Registre Brevet USPTO
Numéro d'application 16961031
Statut En instance
Date de dépôt 2019-01-08
Date de la première publication 2021-06-03
Date de publication 2021-06-03
Propriétaire Hifi Engineering Inc. (Canada)
  • Adeyemi, Adekunle
  • Jalilian, Seyed Ehsan


There is provided a system for determining multiple baselines for detecting events in a conduit. The system comprises an optical fiber interrogator for interrogating optical fiber; and one or more processors communicative with the optical fiber interrogator and memory having stored thereon computer program code configured, when executed by the one or more processors, to cause the one or more processors to perform a method. The method comprises, for each of multiple channels of the conduit, each channel comprising a portion of the conduit: obtaining phase data for the channel, the phase data being obtained by causing the optical fiber interrogator to interrogate optical fiber positioned alongside the conduit; and determining one or more baselines from the phase data.

Classes IPC  ?

  • G01D 5/353 - Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using optical means, i.e. using infra-red, visible or ultra-violet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells influencing the transmission properties of an optical fibre
  • G01H 9/00 - Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
  • G01K 11/3206 - Measuring temperature based on physical or chemical changes not covered by group , , , or using changes in transmittance, scattering or luminescence in optical fibres at discrete locations in the fibre, e.g. using Bragg scattering
  • G01L 1/24 - Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis