Provided is a method for selecting arsenic-containing minerals.
Provided is a method for selecting arsenic-containing minerals.
A peptide comprising an amino acids sequence according to the following formula:
Provided is a method for selecting arsenic-containing minerals.
A peptide comprising an amino acids sequence according to the following formula:
(T,S,N,Q)-(L,I,V,F,A)-(E,D)-(R,K,N,M,D,C,P,Q,S,E,T,G,W,H,Y)-(L,I,V,F,A)-(R,K,N,M,D,C,P,Q,S,E,T,G,W,H,Y)-(L,I,V,F,A)-(L,I,V,F,A)-(L,I,V,F,A)-(R,H,K)-(T,S,N,Q)-(T,S,N,Q)
Provided is a method for selecting arsenic-containing minerals.
A peptide comprising an amino acids sequence according to the following formula:
(T,S,N,Q)-(L,I,V,F,A)-(E,D)-(R,K,N,M,D,C,P,Q,S,E,T,G,W,H,Y)-(L,I,V,F,A)-(R,K,N,M,D,C,P,Q,S,E,T,G,W,H,Y)-(L,I,V,F,A)-(L,I,V,F,A)-(L,I,V,F,A)-(R,H,K)-(T,S,N,Q)-(T,S,N,Q)
wherein one amino acid is respectively selected from each group defined by paired parentheses.
C07K 7/08 - Linear peptides containing only normal peptide links having 12 to 20 amino acids
C12N 15/70 - Vectors or expression systems specially adapted for E. coli
2.
METHOD FOR DISSOLVING LITHIUM COMPOUND, METHOD FOR MANUFACTURING LITHIUM CARBONATE, AND METHOD FOR RECOVERING LITHIUM FROM LITHIUM ION SECONDARY CELL SCRAP
A method for dissolving a lithium compound according to the present invention includes bringing a lithium compound into contact with water or an acidic solution, and feeding, separately from the lithium compound, a carbonate ion to the water or the acidic solution to produce carbonic acid, and allowing the carbonic acid to react with the lithium compound to produce lithium hydrogen carbonate.
A sputtering target containing silicon nitride (Si3N4) with reduced specific resistance of is provided. A sputtering target including Si3N4, SiC, MgO and TiCN, wherein a specific resistance of the sputtering target is 10 mΩ·cm or less.
C23C 14/06 - Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
C04B 35/58 - Shaped ceramic products characterised by their composition; Ceramic compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxides based on borides, nitrides or silicides
This copper alloy for an electronic material contains at most 1.0 mass% of Ni, 0.5-2.5 mass% of Co, and Si in an amount resulting in a mass ratio (Ni+Co)/Si to be 3-5, the remaining portion being copper and unavoidable impurities. The average Taylor factor of the copper alloy under plane strain that occurs when the copper alloy is extended in a direction perpendicular to the rolling direction and when the thickness of the copper alloy decreases is at most 3.5. The crystal grain size of the copper alloy is at most 10 μm. The 0.2% proof stress of the copper alloy in the rolling direction is at least 700 MPa. The conductivity of the copper alloy in the rolling direction is at least 50% IACS.
C22C 9/06 - Alloys based on copper with nickel or cobalt as the next major constituent
C22F 1/00 - Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
C22F 1/08 - Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
2222 heater, the electrode part is provided with a metal film; and an oxide film that has a film thickness of 2.5 µm or less is arranged between the metal film and an MoSi2 base material.
H05B 3/12 - Heating elements characterised by the composition or nature of the materials or by the arrangement of the conductor characterised by the composition or nature of the conductive material
6.
EQUIPMENT AND METHOD FOR LEACHING COPPER, AND METHOD FOR PRODUCING ELECTROLYTIC COPPER USING SAID EQUIPMENT AND METHOD
Provided is a method for efficiently promoting a leaching reaction of copper. Equipment for leaching copper includes a reactor for leaching reaction and a controller for oxidation-reduction potential. The reactor is configured to be provided with a leaching solution containing iodine and iron. The reactor is configured to be capable of being tightly sealed during the leaching reaction. The controller for oxidation-reduction potential is configured so that, during the leaching reaction, the oxidation-reduction potential of the leaching solution can be maintained at 500 mV (based on Ag/AgCl reference) or higher.
Provided is a sputtering target, the sputtering target containing 0.05 at % or more of Bi and having a total content of metal oxides of from 10 vol % to 60 vol %, the balance containing at least Co and Pt.
C22C 19/07 - Alloys based on nickel or cobalt based on cobalt
G11B 5/706 - Record carriers characterised by the selection of the material comprising one or more layers of magnetisable particles homogeneously mixed with a bonding agent on a base layer characterised by the composition of the magnetic material
H01F 1/10 - Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials non-metallic substances, e.g. ferrites
H01F 41/18 - Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
G11B 5/65 - Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent characterised by its composition
C04B 35/01 - Shaped ceramic products characterised by their composition; Ceramic compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxides
The present disclosure addresses the problem of providing an oxide film having a low carrier concentration and high carrier mobility, and an oxide sputtering target suitable for forming said oxide film. Provided is an oxide film containing zinc (Zn), tin (Sn), aluminum (Al), and oxygen (O), the oxide film being characterized by satisfying expressions (1) through (3). In the expressions, Al, Sn, and Zn represent the atomic ratios of each respective element in the oxide film. (1): 3 × Sn/Zn < Al. (2): Al/(Al + Sn + Zn) ≤ 0.10. (3): 0.33 ≤ Sn/(Sn + Zn) ≤ 0.60.
