The present invention enables quick and accurate measurement of the surface shape of an object to be measured comprising a so-called rotating body or a substantially rotating body. This surface shape measurement device measures, by an optical cutting method, the three-dimensional shape of a measurement surface of an object to be measured comprising a rotating body or a substantially rotating body. The surface shape measurement device comprises: a rotation table that rotates an object to be measured which has been placed thereon in the circumferential direction; an encoder that sequentially outputs signals according to the rotation angle of the rotation table; an optical cutting sensor that irradiates the measurement surface with a band-shaped or line-shaped light, and that sequentially images, upon being triggered by the output of the signals from the encoder, an optical cutting line which is formed by the band-shaped or line-shaped light and moves on the measurement surface as the rotation table rotates, thereby obtaining a plurality of optical cutting line image data items; and an image processing unit that generates an image showing the surface shape of the measurement surface by sequentially arranging the optical cutting line image data items respectively according to the corresponding rotation angle.
G01B 11/25 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer des contours ou des courbes en projetant un motif, p.ex. des franges de moiré, sur l'objet
2.
MULTIPLE-DEGREE-OF-FREEDOM DISPLACEMENT MEASUREMENT DEVICE AND MULTIPLE-DEGREE-OF-FREEDOM DISPLACEMENT MEASUREMENT METHOD
This multiple-degree-of-freedom displacement measurement device is provided with: a rotary scale disposed around a first rotation axis, the rotary scale having a scale pattern formed by arranging a plurality of patterns around the circumferential direction; a detection head group including a plurality of detection heads disposed in an installation plane that extends around the first rotation axis and that faces the rotary scale, each of the detection heads reading a pattern from the scale pattern; and a computation unit. On the basis of detection values acquired by the plurality of detection heads, the computation unit calculates a relative rotation angle about the first rotation axis, and calculates, in addition to the relative rotation angle about the first rotation axis, an amount of relative movement in a direction along the first rotation axis, and/or an amount of relative movement in a direction along a second rotation axis orthogonal to the first rotation axis.
G01D 5/12 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensible; Moyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminé; Transducteurs non spécialement adaptés à une variable particulière utilisant des moyens électriques ou magnétiques
G01D 5/20 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensible; Moyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminé; Transducteurs non spécialement adaptés à une variable particulière utilisant des moyens électriques ou magnétiques influençant la valeur d'un courant ou d'une tension en faisant varier l'inductance, p.ex. une armature mobile
3.
SHAPE RECONSTRUCTION METHOD AND IMAGE MEASUREMENT DEVICE
An illumination device 110 includes: a light source unit 112; a lens unit 116 for irradiating a measurement object W with illumination light at a specific irradiation solid angle IS; and a filter unit 114 for separating an area within the specific irradiation solid angle IS into a plurality of solid angle regions IS1, IS2, and IS3 having different light wavelength ranges R, G, and B from each other. An imaging device CM receives, at a predetermined observation solid angle DS, object light from the measurement object W resulting from the illumination light, and has pixels each capable of distinguishing the different light wavelength ranges R, G, and B. The processing device 120 includes: an arithmetic unit 124 for determining normal vector Vn of points on the measurement object W corresponding to the respective pixels from the inclusion relation between a plurality of solid angle regions RS1, RS2, and RS3 forming the object light and the predetermined observation solid angle DS; and a shape reconstruction unit 128 for reconstructing the shape of the measurement object W. This makes it possible to quickly reconstruct information of each point of the measurement object in an image of the measurement object captured.
A high-power fast-pulse driver and illumination system for high speed metrology imaging is provided, which includes an illumination source and a driver circuit configured to overdrive the illumination source using high currents and/or high current densities. The high currents are currents higher than manufacturer-recommended currents, and the high current densities are current densities higher than manufacturer-recommended current densities, used to drive the illumination source. The illumination source is operated using a lifetime preserving technique selected from a first technique of operating the illumination source at low duty cycles of 2% or less or a second technique of operating the illumination source in a burst mode at higher duty cycles for short intervals. The driver and illumination system may be incorporated in a variable focus lens system, to define multiple exposure increments for acquiring one or more images focused at one or more focus planes.
A supplementary metrology position coordinates determination (SMPD) system is used with a robot. "Robot accuracy" (e.g., for controlling and sensing an end tool position of an end tool that is mounted proximate to a distal end of its movable arm configuration) is based on robot position sensors included in the robot. The SMPD system includes an imaging configuration and an XY scale and an alignment sensor for sensing alignment/misalignment therebetween, and an image triggering portion and processing portion. One of the XY scale or imaging configuration is coupled to the movable arm configuration and the other is coupled to a stationary element (e.g., a frame above the robot). The imaging configuration acquires an image of the XY scale with known alignment/misalignment, which is utilized to determine metrology position coordinates that are indicative of the end tool position, with an accuracy level that is better than the robot accuracy.
