COLD ATOM GENERATION DEVICE, COLD ATOM GENERATION METHOD, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOM INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
According to the present invention, in a first area that captures atoms in a first state by means of first light and a magnetic field, atoms are optically pumped into a second state and thereby captured by magnetic force. The atoms in the second state captured in the first area are moved from the first area to a second area by means of gravity or the radiation pressure of second light. In the second area, the second light is radiated at the atoms in the second state, and the atoms in the second state are thereby cooled. The atoms are optically pumped into a third state that is insensitive to magnetic fields and thereby released from a magnetic trap and supplied to a downstream device by means of a moving optical lattice or an optical dipole guide.
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 3/00 - Lasers, c. à d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
2.
MAGNETIC OPTICAL TRAP DEVICE, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE WATCH, PHYSICAL PACKAGE FOR ATOMIC WATCH, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTOM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
According to the present invention, atoms are caught by means of a quadruple magnetic field formed by magnets (106), (108) and three groups of laser beam pairs. A portion of the laser beam pairs LZ is masked by the magnets (106), (108), so that a region (114) which is a non-atom catch space is formed inside a crossing region (112) where the three groups of laser beam pairs cross. The inside of the crossing region (112) is irradiated with a laser beam (118) so that atoms inside the non-atom catch space move to the outside of the crossing region (112).
H01S 3/00 - Lasers, c. à d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
3.
ATOM BEAM GENERATION DEVICE, PHYSICS PACKAGE, PHYSICS PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICS PACKAGE FOR ATOMIC CLOCK, PHYSICS PACKAGE FOR ATOMIC INTERFEREROMETER, PHYSICS PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICS PACKAGE SYSTEM
A sample vessel (104) containing a sample (118), a nozzle (106), and a heated body (108) are arranged in a vacuum vessel (102). An induction coil (114) is located on the outside of the vacuum vessel (102). The heated body (108) is located around the sample vessel (104) and the nozzle (106). Electric power is wirelessly supplied from the induction coil (114) to the heated body (108), whereby the heated body (108) is heated. Heating of the heated body (108) causes the sample vessel (104) and the nozzle (106) to be heated, whereby the sample (118) in the sample vessel (104) is heated. An atomic gas generated by the heating of the sample (118) is emitted from the nozzle (106).
A cleaning liquid (112-0) is stored in a cleaning tank (75) before cleaning of a cuvette (92). The cleaning liquid (112-0) in the cleaning tank (75) is retained while the cuvette (92) is being cleaned by a cleaning nozzle (72). At the start of nozzle cleaning after the cleaning of the cuvette (92), a suction nozzle (80) in the cleaning nozzle (72) is inserted into the cleaning liquid (112-0) in the cleaning tank (75). Then, the suction nozzle (80) is further cleaned through discharging and suctioning the cleaning liquid.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
5.
DERIVATIZING COMPOSITION FOR MASS SPECTROMETRY, DERIVATIZATION KIT FOR MASS SPECTROMETRY, MASS SPECTROMETRIC METHOD FOR BIOLOGICAL COMPONENT, AND METHOD FOR PREPARING SAMPLE FOR USE IN MASS SPECTROMETRY
11's each independently represent an alkyl group having 1 to 4 carbon atoms and X represents an N-alkyl-N-morpholinium group or a halogen atom (provided that, when X represents an N-alkyl-N-morpholinium group, X further has a counter ion).
G01N 27/62 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant les décharges électriques, p.ex. l'émission cathodique
C07D 251/46 - Un atome d'azote avec des atomes d'oxygène ou de soufre liés aux deux autres atomes de carbone du cycle
In S14, stirring of a sample is performed by means of a nozzle. In S16, when it has been determined that an elapsed time after the stirring by means of the nozzle does not exceed a predetermined time, sample dispensing is performed using the nozzle in S18. In S16, when it has been determined that an elapsed time after the stirring by means of the nozzle exceeds a predetermined time, steps of S50-S60 are performed. In S56, re-stirring of the sample is performed by a manual operation of an inspector. Instead of re-stirring of the sample by a manual operation, re-stirring of the sample by means of the nozzle may be performed.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
G01N 1/38 - Dilution, dispersion ou mélange des échantillons
7.
MAGNETO-OPTICAL TRAP DEVICE, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL GRID CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
8.
ATOM BEAM GENERATION DEVICE, PHYSICS PACKAGE, PHYSICS PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICS PACKAGE FOR ATOMIC CLOCK, PHYSICS PACKAGE FOR ATOMIC INTERFEREROMETER, PHYSICS PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICS PACKAGE SYSTEM
An atom beam generation device (100) comprises an atomic oven (102) including a sample chamber (106) in which a sample (114) is contained, a deceleration unit (104), and coil units (110, 124). The deceleration unit (104) includes a bore (122) through which an atom gas and a laser light (128) pass, and decelerates an atom gas emitted from the atomic oven (102) by means of light and a magnetic field. The coil units (110, 124) supply Joule heat to the atomic oven (102), and generates a magnetic field in the deceleration unit (104).
