|
Found results for
patents
1.
|
METHOD FOR ELEMENTAL ANALYSIS OF A SNACK FOOD PRODUCT IN A DYNAMIC PRODUCTION LINE
Application Number |
US2015052510 |
Publication Number |
2016/049610 |
Status |
In Force |
Filing Date |
2015-09-26 |
Publication Date |
2016-03-31 |
Owner |
- FRITO-LAY NORTH AMERICA, INC. (USA)
- APPLIED SPECTRA, INC. (USA)
|
Inventor |
- Fagan, Scott
- Martin, Paul, Allan
- Richardson, Scotty, G.
- Russo, Richard, E.
- Shao, Chen, C.
- Yoo, Jong, Hyun
- Liu, Chunyi
|
Abstract
A method and apparatus for analyzing one or more elements of targeted moving snack food surfaces uses laser-induced breakdown spectroscopy to detect the presence, absence, or amount of an element on a heterogeneous surface, including seasoned and ready -to-eat snack foods. A laser is used to quantify the element concentration without destroying the targeted sample. An automated on-line system may be integrated into the method to create a closed- loop feedback control system, adjusting the concentration as desired.
IPC Classes ?
- G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
|
2.
|
METHOD FOR REAL-TIME OPTICAL DIAGNOSTICS IN LASER ABLATION AND LASER PROCESSING OF LAYERED AND STRUCTURED MATERIALS
Application Number |
US2010055327 |
Publication Number |
2011/056892 |
Status |
In Force |
Filing Date |
2010-11-03 |
Publication Date |
2011-05-12 |
Owner |
APPLIED SPECTRA, INC. (USA)
|
Inventor |
- Yoo, Jong, H.
- Bol'Shakov, Alexander, A.
|
Abstract
A method for real-time optical diagnostics in laser ablation and laser processing of layered or structured materials or material structures. Diagnostics is provided during laser ablation that is utilized regularly in laser processing and/or chemical analysis of structured materials, by means of measuring optical emission generated as a result of the pulsed laser-material interaction in real time. The method can involve a single-layer -film or a stack of multiple layers or a structure of different domains. The method is particularly beneficial in fabrication of thin-film structures, such as photovoltaic and electronic devices or circuits of devices.
IPC Classes ?
- G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
|
3.
|
LASER ABLATION APPARATUS AND METHOD
Application Number |
US2009042862 |
Publication Number |
2009/137494 |
Status |
In Force |
Filing Date |
2009-05-05 |
Publication Date |
2009-11-12 |
Owner |
APPLIED SPECTRA, INC. (USA)
|
Inventor |
- Yoo, Jong, Hyun
- Tribe, Randolph, S.
- Liu, Chunyi
|
Abstract
Provided is a laser ablation spectroscopy apparatus and method. A pulse laser focused on the sample site to generate a plasma plume dunng a laser ablation process. The plasma plume is detected with a spectrometer and an intensified charge coupled device. A sample of matenal is coupled to a stage movable in three axes using an array of x-y-z motors. A change in the sample height is detected using a tπangulation sensor. The apparatus includes a system computer for synchronizing the movement of the stage in all directions dunng the laser ablation process. The method includes a protocol of generating one or more laser ablations per sample site. The spectral data of the total number of laser ablations for each sample site are averaged together. The protocol includes laser ablating additional sample sites and averaging the spectral data of the total number of sample sites
IPC Classes ?
- G01J 3/00 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours
|
|