[Problem] To provide a digital micrometer suitable for measuring an object to be measured that is a strong magnet. [Solution] This digital micrometer is provided with a body frame, a spindle, a thimble part, and a displacement detector that detects the displacement of the spindle. The body frame has a U-frame part, and a spindle holding part provided, on one end side of the U-frame part, so as to have a length in a direction going away from an anvil. The spindle is held in the spindle holding part, is provided so as to be capable of axially advancing/retreating with respect to the anvil, and has a contact on one end surface thereof. The body frame and the spindle are formed of a non-magnetic material.
A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a user interface with a simulation portion (e.g., including a 3D view of a workpiece) and an editing user interface portion (e.g., including an editable plan representation of a current workpiece feature inspection plan). Transparency operations are performed including automatically identifying as a target feature a workpiece feature in the 3D view that corresponds to a workpiece feature or inspection operation representation in the editable plan representation that is indicated by a current feature-directed operation (e.g., a selection operation for selecting a workpiece feature or inspection operation in the editable plan representation). An occluding workpiece feature that would otherwise be occluding at least a portion of the target feature in the 3D view is then automatically rendered as at least partially transparent in the 3D view.
G01B 7/28 - Dispositions pour la mesure caractérisées par l'utilisation de techniques électriques ou magnétiques pour mesurer des contours ou des courbes
G01B 11/00 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques
G01B 21/02 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la longueur, la largeur ou l'épaisseur
G01B 21/04 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la longueur, la largeur ou l'épaisseur en mesurant les coordonnées de points
G05B 19/4099 - Usinage de surface ou de courbe, fabrication d'objets en trois dimensions 3D, p.ex. fabrication assistée par ordinateur
8.
COMPACT MEASUREMENT DEVICE CONFIGURATION FOR INTEGRATING COMPLEX CIRCUITS
A compact coordinate measuring machine (CMM) probe configuration is provided for integrating complex circuits into a CMM probe. The CMM probe configuration includes a stylus position detection portion, a stylus suspension portion and a circuit board assembly. The stylus position detection portion includes an alignment frame and an optical sensing configuration. The circuit board assembly includes a rigid flex circuit element and a three dimensional carrier frame. The rigid flex circuit element includes a set of board portions joined by a set of flexible bend portions. The rigid flex circuit element is folded at the bend portions to locate some of the board portions to be proximate to and/or joined to corresponding support surfaces on the carrier frame. The circuit board assembly at least partially surrounds a majority of the stylus position detection portion and is joined thereto with the carrier frame fixed relative to the alignment frame.
G01B 5/008 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer les coordonnées de points en utilisant des machines de mesure de coordonnées
G01B 5/00 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques
G01B 11/02 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur
G01B 11/03 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur en mesurant les coordonnées de points
G01B 21/04 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la longueur, la largeur ou l'épaisseur en mesurant les coordonnées de points
G01S 7/481 - Caractéristiques de structure, p.ex. agencements d'éléments optiques
9.
SELF-CONFIGURING COMPONENT IDENTIFICATION AND SIGNAL PROCESSING SYSTEM FOR A COORDINATE MEASUREMENT MACHINE
A set of respective self-configuring probe interface circuit boards (SC-MPIC's) are disclosed for use with a measurement system comprising host electronics and respective interchangeable measurement probes. Member SC-MPICs each comprises: a local circuit (LS) for probe identification, signal processing and inter-board signal control; and higher-direction and lower-direction connectors "pointing" toward and away from the measurement probe, respectively. Member SC-MPICs establish a processing hierarchy by generating lower board present signals on their higher-direction connector, higher board present signals on their lower-direction connector, and determining whether they are the highest and/or lowest SC-MPIC based on receiving those signals from adjacent SC-MPICs. They can independently perform probe identification matching operations using probe identification data from compatible and incompatible probes, and the highest SC-MPIC does this first. Member SC-MPICs advantageously pass through or isolate signals from other members in the set depending on the hierarchy, various received signals, and internal processing.
G01B 5/004 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer les coordonnées de points
G01B 21/04 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la longueur, la largeur ou l'épaisseur en mesurant les coordonnées de points
10.
