Hitachi High-Tech Science Corporation

Japan


 
Total IP 324
Total IP Rank # 3,875
IP Activity Score 2.9/5.0    145
IP Activity Rank # 4,762
Parent Entity Hitachi, Ltd.
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

301 3
0 0
18 2
0
 
Last Patent 2024 - Polarization image acquisition a...
First Patent 1995 - X-ray analyzing apparatus
Last Trademark 2015 - TRIPLEBEAM
First Trademark 2014 - Real View

Industry (Nice Classification)

Latest Inventions, Goods, Services

2023 Invention Polarization image acquisition apparatus and thermal analyzer. The apparatus is attached to a th...
Invention Data processing device for chromatograph, data processing method, and chromatograph. To reduce a...
Invention Spectroscopic analysis system and spectroscopic analysis method. A spectroscopic analysis system...
Invention Liquid chromatographic data processing apparatus. Disclosed is a liquid chromatographic data pro...
Invention Sample container and dynamic mechanical analyzer using the same. In measuring dynamic viscoelast...
Invention X-ray inspection apparatus and method of inspection with x-rays. Proposed are an X-ray inspectio...
Invention Sample cell for fluid sample and x-ray fluorescence analyzer and analysis method using same. Wit...
Invention Apparatus for acquiring polarized images. Disclosed is an apparatus for acquiring polarized imag...
Invention Semiconductor detector and method of manufacturing same. An semiconductor detector includes an n...
2022 Invention Amino acid analysis method and liquid chromatographic apparatus. Disclosed herein are an amino a...
Invention Liquid chromatograph. A liquid chromatograph includes a liquid feeding portion, a sample injecti...
Invention Chromatographic data system processing apparatus. A chromatographic data system processing appar...
Invention Spectrophotometer, spectroscopic measurement method, and program. When a measurement sample whose...
Invention Inspection method and inspection device for membrane electrode assembly. An inspection method of ...
2021 Invention Spectrofluorophotometer, spectrofluoro-measurement method, and image capturing method. Provided i...
Invention Charged particle beam device and method for controlling charged particle beam device. This charge...
Invention Sample piece relocating device. This sample piece relocating device (10) includes an optical int...
Invention Sample piece relocating device. This sample piece relocating device (10) comprises an optical int...
Invention Charged particle beam apparatus and control method thereof. Automated processing is provided. A c...
Invention Machining method and charged particle beam device. This machining method includes: a machining st...
Invention Control method, charged particle beam device, and program. The present invention provides a contr...
Invention Liquid chromatography data processing device, and liquid chromatography device. In order to obta...
Invention Computer, program, and charged particle beam processing system. The present invention provides a ...
Invention Charged particle beam device. This charged particle beam device (10) comprises a focused ion beam...
Invention Charged particle beam device and method for adjusting charged particle beam device. An ion beam l...
Invention Charged particle beam device. A focused ion beam lens barrel (17) of this charged particle beam d...
Invention Focused ion beam device. An ion beam tube (17) of a composite beam device (10) is provided with a...
Invention Automatic sample preparation apparatus. An automatic sample preparation apparatus that automatica...
Invention Focused ion beam processing apparatus. Provided is a focused ion beam processing apparatus includ...
Invention Method for observing biological tissue sample. A method for observing a biological tissue sample...
Invention Particle beam apparatus and composite beam apparatus. Provided is a particle beam apparatus capab...
Invention Charged particle beam apparatus. Provided is a charged particle beam apparatus including a focuse...
Invention Scanning probe microscope and setting method thereof. Provided are a scanning probe microscope an...
Invention Inspecting method and inspection apparatus for membraneelectrode assembly. A method of inspecting...
Invention Sample container for thermal analysis and thermal analyzer. Disclosed is a thermal analyzer allo...
Invention Controller for thermal analysis apparatus, and thermal analysis apparatus. Provided are a control...
2020 Invention Thermal analyzer. Provided is a thermal analyzer, with which a sample can be observed even under ...
Invention Charged particle beam apparatus, composite charged particle beam apparatus, and control method fo...
Invention Focused ion beam apparatus, and control method for focused ion beam apparatus. The focused ion be...
Invention Charged particle beam apparatus. To accomplish fast automated micro-sampling, provided is a charg...
Invention Charged particle beam apparatus. To stabilize automated MS, provided is a charged particle beam a...
Invention Sample holder and charged particle beam device. A sample holder (19) includes a base portion (41)...
Invention Focused ion beam apparatus. The focused ion beam apparatus includes: an electron beam column; a f...
Invention Particle beam irradiation apparatus. The particle beam irradiation apparatus includes: an irradia...
Invention Liquid metal ion source and focused ion beam apparatus. A liquid metal ion source (50) includes: ...
Invention X-ray inspection apparatus and x-ray inspection method. The X-ray inspection apparatus includes a...
2019 Invention Thermogravimetric analyzer
Invention Size distribution measurement device, size distribution measurement method, and sample container....
2015 G/S Focused ion beam apparatus for observing, processing and preparing samples
2014 G/S Optical microscopes and their parts and accessories, namely, lenses and reflectors; scanning prob...
G/S Optical microscopes and their parts and accessories; scanning probe microscopes and their parts ...
G/S Differential scanning calorimeters and their parts and accessories; differential thermal analyze...
G/S Differential scanning calorimeters and structural parts thereof; differential scanning calorimete...