Provided is a method for recovering a metal from lithium ion battery waste, the method comprising a wet treatment in which a metal including lithium in lithium-ion battery waste is leached with an acid, and the metal is extracted from a metal-containing solution in which the metal is dissolved, wherein the lithium extracted by means of the wet treatment is used as a pH adjuster used in the wet treatment.
Provided is a method for efficiently recovering metals from lithium ion battery waste while reducing the use of sodium hydroxide as a pH adjuster. A method for recovering metals from lithium ion battery waste includes wet processing of leaching metals containing lithium from lithium ion battery waste with an acid, and extracting the metals from the metal-containing solution in which the metals are dissolved, in which the lithium extracted in the wet processing is used as a pH adjuster used in the wet processing.
A method for producing a mixed metal solution containing manganese ions and at least one of cobalt ions and nickel ions, the method including: an Al removal step of subjecting an acidic solution containing at least manganese ions and aluminum ions, and at least one of cobalt ions and nickel ions, to removal of the aluminum ions by extracting the aluminum ions into a solvent while leaving at least a part of the manganese ions in the acidic solution in an aqueous phase, the acidic solution being obtained by subjecting battery powder of lithium ion batteries to a leaching step; and a metal extraction step of bringing an extracted residual liquid obtained in the Al removal step to an equilibrium pH of 6.5 to 7.5 using a solvent containing a carboxylic acid-based extracting agent, extracting at least one of the manganese ions and at least one of the cobalt ions and the nickel ions into the solvent, and then back-extracting the manganese ions and at least one of the cobalt ions and nickel ions.
Provided are sulfide-based solid electrolyte with good ionic conductivity and an all-solid lithium ion battery using the same. A sulfide-based solid electrolyte having an argyrodite-type structure, wherein a composition of the sulfide-based solid electrolyte is represented by the formula:
Provided are sulfide-based solid electrolyte with good ionic conductivity and an all-solid lithium ion battery using the same. A sulfide-based solid electrolyte having an argyrodite-type structure, wherein a composition of the sulfide-based solid electrolyte is represented by the formula:
Li8GeS5-xTe1+x
Provided are sulfide-based solid electrolyte with good ionic conductivity and an all-solid lithium ion battery using the same. A sulfide-based solid electrolyte having an argyrodite-type structure, wherein a composition of the sulfide-based solid electrolyte is represented by the formula:
Li8GeS5-xTe1+x
in which: −0.5≤x<0, 0
A metal leaching method includes contacting battery powder of lithium ion battery waste with an acidic leachate 21 inside a leaching container 1 and leaching a metal contained in the battery powder into the acidic leachate 21, wherein the leaching container 1 has a porous member 2 arranged at a position above the liquid surface 22 of the acidic leachate 21 stored inside the container so as to cover the liquid surface 22, and when the metal is leached inside the leaching container 1, gas bubbles Ba generated in the acidic leachate 21 are brought into contact with the porous member 2 and collapsed, the opening of the porous member 2 being 12 mm or less.
The present invention provides a method for leaching out a metal contained in a battery powder of lithium ion battery waste into an acidic leaching liquid 21 by bringing the battery powder into contact with the acidic leaching liquid 21 within a leaching container 1. With respect to this method for leaching out a metal, the leaching container 1 has a movable member which is positioned and movable on the liquid level 22 of the acidic leaching liquid 21 retained within the leaching container 1; and when the metal is leached out within the leaching container 1, air bubbles Ba generated in the acidic leaching liquid 21 are broken by the action of the movable member.
The present disclosure addresses the problem of providing a multilayer body which is capable of maintaining high transmittance, while preventing an increase in the resistivity due to annealing. The present disclosure provides a multilayer body which is obtained by stacking an IZO film and an oxide film, wherein: in cases where the multilayer body is subjected to annealing at 350°C in the atmosphere, the surface resistivity of the multilayer body is 200 Ω/sq. or less; and in cases where the multilayer body is subjected to annealing at 350°C in the atmosphere, the average transmittance of visible light (wavelength: 380-780 nm) is 85% or more. The present disclosure also provides a multilayer body which is obtained by stacking an IZO film and an oxide film, wherein: if Rs0 is the surface resistivity of the multilayer body in cases where the multilayer body is not subjected to annealing, and Rs1 is the surface resistivity of the multilayer body in cases where the multilayer body is subjected to annealing at 350°C in the atmosphere, Rs1/Rs0 ≤ 10.0 is satisfied; and in cases where the multilayer body is subjected to annealing at 350°C in the atmosphere, the average transmittance of visible light of the multilayer body is 85% or more.