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION (Japon)
JEOL LTD. (Japon)
Inventeur(s)
Tanimoto Yasunori
Okano Makoto
Abrégé
The purpose of the present invention is to provide a non-evaporable-getter coating device capable of coating a non-evaporable getter on an inner surface of a vacuum container or a vacuum pipe of various shapes and standards when used by being attached thereto. Provided are: a non-evaporable-getter coating device characterized by including a sputtering target having an internal space, a permanent magnet column disposed in the internal space area of the sputtering target and formed from multiple permanent magnets disposed in series, with the directions of the magnetic fields thereof being alternately arranged, and a flange to which the sputtering target and the permanent magnet column are fixed, wherein the ratio (LM/EDM) of the length LM of the permanent magnet to the external diameter EDM of the permanent magnet is 1.0 to 4.0, and the ratio (EDM/EDN) of the external diameter EDM of the permanent magnet to the external diameter EDN of the sputtering target is 0.3 to 0.8; a method for manufacturing a non-evaporable-getter-coated container and/or a non-evaporable-getter-coated pipe; and the non-evaporable-getter-coated container and/or the non-evaporable-getter-coated pipe.
F04B 37/02 - Pompes spécialement adaptées aux fluides compressibles et ayant des caractéristiques pertinentes non prévues dans les groupes ou présentant un intérêt autre que celui visé par ces groupes pour l'évacuation, par absorption ou adsorption
F04B 37/16 - Moyens pour éliminer les espaces morts
10.
SLOW ATOMIC BEAM GENERATOR, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL GRID CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
A high-temperature tank (116) includes an optical window which transmits a laser (132) and is provided at one end, and a right-angle conical mirror (102) which is provided at the other end, has an opening (106) at the apex and which reflects laser light (132) incident from the optical window towards the one end in an area other than the opening (106). A magnetic field generator (112) generates a magnetic field in the region of intersection of the laser reflected by the right-angle conical mirror (102). A magnetic field gradient relaxation module (130) generates a relaxation magnetic field which relaxes the gradient of the magnetic field generated by the magnetic field generator (112).
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H03L 7/26 - Commande automatique de fréquence ou de phase; Synchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
11.
ATOM BEAM GENERATION DEVICE, PHYSICAL PACKAGE, OPTICAL LATTICE CLOCK PHYSICAL PACKAGE, ATOMIC CLOCK PHYSICAL PACKAGE, ATOMIC INTERFEROMETER PHYSICAL PACKAGE, QUANTUM INFORMATION PROCESSING DEVICE PHYSICAL PACKAGE, AND PHYSICAL PACKAGE SYSTEM
An atomic oven (40) includes a cartridge (200) and a main body (220). The cartridge (200) includes: a holder (202) that accommodates an atom source; and a capillary nozzle (204). The main body (220) includes: a housing (226) in which the cartridge (200) is installed; a button heater (228); an access opening (222a) for removing the cartridge (200) from the main body (220) and placing the cartridge into the main body (220), the access opening (222a) being provided on the atmosphere side, which is outside the main body (220); and a passage from the access opening (222a) to the housing (226). The cartridge (200) is inserted into the main body (220) through the access opening (222a) and is installed in the housing (226). The atom source is heated by the button heater (228), whereby atomic gas generated from the atom source is emitted as an atom beam to the vacuum side, which is outside the main body (220).
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
12.
SLOW ATOMIC BEAM GENERATOR, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL GRID CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
By heating a high-temperature tank (116) with a heater (108), atomic gas is generated in the high-temperature tank (116) from an atomic source. A magneto-optical trap is realized by a laser beam (130) reflected by a right-angled conical mirror (102) and a magnetic field formed by a magnetic field generator (112), and the atomic gas is captured by using the magneto-optical trap and cooled. The captured and cooled atoms are output from an opening (106) to the outside of a slow atom beam generator (100) by a laser beam (132), which is a push laser beam. A slow atomic beam is thereby formed.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
H01S 3/00 - Lasers, c. à d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
13.
TRI-AXIAL MAGNETIC FIELD CORRECTION COIL, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOM INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
The purpose of the present invention is to implement a novel magnetic field correction coil which is compatible with a reduction in size or the portability of a physical package. This tri-axial magnetic field correction coil (96) comprises a first coil group and a second coil group with respect to an X-axis direction that passes through a clock transition space in which atoms are disposed. The first coil group is a Helmholtz-type coil composed in a point-symmetrical shape around the clock transition space (52). The second coil group is composed in a point-symmetrical shape around the clock transition space (52) with respect to the X-axis direction, and is a non-Helmholtz-type coil that is different from the first coil group in terms of coil size, coil shape, or distance between coils.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
H01S 3/00 - Lasers, c. à d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
Provided is a physical package for an optical lattice clock which has a structure that makes it possible to achieve reduction in size or transportation. A physical package (12) is provided with: a Zeeman slower (44) with a partial MOT and a partial MOT device (48) which constitute an MOT device; an optical chamber (46) which constitutes an optical lattice formation part; and a vacuum chamber (20) which surrounds these components and has a substantially cylindrical shape. The MOT device is arranged along the beam axis of an atomic beam (42) and traps an atom cluster. The optical lattice formation part uses optical lattice light that enters therein to form an optical lattice in a cavity, confines the atom cluster trapped by the MOT device in the optical lattice, and transfers, along the X-axis which is a movement axis perpendicular to the beam axis, the atom cluster to a clock transition space (52) which facilitates clock transition. The central axis of the cylinder of the main body (22) of the vacuum chamber (20) passes through the clock transition space (52), and is set to be substantially parallel with the beam axis.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c. à d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
15.