POWER TRANSFER CONFIGURATION FOR SUPPLYING POWER TO A DETACHABLE PROBE FOR A COORDINATE MEASUREMENT MACHINE
A power transfer configuration is disclosed for providing power to a stored coordinate measurement machine (CMM) probe. A storage rack comprising at least one CMM probe receptacle is mounted proximate to a CMM. The CMM may automatically attach and detach from the CMM probe and insert and remove it from the storage rack probe receptacle. The power transfer configuration comprises a primary electromagnetic winding mounted to the storage rack proximate to the probe receptacle, and a secondary electromagnetic winding located internal to and proximate to the CMM probe housing. When the CMM probe is in the probe receptacle, the primary electromagnetic winding receives alternating current and generates a changing electromagnetic field proximate to the CMM probe housing. The secondary electromagnetic winding generates power in the CMM probe in response to receiving the changing electromagnetic field. The CMM probe may be internally heated while stored, using the generated power.
G01B 5/004 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer les coordonnées de points
G01B 1/00 - Instruments de mesure caractérisés par l'usage d'un matériau spécifique
G01B 3/30 - Barres, blocs, ou bandes où la distance entre deux faces est fixe, mais peut être réglée à l'avance, p.ex. calibres de longueur, calibres d'épaisseur
G01P 21/00 - Essai ou étalonnage d'appareils ou de dispositifs couverts par les autres groupes de la présente sous-classe
A coordinate measuring probe body includes a rigid probe body structure including an upper mounting portion, a compliant element mounting frame, and an axial extension portion between them. A stylus suspension portion includes compliant elements that suspend a moving element from the compliant element mounting frame. A displacement sensing arrangement that senses displacement of the moving element includes displacement sensors that output a respective displacement signals. A circuit board assembly that receives the displacement signals has three component mounting portions which are interconnected with a flexible circuit component, and located around the axial extension portion. In various embodiments, all of the compliant elements are located on a distal side of the circuit board assembly.
A touch probe circuit comprises a displacement sensor having a sensor signal responsive to touch probe stylus displacement, an offset compensation controller, and a difference amplifier. The offset compensation controller provides a varying offset compensation signal to compensate drift in a rest-state signal component of the sensor signal. The difference amplifier inputs the offset compensation signal and the sensor signal and amplifies the difference therebetween to provide an offset compensated displacement signal, which is output to a touch trigger signal generating circuit that provides a touch signal when the stylus touches a workpiece, and is also output to the offset compensation controller. The offset compensation controller portion provides a feedback loop that inputs the offset compensated displacement signal and outputs a responsive low pass filtered offset compensation signal to the difference amplifier, in order to provide the offset compensated displacement signal.
G01B 11/00 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques
G01B 11/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés
13.
INSPECTION PROGRAM EDITING ENVIRONMENT INCLUDING INTEGRATED ALIGNMENT PROGRAM PLANNING AND EDITING FEATURES
A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (CMM), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3 D view of a workpiece; an editing user interface portion comprising an editable plan representation of a current workpiece feature inspection plan for the workpiece; and an editable alignment program plan representation for the workpiece. The system is configured with the editable alignment program plan representation being automatically responsive to editing operations, regardless of whether the editing operations are performed in the 3-D view or the editable plan representation. The editing operations include deleting or adding at least one workpiece feature to or from the editable alignment program plan representation.
G01B 21/04 - Dispositions pour la mesure ou leurs détails, où la technique de mesure n'est pas couverte par les autres groupes de la présente sous-classe, est non spécifiée ou est non significative pour mesurer la longueur, la largeur ou l'épaisseur en mesurant les coordonnées de points
G05B 19/18 - Commande numérique (CN), c.à d. machines fonctionnant automatiquement, en particulier machines-outils, p.ex. dans un milieu de fabrication industriel, afin d'effectuer un positionnement, un mouvement ou des actions coordonnées au moyen de données d'u
G05B 19/401 - Commande numérique (CN), c.à d. machines fonctionnant automatiquement, en particulier machines-outils, p.ex. dans un milieu de fabrication industriel, afin d'effectuer un positionnement, un mouvement ou des actions coordonnées au moyen de données d'u caractérisée par des dispositions de commande pour la mesure, p.ex. étalonnage et initialisation, mesure de la pièce à usiner à des fins d'usinage
G06F 7/00 - Procédés ou dispositions pour le traitement de données en agissant sur l'ordre ou le contenu des données maniées
G06F 19/00 - Équipement ou méthodes de traitement de données ou de calcul numérique, spécialement adaptés à des applications spécifiques (spécialement adaptés à des fonctions spécifiques G06F 17/00;systèmes ou méthodes de traitement de données spécialement adaptés à des fins administratives, commerciales, financières, de gestion, de surveillance ou de prévision G06Q;informatique médicale G16H)
A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (CAD) file processing portion, an inspection motion path generation portion and a user interface. The user interface includes a workpiece inspection program simulation portion and auxiliary collision avoidance volume creation elements. The workpiece inspection program simulation portion displays a 3D view and the auxiliary collision avoidance volume creation elements are operable to create or define auxiliary collision avoidance volumes that are displayed in the 3D view. In various implementations, rather than requiring a user to model a physical object (e.g., as part of a workpiece or CMM) in a CAD file, the user may instead create and position an auxiliary collision avoidance volume at a location where the physical object is expected to be, so as to prevent collisions that could occur with the physical object.