A highly pure electrodeposited copper comprising copper and unavoidable impurities, wherein the purity is at least 6N, the content of Ag included as an impurity is 0.2 ppm or less, the amount of included nonmetal inclusions with a particle size of 0.5-20 μm is 20,000/g or less, the average particle size in an electrodeposition cross section is in the range of 40-400 μm, the maximum particle size in the electrodeposition cross section is in the range of 300-2,700 μm, the average particle size in the electrodeposition surface is in the range of 25-150 μm, and the maximum particle size in the electrodeposition surface is in the range of 100-450 μm. As a result, the present invention provides a highly pure electrodeposited copper that has excellent crushability while suppressing the occurrence of lumps. (Selected drawing) FIG. 1B
The present invention provides a rolled copper foil for secondary batteries, the rolled copper foil having good heat resistance, thereby maintaining high strength even after a heat treatment. The present invention provides a rolled copper foil for secondary batteries, the rolled copper foil containing 0.05% by weight to 0.15% by weight of Zr and 0.05% by weight or less of oxygen, with the balance being made up of Cu and unavoidable impurities, while having a tensile strength in a direction parallel to the rolling direction of 500 MPa or more after a heat treatment at 350°C for 3 hours, and a change ratio of the tensile strength in the direction parallel to the rolling direction of 15% or less between before and after the heat treatment.
C22F 1/00 - Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working
C22F 1/08 - Changing the physical structure of non-ferrous metals or alloys by heat treatment or by hot or cold working of copper or alloys based thereon
The present invention provides a metal resin composite electromagnetic shielding material which is obtained by stacking N-number of metal layers (N represents an integer of 1 or more) and M-number of resin layers (M represents an integer of 1 or more), with adhesive layers being interposed therebetween, wherein an adhesive layer that is closest to the outer surface of the metal resin composite electromagnetic shielding material has an air bubble proportion of 4.5% or less when the adhesive layer is observed from the resin layer side.
H05K 9/00 - Screening of apparatus or components against electric or magnetic fields
B32B 7/12 - Interconnection of layers using interposed adhesives or interposed materials with bonding properties
B32B 15/08 - Layered products essentially comprising metal comprising metal as the main or only constituent of a layer, next to another layer of a specific substance of synthetic resin
19.
METHOD FOR PRODUCING COBALT SOLUTION, METHOD FOR PRODUCING COBALT SALT, METHOD FOR PRODUCING NICKEL SOLUTION, AND METHOD FOR PRODUCING NICKEL SALT
A method for producing a cobalt solution which involves removing magnesium ions from a cobalt-containing solution which contains magnesium ions and is obtained by subjecting battery powder from lithion-ion battery waste to at least a leaching treatment, said method including a magnesium separation step which involves extracting cobalt ions from said cobalt-containing solution by using a solvent which contains a carboxylic acid-type extracting agent, separating magnesium ions, and thereafter, inverse-extracting the cobalt ions from the solvent and obtaining a cobalt solution as an inverse-extracted liquid.
C22B 3/38 - Treatment or purification of solutions, e.g. obtained by leaching by liquid-liquid extraction using organic compounds containing phosphorus
C22B 7/00 - Working-up raw materials other than ores, e.g. scrap, to produce non-ferrous metals or compounds thereof
H01M 10/54 - Reclaiming serviceable parts of waste accumulators
20.
SPUTTERING TARGET MEMBER, SPUTTERING TARGET ASSEMBLY, AND FILM FORMING METHOD
Provided is a sputtering target member which is for a magnetic recording layer and can suppress the generation of particles. This sputtering target member for a magnetic recording layer contains 10-70 mol% of Co, 5-30 mol% of Pt, 1.5-10 mol% of carbide, and 0-30 mol% in total of one or two more non-magnetic materials selected from among carbon, oxide, nitride, and carbonitride.
G11B 5/65 - Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent characterised by its composition
21.
Fe-Pt-C-BASED SPUTTERING TARGET MEMBER, SPUTTERING TARGET ASSEMBLY, METHOD FOR FORMING FILM, AND METHOD FOR PRODUCING SPUTTERING TARGET MEMBER
Provided is a Fe-Pt-C-based sputtering target member which is prevented from the formation of particles during sputtering. The Fe-Pt-C-based sputtering target member has a magnetic phase containing Fe and Pt and a non-magnetic phase, the sputtering target member having a carbon-derived diffraction peak at a diffraction angle satisfying the formula: 25.6° ≤ 2θ ≤ 26.2° in an X-ray diffraction profile produced by the analysis of the sputtering target member by an X-ray diffraction method.
G11B 5/851 - Coating a support with a magnetic layer by sputtering
H01F 10/14 - Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys containing iron or nickel
The present invention provides an IGZO sputtering target which has a high relative density, while suppressing particle increase and arcing during sputtering. The present invention provides an IGZO sputtering target which contains indium (In), gallium (Ga), zinc (Zn), zirconium (Zr) and oxygen (O), with the balance being made up of unavoidable impurities; and this IGZO sputtering target contains Zr in an amount of less than 20 ppm by mass, while having a relative density of 95% or more.
C04B 35/01 - Shaped ceramic products characterised by their composition; Ceramic compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxides
23.
HEAT TREATMENT METHOD FOR BATTERY WASTE AND LITHIUM RECOVERY METHOD
A method for heat-treating battery waste containing lithium includes: allowing an atmospheric gas containing oxygen and at least one selected from the group consisting of nitrogen, carbon dioxide and water vapor to flow in a heat treatment furnace in which the battery waste is arranged, and heating the battery waste while adjusting an oxygen partial pressure in the furnace.
The disclosure is related to reducing the cost of sputtering target products. Provided is a sputtering target product wherein: the sputtering target product includes a target, a backing plate or backing tube, and insert material layer; at least a part of the non-sputtering side of the target is profiled so as to have protrusions and recesses that have plane symmetry; the insert material layer is formed so as to adhere closely to the profiled side, and the insert material is made of metal with specific gravity that is at least less than those of the metal constituting the target.
Provided is a sputtering target which can lower a heat treatment temperature for ordering a Fe—Pt magnetic phase and can suppress generation of particles during sputtering. The sputtering target is a nonmagnetic material-dispersed sputtering target containing Fe, Pt and Ge. The sputtering target includes at least one magnetic phase satisfying a composition represented by (Fe1-αPtα)1-βGeβ, as expressed in an atomic ratio for Fe, Pt and Ge, in which α and β represent numbers meeting 0.35≤α≤0.55 and 0.05≤β≤0.2, respectively. The magnetic phase has a ratio (SGe30mass %/SGe) of 0.5 or less. The ratio (SGe30mass %/SGe) is an average area ratio of Ge-based alloy phases containing a Ge concentration of 30% by mass or more (SGe30mass %) to an area ratio of Ge (SGe) calculated from the entire composition of the sputtering target, in element mapping by EPMA of a polished surface obtained by polishing a cross section perpendicular to a sputtering surface of the sputtering target.
Provided is a method for producing lithium hydroxide, which can obtain lithium hydroxide from lithium sulfate with a relatively low cost. A method for producing lithium hydroxide from lithium sulfate includes: a hydroxylation step of allowing the lithium sulfate to react with barium hydroxide in a liquid to provide a lithium hydroxide solution; a barium removal step of removing barium ions in the lithium hydroxide solution using a cation exchange resin and/or a chelate resin; and a crystallization step of precipitating lithium hydroxide in the lithium hydroxide solution that has undergone the barium removal step.
Provided is a method for removing a linear object, a device for removing a linear object, and a method for processing electronic/electrical equipment component waste, which can improve separation efficiency. The method for removing linear objects including: arranging a plurality of filters 3 in a vibrating sieve machine 1 such that the filters 3 are adjacent to each other so as to partially overlap with each other in a feed direction of a raw material, each of the filters 3 comprising a plurality of rods 2 extending at distances in the feed direction of the raw material and a beam portion 21 supporting the plurality of rods 1 at one ends of the plurality of the rods 2, the other ends of the plurality of the rods 2 being free ends; arranging a guide 6 below a tip of one of the filters 3 located on a most downstream side in the feed direction; feeding the raw material containing at least linear objects and plate-form objects into the vibrating sieve machine 1; and sorting the linear objects and the plate-form objects by vibrating the filters 3, sieving the linear objects to an under-sieve side of the vibrating sieve machine 1, and capturing lumpy linear objects with the guide.
B07B 1/12 - Apparatus having only parallel elements
B07B 1/36 - Moving screens not otherwise provided for, e.g. swinging, reciprocating, rocking, tilting, or wobbling screens jigging or moving to-and-fro in more than one direction
28.
BROOKITE-TYPE CRYSTALLINE TITANIUM OXIDE POWDER, AND METHOD FOR PRODUCING BROOKITE-TYPE CRYSTALLINE TITANIUM OXIDE POWDER
Provided are: a high-purity brookite-type crystalline titanium oxide powder; and a method for producing a brookite-type crystalline titanium oxide powder. The brookite-type crystalline titanium oxide powder has a sulfur atom content of 100 wtppm or less.
An indium phosphide substrate, the phosphide substrate has an angle θ on the main surface side of 0°<θ≤120° for all of the planes A, the indium phosphide substrate has edge rounds on the main surface side and a surface side opposite to the main surface; wherein a chamfered width Xf from the wafer edge on the main surface side is 50 μm or more to 130 μm or less; wherein a chamfered width Xb from the wafer edge on the surface side opposite to the main surface is 150 μm or more to 400 μm or less; and wherein the indium phosphide substrate has a thickness of 330 μm or moreto 700 μm or less.
H01L 21/02 - Manufacture or treatment of semiconductor devices or of parts thereof
H01L 29/20 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
H01L 21/304 - Mechanical treatment, e.g. grinding, polishing, cutting
Provided are a packaging container, a packaging method, and a method for carrying metal foil, which can suppress damage and deformation of the packaging container and enable stable carrying even if the packaging container is carried while suspending it in the midair. A packaging container made of corrugated cardboard includes: a pallet 2 having leg portions 21; a body frame 3 arranged on the pallet 2, the body frame 3 having bearing grooves 31 at end wall portions 32 opposing to each other; and a lid portion 4 provided on the body frame 3, wherein each of the leg portions 21 is arranged on an inner side than each of the end wall portions 23 of the pallet 2.
B65D 19/00 - Pallets or like platforms, with or without side walls, for supporting loads to be lifted or lowered
B65D 19/20 - Rigid pallets with side walls, e.g. box pallets with bodies formed by uniting or interconnecting two or more components made wholly or mainly of paper
B65D 19/36 - Pallets comprising a flexible load carrier extending between guide elements, e.g. guide tubes
B65D 19/44 - Elements or devices for locating articles on platforms
B65D 5/44 - Integral, inserted or attached portions forming internal or external fittings
B65D 5/50 - Internal supporting or protecting elements for contents
B65D 85/66 - Containers, packaging elements or packages, specially adapted for particular articles or materials for rolls of floor covering
B65D 85/672 - Containers, packaging elements or packages, specially adapted for particular articles or materials for web or tape-like material wound in flat spiral form on cores
32.
PURE COPPER OR COPPER ALLOY POWDER FOR DEPOSITION MODELING
The present invention addresses the problem of providing a pure copper or copper alloy powder which is used for deposition modeling by means of a laser beam system, and which is capable of decreasing the oxygen concentration in a model, while having an increased laser absorptance. The present invention provides a pure copper or copper alloy powder which is provided with an oxide coating, wherein: the oxide coating contains carbon; and the ratio of the oxygen concentration to the carbon concentration ((oxygen concentration)/(carbon concentration)) is 5 or less.
The smelting furnace according to the present invention is characterized by comprising: a first reaction zone into which a first charge containing a powder-form concentrate is charged, and in which the concentrate is oxidized by an oxygen-containing gas and allowed to fall downward in the form of liquid drops; and a second reaction zone having a holding container for holding molten metal obtained through the falling of the liquid drops, the second reaction zone being such that a raw material other than the concentrate is charged as a second charge into the molten metal and the second charge is caused to melt by the heat of oxidation of a matte in the molten metal or by a fuel combustion flame, and the second reaction zone being located at a position that is below the first reaction zone and on the upstream side relative to the first reaction zone with respect to the flow of the molten metal.
A metal-resin composite body 1 is provided with a metal plate 2, and a resin member 3 affixed to the metal plate 2, and has an internal space which is partitioned by means of a sealing member that includes the resin member 3, wherein: the resin member 3 has a frame-like shape extending on the metal plate 2 so as to enclose the perimeter of the internal space; there are weld lines 7 in one or two locations in the circumferential direction of the frame-shaped resin member 3; and, on a resin-covered surface in which the metal plate 2 is covered by the resin member 3, there is a rough undulating surface formed by means of rectangular recessed portions 5a and rectangular protruding portions 5b that are aligned alternately in each of one direction and a direction perpendicular thereto, in a plan view of the resin-covered surface.
H01L 23/50 - Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads or terminal arrangements for integrated circuit devices
35.
SPUTTERING TARGET AND METHOD FOR PRODUCING SPUTTERING TARGET
This sputtering target is formed from multiple structural members including a target and a substrate. The multiple structural members include a first structural member and a second structural member that are layered together. The first structural member contains Al and the second structural member contains Cu. At least one of the first structural member and the second structural member contains Mg. The sputtering target contains Al and Cu between the first structural member and the second structural member and has an alloy layer contacting the first structural member and the second structural member. At least a portion of the alloy layer further includes an Mg-containing layer in which Mg content is 5.0 at% or more.
A sputtering target according to the present invention contains Co and Pt as metal components, wherein a molar ratio of a content of Pt to a content of Co is from 5/100 to 45/100, and wherein the sputtering target contains Nb2O5 as a metal oxide component.
G11B 5/706 - Record carriers characterised by the selection of the material comprising one or more layers of magnetisable particles homogeneously mixed with a bonding agent on a base layer characterised by the composition of the magnetic material
G11B 5/851 - Coating a support with a magnetic layer by sputtering
H01F 41/18 - Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
37.
HIGH-PURITY MOLYBDENUM OXYCHLORIDE AND MANUFACTURING METHOD THEREFOR
Provided is a molybdenum oxychloride characterized in having a purity of 99.9995 wt % or higher. Additionally provided is a manufacturing method of a molybdenum oxychloride including the steps of reacting MoO3 and Cl2 and synthesizing the molybdenum oxychloride in a reaction chamber, and cooling the synthesized molybdenum oxychloride gas and precipitating the molybdenum oxychloride in a recovery chamber, wherein an impurity trap is provided between the reaction chamber and the recovery chamber, and impurities are removed with the impurity trap. An object of the present invention is to provide a high-purity molybdenum oxychloride and a manufacturing method therefor.
C23C 16/455 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition (CVD) processes characterised by the method of coating characterised by the method used for introducing gases into the reaction chamber or for modifying gas flows in the reaction chamber
C23C 16/08 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition (CVD) processes characterised by the deposition of metallic material from metal halides
38.
MAGNETIC PARTICLE POWDER AND MAGNETIC PARTICLE DISPERSION
Provided is a magnetic particle powder containing a plurality of fine magnetic particles that can exhibit high magnetic force. This magnetic particle powder has a BET specific surface area of 10 m2/g to 50 m2/g, a median diameter (D50) of 0.5 μm to 10 μm, and saturation magnetization (Ms) of 50 emu/g or greater.
B82B 1/00 - Nanostructures formed by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
H01F 1/00 - Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
B01J 20/02 - Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof comprising inorganic material
B01J 20/06 - Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof comprising inorganic material comprising oxides or hydroxides of metals not provided for in group
B01J 20/28 - Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof characterised by their form or physical properties
39.
SURFACE-TREATED COPPER FOIL, COPPER-CLAD LAMINATE AND PRINTED WIRING BOARD
The present invention provides a surface-treated copper foil which comprises a copper foil and a surface treatment layer that is formed on at least one surface of the copper foil. The surface treatment layer has an Sku of 2.50 to 4.50 and an Str of 0.20 to 0.40.
C23C 28/00 - Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of main groups , or by combinations of methods provided for in subclasses and
C25D 3/38 - Electroplating; Baths therefor from solutions of copper
C25D 3/58 - Electroplating; Baths therefor from solutions of alloys containing more than 50% by weight of copper
C25D 5/16 - Electroplating with layers of varying thickness
This surface-treated copper foil has a copper foil and a surface-treated layer formed on at least one surface of the copper foil. The surface-treated layer has an Spk change amount represented by formula (1) below of 0.02 to 0.24 µm. (1) Spk change amount = P2-P1 (in the formula, P1 is Spk calculated by applying a λs filter having a cutoff value λs of 2 µm, and P2 is Spk calculated without applying the λs filter).