TRIAXIAL MAGNETIC FIELD CORRECTION COIL, PHYSICS PACKAGE, PHYSICS PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICS PACKAGE FOR ATOMIC CLOCK, PHYSICS PACKAGE FOR ATOM INTERFEROMETER, PHYSICS PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICS PACKAGE SYSTEM
There is a need to maintain or enhance the magnetic field correction accuracy of a physics package while making the physics package more compact and portable. A triaxial magnetic field correction coil (96) is provided inside a vacuum chamber (20) surrounding a clock transition space (52) having atoms disposed therein. The triaxial magnetic field correction coil (96) is formed into a shape such that it is possible to correct, for magnetic field components of three axial directions passing through the clock transition space (52), a constant term, a first order spatial derivative term, a second order spatial derivative term, a third or higher order spatial derivative term, or some given combination of these terms. The triaxial magnetic field correction coil (96) can be used in, for example, a physics package (12) for an optical lattice clock.
This invention achieves an optical lattice clock that comprises a new adjustment mechanism for using a magnetic field correction coil to make a magnetic field uniform. The optical lattice clock comprises a clock transition space (52) having disposed therein an atom group (240) trapped in an optical lattice and a triaxial magnetic field correction coil for correcting the magnetic field of the clock transition space. Additionally, in a correction space (242) that includes the clock transition space and is larger than the clock transition space, a photoreceiver (246) serving as an acquisition means promotes the clock transition of the atom group (240) trapped in the optical lattice and acquires a clock transition frequency distribution for the correction space (242). Further, a correction means corrects the magnetic field of the triaxial magnetic field correction coil on the basis of the frequency distribution measured by the acquisition means.
Provided is a method for industrially producing a triazolidinedione compound at a high purity and a high yield. A precipitation step for preparing a solution that contains a triazolidinedione compound represented by formula (1) and precipitating the triazolidinedione compound therefrom is performed. In this step, the pH of the solution is adjusted to 3.0 to 8.5 and the solution is prepared so as to contain 3-15 parts by volume of solvents for 1 part by mass of the triazolidinedione compound. (In the formula, R1 is a substituted or unsubstituted amino group-bearing organic group.)
Provided are a stable triazolinedione adduct, a method for producing the same, a method for producing an ene compound, and a method for analyzing an ene compound. A triazolinedione adduct that is stable until the time of use and can be reacted while reverting to a triazolinedione compound at the time of use. Specifically, a triazolinedione adduct represented by formula (1). (In the formula, R1 is an organic group, and A is a fused ring of three or more rings including at least one aromatic ring.)
Provided are a method for separating a DAPTAD-containing triazolinedione compound in solid form from a reaction solution, a separated solid triazolinedione compound, and a novel method for producing a triazolinedione compound. A triazolinedione solution in which a DAPTAD-containing triazolinedione compound is dissolved is brought into contact with a C5-15 hydrocarbon-based poor solvent to obtain a solid triazolinedione compound. Also, a triazolinedione compound is oxidized using an oxidizing agent that does not produce acid as a byproduct to obtain a triazolinedione compound.
Provided is a method for producing a high-purity, high-quality semicarbazide compound at a high yield by a simple method. The semicarbazide compound is recrystallized by a solvent containing a halogenated hydrocarbon. Dichloromethane is preferred as the halogenated hydrocarbon.
This automated analysis device is characterized in that, during an operation by a sample dispensing mechanism to dispense a sample once, a control unit causes a sample dispensing pump to perform a sample sucking operation a plurality of times, causes a pressure measuring means to measure the pressure inside a sample dispensing flow passage each time the sample dispensing pump performs the sample sucking operation, and determines an abnormality of the sample dispensing mechanism by comparing the pressure output by the pressure measuring means with a preset threshold.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
22.
INDUCTIVE COUPLING IN MULTIPLE RESONANCE CIRCUITS IN A NUCLEAR MAGNETIC RESONANCE PROBE AND METHODS OF USE
In various embodiments of the invention, inductive coupling can be to a secondary coil rather than a primary coil in order to optimize the topology of the NMR probe. In addition, by coupling to a secondary coil using a detection coil located below the lower insulator the RF homogeneity and signal to noise can be improved together with the NMR probe topology. By effecting inductive coupling to an inductor in a multiple resonance circuit, rather than to the sample inductor parameters associated with the NMR, probe construction can be arranged to increase RF homogeneity and signal to noise, while reducing space utilization constraints. In various embodiments of the invention, the primary mode in a secondary coil can be split into two modes with a resonator with inductive coupling to the secondary coil.
