ASML Netherlands B.V.

Netherlands


 
Total IP 6,784
Total IP incl. subs 6,784 (+ 0 for subs)
Total IP Rank # 140
IP Activity Score 4.2/5.0    4,439
IP Activity Rank # 130
Parent Entity ASML Holding N.V.
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

3,907 42
49 7
2,703 39
37
 
Last Patent 2024 - Method for generating patterning...
First Patent 1990 - Two-step positioning device usin...
Last Trademark 2023 - ASML PAS
First Trademark 1999 - TWINSCAN

Subsidiaries

1 subsidiaries with IP (0 patents, 0 trademarks)

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Industry (Nice Classification)

Latest Inventions, Goods, Services

2023 Invention Charged particle device and method. The present disclosure provides a charged particle optical d...
Invention Transport system having a magnetically levitated transportation stage. A reticle transport syste...
Invention Data processing device and method, charged particle assessment system and method. A data process...
Invention Charged particle optical device, objective lens assembly, detector, detector array, and methods. ...
Invention Target delivery system. A target delivery system for an extreme ultraviolet (EUV) light source i...
Invention Assessment system, method of assessing. Assessment systems and methods are disclosed. In one arr...
Invention Charged particle assessment system and method. The embodiments of the present disclosure provide...
Invention Method for generating patterning device pattern at patch boundary. A method for generating a mas...
Invention Guiding device and associated system. An extreme ultraviolet radiation (EUV) source, including: ...
Invention Apparatus using multiple beams of charged particles. Disclosed herein is an apparatus comprising...
Invention Systems and methods for thermally conditioning a wafer in a charged particle beam apparatus. An ...
Invention A patterning device voltage biasing system for use in euv lithography. A patterning device voltag...
Invention Pellicle and methods for forming pellicle for use in a lithographic apparatus. A pellicle for use...
Invention Mixed energy control in an euv lithography system. A system for and method of controlling extreme...
Invention Dose control in an extreme ultraviolet light source. A dose controller is configured to: receive ...
Invention Illumination adjustment apparatuses and lithographic apparatuses. An illumination adjustment appa...
Invention Metrology method and associated metrology device. Disclosed is a dark-field metrology method. A f...
Invention Measuring contrast and critical dimension using an alignment sensor. A method can include directi...
Invention Method for monitoring proper functioning of one or more components of a lithography system. Discl...
Invention Euv radiation beam power reduction. A method of providing an additional EUV radiation exposure of...
Invention A multi-pass radiation device. A radiation device for generating broadband output radiation upon ...
Invention Holographic metrology apparatus and method. A method of determining a parameter of interest of a ...
Invention Metrology method and associated metrology device. Disclosed is a method of determining at least o...
Invention Method for configuring a field of view of an inspection apparatus. Disclosed is method for config...
Invention System and method for detecting particles with a detector during inspection. Systems, apparatuses...
Invention Modelling of multi-level etch processes. Disclosed are methods, systems, and computer software fo...
Invention Metrology system and method. A system includes an illumination system, a scanning system, an opti...
Invention Suppressing specular reflection of mask absorber and on- resolution field stitching. Described a ...
Invention Method to stabilize a wavelength of a tunable laser device, tunable laser device, and position me...
Invention A conditioning system, arrangement and method. Disclosed herein is a stand-alone conditioning sys...
G/S Machines for micro lithography and machines for use in the manufacture, fabrication and treatment...
G/S Machines for micro lithography and machines for use in the fields of integrated circuits, semico...
G/S Registered software, namely, recorded software for the storage, processing and generation of data...
G/S Software, especially software for the storage, processing and generation of data and graphics.
2022 G/S Software, especially software for the storage, processing and generation of data and graphics.
G/S Micro-lithography apparatus and instruments for use in the electronics, micro-lithography, semi-c...
Invention Data filter for scanning metrology. A method of processing a data set including equispaced and/o...
Invention Method to predict metrology offset of a semiconductor manufacturing process. A method for determ...
