ASML Netherlands B.V.

Netherlands


 
Total IP 6,851
Total IP incl. subs 6,851 (+ 0 for subs)
Total IP Rank # 136
IP Activity Score 4.2/5.0    4,483
IP Activity Rank # 130
Parent Entity ASML Holding N.V.
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

3,910 42
53 7
2,763 39
37
 
Last Patent 2024 - Digital holographic microscope a...
First Patent 1990 - Two-step positioning device usin...
Last Trademark 2023 - ASML PAS
First Trademark 1999 - TWINSCAN

Subsidiaries

1 subsidiaries with IP (0 patents, 0 trademarks)

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Industry (Nice Classification)

Latest Inventions, Goods, Services

2024 Invention Systems and methods for distributing light delivery. A method for improved sequencing of light d...
Invention Method for decoupling sources of variation related to semiconductor manufacturing. Described her...
Invention Charged particle apparatus and method. A charged particle apparatus, configured to project a cha...
2023 Invention Measurement apparatus. In order to improve the throughput performance and/or economy of a measur...
Invention Object table, a stage apparatus and a lithographic apparatus. An object table configured to hold...
Invention Model for calculating a stochastic variation in an arbitrary pattern. A method of determining a ...
Invention Prolonging optical element lifetime in an euv lithography system. Degradation of the reflectivit...
Invention Multiple charged-particle beam apparatus and methods. Systems and methods of mitigating Coulomb ...
Invention Methods and systems for cleaning a portion of a lithography apparatus. Cleaning contamination par...
Invention Linear motor motion system and method. A linear motor motion system is configured to move an obje...
Invention Objective lens system for fast scanning large fov. The device includes a beam source for generat...
Invention Charged particle beam detector with adaptive detection area for multiple field of view settings. ...
Invention Semiconductor detector and method of fabricating same. The present disclosure describes a detect...
Invention Alignment method and associated alignment and lithographic apparatuses. Disclosed is a method for...
Invention Method and apparatus for inspection focus measurement. Systems and methods of measuring a focus p...
Invention Extreme ultraviolet light source obscuration bar and methods. An extreme ultraviolet (EUV) source...
Invention Creating a dense defect probability map for use in a computational guided inspection machine lear...
Invention Systems, methods, and software for overlay model building and application. Systems, methods, and ...
Invention Correcting scan data. A method for correcting scan data generated by scanning a sample with charg...
Invention Contamination control. A lithographic patterning device contamination control assembly comprising...
Invention Optical amplifier. An optical amplifier configured to amplify a laser beam, the optical amplifier...
Invention Position measurement system and lithographic apparatus. In an integrated displacement sensor, a l...
Invention Cooling system for a linear actuator. A cooling system for a linear actuator is described. The sy...
Invention Source optimization for mitigating mask error impact. Systems, methods, and computer software are...
Invention Compact optical arrangement for a metrology system. A metrology system is described. Active or pa...
Invention Charged particle-optical apparatus. An electron-optical projection device for projecting a plural...
Invention Substrate support and lithographic apparatus. A substrate support configured to support a substra...
Invention An illumination module for a metrology device. Disclosed is an illumination configuration module ...
Invention Dose control system. A control apparatus includes: a power controller configured to control an am...
Invention A coated assembly with a brazed feature and a ceramic cvd coating; and processes of fabricating t...
Invention Positioning system and method for positioning a moveable object using a positioning system. The i...
Invention Simulation-assisted methods and software to guide selection of patterns or gauges for lithographi...
Invention Method of tilt metrology and associated apparatuses. Disclosed is metrology method comprising: ob...
Invention Training a machine learning model to predict images representative of defects on a substrate. A m...
Invention Failure mode identification. A computer-implemented method of identifying one or more failures in...
G/S Machines for micro lithography and machines for use in the manufacture, fabrication and treatment...
G/S Machines for micro lithography and machines for use in the fields of integrated circuits, semico...
G/S Registered software, namely, recorded software for the storage, processing and generation of data...
G/S Software, especially software for the storage, processing and generation of data and graphics.