G01R 33/36 - Systèmes d'excitation ou de détection, p.ex. utilisant des signaux radiofréquence - Détails électriques, p.ex. adaptations ou couplage de la bobine au récepteur
G01N 24/00 - Recherche ou analyse des matériaux par l'utilisation de la résonance magnétique nucléaire, de la résonance paramagnétique électronique ou d'autres effets de spin
G01N 24/08 - Recherche ou analyse des matériaux par l'utilisation de la résonance magnétique nucléaire, de la résonance paramagnétique électronique ou d'autres effets de spin en utilisant la résonance magnétique nucléaire
G01N 24/12 - Recherche ou analyse des matériaux par l'utilisation de la résonance magnétique nucléaire, de la résonance paramagnétique électronique ou d'autres effets de spin en utilisant la résonance double
A61B 5/055 - Détection, mesure ou enregistrement pour établir un diagnostic au moyen de courants électriques ou de champs magnétiques; Mesure utilisant des micro-ondes ou des ondes radio faisant intervenir la résonance magnétique nucléaire [RMN] ou électronique [RME], p.ex. formation d'images par résonance magnétique
G01R 33/561 - Amélioration ou correction de l'image, p.ex. par des techniques de soustraction ou d'établissement de moyenne par réduction du temps de balayage, c.à d. systèmes d'acquisition rapide, p.ex. utilisant des séquences d'impulsions écho-planar
H01Q 7/00 - Cadres ayant une distribution du courant sensiblement uniforme et un diagramme de rayonnement directif perpendiculaire au plan du cadre
23.
SAMPLE RACK CONVEYANCE DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND SAMPLE RACK RECOVERY METHOD FOR SAMPLE RACK CONVEYANCE DEVICE
This sample rack conveyance device is provided with a conveyance mechanism, a re-inspection waiting tray, a recovery tray, a conveyance lane for re-inspection, a control unit, and a recovery start signal output unit. When a recovery start signal is received from the recovery start signal output unit, the control unit moves a pusher member of the conveyance mechanism so as to abut against the last sample rack which is housed upstream in the conveyance direction in the re-inspection waiting tray or the recovery tray.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
24.
AUTOMATED ANALYSIS DEVICE AND AUTOMATED ANALYSIS METHOD
This automated analysis device has a dispensing mechanism comprising: a probe having an open end for discharging a dispensing liquid; a pump connected to an opposite side of the probe to the open end; and a drive control unit controlling drive of the pump. For discharge drive of the pump to discharge a predetermined amount of a dispensing liquid into a dispensing container from the open end in the probe, the drive control unit controls the drive of the pump such that the pump has a discharge speed that forms a liquid droplet of the dispensing liquid at the open end in the probe in an early stage of the discharge drive and the pump has a discharge speed that forms a liquid column of the dispensing liquid at the open end in the probe in a later stage of the discharge drive.
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
25.
SAMPLE RACK CONVEYANCE DEVICE AND AUTOMATIC ANALYSIS SYSTEM
This sample rack conveyance device is provided with a pusher member, a drive unit, a control unit, a front rack detection sensor, and a pusher displacement amount storage unit. The front rack detection sensor moves together with the pusher member and detects a sample rack which, in the conveyance direction, is arranged in front of the sample rack conveyed by said pusher member. The pusher displacement amount storage unit stores the amount of displacement of the pusher member when this moves from the position where said pusher member starts conveyance of the sample rack. Further, the control unit controls driving of the drive unit on the basis of the amount of displacement stored in the pusher displacement amount storage unit.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
An automatic analyzing apparatus having a stirring mechanism, wherein the stirring mechanism is provided with: a fixed member fixed to the apparatus body; a motor attached to the fixed member; a drive-side helical gear provided on the drive shaft of the motor; bearings provided to the fixed member with the center shaft held parallel to the drive shaft of the motor; a support member of circular column shape, supported so as to be capable of receding from one side relative to the bearings; a driven-side helical gear fixed to an end of the support member coaxially with respect to the support member, the driven-side helical gear being fitted together with the drive-side helical gear with the support member recessed into the bearings; and a stirring rod extending coaxially with the support member from the end of the support member opposite to the end provided with the driven-side helical gear.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 1/38 - Dilution, dispersion ou mélange des échantillons
In the present invention, a container supply unit is provided with a container retaining part, a container discharging part, and a container aligning part. The container aligning part is provided with an alignment rail. The alignment rail has a transport speed ensuring area and a orientation stabilizing area. The transport speed ensuring area is inclined relative to the horizontal direction. The orientation stabilizing area is provided continuously with the side of the transport speed ensuring area that is downstream in the transport direction, and is provided so that the inclination angle relative to the horizontal direction is smaller than the transport speed ensuring area. A movement position is provided on the side of the orientation stabilizing area that is downstream in the transport direction and is positioned parallel to the horizontal direction.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
28.