B65H 1/00 - Supports ou magasins pour les piles dans lesquelles on prélève des articles
G01B 5/008 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer les coordonnées de points en utilisant des machines de mesure de coordonnées
G01B 5/20 - Dispositions pour la mesure caractérisées par l'utilisation de techniques mécaniques pour mesurer des contours ou des courbes
G06F 3/048 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI]
G06F 15/00 - TRAITEMENT ÉLECTRIQUE DE DONNÉES NUMÉRIQUES Équipement de traitement de données en général
15.
MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING OPERATING CONTEXT AWARE COPY AND PASTE FEATURE
A method is provided for copying and pasting a set of machine vision part program operations when editing a part program in a machine vision inspection system. The method includes: a) selecting at least a first instruction representation at a copy location in a displayed part program representation; b) performing copy operations by executing a first subset of modification operations directed to elements that are specific to a first operating context at the copy location, to thereby generate a partially modified selected instruction representation and/or its underlying instruction code; c) defining a paste location in the displayed part program representation; and d) performing paste operations by executing a second subset of modification operations directed to elements that are specific to a second operating context at the paste location, to thereby generate and paste onto the paste location a fully modified selected instruction representation and/or its underlying instruction code.
A method for operating a chromatic range sensor (CRS) system to identify abnormal spectral profiles arising from light reflected from more than one portion of a workpiece surface is provided. The method comprises: providing a CRS system comprising: an optical element, a light source, and CRS electronics comprising a CRS wavelength detector; operating the CRS system to receive an output spectral profile from a measurement point on a workpiece surface and provide corresponding output spectral profile data; analyzing the output spectral profile data to provide a peak region asymmetry characterization; and providing a corresponding abnormality indicator if the peak region asymmetry characterization indicates that the peak region is abnormally asymmetric.
A method of automatically adjusting lighting conditions improves the results of points from focus (PFF) 3D reconstruction. Multiple lighting levels are automatically found based on brightness criteria and an image stack is taken at each lighting level. In some embodiments, the number of light levels and their respective light settings may be determined based on trial exposure images acquired at a single global focus height which is a best height for an entire region of interest, rather than the best focus height for just the darkest or brightest image pixels in a region of interest. The results of 3D reconstruction at each selected light level are combined using a Z-height quality metric. In one embodiment, the PFF data point Z-height value that is to be associated with an X- Y location is selected based on that PFF data point having the best corresponding Z- height quality metric value at that X-Y location.
G01N 21/00 - Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c. à d. en utilisant des ondes submillimétriques, de la lumière infrarouge, visible ou ultraviolette
18.
REFLECTIVE ENCODER, SCALE THEREOF, AND METHOD FOR MANUFACTURING SCALE
A reflective encoder comprising a light source, a scale forming a plurality of patterns onto which the light is irradiated from the light source, and an optical receiver element for receiving each light reflected by a plurality of patterns, wherein a plurality of optical receiving signals are obtained through a single scale. A plurality of patterns with different thickness are formed on a single track of the scale using dielectric materials, and the light with a plurality of wavelengths whose brightness is different depending on difference in thickness of the dielectric materials are irradiated from the light source to obtain the optical receiving signals for each thickness of the dielectric materials. In such a manner, the scale is reduced in size by superimposing a plurality of patterns on the same track.
G01D 5/30 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensible; Moyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminé; Transducteurs non spécialement adaptés à une variable particulière utilisant des moyens optiques, c. à d. utilisant de la lumière infrarouge, visible ou ultraviolette avec déviation des rayons lumineux, p.ex. pour une indication optique directe les rayons lumineux étant détectés par des cellules photo-électriques
19.
DISPLACEMENT TRANSDUCER WITH SELECTABLE DETECTOR AREA
A displacement measurement device has a detector area which is larger than the area of the beam spot reflected from the measurement surface. The detector area is made larger than the size of the beam spot on the detector area, in order to accommodate shifts in the location of the beam spot due to changes in the precise locations of the components of the displacement measurement device. The subset of pixels in the detector area having advantageous correlation characteristics, is then selected to perform the correlation calculation, thereby reducing data processing time requirements.
G01B 11/16 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la déformation dans un solide, p.ex. indicateur optique de déformation
brevets