2022 G/S Software, especially software for the storage, processing and generation of data and graphics.
G/S Micro-lithography apparatus and instruments for use in the electronics, micro-lithography, semi-c...
Invention A method for modeling measurement data over a substrate area and associated apparatuses. A metho...
Invention Digital holographic microscope and associated metrology method. A method of correcting a hologra...
Invention Lithographic apparatus and method for illumination uniformity correction. A lithographic apparat...
Invention Method and system for predicting process information with a parameterized model. A method and sy...
Invention Hollow-core optical fiber based radiation source. A radiation source including: a hollow core op...
Invention Target material transfer system components and methods of making the same. A component for a tar...
Invention System and method for inspection by deflector control in a charged particle system. Apparatuses,...
Invention Hollow-core photonic crystal fiber based multiple wavelength light source device. A multiple wav...
Invention Methods and apparatus for characterizing a semiconductor manufacturing process. Methods and appa...
Invention Operating a metrology system, lithographic apparatus, and methods thereof. A method includes det...
Invention Substrate restraining system. A substrate restraining system comprising: a substrate table and a...
Invention Methods and apparatuses for spatially filtering optical pulses. An optical filter apparatus incl...
2021 G/S Recorded software, in particular software for the storage, processing, and generation of data and...
2020 G/S Maintenance and repair services in connection with machines for use in microlithography and in th...
G/S Maintenance and repair services in connection with machines for use in the electronics, micro-lit...
Invention Method and apparatus for coherence scrambling in metrology applications. Disclosed is a pupil sh...
Invention Membrane cleaning apparatus. A membrane cleaning apparatus for removing particles from a membran...
G/S Maintenance and repair services in connection with machines for use in the electronics, micro-li...
2018 G/S Computer hardware and software for the design and manufacture of semiconductor wafers and masks; ...
G/S Computer hardware and software for the design and manufacture of semiconductor wafers and masks;...
2017 G/S Semiconductor lithographic machines, namely, lithographic machines used to manufacture semiconduc...
G/S Computer hardware for improving lithography manufacturing processes; computer software for impro...
G/S Computer hardware for improving lithography manufacturing processes; computer software for improv...
G/S Grinding, cutting, polishing and coating of glass and other optical surfaces Micro-lithography ma...
2016 G/S Micro-lithography equipment; machines for use in the manufacture by micro-lithography, especially...
2015 G/S Exposure units being optical instruments and their parts, for use in lithographic machines, namel...
G/S Exposure units [optical instruments] and their parts, for use in lithographic machines.
Invention Beam grid layout. A sub-beam aperture array for forming a plurality of sub-beams from one or more...
G/S Machine tool for mounting, demounting and remounting a pellicle to a reticle in lithographic equ...
G/S Electronic inspection devices, data processors, computer hardware and software for defect inspect...
G/S [ Electronic inspection devices and ] computer software for inspection of semiconductor materials...
G/S Inspection tool using particle beam for inspection of semiconductor materials, devices and products
2014 G/S Process control equipment for semiconductor wafer production, namely particle beam emitter in the...
G/S Optical measuring apparatus and instruments for measuring test wafers for the manufacture of elec...
G/S Optical measuring apparatus and instruments for measuring test wafers for the manufacture of ele...
2013 G/S Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semic...
G/S Machinery maintenance and repair in the field of semiconductor industry; installation of semicond...
G/S Technology supervision and inspection in the field of quality control of semiconductor wafers and...
2012 G/S testing and inspection in the field of quality control of semiconductor wafers and reticles
G/S Micro-lithography machines, namely, machines for manufacturing electronic components, integrated ...
G/S Micro-lithography machines; machines for use in the electronics, integrated circuit, semi-conduc...
G/S [ Cutting, polishing and heat treatment and coating of glass and other optical surfaces, namely, ...
2011 G/S Machines for micro-lithography, namely, machines for manufacturing semiconductors; machines not i...
G/S Micro-lithography equipment; machines for use in industry in the field of electronics, integrated...
G/S Machines for micro-lithography; machines not included in other classes, for use in the field of ...