SPECIMEN RACK TRANSFER DEVICE AND AUTOMATIC ANALYSIS SYSTEM
A specimen rack transfer device 30 is provided with a tray section 51, a pusher mechanism 53, a transfer lane 34, a guide rail 54, and a guide rail movable mechanism 55. The pusher mechanism transfers, in the first direction X, a specimen rack 90 placed on the tray section 51. The transfer lane 34 transfers the specimen rack 90 in the second direction Y. The guide rail is provided on the tray section. Furthermore, the movable mechanism 55 supports the guide rail 54 such that the guide rail can move in the first direction X.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
29.
CONTAINER SUPPLYING UNIT AND AUTOMATIC ANALYSIS DEVICE
This container supplying unit 3 is provided with a container storing part 32, a container discharging part 33, and a container aligning part 34. The container aligning part 34 is provided with an aligning rail 51 and a shutter mechanism 52. The shutter mechanism 52 is provided with a support frame 71, a rotating shaft 74, a first shutter member 72, a second shutter member 73, and a driver. The first shutter member 72 is fixed to the rotating shaft 74, and has a first shutter piece which prevents/allows the movement of the container. The second shutter member 73 is fixed to the rotating shaft at a position spaced farther apart from a feeding position than the first shutter member 72, and has a second shutter piece which prevents/allows the movement of the container.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
B65G 47/88 - Eléments pour séparer ou stopper, p.ex. doigts
30.
SAMPLE RACK CONVEYING APPARATUS AND AUTOMATED ANALYSIS SYSTEM
This sample rack conveying apparatus is provided with a pusher unit (53), a linear motion guide (55), and a conveyance drive mechanism (54). The pusher unit (53) has a base portion (101), a moving member (103), and a base-side guide (102). The base portion (101) is supported by the linear motion guide (55) so as to be movable in a first guide direction. The moving member (103) is provided with a pusher (106a) that pushes a sample rack (90). The base-side guide (102) supports the moving member (103) such that the moving member (103) is movable in a second guide direction that crosses the first guide direction.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
31.
MAGNETIC COUPLING HIGH RESOLUTION NUCLEAR MAGNETIC RESOLUTION PROBE AND METHOD OF USE
The present invention is directed to a method and device of inductive coupling of an idler coil to a parent coil to provide a double resonance circuit without the disadvantages of capacitive coupling to the parent coil. In an embodiment of the invention, an inductive coupling coil can be used to achieve a double-tuned circuit. In an embodiment of the invention, a circuit uses inductive coupling to achieve a double resonance circuit for 1H, 19F, and 13C experiments where one of the three nuclei are observed and the other two are decoupled. In an embodiment of the invention a pivot or a shunt can be used to couple and decouple the idler coil and the parent coil.
G01R 33/36 - Systèmes d'excitation ou de détection, p.ex. utilisant des signaux radiofréquence - Détails électriques, p.ex. adaptations ou couplage de la bobine au récepteur
G01R 33/34 - Systèmes d'excitation ou de détection, p.ex. utilisant des signaux radiofréquence - Détails de structure, p.ex. résonateurs
32.
AUTOMATIC ANALYSIS DEVICE AND SEPARATION AND CLEANING METHOD
An aspect of the present invention is an automatic analysis device having a BF separation process, wherein the width in a container conveyance direction of a surface facing a reaction container of a magnet for preliminary magnetic collection of a first magnetic generation part is set to have a length including a region for housing a liquid sample of the reaction container conveyed to a magnetic collection position of the first magnetic generation part. An end in the container conveyance direction of a surface facing the reaction container of a magnet for regular magnetic collection of a second magnetic generation part is designed to be close to the center of the region for housing the liquid sample of the reaction container conveyed to a magnetic collection position of the second magnetic generation part.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
B03C 1/02 - Séparation magnétique agissant directement sur la substance à séparer
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
33.
LUMINESCENCE MEASURING DEVICE AND AUTOMATIC ANALYSIS DEVICE
The present invention is a luminescence measuring device that is provided with: a black box-like housing having a vessel accommodating portion for accommodating a reaction vessel, a reaction vessel insertion/withdrawal opening for inserting and withdrawing the reaction vessel into and from the vessel accommodating portion, and a penetrating light path that connects the vessel accommodating portion to the outside; a light detector having a light receiving surface, which faces the vessel accommodating portion with the penetrating light path interposed therebetween, and being attached to the housing; a light shielding member having an insertion/withdrawal opening shutter portion, which freely opens and closes the reaction vessel insertion/withdrawal opening, and a detection shutter portion, which freely opens and closes the penetrating light path; and a drive mechanism that synchronizes and drives the insertion/withdrawal opening shutter portion and the detection shutter portion. With the penetrating light path shielded by the detection shutter portion, the reaction vessel insertion/withdrawal opening is configured by the insertion/withdrawal opening shutter portion to be in an open state.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
34.
THREE-DIMENSIONAL IMAGE CONSTRUCTION METHOD, IMAGE PROCESSING DEVICE, AND ELECTRON MICROSCOPE
NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY (Japon)
JEOL LTD. (Japon)
Inventeur(s)
Fujiyoshi, Yoshinori
Ishikawa, Isamu
Hosogi, Naoki
Abrégé
Provided is a three-dimensional image construction method that can construct a three-dimensional image of membrane proteins present in a lipid membrane. This three-dimensional image construction method includes: a step (step S10) for acquiring a first transmission electron micrograph of a sample that contains the membrane proteins that are present in a lipid membrane, the first transmission electron micrograph being captured by radiating an electron beam into the sample from a direction that is inclined with respect to a line that is perpendicular to the membrane surface of the lipid membrane; a step (step S12) for acquiring a second transmission electron micrograph of the sample, the second transmission electron micrograph being captured by radiating an electron beam into the sample perpendicularly with respect to the membrane surface of the lipid membrane; a step (step S14) for specifying, on the basis of the second transmission electron micrograph, the orientation of the membrane proteins in the first transmission electron micrograph; and a step (step S18) for constructing from the first transmission electron micrograph a three-dimensional image of the membrane proteins on the basis of information on the specified orientation of the membrane proteins.
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
H01J 37/22 - Dispositifs optiques ou photographiques associés au tube
35.
SAMPLE INTRODUCTION METHOD, SAMPLE STAGE, AND CHARGED PARTICLE BEAM DEVICE
The sample introduction method for introducing a sample that contains moisture into a sample chamber of a charged particle beam device comprises: a step (S100) for mounting the sample onto a sample holding part; a step (S102) for covering a predetermined region of the sample with a moisture-retaining material; a step (S104) for evacuating the sample chamber housing the sample whereof the predetermined region has been covered with the moisture-retaining material; and a step (S106) for exposing the predetermined region covered with the moisture-retaining material.
To clean a nozzle that is part of an automated analyzer and is provided with both a tubular discharge unit that discharges a cleaning liquid and a tubular suction unit that suctions in cleaning liquid that was discharged from the discharge unit and is running down an outer surface, first the discharge unit is made to start discharging, and then in parallel with said discharging, the suction unit is made to start suctioning. After the suction unit has suctioned in the cleaning liquid running down the aforementioned outer surface for a prescribed length of time, the suctioning is temporarily stopped. Next, after a prescribed amount of the cleaning liquid has accumulated in a cleaning tank, the discharging is stopped, and with the suction unit immersed in the cleaning liquid accumulated in the cleaning tank, the suctioning is restarted.
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p.ex. dispositifs d'aspiration, dispositifs d'injection
G01N 1/00 - Echantillonnage; Préparation des éprouvettes pour la recherche
B08B 3/04 - Nettoyage impliquant le contact avec un liquide
B08B 9/02 - Nettoyage de conduites ou de tubes ou des systèmes de conduites ou de tubes
This invention provides a container supply unit and an automated analyzer in which anomalous orientations of containers ejected from a container (cuvette) ejection part can be prevented in advance. This container supply unit has a container storage part, a container ejection part, and a container alignment part. The container ejection part includes a circular belt, placement members provided on said circular belt, and a belt rotation mechanism. Said belt rotation mechanism rotates the circular belt in an R direction, forming an outward leg along which the placement members move upwards and a return leg along which the placement members move downwards. The placement members carry containers placed thereon on the outward leg and eject said containers to the container alignment part between the outward leg and the return leg. The top of each placement member during the outward leg comprises the following: a first inclined surface that is sloped upwards from one end, on the circular-belt side, towards the other end; and a second inclined surface that is sloped downwards from one end, which connects to the first inclined surface, towards the other end.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
B65G 17/12 - Transporteurs comportant un élément de traction sans fin, p.ex. une chaîne transmettant le mouvement à une surface porteuse de charges continue ou sensiblement continue, ou à une série de porte-charges individuels; Transporteurs à chaîne sans fin dans lesquels des chaînes constituent la surface portant la charge comprenant une série de porte-charges individuels fixés ou normalement fixés à l'élément de traction
B65G 47/14 - Dispositifs pour alimenter en objets ou matériaux les transporteurs pour alimenter en objets à partir de piles d'objets en désordre ou de tas d'objets en vrac disposant ou présentant les objets par des moyens mécaniques ou pneumatiques durant l'alimentation
38.
