTEM

      
Numéro d'application 18048634
Statut En instance
Date de dépôt 2022-10-21
Date de la première publication 2023-05-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kano, Daiki
  • Shimakawa, Nobuaki

Abrégé

According to the present invention, provided is a mobile terminal testing system that can be easily adding or deleting test functions of another communication standard to or from test functions of a predetermined communication standard. A mobile terminal testing system includes a mobile terminal testing device 1 including an LTE measurement unit 12 which transmits and receives a signal to and from a mobile terminal by LTE, and an NR measurement unit 13 which transmits and receives the signal to and from the mobile terminal by NR, and a personal computer device 2 including an LTE interface unit 22 which controls an interface with a user for LTE, and an NR interface unit 23 which controls an interface with the user for NR, in which the LTE interface unit 22 and the LTE measurement unit 12 transmit and receive information via the NR interface unit 23.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

39.

MOBILE TERMINAL TESTING SYSTEM AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 18049038
Statut En instance
Date de dépôt 2022-10-24
Date de la première publication 2023-05-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kano, Daiki
  • Shimakawa, Nobuaki

Abrégé

A mobile terminal testing system includes a mobile terminal testing device 1 that includes an LTE measurement unit 12 which transmits and receives a signal to and from a mobile terminal by LTE and an NR measurement unit 13 which transmits and receives the signal to and from the mobile terminal by NR, and a personal computer device 2 that includes an LTE interface unit 22 which controls an interface with a user for LTE and an NR interface unit 23 which controls an interface with the user for NR, in which the LTE interface unit 22 acquires a hardware configuration of the LTE measurement unit 12, and converts and sets a parameter set in the interface with a user into a parameter suitable for the hardware configuration of the LTE measurement unit 12.

Classes IPC  ?

40.

MOBILE TERMINAL TEST DEVICE AND PARAMETER SETTING METHOD THEREOF

      
Numéro d'application 17935660
Statut En instance
Date de dépôt 2022-09-27
Date de la première publication 2023-05-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Inoue, Naoki

Abrégé

To provide a mobile terminal test device capable of efficiently testing a mobile terminal compatible with NSA while suppressing a test configuration to be small. A mobile terminal test device includes a first analysis unit 24a and a second analysis unit 24b that analyze a signal received from a mobile terminal, a first port 21a, a second port 21b, a first port 31a, and a second port 31b connected to the mobile terminal, a selection unit 22 that selects the ports to be connected to the first analysis unit 24a and the second analysis unit 24b, and a control unit 6 that performs control such that it is not possible to perform measurement setting for a measurement target of which it is not possible to simultaneously perform measurement, based on the measurement target to be measured by the set first analysis unit 24a and second analysis unit 24b.

Classes IPC  ?

41.

MOBILE TERMINAL TEST DEVICE AND PORT CONNECTION METHOD THEREOF

      
Numéro d'application 17934649
Statut En instance
Date de dépôt 2022-09-23
Date de la première publication 2023-05-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Inoue, Naoki

Abrégé

To provide a mobile terminal test device capable of efficiently testing a mobile terminal compatible with NSA while suppressing a test configuration to be small. A mobile terminal test device includes a first analysis unit 24a and a second analysis unit 24b that analyze a signal received from a mobile terminal, a selection unit 22 that selects ports for a first port 21a, a second port 21b, a first port 31a, and a second port 31b connected to the mobile terminal, and ports connected to the first analysis unit 24a and the second analysis unit 24b, and a control unit 6 that causes the selection unit 22 to select the ports to be connected to the first analysis unit 24a and the second analysis unit 24b, from a connection state between the port and the mobile terminal.

Classes IPC  ?

  • H04M 1/24 - Dispositions pour les tests
  • H04B 17/21 - Surveillance; Tests de récepteurs pour la correction des mesures

42.

ARTICLE INSPECTION APPARATUS AND ARTICLE INSPECTION METHOD

      
Numéro d'application 18045636
Statut En instance
Date de dépôt 2022-10-11
Date de la première publication 2023-04-20
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takata, Osamu
  • Waki, Shinya

Abrégé

An article inspection apparatus inspects a workpiece W including a plurality of ingredients Wa, Wb, Wc, and Wd by using an inspection image of the workpiece. The article inspection apparatus includes an X-ray image memory 61 that stores information of a predetermined detection value related to the inspection image, a configuration determination unit 53 that determines a material configuration of a content in the workpiece W by performing predetermined recognition processing based on image data of the workpiece W obtained by capturing of the camera 41, and a proposal output unit 54 that, when the configuration determination unit 53 determines the material configuration of the content, estimates detection sensitivity to the predetermined detection value based on information stored in the X-ray image memory 61 and a management sensitivity memory 64, and proposes and outputs a determination criterion for an article inspection.

Classes IPC  ?

43.

ERROR DETECTION DEVICE AND ERROR DETECTION METHOD

      
Numéro d'application 17931237
Statut En instance
Date de dépôt 2022-09-12
Date de la première publication 2023-04-13
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Sunayama, Ryo

Abrégé

It is possible to intuitively identify the reason for the handshake failure. An entire state transition flow including each state based on the communication standard and a state transition condition to be executed between states is displayed as a state transition setting screen 11, and an immediately preceding state in which the state transition fails and the failed state transition condition are highlighted on the state transition setting screen 11, when the handshake with the device under test ends.

Classes IPC  ?

  • G06F 11/27 - Tests intégrés
  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p.ex. essais de mise en route

44.

Error detection device and error detection method

      
Numéro d'application 17931250
Numéro de brevet 11934282
Statut Délivré - en vigueur
Date de dépôt 2022-09-12
Date de la première publication 2023-04-06
Date d'octroi 2024-03-19
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Sunayama, Ryo

Abrégé

a, and input setting for the state transition condition is possible on the state transition setting screen 11.

Classes IPC  ?

  • G06F 11/27 - Tests intégrés
  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p.ex. essais de mise en route

45.

Measurement system and measurement method

      
Numéro d'application 17934016
Numéro de brevet 11965921
Statut Délivré - en vigueur
Date de dépôt 2022-09-21
Date de la première publication 2023-03-30
Date d'octroi 2024-04-23
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Iida, Hiroaki
  • Iwata, Koki
  • Horiuchi, Kayoko

Abrégé

A measurement system and method tests for spurious emissions included in a signal transmitted from a mobile terminal in a shorter time than before. The system includes: a band division unit for dividing the measurement frequency band into a plurality of divided bands; a first spurious measurement control unit which causes a measurement device to measure the spurious emissions of the signal to be measured in each divided band and the peak power of the spear in each divided band; and a first pass/fail determination unit that determines whether or not pass determination criteria is satisfied. The first pass/fail determination unit determines whether the peak power does not exceed the threshold of the pass determination criteria in each divided band. The threshold value of the pass determination criteria is lower than the threshold of the standard determination criteria defined by the 3GPP standard.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • G01R 23/06 - Dispositions pour procéder à la mesure de fréquences, p.ex. taux de répétition d'impulsions; Dispositions pour procéder à la mesure de la période d'un courant ou d'une tension par conversion de la fréquence en une amplitude de courant ou de tension
  • G01R 23/167 - Analyse de spectre; Analyse de Fourier en utilisant des filtres des filtres numériques
  • H04B 17/17 - Détection de contre-performance ou d’exécution défectueuse, p.ex. déviations de réponse

46.

Error rate measuring apparatus and uncorrectable codeword search method

      
Numéro d'application 17661170
Numéro de brevet 11677418
Statut Délivré - en vigueur
Date de dépôt 2022-04-28
Date de la première publication 2023-03-09
Date d'octroi 2023-06-13
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus includes: an operation unit that sets a codeword length, an FEC symbol length, and an FEC symbol error threshold; error counting unit for counting FEC symbol error and an uncorrectable codeword; a display unit that performs display by setting one zone of a display area as one FEC symbol length, matching a zone length of a horizontal axis of the display area with one codeword length, and performing line feed in codeword length units according to presence or absence of the FEC symbol error in FEC symbol length units based on a counting result; search unit for searching for the uncorrectable codeword starting from the cursor on the identification display; and display control unit for performing display control of the cursor at a position of a head error of the searched uncorrectable codeword.

Classes IPC  ?

  • H03M 13/01 - Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes
  • H03M 13/43 - Décodage par logique majoritaire ou selon le seuil
  • H03M 13/25 - Détection d'erreurs ou correction d'erreurs transmises par codage spatial du signal, c. à d. en ajoutant une redondance dans la constellation du signal, p.ex. modulation codée en treillis [TMC]
  • H03M 13/00 - Codage, décodage ou conversion de code pour détecter ou corriger des erreurs; Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes

47.