This surface-treated copper foil has a copper foil and a surface-treated layer formed on at least one surface of the copper foil. The surface-treated layer has an Sku of 2.50-4.50 and an Str of 0.20-0.40.
C23C 28/00 - Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of main groups , or by combinations of methods provided for in subclasses and
C25D 3/38 - Electroplating; Baths therefor from solutions of copper
C25D 3/58 - Electroplating; Baths therefor from solutions of alloys containing more than 50% by weight of copper
C25D 5/16 - Electroplating with layers of varying thickness
The present invention provides a surface-treated copper foil which comprises a copper foil and a surface treatment layer that is formed on at least one surface of the copper foil. The surface treatment layer has a change ratio of Vmc of 23.00% to 40.00%, the change ratio of Vmc being represented by formula (1). (1): (Change ratio of Vmc) = (P2 – P1)/P2 × 100 In the formula, P1 is the value of Vmc as calculated, while applying a λs filter having a cut-off value λs of 2 µm; and P2 is the value of Vmc as calculated without applying the λs filter.
A surface-treated copper foil that has a copper foil and a surface-treatment layer formed on at least one surface of the copper foil. The amount of Vmp change, represented by formula (1), in the surface-treatment layer is 0.0010–0.0110 μm3/μm2. Amount of Vmp change = P2–P1 ... (1) In the formula: P1 is Vmp calculated after a λs filter is applied that has a cut off value λs of 2 μm; and P2 is Vmp calculated without the λs filter applied.
Provided is a surface-treated copper foil including a copper foil and a surface-treated layer formed on at least one surface of the copper foil. The surface-treated layer has an Sk rate of change, represented by formula (1) below, of 23.0-45.0%. Formula (1): Sk rate of change = (P2-P1)/P2×100 In the formula, P1 is Sk calculated by applying a λs filter having a cutoff value λs of 2 µm, and P2 is Sk calculated without applying the λs filter.
This surface-treated copper foil comprises a copper foil and a surface-treatment layer formed on at least one surface of the copper foil. The amount of change in Sk given by formula (1) for the surface-treatment layer is 0.180-0.600 µm. (1): Amount of change in Sk = P2 - P1 In the formula, P1 is the Sk calculated using a λs filter for which the cut off value λs is 2 µm, and P2 is the Sk calculated without using this λs filter.
A copper oxide-containing powder containing copper oxide (I) wherein, when the powder has been heated to 400°C, the powder contains thermal decomposition residue deriving from pitch in a mass ratio of 0.025-0.060 with respect to the copper oxide (I).
Copper powder comprising copper particles wherein the compacted bulk density is 1.30 g/cm3to 2.96 g/cm3, and the 50% particle size D50 at the time when the cumulative frequency of the copper particles becomes 50% in the volume-based particle size histogram, and the crystallite diameter D, determined using Scherrer's equation from the Cu (111) plane diffraction peak in an X-ray diffraction profile obtained by powder X-ray diffraction on the copper powder, satisfies D/D50≥0.060.
B22F 9/24 - Making metallic powder or suspensions thereof; Apparatus or devices specially adapted therefor using chemical processes with reduction of metal compounds starting from liquid metal compounds, e.g. solutions
A YAG ceramic bonded body in which a YAG ceramic and a YAG ceramic or optical glass are bonded, wherein the YAG ceramic bonded body comprises glass as a bonding layer, and has a rate of change of transmittance that is within 7%. An object of this invention is to provide a bonded body in which a YAG ceramic and a YAG ceramic are bonded, or a bonded body in which a YAG ceramic and optical glass are bonded, and which is capable of suppressing the reflection of light at the bonded interface, as well as the production method thereof.
The present invention addresses the problem of providing a sputtering target suitable for the formation of a semiconductor film having a low carrier concentration and a high mobility. Provided is a sputtering target containing zinc (Zn), tin (Sn), gallium (Ga) and oxygen (O), in which Ga is contained in an amount of 0.15 to 0.50 inclusive in terms of a Ga/(Zn+Sn+Ga) atomic ratio, Sn is contained in an amount of 0.30 to 0.60 inclusive in terms of an Sn/(Zn+Sn) atomic ratio, and the volume resistivity of the sputtering target is 50 Ω·cm or less.
C04B 35/01 - Shaped ceramic products characterised by their composition; Ceramic compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxides
C04B 35/453 - Shaped ceramic products characterised by their composition; Ceramic compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxides based on zinc, tin or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
H01L 21/363 - Deposition of semiconductor materials on a substrate, e.g. epitaxial growth using physical deposition, e.g. vacuum deposition, sputtering
50.
COPPER ALLOY POWDER HAVING Si COATING FILM AND METHOD FOR PRODUCING SAME
Provided is a copper alloy powder which is a metal powder to be used for additive manufacturing by a laser beam system, and which is able to achieve a higher laser absorption rate and additionally suppress heat transfer through necking, and a method for producing this copper alloy powder. A copper alloy powder which contains one or more elements selected from among Cr, Zr and Nb in a total amount of 15 wt % or less, with a balance being made up of Cu and unavoidable impurities, and which is characterized in that a coating film containing Si atoms is formed on the copper alloy powder, and a Si concentration in the copper alloy powder with the coating film is 5 wt ppm or more and 700 wt ppm or less.