Invention A method and system for predicting aberrations in a projection system. A method of predicting th...
2021 Invention Multi-channel light source for projection optics heating. Systems, apparatuses, and methods are ...
Invention Method for determining a focus actuation profile for one or more actuators of a lithographic expo...
Invention Metrology methods and apparatuses. Disclosed is a method of determining a performance parameter ...
Invention Metrology method and system and lithographic system. A method for measuring a parameter of inter...
Invention Modular autoencoder model for manufacturing process parameter estimation. A modular autoencoder ...
Invention A metrology apparatus and a metrology method. A metrology apparatus for measuring a parameter of...
Invention Methods and apparatus for acoustic metrology. A metrology apparatus for determining one or more ...
Invention An interferometer system, positioning system, a lithographic apparatus, a jitter determination me...
Invention Dual focus soluton for sem metrology tools. There is provided a charged particle apparatus compr...
Invention Data-driven prediction and identification of failure modes based on wafer-level analysis and root...
Invention Operation methods of 2d pixelated detector for an apparatus with plural charged-particle beams an...
Invention Training machine learning models based on partial datasets for defect location identification. A...
Invention Machine learning-based systems and methods for generating synthetic defect images for wafer inspe...
Invention Intensity order difference based metrology system, lithographic apparatus, and methods thereof. ...
G/S Recorded software, in particular software for the storage, processing, and generation of data and...
Invention Semiconductor charged particle detector for microscopy. A detector may be provided for a charged...
2020 G/S Maintenance and repair services in connection with machines for use in microlithography and in th...
G/S Maintenance and repair services in connection with machines for use in the electronics, micro-lit...
Invention Patterning device conditioning system and method. A reticle conditioning system includes: a supp...
G/S Maintenance and repair services in connection with machines for use in the electronics, micro-li...
2018 G/S Computer hardware and software for the design and manufacture of semiconductor wafers and masks; ...
G/S Computer hardware and software for the design and manufacture of semiconductor wafers and masks;...
2017 G/S Semiconductor lithographic machines, namely, lithographic machines used to manufacture semiconduc...
G/S Computer hardware for improving lithography manufacturing processes; computer software for impro...
G/S Computer hardware for improving lithography manufacturing processes; computer software for improv...
G/S Micro-lithography machines, namely, machines for manufacturing electronic components, integrated ...
2016 G/S Micro-lithography equipment; machines for use in the manufacture by micro-lithography, especially...
2015 G/S Exposure units being optical instruments and their parts, for use in lithographic machines, namel...
G/S Exposure units [optical instruments] and their parts, for use in lithographic machines.
G/S Machine tool for mounting, demounting and remounting a pellicle to a reticle in lithographic equ...
G/S Electronic inspection devices, data processors, computer hardware and software for defect inspect...
G/S [ Electronic inspection devices and ] computer software for inspection of semiconductor materials...
G/S Inspection tool using particle beam for inspection of semiconductor materials, devices and products
2014 G/S Process control equipment for semiconductor wafer production, namely particle beam emitter in the...
G/S Optical measuring apparatus and instruments for measuring test wafers for the manufacture of elec...
G/S Optical measuring apparatus and instruments for measuring test wafers for the manufacture of ele...
2013 G/S Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semic...
G/S Machinery maintenance and repair in the field of semiconductor industry; installation of semicond...
G/S Technology supervision and inspection in the field of quality control of semiconductor wafers and...
2012 G/S testing and inspection in the field of quality control of semiconductor wafers and reticles
G/S Micro-lithography machines; machines for use in the electronics, integrated circuit, semi-conduc...
2011 G/S Machines for micro-lithography, namely, machines for manufacturing semiconductors; machines not i...
G/S Micro-lithography equipment; machines for use in industry in the field of electronics, integrated...
G/S Machines for micro-lithography; machines not included in other classes, for use in the field of ...