Error rate measuring apparatus and codeword error display method

      
Numéro d'application 17659924
Numéro de brevet 11632131
Statut Délivré - en vigueur
Date de dépôt 2022-04-20
Date de la première publication 2023-03-09
Date d'octroi 2023-04-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus includes: an operation unit that sets a codeword length, an FEC symbol length, and an FEC symbol error threshold in accordance with a communication standard of a device under test W; error counting means for counting FEC symbol error detected at one FEC symbol interval and an uncorrectable codeword; a display unit that identifies and displays bit string data according to presence or absence of the FEC symbol error in FEC symbol length units based on a counting result; and display control means for performing display control by setting one zone of a display area of identification display as one FEC symbol length, matching a zone length of a horizontal axis of the display area with one codeword length, and performing line feed in codeword length units.

Classes IPC  ?

  • H03M 13/00 - Codage, décodage ou conversion de code pour détecter ou corriger des erreurs; Hypothèses de base sur la théorie du codage; Limites de codage; Méthodes d'évaluation de la probabilité d'erreur; Modèles de canaux; Simulation ou test des codes
  • H03M 13/11 - Détection d'erreurs ou correction d'erreurs transmises par redondance dans la représentation des données, c.à d. mots de code contenant plus de chiffres que les mots source utilisant un codage par blocs, c.à d. un nombre prédéterminé de bits de contrôle ajouté à un nombre prédéterminé de bits d'information utilisant plusieurs bits de parité

48.

MEASUREMENT DEVICE AND MEASUREMENT METHOD

      
Numéro d'application 17664493
Statut En instance
Date de dépôt 2022-05-23
Date de la première publication 2023-03-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Furuki, Atsushi
  • Ishizuka, Yasuji
  • Seto, Shinichi

Abrégé

A network measurement device includes a setting control unit that sets, for example, a single GNSS as a transmission source of a signal of a multi-band, a multi-band abnormality detection unit that detects a multi-band reception abnormality based on an existing GNSS antenna receiving a signal in the multi-band transmitted from the GNSS, which is the transmission source, and reception signal information obtained by reception processing in a state in which the network measurement device is connected to the apparatus of a moving destination, for example, a boundary clock, and the existing GNSS antenna is connected to an antenna input terminal, for example, and an alert notification control unit that notifies a user of an alert notification that a multi-band reception abnormality occurs when a multi-band reception abnormality is detected.

Classes IPC  ?

  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04B 17/15 - Tests de performance
  • H04W 56/00 - Dispositions de synchronisation
  • G01S 19/25 - Acquisition ou poursuite des signaux émis par le système faisant intervenir des données d'assistance reçues en provenance d'un élément coopérant, p.ex. un GPS assisté
  • H04J 3/06 - Dispositions de synchronisation

49.

NETWORK MEASUREMENT DEVICE AND NETWORK MEASUREMENT METHOD

      
Numéro d'application 17804384
Statut En instance
Date de dépôt 2022-05-27
Date de la première publication 2023-03-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Furuki, Atsushi
  • Seto, Shinichi

Abrégé

A network measurement device includes a display control unit that displays location information stored in a location information table and a setting control unit that sets the location information selected from the displayed location information as positioning start location information of a moving destination, and has a configuration of, after setting the positioning start location information, executing positioning at the moving destination based on reception signal information from a GNSS and measuring a time synchronization error between reference time information acquired from the GNSS and reference time information under test used by an apparatus in a location of the moving destination by comparing the reference time information and the reference time information under test.

Classes IPC  ?

  • H04W 4/029 - Services de gestion ou de suivi basés sur la localisation
  • H04W 24/08 - Réalisation de tests en trafic réel
  • G01S 19/24 - Acquisition ou poursuite des signaux émis par le système

50.

Test apparatus and test method

      
Numéro d'application 17663449
Numéro de brevet 11921140
Statut Délivré - en vigueur
Date de dépôt 2022-05-16
Date de la première publication 2023-02-02
Date d'octroi 2024-03-05
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Maruo, Tomohiko
  • Hasegawa, Hiroshi

Abrégé

b, for measuring the transmission characteristics or the reception characteristics of the DUT, a reflector that reflects a radio signal radiated by the first test antenna and converts the radio signal into a plane wave radio signal, and a movable antenna mechanism 60 that moves a position of the second test antenna such that the radio signal is transmitted to or received from the DUT installed in a far field at a plurality of angles of arrival, with reference to a radio-wave arrival direction from the first test antenna.

Classes IPC  ?

  • G01R 29/10 - Diagrammes de rayonnement d'antennes
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

51.

Article inspection apparatus using spectrum analyzer

      
Numéro d'application 17814034
Numéro de brevet 11860110
Statut Délivré - en vigueur
Date de dépôt 2022-07-21
Date de la première publication 2023-02-02
Date d'octroi 2024-01-02
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Arai, Shigeo
  • Taniguchi, Eiji
  • Suzuki, Takashi

Abrégé

To provide an article inspection apparatus capable of sensitively and stably detecting a change in a spectrum when an unspecified foreign substance is contained and determining a defective product. A transport unit that transports a tablet for inspection to an article inspection position, a light irradiation unit that irradiates the tablet transported to the article inspection position with light, a light detection unit that detects light transmitted through the tablet, and an article inspection unit that inspects a quality of the tablet based on spectral characteristics of the light detected by the light detection unit are provided, and the article inspection unit standardizes a measured value of a spectrum of the light detected by the light detection unit for each wavelength and determines whether the tablet is a normal product or a defective product based on a standardized value.

Classes IPC  ?

  • G01N 21/95 - Recherche de la présence de criques, de défauts ou de souillures caractérisée par le matériau ou la forme de l'objet à analyser
  • G01N 21/84 - Systèmes spécialement adaptés à des applications particulières
  • G01N 21/88 - Recherche de la présence de criques, de défauts ou de souillures

52.

Receiving device

      
Numéro d'application 17811165
Numéro de brevet 11665042
Statut Délivré - en vigueur
Date de dépôt 2022-07-07
Date de la première publication 2023-01-26
Date d'octroi 2023-05-30
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Morita, Atsuki
  • Isip, Mark Joseph Aquino

Abrégé

Included are a demodulation unit 20 that demodulates a received OFDM modulation signal to acquire a demodulated constellation signal, an ideal constellation signal generation unit 312 that generates an ideal constellation signal from the demodulated constellation signal, a data extraction unit 313 that extracts signal data included in some symbol sections including a known reference symbol, among all symbol sections, from the demodulated constellation signal and the ideal constellation signal, a phase error calculation unit 314 that calculates the phase error of the demodulated constellation signal for the ideal constellation signal, with respect to the extracted signal data, a phase error characteristics estimation unit 315 that estimates the frequency characteristics of the phase error, and a phase error correction unit 316 that corrects the phase error of the demodulated constellation signal, based on the frequency characteristics of the phase error.

Classes IPC  ?

  • H04L 27/34 - Systèmes à courant porteur à modulation de phase et d'amplitude, p.ex. en quadrature d'amplitude
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission

53.

SIGNAL GENERATING DEVICE AND FLOOR NOISE REDUCTION METHOD THEREFOR

      
Numéro d'application 17807750
Statut En instance
Date de dépôt 2022-06-20
Date de la première publication 2023-01-12
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kaji, Ittetsu
  • Tanaka, Takanori
  • Horiuchi, Kayoko

Abrégé

The signal generating device includes a signal generator that generates a signal of a predetermined frequency, a high-pass filter bank that removes a signal of a frequency lower than or equal to a first frequency lower than a predetermined frequency from the signal generated by the signal generator, a YTF that removes a signal outside a predetermined frequency band from the signal output by the high-pass filter bank, a splitter that distributes the signal output by the YTF into a plurality of signals, two amplifiers that adjust levels of the signals distributed by the splitter, respectively, and two low-pass filter banks that remove signals of frequencies equal to or higher than a second frequency which is higher than the predetermined frequency from each of the signals output by the amplifiers.

Classes IPC  ?

54.