B22F 1/16 - Metallic particles coated with a non-metal
B22F 1/05 - Metallic powder characterised by the size or surface area of the particles
51.
LAYERED BODY HAVING FUNCTION AS TRANSPARENT ELECTROCONDUCTIVE FILM AND METHOD FOR PRODUCING SAME, AND OXIDE SPUTTERING TARGET FOR SAID LAYERED BODY PRODUCTION
The present invention addresses the problem of providing a layered body having a higher transmittance and a lower resistivity (high conductivity) than conventional ITO films. Provided is a layered body that is obtained by layering an ITO film and an oxide film, the layered body having a surface resistance of 40 Ω/sq. s or less, and a visible light average transmittance of at least 90%, where the ratio between the ITO film thickness and the oxide film thickness (ITO film thickness/oxide film thickness) is less than 15. Also provided is a layered body that is obtained by layering an ITO film and an oxide film, wherein the layered body is characterized by satisfying R2/R1≤1.0 when R1 is the surface resistance of the layered body that has been subjected to atmosphere annealing at 220°C, and R2 is the surface resistance of the layered body that has been subjected to atmosphere annealing at 550°C.
Provided is a Mg2Si single crystal in which generation of low-angle grain boundaries in the crystal is satisfactorily suppressed. A Mg2Si single crystal, wherein a variation in crystal orientation as measured by XRD is in a range of ±0.020°.
The present invention provides an electrical and electronic component scrap processing method and an electrical and electronic component scrap processing device which are able to more efficiently select a desired component scrap from among electrical and electronic component scraps by using image recognition processing technology and a selection device. The electrical and electronic component scrap processing method comprises a selection conditions decision step S10 for deciding selection conditions for electrical and electronic component scraps 1, the selection conditions decision step S10 comprising: an image recognition processing step S12 in which component scraps belonging to a specific category of components are identified, using image recognition processing, from among a plurality of captured images capturing the electrical and electronic component scraps 1 which include a plurality of component scraps, and image recognition information including information on detection area, quantity, and scores indicating certainty of the identified component scraps are acquired; a classification step S13 in which the image recognition information of the captured images is used to create classification information of the identified component scraps; and a conditions decision step S14 in which a score threshold for image recognition processing and a detection area threshold for component scraps are decided on the basis of the classification information and processing capability information of a selection device 13 that selects component scraps.
B07C 5/34 - Sorting according to other particular properties
G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
54.
MALE PIN FOR CONNECTOR AND MANUFACTURING METHOD OF MALE PIN FOR CONNECTOR
Provided are a male pin for a connector which achieves low insertion force (friction force) when inserted into a female pin and good contact resistance with the female pin, and a manufacturing method of the male pin for the connector. This male pin for the connector is manufactured by plating a base material formed from copper or a copper alloy, said male pin comprising an inclined portion to be inserted into the female pin and a flat portion continuous to the inclined portion, wherein: a first region extending from the inclined portion and including the boundary between the inclined portion and the flat portion and a second region, which comes into electrical contact with the female pin when fitted into the female pin, are plated with dissimilar coatings; the first region has greater hardness than the hardness of the second region; the second region has less contact resistance than the contact resistance of the first region; and at least the first region is coated with oil.
C25D 5/12 - Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
C25D 5/50 - After-treatment of electroplated surfaces by heat-treatment
C25D 7/00 - Electroplating characterised by the article coated
H01R 43/16 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for manufacturing contact members, e.g. by punching and by bending
H01R 13/03 - Contact members characterised by the material, e.g. plating or coating materials
55.
RAW MATERIAL DISCHARGE DEVICE, METHOD OF PROCESSING OF ELECTRONIC/ELECTRICAL DEVICE COMPONENT SCRAP, AND METHOD OF RAW MATERIAL DISCHARGE FOR ELECTRONIC/ELECTRICAL DEVICE COMPONENT SCRAP
Provided are a raw material discharge device, a method of processing an electronic and electrical device component scrap, and a raw material discharging method of an electronic and electrical device component scrap, which are capable of efficiently discharging the raw material having various shapes, specific gravities and shapes in each fixed amount. A raw material discharge device including: a storage unit 1 which stores a raw material and comprising a discharge port 11 at one end; a discharge unit 2 arranged at a bottom surface 15 of the storage unit 1, which conveys the raw material toward the discharge port 11 and discharges the raw material to an outside of the storage unit 1; an adjustment unit 3 including a plurality of struts 31 extending from above to below the discharge unit 2 and adjusting an amount of the raw material to be discharged by holding a part of the raw material with the struts 31; wherein a ratio (d1/d2) of a distance (d1) between a strut 31 closest to a side surface 13, 14 of the storage unit 1 and the side surface 13, 14 of the storage unit 1 to a narrowest distance (d2) between the struts 31 in a center portion of the storage unit 1, and a ratio (H1/H2) of a height of the strut 31 closest to the side surface 13, 14 of the storage unit 1 from a floor to a minimum height (H2) of a strut 31 which is other than the strut 31 closest to the side surface of the storage unit 1 from the floor are respectively adjustable so as to prevent clogging of the raw material being discharged to the outside of the storage unit 1.
