2021
|
Invention
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Device and method for thermal stabilization of probe elements using a heat conducting wafer. A th... |
2019
|
Invention
|
Pick and place machine cleaning system and method.
A device, mechanism, and methodology for regu... |
2018
|
Invention
|
Apparatuses, device, and methods for cleaning tester interface contact elements and support hardw... |
2010
|
Invention
|
Wafer manufacturing cleaning apparatus, process and method of use.
A cleaning wafer or substrate... |
2009
|
Invention
|
Test cell conditioner (tcc) surrogate cleaning device.
A test cell conditioner (TCC) surrogate c... |
|
G/S
|
Cleaning preparations for collecting and/or removing debris
generated during testing of integrat... |
|
G/S
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Cleaning material comprised of polymer chains used to
collect and/or remove debris generated dur... |
|
G/S
|
Cleaning material used to collect and/or remove debris
generated during testing of integrated ci... |
2005
|
Invention
|
Working surface cleaning system and method.
A cleaning device cleaning method is provided wherei... |
|
Invention
|
Cleaning system, device and method.
The cleaning device may clean probe elements. The probe elem... |
2004
|
Invention
|
Cleaning system, device and method. The cleaning device may clean probe elements. The probe eleme... |
|
Invention
|
Substrate protection system, device and method.
A substrate protection system and method are des... |