Signal generation apparatus and linearity correction method thereof

      
Numéro d'application 17808165
Numéro de brevet 11909420
Statut Délivré - en vigueur
Date de dépôt 2022-06-22
Date de la première publication 2023-01-05
Date d'octroi 2024-02-20
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kaji, Ittetsu
  • Horiuchi, Kayoko

Abrégé

There are provided a signal generation unit that generates a predetermined digital signal, a level conversion unit that converts a level of the digital signal generated by the signal generation unit, a DA converter that converts the digital signal of which the level is converted by the level conversion unit into an analog signal in a predetermined intermediate frequency bandwidth, and a control unit that creates correction data for correcting a linearity of a level of an output signal of the DA converter for all frequencies to be used, based on actual data which is data of a level of an actual output signal when a setting of the level of the output signal of the DA converter is changed at a predetermined level interval, at a predetermined frequency, and converts a level of an input signal of the DA converter with the correction data.

Classes IPC  ?

  • H03M 1/00 - Conversion analogique/numérique; Conversion numérique/analogique
  • H03M 3/00 - Conversion de valeurs analogiques en, ou à partir d'une modulation différentielle
  • G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie

55.

PRODUCTION MANAGEMENT SYSTEM AND NON-TRANSITORY STORAGE MEDIUM STORING PRODUCTION MANAGEMENT PROGRAM

      
Numéro d'application 17807253
Statut En instance
Date de dépôt 2022-06-16
Date de la première publication 2022-12-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Koizumi, Koji
  • Kawamata, Jyunki

Abrégé

A production management system is capable of detecting an abnormal tendency in a production line device forming a production line and finding out a trouble of the production line device at an early stage. The production management system includes a weighing device and a packaging device which are production line devices, an inspection device, and a host computer. The production line devices, the inspection device, and the host computer are configured to communicate with each other via a network. The inspection device transmits inspection result information in the own device to the host computer. The weighing device and the packaging device transmit processing result information in the own devices to the host computer. The host computer detects the abnormal tendency of the production line device based on the inspection result information and/or the processing result information and outputs an alarm.

Classes IPC  ?

  • G05B 19/418 - Commande totale d'usine, c.à d. commande centralisée de plusieurs machines, p.ex. commande numérique directe ou distribuée (DNC), systèmes d'ateliers flexibles (FMS), systèmes de fabrication intégrés (IMS), productique (CIM)

56.

ERROR RATE MEASURING APPARATUS AND ERROR RATE MEASURING METHOD

      
Numéro d'application 17656502
Statut En instance
Date de dépôt 2022-03-25
Date de la première publication 2022-12-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Sunayama, Ryo

Abrégé

An error rate measuring apparatus detects a bit error of input data returned from a device under test with transmission of a test signal at an error detector, and includes a log recording unit that records log data of state transition of each lane by handshakes of a plurality of lanes in a predetermined communication standard with respect to the device under test in making the device under test transit to a state of LOOPBACK, and a display unit that displays the recorded log data of the state transition of each lane in a time-series order.

Classes IPC  ?

  • G06F 11/263 - Génération de signaux d'entrée de test, p.ex. vecteurs, formes ou séquences de test
  • G06F 11/273 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G06F 11/07 - Réaction à l'apparition d'un défaut, p.ex. tolérance de certains défauts
  • G06F 11/30 - Surveillance du fonctionnement

57.

X-RAY INSPECTION APPARATUS

      
Numéro d'application 17663874
Statut En instance
Date de dépôt 2022-05-18
Date de la première publication 2022-11-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Saito, Naoya
  • Noda, Akihiro
  • Okano, Keishi

Abrégé

There is provided an X-ray inspection apparatus that inspects an inspection object by irradiating the inspection object with X-rays and detecting transmitted X-rays, the apparatus includes a module group (X-ray detection portion) which is disposed inside a housing and in which an electric component that is vulnerable to dew condensation caused by cooling of cooling means is mounted, a humidity sensor that monitors a humidity inside the housing, dehumidifying means (air conditioner) for dehumidifying an inside of the housing, and a control portion that performs supplying of power to the module group when the humidity monitored by the humidity sensor is equal to or lower than a predetermined value.

Classes IPC  ?

  • A61B 6/00 - Appareils pour diagnostic par radiations, p.ex. combinés avec un équipement de thérapie par radiations

58.

PRODUCTION MANAGEMENT SYSTEM AND NON-TRANSITORY STORAGE MEDIUM STORING PRODUCTION MANAGEMENT PROGRAM

      
Numéro d'application 17664068
Statut En instance
Date de dépôt 2022-05-19
Date de la première publication 2022-11-24
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Koizumi, Koji
  • Kawamata, Jyunki

Abrégé

There is provided a production management system capable of grasping a production line device that has caused a decrease in production efficiency and notifying an operator that the production efficiency of the entirety of the production line has decreased. A production line device including a weighing device, a packaging device, an inspection device, and a caser, and a host computer are configured to communicate via a network. In a case where a predetermined event has occurred in each of the production line devices, the production line device transmits event data indicating that the event has occurred, to the host computer. In a case where the host computer determines that production efficiency has decreased, based on the received event data, the host computer specifies the production line device that has caused the decrease in the production efficiency and outputs an alarm indicating that the production efficiency has decreased.

Classes IPC  ?

  • G06Q 50/04 - Fabrication
  • G06Q 10/06 - Ressources, gestion de tâches, des ressources humaines ou de projets; Planification d’entreprise ou d’organisation; Modélisation d’entreprise ou d’organisation

59.

Jitter tolerance measurement apparatus and jitter tolerance measurement method

      
Numéro d'application 17652156
Numéro de brevet 11626944
Statut Délivré - en vigueur
Date de dépôt 2022-02-23
Date de la première publication 2022-10-20
Date d'octroi 2023-04-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

There are provided a data comparison unit that detects an FEC symbol error of a signal under test output from a DUT in accordance with an input of a jitter signal, an error counting unit that counts the number of detected FEC symbol errors for each codeword for each phase modulation amount, a codeword classification unit that classifies a plurality of codewords included in the signal under test into a plurality of groups based on the counted number of FEC symbol errors, a codeword number counting unit that counts the number of codewords in each group for each phase modulation amount, and a display control unit that controls a display of a first graph having a horizontal axis as the phase modulation amount and a vertical axis as a ratio of the number of codewords in each group, on a display screen.

Classes IPC  ?

  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • H04L 1/24 - Tests pour s'assurer du fonctionnement correct
  • H04L 41/22 - Dispositions pour la maintenance, l’administration ou la gestion des réseaux de commutation de données, p.ex. des réseaux de commutation de paquets comprenant des interfaces utilisateur graphiques spécialement adaptées [GUI]
  • H04L 1/20 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue en utilisant un détecteur de la qualité du signal

60.

Optical spectrum analyzer

      
Numéro d'application 17654683
Numéro de brevet 11598669
Statut Délivré - en vigueur
Date de dépôt 2022-03-14
Date de la première publication 2022-09-29
Date d'octroi 2023-03-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Morimoto, Shinji
  • Banno, Motohiro
  • Murakami, Taichi

Abrégé

An optical spectrum analyzer is provided that can separate measurement target light into orthogonal polarization components and perform measurement and enable optical spectrum measurement that does not depend on polarization of the measurement target light. Measurement target light is separated into two orthogonal polarization components, the two polarization components whose position is shifted in an engraved line direction of a diffraction grating are incident on the diffraction grating, diffracted light of the two polarization components emitted from the diffraction grating is condensed, and the condensed diffracted light is incident on an incident side end surface of a 2-core ferrule with the two polarization components adjacent to each other.

Classes IPC  ?

  • G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives
  • G01J 3/18 - Production du spectre; Monochromateurs en utilisant des éléments diffractants, p.ex. réseaux
  • G02B 27/28 - Systèmes ou appareils optiques non prévus dans aucun des groupes , pour polariser

61.

Optical spectrum analyzer and pulse-modulated light measurement method

      
Numéro d'application 17650877
Numéro de brevet 11686617
Statut Délivré - en vigueur
Date de dépôt 2022-02-14
Date de la première publication 2022-09-29
Date d'octroi 2023-06-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Murakami, Taichi
  • Yamazaki, Tomohide

Abrégé

Provided are an optical spectrum analyzer and a pulse-modulated light measurement method capable of measuring pulse-modulated light even when a pulse-on time and a pulse period of the pulse-modulated light are unknown. Pulse-modulated light (DUT) is incident on a diffraction grating 3. A first light receiving unit 8 receives the 0th-order light of diffracted light diffracted by the diffraction grating 3. A second light receiving unit 7 receives diffracted light of an order other than the 0th-order light. A measurement timing signal generation unit 9 generates a sampling signal based on the 0th-order light received by the first light receiving unit. The spectrum of the diffracted light received by the second light receiving unit is measured based on the sampling signal generated by the measurement timing signal generation unit.

Classes IPC  ?