REAGENT VESSEL HOUSING UNIT AND AUTOMATIC ANALYSIS DEVICE
This reagent vessel housing unit (7) is provided with a drive unit (121), a base member (122), a first opening/closing mechanism (135), and a second opening/closing mechanism (136). By means of the driving force of the drive unit (121), the base member (122) can move to an initial position, at which the cap of a first reagent vessel and the cap of a second reagent vessel are closed, a first opening position at which the cap of the first reagent vessel is opened, and a second opening position at which the cap of the second reagent vessel is opened. The first opening/closing mechanism (135) opens the cap of the first regent vessel. The second opening/closing mechanism (136) opens the cap of the second regent vessel.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet
To provide a measurement-container supply device that can more reliably hold measurement containers and transport same to a prescribed supply position. A supply unit that transports measurement containers to said supply position has a holding part (50) that holds said measurement containers. First slot sections (52), the width of each of which corresponds to the outside diameter of measurement-container body sections, and second slot sections (54), the width of each of which corresponds to the outside diameter of measurement-container neck sections, are formed in the holding part (50). When the holding part (50) is holding a measurement container, a first slot section (52) contacts the outer surface of the body section of said measurement container, a second slot section (54) contacts the outer surface of the neck section of the measurement container, and a step section (56) between that first slot section (52) and that second slot section (54) contacts a step section of the measurement container between the body section and the neck section thereof.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
[Problem] To provide a gripping mechanism capable of suppressing the occurrence of static electricity in or contamination of an article being gripped and capable of stabilizing the posture of the article being gripped. [Solution] A gripping mechanism for gripping cuvettes (T), comprising: a gripping section (50) that grips a cuvette (T) from the side; and a pressing section (60) that presses downwards on the upper end surface of the cuvette (T) held in a gripped state by the gripping section (50). The pressing section (60) is arranged such that the center axis along the vertical direction of the cuvette (T) matches the center axis along the vertical direction of the pressing section (60), when the cuvette (T) is held a gripped state by the gripping section (50).
B25J 15/08 - Têtes de préhension avec des éléments en forme de doigts
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
An alignment transferring unit (30) transfers measuring containers (60) aligned in an alignment rail (32). The measuring containers (60) are supported by suspending on the alignment rail (32) by way of a step portion (66) that is formed by a trunk portion and a neck portion being in contact with the top face (32a) of the alignment rail (32). The alignment rail (32) is disposed to incline down toward the terminal end. The alignment transferring unit (30) has a push-up plate (34) abutting the bottom of the measuring containers (60) supported in the alignment rail (32) and transfers the measuring containers (60) toward the terminal end of the alignment rail (32) by moving the push-up plate (34) or the alignment rail (32) up and down so that a state in which the step portions (66) of the measuring containers (60) are in contact with the top face (32a) of the alignment rail alternates repeatedly with a state in which the step portions (66) are not in contact with the top face (32a) of the alignment rail.
G01N 35/04 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes ; Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse - Détails du transporteur
INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTES OF NATURAL SCIENCES (Japon)
NAGAYAMA IP HOLDINGS, LLC (USA)
JEOL LTD. (Japon)
Inventeur(s)
Nagayama Kuniaki
Arai Yoshihiro
Iijima Hirofumi
Terakawa Susumu
Abrégé
Disclosed is a compound microscope device (1) which is provided with a transmissive electron microscope (2), and an optical microscope (4). On the electron optical axis (C) of an electron beam, a sample (10) and a reflecting mirror (41) are disposed, and the reflecting mirror is tilted from the electron optical axis toward an optical objective lens (43) and the sample. Light, such as fluorescent light, reflected light and the like, which is generated from the sample, is inputted to the optical objective lens by being reflected by the reflecting mirror, and is detected by an optical detecting section (46). The electron beam that has passed through the sample passes through the installation center hole (42) of the reflecting mirror, and is detected by a detecting section (30). Thus, the compound microscope device, whereby the same sample can be observed at the same time by means of the transmissive electron microscope and the optical microscope, is provided.
In the field of semiconductor production using shaped charged particle beam lithography, a pattern is formed on a surface (130) by dragging a charged particle beam (140) across the surface in a single extended shot to form a track. In some embodiments, the track may form a straight path, a curved path, or a perimeter of a curvilinear shape (850,852,854,856,858,860,862). In other embodiments, the width of the track may be altered by varying the velocity of the dragged beam (140). The techniques may be used for manufacturing an integrated circuit by dragging a charged particle beam across a resist-coated wafer to transfer a pattern to the wafer, or by dragging a charged particle beam across a reticle, where the reticle is used to manufacture a photomask which is then used to transfer a pattern to a wafer using an optical lithographic process.
G03F 1/14 - Originaux caractérisés par des détails de structure, p.ex. supports, couches de recouvrement, anneaux pelliculaires
H01J 37/317 - Tubes à faisceau électronique ou ionique destinés aux traitements localisés d'objets pour modifier les propriétés des objets ou pour leur appliquer des revêtements en couche mince, p.ex. implantation d'ions
44.
TRANSMIT-RECEIVE SWITCHING CIRCUIT FOR NUCLEAR MAGNETIC RESONANCE DEVICE AND NUCLEAR MAGNETIC RESONANCE DEVICE
Disclosed is a transmit-receive switching circuit for an NMR device that is well suited for use in solid-state NMR probes with cooled detector coils. A transmit-receive switching circuit for an NMR device, which is used while cooled to a very low temperature to decrease thermal noise, is equipped with a first terminal to which high-power, high-frequency pulses transmitted from the power amplifier of an NMR spectrometer are input, a second terminal that transmits and outputs high-frequency pulses that have been input from the first terminal to an NMR detector via a cross diode, and to which low-power NMR signals detected by the NMR detector are received and input, and a third terminal that transmits and outputs NMR signals received and input from the second terminal to the pre-amp, wherein a shunt is disposed at each 90° shift in the high-frequency phase in the transmission line connecting the second terminal to the third terminal.