  • G01J 3/18 - Production du spectre; Monochromateurs en utilisant des éléments diffractants, p.ex. réseaux
  • G01M 11/00 - Test des appareils optiques; Test des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs
  • G01J 3/02 - Spectrométrie; Spectrophotométrie; Monochromateurs; Mesure de la couleur - Parties constitutives

62.

SIGNAL ANALYSIS DEVICE AND SIGNAL ANALYSIS RESULT DISPLAY METHOD

      
Numéro d'application 17560891
Statut En instance
Date de dépôt 2021-12-23
Date de la première publication 2022-09-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nitsuma, Yuki
  • Kamisawa, Takaaki

Abrégé

The base station simulator 10 as a signal analysis device performs communication with a UE 70 by simulating a base station to test an operation of a communication function of the UE 70, and includes a reception unit 21a that receives a signal to be measured modulated by an OFDM method, transmitted from the UE 70, an analog signal processing unit 22 that calculates signal data of the signal to be measured received by the reception unit 21a, a data analysis unit 27c that analyzes the signal data for a predetermined analysis item for each time domain defined by the OFDM method, and calculates analysis results of a plurality of analysis items corresponding to each time domain, and an analysis result display unit 28c that displays the analysis results of the plurality of analysis items side by side.

Classes IPC  ?

63.

SIGNAL ANALYSIS DEVICE AND SIGNAL ANALYSIS RESULT DISPLAY METHOD

      
Numéro d'application 17565562
Statut En instance
Date de dépôt 2021-12-30
Date de la première publication 2022-09-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nitsuma, Yuki
  • Kamisawa, Takaaki

Abrégé

The base station simulator 10 as a signal analysis device performs communication with the UE 70 by simulating a base station to test the operation of the communication function of the UE 70, and includes a reception unit 21a that receives a signal to be measured modulated by an OFDM method from the UE 70; an analog signal processing unit 22 that calculates signal data of the signal to be measured received by the reception unit 21a; a data analysis unit 27c that calculates power of the signal data for each frequency in each time, based on the signal data; and an analysis result display unit 28c that displays a distribution of the power of the signal data on a time axis and a frequency axis.

Classes IPC  ?

  • H04W 24/08 - Réalisation de tests en trafic réel
  • H04L 43/045 - Traitement des données de surveillance capturées, p.ex. pour la génération de fichiers journaux pour la visualisation graphique des données de surveillance

64.

DIFFERENTIAL AMPLIFIER WITH VARIABLE FREQUENCY CHARACTERISTICS

      
Numéro d'application JP2022007901
Numéro de publication 2022/186073
Statut Délivré - en vigueur
Date de dépôt 2022-02-25
Date de publication 2022-09-09
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Hirabayashi, Fumihito
  • Kawada, Yumi
  • Kamizono, Takashi

Abrégé

The present invention is provided with a baseband amplifier 100 having an input side differential line and an output side differential line, the baseband amplifier 100 being electrically connected between the two lines, and a peaking amplifier 200 electrically connected between the input side differential line and the output side differential line. The baseband amplifier includes a variable gain differential amplifier 101 able to vary the gain while maintaining a current from a constant current source of a differential circuit constant. An input differential signal is amplified according to a gain frequency characteristic determined by a first frequency characteristic of the baseband amplifier and a second frequency characteristic of the peaking amplifier on the basis of magnitudes and proportions of the gain of the baseband amplifier and the gain of the peaking amplifier, and a frequency characteristic of an output differential signal obtained by the input differential signal being multiplexed while propagating through the output side differential line can be varied by changing the magnitudes and proportions.

Classes IPC  ?

  • H03F 3/189 - Amplificateurs à haute fréquence, p.ex. amplificateurs radiofréquence
  • H03F 3/45 - Amplificateurs différentiels

65.

Error rate measuring apparatus and error distribution display method

      
Numéro d'application 17552608
Numéro de brevet 11714130
Statut Délivré - en vigueur
Date de dépôt 2021-12-16
Date de la première publication 2022-09-08
Date d'octroi 2023-08-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus that measures whether or not an FEC operation of the device under test is possible based on a comparison result of the signal received from the device under test and a test signal includes an operation unit that sets a codeword length and an FEC symbol length of the FEC corresponding to a communication standard of the device under test, a data comparison unit that compares bit string data obtained by converting the signal received from the device under test with error data to detect an FEC symbol error of each FEC symbol length, a display unit that associates the bit string data of the FEC symbol length as one point with one unit region of a display region and performs color-coding display depending on presence or absence of occurrence of the FEC symbol error by each FEC symbol length.

Classes IPC  ?

  • G01R 31/3177 - Tests de fonctionnement logique, p.ex. au moyen d'analyseurs logiques
  • G01R 31/317 - Tests de circuits numériques
  • G06F 11/10 - Détection ou correction d'erreur par introduction de redondance dans la représentation des données, p.ex. en utilisant des codes de contrôle en ajoutant des chiffres binaires ou des symboles particuliers aux données exprimées suivant un code, p.ex. contrôle de parité, exclusion des 9 ou des 11
  • H04L 25/49 - Circuits d'émission; Circuits de réception à au moins trois niveaux d'amplitude

66.

Metal detection apparatus

      
Numéro d'application 17597058
Numéro de brevet 11762118
Statut Délivré - en vigueur
Date de dépôt 2020-05-19
Date de la première publication 2022-08-25
Date d'octroi 2023-09-19
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Taniguchi, Eiji
  • Nishimura, Chie
  • Hayakawa, Yuki

Abrégé

A metal detection apparatus that can accurately and automatically determine whether a metal passing through the inspection area is a magnetic or non-magnetic metal comprises a detection unit quadrature-detecting a differential detection signal of magnetic field fluctuation in the inspection area due to the passage of a workpiece, and a determination unit that determines the presence or absence of a mixed metal based on both fluctuation components after the detection. The determination unit compares sample signal phase data obtained beforehand from the detection signal of the magnetic field fluctuation in the inspection area due to the passage of various metal samples, with the signal phase data obtained from the detection signal of the magnetic field fluctuation in the inspection area due to the passage of the workpiece mixed with metal, and determines the type of metal passing through the inspection area based on the phase determination result.

Classes IPC  ?

  • G01V 3/10 - Prospection ou détection électrique ou magnétique; Mesure des caractéristiques du champ magnétique de la terre, p.ex. de la déclinaison ou de la déviation fonctionnant au moyen de champs magnétiques ou électriques produits ou modifiés par les objets ou les structures géologiques, ou par les dispositifs de détection en utilisant des cadres inducteurs
  • G01R 33/10 - Tracé par points de la répartition de champ
  • G01V 3/08 - Prospection ou détection électrique ou magnétique; Mesure des caractéristiques du champ magnétique de la terre, p.ex. de la déclinaison ou de la déviation fonctionnant au moyen de champs magnétiques ou électriques produits ou modifiés par les objets ou les structures géologiques, ou par les dispositifs de détection
  • G01V 3/38 - Traitement de données, p.ex. pour l'analyse, pour l'interprétation ou pour la correction
  • G01N 27/72 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant des variables magnétiques

67.

Signal generation apparatus and attenuation amount correction method of signal generation apparatus

      
Numéro d'application 17544122
Numéro de brevet 11609264
Statut Délivré - en vigueur
Date de dépôt 2021-12-07
Date de la première publication 2022-08-18
Date d'octroi 2023-03-21
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tomisaki, Koichiro
  • Macabasco, Jesse Paulo Valencia

Abrégé

There is provided an attenuation amount setting unit that sets, in a case where signals are simultaneously output from all output ports of a plurality of interface units at the same signal level, one of the plurality of interface units as the reference interface unit, and adds a difference between an attenuation amount of a second attenuator stored in a storage unit of the reference interface unit and an attenuation amount of another second attenuator stored in another storage unit of the other interface unit to an attenuation amount of each of a plurality of third attenuators of the other interface unit to correct the attenuation amount.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie

68.

Spread spectrum clock generator and spread spectrum clock generation method, pulse pattern generator and pulse pattern generation method, and error rate measuring device and error rate measuring method

      
Numéro d'application 17551874
Numéro de brevet 11588479
Statut Délivré - en vigueur
Date de dépôt 2021-12-15
Date de la première publication 2022-08-11
Date d'octroi 2023-02-21
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

Provided are a spread spectrum clock generator and a spread spectrum clock generation method, a pulse pattern generator and a pulse pattern generation method, and an error rate measuring device and an error rate measuring method capable of improving usability when adjusting a waveform of a modulation signal during training. A setting screen 60 includes a 0-th frequency shift input unit 71 for arbitrarily setting a frequency shift of a waveform of a modulation signal in a plurality of time sections, a first frequency shift input unit 72, a second frequency shift input unit 73, a third frequency shift input unit 74, and a modulation selection unit 67 for switching a waveform pattern of the modulation signal from a first pattern to a second pattern.