G01R 33/36 - Systèmes d'excitation ou de détection, p.ex. utilisant des signaux radiofréquence - Détails électriques, p.ex. adaptations ou couplage de la bobine au récepteur
The sensitivity of a resist formed from hydrosilsesquioxane when a pattern is formed in the resist by irradiation with a charged particle beam is improved. A method for improving the sensitivity of a resist formed from hydrosilsesquioxane to a charged particle beam when a pattern is formed in the resist by irradiation with the charged particle beam is characterized in that the resist which is formed from hydrosilsesquioxane and applied onto a substrate is prebaked at t°C (where 20≤t≤300), a composition containing a water-soluble conductive polymer compound is applied onto the surface to be irradiated with the charged particle beam of the prebaked resist, the applied composition is baked at T°C (where 0≤T
G03F 7/11 - Matériaux photosensibles - caractérisés par des détails de structure, p.ex. supports, couches auxiliaires avec des couches de recouvrement ou des couches intermédiaires, p.ex. couches d'ancrage
46.
ELECTRON BEAM COLUMN FOR WRITING SHAPED ELECTRON BEAMS
An electron beam column comprises a thermal field emission electron source (15) to generate an electron beam (112), an electron beam blanker, a beam shaping module (128), and electron beam optics comprising a plurality of electron beam lenses (154, 160). In one version, the optical parameters of the electron beam blanker, beam shaping module, and electron beam optics are set to achieve an acceptance semi-angle β of from about 1/4 to about 3 mrads, where the acceptance semi-angle β is the half the angle subtended by the electron beam at the writing plane. The beam-shaping module can also operate as a single lens using upper and lower projection lenses. A multifunction module for an electron beam column is also described.
H01J 37/317 - Tubes à faisceau électronique ou ionique destinés aux traitements localisés d'objets pour modifier les propriétés des objets ou pour leur appliquer des revêtements en couche mince, p.ex. implantation d'ions
47.
ELECTRON MICROSCOPE AND COMPOSITE IRRADIATION LENS
NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY (Japon)
JEOL Ltd. (Japon)
Inventeur(s)
Endoh, Hisamitsu
Achihara, Masato
Tsuno, Katsushige
Oikawa, Tetsuo
Abrégé
An electron microscope capable of re-constructing a microscope image free of the imaging aberration due to the imaging lens by using a hologram of diffraction pattern and a composite irradiation lens used in such an electron microscope. The electron microscope comprises an electron source (11), a condenser lens (12), a biprism (13) for splitting an electron beam fed from the condenser lens (12) into first and second coherent electron beams (L1, L2) parallel to each other, a composite irradiation lens (15) for making the first electron beam (L1) a parallel wave and making the second electron beam (L2) a converging wave converging at a predetermined distance, a specimen stage (16) for holding a specimen irradiated with the first electron beam (L1), a detector (17) for detecting a hologram of the diffraction pattern formed by the interference between the first and second electron beams (L1, L2), a computing unit (18) for re-constructing a microscope image of the specimen by subjecting the hologram fed from the detector (17) to predetermined Fourier transform, and a display (19) for displaying the re-constructed microscope image.
NATIONAL UNIVERSITY CORPORATION NARA INSTITUTE OF SCIENCE AND TECHNOLOGY (Japon)
JEOL Ltd. (Japon)
Inventeur(s)
Daimon, Hiroshi
Matsuda, Hiroyuki
Kato, Makoto
Kudo, Masato
Abrégé
A mesh (M) having a shape of a spheroidal surface or a shape near to it is arranged on an electrode (EL1) among electrodes (EL1 to ELn) and voltage of the electrodes (EL2 to ELn) of the latter stages are appropriately set so that a local negative spherical aberration generated by the mesh (M) is compensated by a positive spherical aberration generated by a focusing electric field, thereby forming an optimal electric field distribution. By this, it is possible to realize an electrostatic lens having an intake angle enlarged up to the order of 됙 60 degrees.
G01N 23/227 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p.ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p.ex. microscopie d'émission photo-électronique [PEEM]
49.
METHOD AND DEVICE FOR ANALYZING TIME-OF-FLIGHT MASS
A method and a device for analyzing time-of-flight mass. The device connectable to an orthogonal acceleration ion source for increasing sensitivity by increasing the converging property of ions in the vertical direction comprises the ion source (10) capable of emitting the plurality of ions in a pulse form, an analyzer realizing a spiral route, and a detector (15) detecting the ions. The analyzer for realizing the spiral route is formed of a plurality of laminated toroidal electric fields (1 to 4).
G01N 27/62 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant les décharges électriques, p.ex. l'émission cathodique
H01J 49/06 - Dispositifs électronoptiques ou ionoptiques
brevets