Classes IPC  ?

  • G09G 3/20 - Dispositions ou circuits de commande présentant un intérêt uniquement pour l'affichage utilisant des moyens de visualisation autres que les tubes à rayons cathodiques pour la présentation d'un ensemble de plusieurs caractères, p.ex. d'une page, en composant l'ensemble par combinaison d'éléments individuels disposés en matrice
  • H03K 5/156 - Dispositions dans lesquelles un train d'impulsions est transformé en un train ayant une caractéristique désirée
  • G06F 1/04 - Génération ou distribution de signaux d'horloge ou de signaux dérivés directement de ceux-ci

69.

TEMPERATURE TEST APPARATUS AND TEMPERATURE TEST METHOD

      
Numéro d'application 17533710
Statut En instance
Date de dépôt 2021-11-23
Date de la première publication 2022-08-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Morita, Tomonori

Abrégé

The temperature test apparatus includes an OTA chamber 50 as an anechoic box, a heat insulating housing that is accommodated in the OTA chamber, a temperature control device that controls a temperature in the heat insulating housing, a ventilation block 210 that is made of metal and provided to block an opening 502 formed in the OTA chamber, and in which a plurality of through-holes 214 are formed, a first cover 220 that is provided on an outer side of the OTA chamber to cover the ventilation block, and form a first space 225 with the ventilation block, and is joined to a pipe for air from the temperature control device, and a second cover 250 that is provided on an inner side of the OTA chamber to cover the ventilation block, and form a second space 255 communicating with the heat insulating housing, together with the ventilation block.

Classes IPC  ?

  • G01R 29/10 - Diagrammes de rayonnement d'antennes
  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

70.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17544396
Numéro de brevet 11489600
Statut Délivré - en vigueur
Date de dépôt 2021-12-07
Date de la première publication 2022-08-11
Date d'octroi 2022-11-01
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Wu, Zhihui
  • Nakamura, Takumi

Abrégé

d performs a process of setting a next output level for the CC that has not reached the measurement end condition based on the total status, a control is performed to continue a reception sensitivity test until all CCs reach a measurement end condition.

Classes IPC  ?

  • H04B 17/29 - Tests de performance
  • H04B 17/17 - Détection de contre-performance ou d’exécution défectueuse, p.ex. déviations de réponse
  • H04B 17/00 - Surveillance; Tests

71.

TEST OBJECT AND DIAGNOSIS SYSTEM AND GOODS INSPECTION DEVICE USING SUCH OBJECT

      
Numéro d'application 17612069
Statut En instance
Date de dépôt 2020-05-18
Date de la première publication 2022-08-04
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Tamura, Junichi
  • Anzai, Hirotaka
  • Komiyama, Hitoshi

Abrégé

[Problem] [Problem] There is provided a goods inspection device making it possible to make a diagnosis easily for inspection function failure caused by dynamic behavior of goods attributed to a conveyance subsystem of an inspection line. [Problem] There is provided a goods inspection device making it possible to make a diagnosis easily for inspection function failure caused by dynamic behavior of goods attributed to a conveyance subsystem of an inspection line. [Solution] [Problem] There is provided a goods inspection device making it possible to make a diagnosis easily for inspection function failure caused by dynamic behavior of goods attributed to a conveyance subsystem of an inspection line. [Solution] The goods inspection device 1 that inspects goods being carried on an inspection line includes a diagnosis unit 25c that diagnoses a conveyance subsystem of the inspection line, based on data of acceleration and angular velocity obtained with respect to respective axial directions from a test object 2 when the test object 2 having a motion sensor 12 to detect acceleration and angular velocity with respect to respective directions of three-dimensional axes is carried.

Classes IPC  ?

  • B65G 43/00 - Dispositifs de commande, p.ex. de sécurité, d'alarme ou de correction des erreurs
  • G01P 13/00 - Indication ou enregistrement de l'existence ou de l'absence d'un mouvement; Indication ou enregistrement de la direction d'un mouvement
  • G01P 15/18 - Mesure de l'accélération; Mesure de la décélération; Mesure des chocs, c. à d. d'une variation brusque de l'accélération dans plusieurs dimensions
  • G01P 3/00 - Mesure de la vitesse linéaire ou angulaire; Mesure des différences de vitesses linéaires ou angulaires
  • H04W 4/38 - Services spécialement adaptés à des environnements, à des situations ou à des fins spécifiques pour la collecte d’informations de capteurs

72.

Signal generator and a method for controlling the signal generator

      
Numéro d'application 17457972
Numéro de brevet 11762016
Statut Délivré - en vigueur
Date de dépôt 2021-12-07
Date de la première publication 2022-07-28
Date d'octroi 2023-09-19
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Macabasco, Jesse Paulo Valencia
  • Tomisaki, Koichiro

Abrégé

f.

Classes IPC  ?

  • G01R 31/3185 - Reconfiguration pour les essais, p.ex. LSSD, découpage
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G06F 11/27 - Tests intégrés

73.

Error detection device and error detection method

      
Numéro d'application 17510730
Numéro de brevet 11555850
Statut Délivré - en vigueur
Date de dépôt 2021-10-26
Date de la première publication 2022-07-28
Date d'octroi 2023-01-17
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Kidokoro, Hisao

Abrégé

It is possible to know a guideline for adjusting the levels of three voltage thresholds of a PAM4 signal. An error detection device receives a measurement pattern including a pseudo random pattern having equal appearance frequencies of four levels, decodes the measurement pattern into a most significant bit sequence signal MSB and a least significant bit sequence signal LSB, based on three voltage thresholds Vth1, Vth2, and Vth3, identifies and counts, by a level counting unit, the four levels of the measurement pattern, based on the most significant bit sequence signal MSB and the least significant bit sequence signal LSB, and displays numerical values or bar graphs indicating ratios of the appearance frequencies of the four levels of the measurement pattern so as to be in the same order as waveform levels of the measurement pattern, based on a result of the counting.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G01R 31/3183 - Génération de signaux d'entrée de test, p.ex. vecteurs, formes ou séquences de test
  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • H03M 13/35 - Protection inégale ou adaptative contre les erreurs, p.ex. en fournissant un niveau différent de protection selon le poids de l'information d'origine ou en adaptant le codage selon le changement des caractéristiques de la voie de transmission

74.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17541574
Numéro de brevet 11874321
Statut Délivré - en vigueur
Date de dépôt 2021-12-03
Date de la première publication 2022-07-28
Date d'octroi 2024-01-16
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nakamura, Takumi
  • Wu, Zhihui

Abrégé

In an integrated control device 10 of the measurement device 1, a reception sensitivity test control unit 18 repeatedly performs a reception sensitivity test of measuring a throughput of a signal under measurement transmitted from a DUT 100 which has received a test signal while changing an output level of the test signal non-linearly for each of a first orientation (PSa) regulated by a predetermined step interval of a spherical coordinate system and a second orientation (PSb) regulated by a step interval finer than the predetermined step interval, and a peak power measurement control unit 19 sets, as a peak power candidate, reception power within a range of a power width (ΔPw) from the maximum reception power of reception power measured for each first orientation, measures the reception power for each second orientation with respect to the peak power candidate, and determines the peak power based on a measurement result.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux
  • H04B 17/13 - Surveillance; Tests d’émetteurs pour l’étalonnage d’amplificateurs de puissance, p.ex. de gain ou de non-linéarité
  • H04B 17/10 - Surveillance; Tests d’émetteurs

75.

Mobile terminal test apparatus, mobile terminal test system, and control method for mobile terminal test apparatus

      
Numéro d'application 17559266
Numéro de brevet 11463181
Statut Délivré - en vigueur
Date de dépôt 2021-12-22
Date de la première publication 2022-07-28
Date d'octroi 2022-10-04
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kano, Daiki
  • Nakamura, Takumi
  • Nakagawa, Daisuke
  • Takeuchi, Masato

Abrégé

e, lower parameter operation images whose parameter hierarchies are lower than the parameter operation image are updated according to the specification selected by the operation with respect to the first operation image 21.

Classes IPC  ?

76.

X-RAY INSPECTION DEVICE

      
Numéro d'application JP2022000278
Numéro de publication 2022/153920
Statut Délivré - en vigueur
Date de dépôt 2022-01-06
Date de publication 2022-07-21
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Yamazaki, Takeshi
  • Kanai, Takashi

Abrégé

This X-ray inspection device comprises: a transport unit (21) for transporting an object (P) being inspected; an X-ray source (22); an X-ray detection unit (23) having a plurality of sensor elements for receiving X-rays that have passed through the object being inspected; an image data generation unit (41) for generating image data from an X-ray detection output; a quality determination unit (44) that inspects the quality of the object being inspected on the basis of the image data generated and preset determination criteria; and a control unit (4) for controlling the inspection. The control unit (4) is configured to be capable of switching between an inspection mode for the inspection of the object (P) being inspected and a calibration mode for generating calibration data for making the density of the generated image uniform. The control unit (4) includes: a calibration data generation unit (46) for generating, in the calibration mode, calibration data on the basis of the image data generated before and after a calibration member (61) is placed in an inspection area; and a correction unit (432) for correcting, on the basis of the calibration data, the image data of the object (P) being inspected that has passed through the inspection area in the inspection mode.

Classes IPC  ?

  • G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

77.

MEASURING DEVICE AND MEASURING METHOD

      
Numéro d'application 17559370
Statut En instance
Date de dépôt 2021-12-22
Date de la première publication 2022-07-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Nitsuma, Yuki
  • Kamisawa, Takaaki
  • Sakurai, Katsuo
  • Fukuda, Issei
  • Sano, Tomoya

Abrégé

A measuring device 1 tests the operation of the communication function of an UE 70 by performing communication simulating a base station with the UE 70, and includes a reception unit 11a that receives a signal to be measured transmitted from the UE 70, a signal data calculation unit 12 that converts the signal to be measured into a digital signal and calculates signal data, a trigger signal output unit 13 that outputs a trigger signal at a predetermined timing when a predetermined trigger condition is satisfied, a signal extraction unit 14 that receives the trigger signal, and extracts IQ data in a predetermined section according to the predetermined timing from the signal data, and an IQ data analysis unit 52 that analyzes the extracted IQ data.

Classes IPC  ?

  • H04W 24/06 - Réalisation de tests en trafic simulé

78.

ERROR RATE MEASURING APPARATUS AND ERROR COUNT DISPLAY METHOD

      
Numéro d'application 17514325
Statut En instance
Date de dépôt 2021-10-29
Date de la première publication 2022-06-30
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus includes error counting means for comparing bit string data obtained by converting a signal received from the device under test with error data, counting the number of FEC symbol errors by each codeword length in a case where the number of FEC symbol errors is less than the threshold value, and collectively counting the number of FEC symbol errors of codeword lengths in a case where the number of FEC symbol errors is equal to or greater than the threshold value, and display control means for displaying and controlling a list of collected results of the number of FEC symbol errors of each codeword length.

Classes IPC  ?

  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • G06F 3/0482 - Interaction avec des listes d’éléments sélectionnables, p.ex. des menus
  • G06F 3/0484 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI] pour la commande de fonctions ou d’opérations spécifiques, p.ex. sélection ou transformation d’un objet, d’une image ou d’un élément de texte affiché, détermination d’une valeur de paramètre ou sélection d’une plage de valeurs

79.

Error rate measuring apparatus and codeword position display method

      
Numéro d'application 17518981
Numéro de brevet 11687429
Statut Délivré - en vigueur
Date de dépôt 2021-11-04
Date de la première publication 2022-06-23
Date d'octroi 2023-06-27
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Onuma, Hiroyuki

Abrégé

An error rate measuring apparatus includes an operation unit that sets a codeword length and an FEC symbol length, a display unit that displays bit string data obtained by converting a signal from a device under test, a codeword position calculation means for calculating a codeword head position from the FEC symbol length, codeword head symbol information, and an FEC symbol position, calculating codeword position information of a zeroth address of a display screen from the codeword head position, the codeword length, and the FEC symbol length, and calculating position information of a codeword at a currently selected position of a cursor from the codeword position information of the zeroth address of the display screen, the codeword length, the FEC symbol length, and a position of the cursor on the display screen, and display control means for displaying the calculated position information of the codeword on the display screen.

Classes IPC  ?

  • G06F 11/00 - Détection d'erreurs; Correction d'erreurs; Contrôle de fonctionnement
  • G06F 11/263 - Génération de signaux d'entrée de test, p.ex. vecteurs, formes ou séquences de test
  • G06F 11/10 - Détection ou correction d'erreur par introduction de redondance dans la représentation des données, p.ex. en utilisant des codes de contrôle en ajoutant des chiffres binaires ou des symboles particuliers aux données exprimées suivant un code, p.ex. contrôle de parité, exclusion des 9 ou des 11
  • H04L 27/02 - Systèmes à courant porteur à modulation d'amplitude, p.ex. utilisant la manipulation par tout ou rien; Modulation à bande latérale unique ou à bande résiduelle

80.

OTDR measurement apparatus and control method

      
Numéro d'application 17470458
Numéro de brevet 11632172
Statut Délivré - en vigueur
Date de dépôt 2021-09-09
Date de la première publication 2022-04-21
Date d'octroi 2023-04-18
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Takasu, Ryota
  • Murakami, Taichi

Abrégé

It is possible to allow a user to easily distinguish between an event at a place to be resolved and an event at a place having no problem on a path of a PON communication network to be measured. A light intensity distribution of return light is processed in a time-series order to detect an event at each position on a network. A parameter N1 relating to the total number of splitters present on a path of the network is specified, the number N2 of detections of the total number of splitters detected as an event is recognized, and in a case where “N1>N2”, a last detected event is associated with one optical splitter and is further displayed as an “uncertain splitter” in distinction from a normal splitter.

Classes IPC  ?

  • H04B 10/07 - Dispositions pour la surveillance ou le test de systèmes de transmission; Dispositions pour la mesure des défauts de systèmes de transmission
  • H04B 10/071 - Dispositions pour la surveillance ou le test de systèmes de transmission; Dispositions pour la mesure des défauts de systèmes de transmission utilisant un signal réfléchi, p.ex. utilisant des réflectomètres optiques temporels [OTDR]
  • H04Q 11/00 - Dispositifs de sélection pour systèmes multiplex

81.

Receiving device, mobile terminal test apparatus provided with receiving device, and mobile terminal test method

      
Numéro d'application 17480682
Numéro de brevet 11892498
Statut Délivré - en vigueur
Date de dépôt 2021-09-21
Date de la première publication 2022-04-07
Date d'octroi 2024-02-06
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ikebe, Takasumi
  • Goto, Kenji
  • Dangkiw, Mayfor

Abrégé

A receiving device includes a reception unit that samples a sample signal from a DUT 2; an FFT processing unit 21 that performs an FFT process by multiplying the sample signal by a window function; an FFT length setting unit 34 that, when the signal length of the signal to be measured is shorter than the first FFT length conforming to the communication standard, instead of the first FFT length, sets a second FFT length shorter than the signal length of the signal to be measured, as an FFT length of the FFT process; and a window function setting unit 35 that, when the signal length of the signal to be measured is shorter than the first FFT length, instead of a first window function, sets an asymmetric second window function having a peak separated from a center of a window section, as the window function.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p.ex. à l'aide d'un traceur de signaux
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G01R 29/26 - Mesure du coefficient de bruit; Mesure de rapport signal-bruit
  • G01R 23/20 - Mesure de la distorsion non linéaire

82.

Receiving device, mobile terminal test apparatus provided with receiving device, and mobile terminal test method

      
Numéro d'application 17481858
Numéro de brevet 11616677
Statut Délivré - en vigueur
Date de dépôt 2021-09-22
Date de la première publication 2022-04-07
Date d'octroi 2023-03-28
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ikebe, Takasumi
  • Goto, Kenji
  • Dangkiw, Mayfor

Abrégé

A receiving device includes a reception unit 10 that samples a signal to be measured a transmitted from a DUT 2 and acquires a sample signal d; an FFT processing unit 21 that performs an FFT process by multiplying the sample signal; a signal length calculation unit 31 that calculates a signal length of the signal to be measured from the sample signal; a comparing unit 33 that compares the calculated signal length of the signal to be measured with a first FFT length conforming to a communication standard; and an FFT length setting unit 34 that, when as a result of the comparison by the comparing unit, the signal length is shorter than the first FFT length, sets a second FFT length shorter than the signal length of the signal to be measured, as the FFT length of the FFT process by the FFT processing unit.

Classes IPC  ?

  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04B 17/10 - Surveillance; Tests d’émetteurs

83.

Signal analysis apparatus and signal analysis method

      
Numéro d'application 17468795
Numéro de brevet 11463285
Statut Délivré - en vigueur
Date de dépôt 2021-09-08
Date de la première publication 2022-03-31
Date d'octroi 2022-10-04
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Ito, Shinichi
  • Hinooka, Shunsuke
  • Kihara, Yoshitaka
  • Iwamoto, Mamoru

Abrégé

IF2≤+W/2.

Classes IPC  ?

  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p.ex. réseaux de mise en forme adaptatifs
  • H04B 1/26 - Circuits pour récepteurs superhétérodynes

84.

Signal analysis apparatus and signal analysis method

      
Numéro d'application 17478280
Numéro de brevet 11463183
Statut Délivré - en vigueur
Date de dépôt 2021-09-17
Date de la première publication 2022-03-31
Date d'octroi 2022-10-04
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Dangkiw, Mayfor
  • Ikebe, Takasumi
  • Kanno, Hirofumi

Abrégé

IF2′≤+W/2.

Classes IPC  ?

  • H04B 17/30 - Surveillance; Tests de canaux de propagation
  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p.ex. réseaux de mise en forme adaptatifs

85.

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

      
Numéro d'application JP2021033560
Numéro de publication 2022/065110
Statut Délivré - en vigueur
Date de dépôt 2021-09-13
Date de publication 2022-03-31
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Ishida, Masaru

Abrégé

The present invention provides an X-ray inspection device comprising an X-ray generator (21), an X-ray detector (24), and a determination unit (33) which determines the state of quality of an inspection target (W) on the basis of an X-ray detection signal, said X-ray inspection device comprising: an X-ray image storage unit (31) which stores a first X-ray image (Pe) corresponding to an X-ray detection signal for each transmission area; a pseudo 3D information generation model (41) which generates pseudo 3D information relating to a breed under study; an inspection image generation unit (42) which, on the basis of the first inspection image (Pe) relating to the breed under study, uses the pseudo 3D information to create a pseudo second inspection image (Ps1, Ps2) in which the direction of observation differs from that in the first inspection image (Pe), wherein the determination unit (33) makes a determination on the basis of at least the second inspection image (Ps1, Ps2) created by the inspection image generation unit (42).

Classes IPC  ?

  • G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers

86.

Error rate measuring apparatus and error rate measuring method

      
Numéro d'application 17370566
Numéro de brevet 11579192
Statut Délivré - en vigueur
Date de dépôt 2021-07-08
Date de la première publication 2022-03-10
Date d'octroi 2023-02-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kidokoro, Hisao
  • Inaba, Hiroyuki

Abrégé

An error rate measuring apparatus includes a data transmission unit that transmits a test signal of a known pattern and a parameter value defined by a communication standard to a device under test, and a bit error measurement unit that measures a bit error of a signal transmitted from the device under test. The data transmission unit sequentially changes the parameter value and transmits the parameter value to the device under test. The bit error measurement unit measures a bit error of a signal transmitted from the device under test corresponding to the parameter value. The error rate measuring apparatus further includes a discrimination unit that discriminates a parameter value at which the number of bit errors is the least in a measurement result of the bit error measurement unit, as an optimum value of emphasis of an output waveform of the device under test.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/319 - Matériel de test, c. à d. circuits de traitement de signaux de sortie
  • G01R 31/3193 - Matériel de test, c. à d. circuits de traitement de signaux de sortie avec une comparaison entre la réponse effective et la réponse connue en l'absence d'erreur
  • H04L 1/20 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue en utilisant un détecteur de la qualité du signal

87.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17355889
Numéro de brevet 11251879
Statut Délivré - en vigueur
Date de dépôt 2021-06-23
Date de la première publication 2022-02-15
Date d'octroi 2022-02-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Wu, Zhihui
  • Nakamura, Takumi

Abrégé

e for performing a setting process of setting an output level of the test signal to be different from a previous output level according to a comparison result indicating whether a throughput measurement result exceeds a predetermined threshold value and a determination result indicating whether the measured throughput is in the dropped state by the drop determination means, the setting process including a process of performing level down or level up on the output level of the test signal with respect to the previous output level in units of an error tolerance level EL when it is determined to be the dropped state.

Classes IPC  ?

88.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17357384
Numéro de brevet 11356187
Statut Délivré - en vigueur
Date de dépôt 2021-06-24
Date de la première publication 2022-02-03
Date d'octroi 2022-06-07
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Endo, Hideyuki
  • Watanabe, Hironori
  • Nakamura, Takumi
  • Yoshida, Yui

Abrégé

d that displays a measurement progress display screen having a first display area for displaying a result of the reception sensitivity test up to the measurement position where the reception sensitivity test is completed, and a second display area for displaying a progress situation of the measurement of the reception sensitivity test at the measurement position at which the reception sensitivity test is started.

Classes IPC  ?

89.

Receiving device and receiving method, and mobile terminal test apparatus provided with receiving device

      
Numéro d'application 17360422
Numéro de brevet 11528121
Statut Délivré - en vigueur
Date de dépôt 2021-06-28
Date de la première publication 2022-01-27
Date d'octroi 2022-12-13
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Morita, Atsuki

Abrégé

Included are a demodulation unit that demodulates a received OFDM modulation signal to acquire a demodulated constellation signal, an ideal constellation signal generation unit that generates an ideal constellation signal from the demodulated constellation signal, a data extraction unit that extracts signal data corresponding to subcarriers included in a part of an intermediate frequency section among all frequency sections, from the demodulated constellation signal and the ideal constellation signal, a phase error calculation unit that calculates the phase error of the demodulated constellation signal for the ideal constellation signal, with respect to the extracted signal data, a phase error characteristic estimation unit that estimates the frequency characteristic of the phase error, and a phase error correction unit that corrects the phase error of the demodulated constellation signal, based on the frequency characteristic of the phase error.

Classes IPC  ?

  • H04L 7/00 - Dispositions pour synchroniser le récepteur avec l'émetteur
  • H04B 17/00 - Surveillance; Tests
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples

90.

Spread spectrum clock generator and spread spectrum clock generation method, pulse pattern generator and pulse pattern generation method, and error rate measuring device and error rate measuring method

      
Numéro d'application 17332071
Numéro de brevet 11283481
Statut Délivré - en vigueur
Date de dépôt 2021-05-27
Date de la première publication 2022-01-20
Date d'octroi 2022-03-22
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Iwai, Tatsuya

Abrégé

a capable of arbitrarily controlling the frequency shift of the modulation waveform and a slope of the frequency shift in any time section.

Classes IPC  ?

91.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17357170
Numéro de brevet 11290195
Statut Délivré - en vigueur
Date de dépôt 2021-06-24
Date de la première publication 2022-01-06
Date d'octroi 2022-03-29
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Wu, Zhihui
  • Nakamura, Takumi

Abrégé

e for continuing the transmission and reception in a case where a fluctuation range with respect to the previous output level exceeds the error tolerance level, and outputting a test result in a case where the fluctuation range with respect to the previous output level is in a range of the error tolerance level.

Classes IPC  ?

92.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17341926
Numéro de brevet 11387921
Statut Délivré - en vigueur
Date de dépôt 2021-06-08
Date de la première publication 2021-12-23
Date d'octroi 2022-07-12
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Endo, Hideyuki
  • Watanabe, Hironori
  • Nakamura, Takumi
  • Yoshida, Yui

Abrégé

c that returns to measurement at a subsequent measurement position from a measurement position where the disconnection of the call connection is detected after reconnection.

Classes IPC  ?

  • H04W 24/00 - Dispositions de supervision, de contrôle ou de test
  • H04B 17/10 - Surveillance; Tests d’émetteurs
  • H04B 17/15 - Tests de performance
  • H04W 24/06 - Réalisation de tests en trafic simulé

93.

Receiving device and receiving method, and mobile terminal test apparatus provided with receiving device

      
Numéro d'application 17351614
Numéro de brevet 11362876
Statut Délivré - en vigueur
Date de dépôt 2021-06-18
Date de la première publication 2021-12-23
Date d'octroi 2022-06-14
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Morita, Atsuki

Abrégé

A receiving device 100 includes a reception unit 10, a delay signal generation unit 22, a difference calculation unit 23 that calculates a phase difference between the received signal and the delay signal, a variance calculation unit 24 that calculates a variance of the phase difference within a plurality of calculation sections while sliding a set of the plurality of calculation sections which are set corresponding to a cyclic prefix group assigned to a predetermined symbol group included in the received signal, together on the time axis, a symbol detecting unit 25 that detects a position of a symbol in the symbol group on the time axis, based on the position of the minimum peak of the variance on the time axis, and a synchronization timing signal generation unit 29 that generates a synchronization timing signal, based on information on the position of the symbol on the time axis.

Classes IPC  ?

  • H04B 3/46 - Surveillance; Tests
  • H04B 17/00 - Surveillance; Tests
  • H04Q 1/20 - Circuits ou appareils de test; Circuits ou appareils pour détecter, indiquer ou signaler des fautes ou des dérangements
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04B 17/23 - Moyens d’indication, p.ex. affichages, alarmes ou moyens audibles

94.

Thin film board, circuit element, manufacturing method of circuit element, and electric signal transmission method

      
Numéro d'application 17314414
Numéro de brevet 11503714
Statut Délivré - en vigueur
Date de dépôt 2021-05-07
Date de la première publication 2021-11-25
Date d'octroi 2022-11-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s) Kuramitsu, Kota

Abrégé

A thin film board according to the present invention has a structure in which a land, which is a connection portion with a transmission line of a printed circuit board, is used as a back wiring and extends from the end to the inside of the thin film board, and the back wiring and the front wiring are connected by a through hole. In the structure of this thin film board, the land does not become a stub and does not affect the high frequency characteristics of the circuit element. That is, there is no trade-off between the connectivity between the printed circuit board and the thin film board and the high frequency characteristics of the circuit element. Therefore, the thin film board and the circuit element in which the thin film board is mounted on the printed circuit board can support high frequency electric signals up to 60 GHz.

Classes IPC  ?

  • H05K 1/18 - Circuits imprimés associés structurellement à des composants électriques non imprimés
  • H05K 3/40 - Fabrication d'éléments imprimés destinés à réaliser des connexions électriques avec ou entre des circuits imprimés
  • H05K 1/11 - Eléments imprimés pour réaliser des connexions électriques avec ou entre des circuits imprimés

95.

Mobile terminal testing device and mobile terminal testing method

      
Numéro d'application 17321787
Numéro de brevet 11927615
Statut Délivré - en vigueur
Date de dépôt 2021-05-17
Date de la première publication 2021-11-25
Date d'octroi 2024-03-12
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Endo, Hideyuki
  • Watanabe, Hironori
  • Nakamura, Takumi
  • Yoshida, Yui

Abrégé

g at a rotation speed which shortens a time required for the movement in a case where the biaxial positioner is moved at a unit step angle from a measurement position where the measurement is completed to a measurement position where next measurement is performed during the DUT 100 is measured.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • G01R 29/10 - Diagrammes de rayonnement d'antennes
  • H04B 17/00 - Surveillance; Tests

96.

Test apparatus and test method

      
Numéro d'application 17322067
Numéro de brevet 11500004
Statut Délivré - en vigueur
Date de dépôt 2021-05-17
Date de la première publication 2021-11-25
Date d'octroi 2022-11-15
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Maruo, Tomohiko
  • Baba, Hiroyuki

Abrégé

f.

Classes IPC  ?

  • H01Q 15/14 - Surfaces réfléchissantes; Structures équivalentes
  • G01R 29/10 - Diagrammes de rayonnement d'antennes
  • H04B 17/00 - Surveillance; Tests
  • H04B 17/15 - Tests de performance
  • H01Q 15/16 - Surfaces réfléchissantes; Structures équivalentes courbes suivant deux dimensions, p.ex. paraboloïdales
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

97.

Mobile terminal test apparatus, mobile terminal test system, and control method for mobile terminal test apparatus

      
Numéro d'application 17235393
Numéro de brevet 11792663
Statut Délivré - en vigueur
Date de dépôt 2021-04-20
Date de la première publication 2021-10-28
Date d'octroi 2023-10-17
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Kano, Daiki
  • Naruse, Yuki
  • Mineda, Keiichi

Abrégé

Provided is a mobile terminal test apparatus, which is capable of visualizing a correspondence between a plurality of component carriers and a plurality of signal processing units. Provided is a mobile terminal test apparatus including: a plurality of signal processing units; a pseudo base station unit; a test control unit; and a display unit, the test control unit displays, on the display unit, a path image having a first area in which information indicating the plurality of CCs is displayed, a second area in which information indicating the plurality of signal processing units is displayed, and a third area in which information indicating a correspondence between the plurality of CCs displayed in the first area and the plurality of signal processing units displayed in the second area is displayed.

Classes IPC  ?

  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission
  • H04W 88/08 - Dispositifs formant point d'accès
  • H04L 43/50 - Disposition de test
  • H04L 43/045 - Traitement des données de surveillance capturées, p.ex. pour la génération de fichiers journaux pour la visualisation graphique des données de surveillance
  • H04W 24/06 - Réalisation de tests en trafic simulé
  • H04W 24/00 - Dispositions de supervision, de contrôle ou de test

98.

Mobile terminal test device and mobile terminal test method

      
Numéro d'application 17223320
Numéro de brevet 11483725
Statut Délivré - en vigueur
Date de dépôt 2021-04-06
Date de la première publication 2021-10-28
Date d'octroi 2022-10-25
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Sato, Tsuyoshi
  • Goto, Takuma
  • Chino, Shunsuke
  • Yamamoto, Ryoji

Abrégé

Provided is a mobile terminal test device that tests a mobile communication terminal by simulating a mobile communication base station, the mobile terminal test device including: an acquisition unit that acquires terminal capability information, which is information related to a capability of the mobile communication terminal, by communicating with the mobile communication terminal; a generation unit that generates a test case as a combination of parameter setting values set in test parameters based on the terminal capability information; an execution unit that sequentially executes the test cases; an identification unit that identifies a parameter condition in which an error occurs, from a set of test cases in which the error occurred among the executed test cases; and a management unit that excludes unexecuted test cases that meet the identified parameter condition from subsequent execution targets.

Classes IPC  ?

  • H04W 24/00 - Dispositions de supervision, de contrôle ou de test
  • H04W 24/06 - Réalisation de tests en trafic simulé
  • H04W 8/24 - Transfert des données du terminal

99.

Signal generation apparatus and signal generation method

      
Numéro d'application 17231410
Numéro de brevet 11469780
Statut Délivré - en vigueur
Date de dépôt 2021-04-15
Date de la première publication 2021-10-21
Date d'octroi 2022-10-11
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Goto, Kenji
  • Inomata, Ryo
  • Ono, Hirofumi
  • Dangkiw, Mayfor

Abrégé

According to the present disclosure, there is provided a signal generation apparatus including: a base band module (11); a DA converter that converts digital base band signals into modulation signals corresponding to a plurality of cells; an RF converter (20) to which the modulation signals corresponding to the plurality of cells are input, and which outputs an RF signal obtained by frequency-converting the modulation signal; and an RF converter control unit (31), in which the RF converter control unit controls the base band module to reduce a power value of a digital base band signal corresponding to a predetermined cell, among the digital base band signals corresponding to the plurality of cells in the base band module so that an input level of the modulation signal input to the RF converter is equal to or lower than an input limit value of the RF converter.

Classes IPC  ?

  • H04L 25/49 - Circuits d'émission; Circuits de réception à au moins trois niveaux d'amplitude
  • H04B 1/00 - TRANSMISSION - Détails des systèmes de transmission non caractérisés par le milieu utilisé pour la transmission
  • H04B 17/13 - Surveillance; Tests d’émetteurs pour l’étalonnage d’amplificateurs de puissance, p.ex. de gain ou de non-linéarité
  • H04B 10/2575 - Radio sur fibre, p.ex. signal radio modulé en fréquence sur une porteuse optique

100.

Mobile terminal test apparatus, mobile terminal test system, and control method for mobile terminal test apparatus

      
Numéro d'application 17226632
Numéro de brevet 11444705
Statut Délivré - en vigueur
Date de dépôt 2021-04-09
Date de la première publication 2021-10-21
Date d'octroi 2022-09-13
Propriétaire ANRITSU CORPORATION (Japon)
Inventeur(s)
  • Wu, Zhihui
  • Omoto, Reiji

Abrégé

Provided are a mobile terminal test apparatus, a mobile terminal test system, and a control method for a mobile terminal test apparatus, capable of displaying setting information for each signal forming a multiplexed signal on one screen. A part of setting information set in the pseudo base station unit for each of signals forming the multiplexed signal is displayed as first setting information on the display unit, and when one of the signals forming the multiplexed signal is selected in a specific mode by the operation unit, setting information, other than the first setting information, set in the pseudo base station unit for the signal selected by the operation unit is displayed on the display unit, as second setting information such that the second setting information is superimposed on the first setting information.

Classes IPC  ?

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