A ceramic sputtering target, wherein when a cross-sectional structure of a sputtering surface is observed with an electron microscope, an amount of microcracks defined below is 50 μm/mm or less, and after performing a peel test on the sputtering surface, an area ratio of peeled particles confirmed by observing the cross-sectional structure with an electron microscope is 1.0% or less.
A ceramic sputtering target, wherein when a cross-sectional structure of a sputtering surface is observed with an electron microscope, an amount of microcracks defined below is 50 μm/mm or less, and after performing a peel test on the sputtering surface, an area ratio of peeled particles confirmed by observing the cross-sectional structure with an electron microscope is 1.0% or less.
Amount of microcracks=frequency of microcracks×average depth of microcracks
This method for treating battery waste includes: a first heat treatment step of heating the battery waste under an atmosphere including at least one selected from the group comprising nitrogen, carbon dioxide, and steam; and, after the first heat treatment step, a second heat treatment step of switching from the atmosphere in the first heat treatment step and heating the battery waste under an atmosphere that is different from said atmosphere and that includes a larger amount of oxygen than in the first heat treatment step.
Provided is a laminate that enhances an electromagnetic wave shielding effect in a low-frequency region. The present invention provides a laminate including at least one non-magnetic metal layer and at least one magnetic metal layer, at least one magnetic metal layer including an amorphous phase.
A method for treating battery waste includes: a first heat treatment step of heating the battery waste in an atmosphere containing at least one selected from the group consisting of nitrogen, carbon dioxide and water vapor; and after the first heat treatment step, a second heat treatment step of changing the atmosphere in the first heat treatment step and heating the battery waste in an atmosphere which is different from the atmosphere in the first heat treatment step and which contains a larger amount of oxygen than that in the first heat treatment step.
Provided is an indium phosphide substrate, a semiconductor epitaxial wafer, and a method for producing an indium phosphide substrate, which can satisfactorily suppress warpage of the back surface of the substrate. The indium phosphide substrate includes a main surface for forming an epitaxial crystal layer and a back surface opposite to the main surface, wherein the back surface has a BOW value of −2.0 to 2.0 μm, as measured with the back surface of the indium phosphide substrate facing upward.
H01L 21/02 - Manufacture or treatment of semiconductor devices or of parts thereof
H01L 29/20 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
B28D 5/04 - Fine working of gems, jewels, crystals, e.g. of semiconductor material; Apparatus therefor by tools other than of rotary type, e.g. reciprocating tools
Provided is an indium phosphide substrate, a semiconductor epitaxial wafer, and a method for producing an indium phosphide substrate, which can satisfactorily suppress warpage of the back surface of the substrate. The indium phosphide substrate includes a main surface for forming an epitaxial crystal layer and a back surface opposite to the main surface, wherein the back surface has a WARP value of 3.5 μm or less, as measured with the back surface of the indium phosphide substrate facing upward.
H01L 21/02 - Manufacture or treatment of semiconductor devices or of parts thereof
H01L 29/20 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
B28D 5/04 - Fine working of gems, jewels, crystals, e.g. of semiconductor material; Apparatus therefor by tools other than of rotary type, e.g. reciprocating tools
C30B 25/18 - Epitaxial-layer growth characterised by the substrate
62.
POSITIVE ELECTRODE ACTIVE MATERIAL FOR ALL-SOLID-STATE LITHIUM ION BATTERIES, POSITIVE ELECTRODE FOR ALL-SOLID-STATE LITHIUM ION BATTERIES, ALL-SOLID-STATE LITHIUM ION BATTERY, AND METHOD FOR PRODUCING POSITIVE ELECTRODE ACTIVE MATERIAL FOR ALL-SOLID-STATE LITHIUM ION BATTERIES
abcdee (wherein 1.0 ≤ a ≤ 1.05, 0.8 ≤ b ≤ 0.9, 1.8 ≤ e ≤ 2.2 and (b + c + d) = 1); the coating layer is an oxide of Li and Nb; and the specific surface area X (m2/g) of the positive electrode active material and the Nb content Y (mass%) in the positive electrode active material satisfy the relational expression (2) described below. (2): 0.65 ≤ Y/X ≤ 1.20
H01M 4/36 - Selection of substances as active materials, active masses, active liquids
H01M 4/505 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of manganese of mixed oxides or hydroxides containing manganese for inserting or intercalating light metals, e.g. LiMn2O4 or LiMn2OxFy
H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
A method for processing ores containing gold or refining intermediates containing gold, the refining intermediate being obtained by subjecting the ores to a refining process, wherein the method includes: a leaching step of leaching gold from the ores or the refining intermediates using a sulfate solution containing iodide ions and iron (III) ions as a leaching solution; an adsorption step of adsorbing iodine and gold in the leached solution obtained in the leaching step on activated carbon; and an iodine separation step of separating iodine from the activated carbon while leaving gold on the activated carbon that has undergone the adsorption step.
C22B 3/24 - Treatment or purification of solutions, e.g. obtained by leaching by physical processes, e.g. by filtration, by magnetic means by adsorption on solid substances, e.g. by extraction with solid resins
B01J 20/20 - Solid sorbent compositions or filter aid compositions; Sorbents for chromatography; Processes for preparing, regenerating or reactivating thereof comprising inorganic material comprising carbon obtained by carbonising processes
The present invention provides: a plated material which has low insertion force (frictional force) and good durability at high humidities; and an electronic component. A plated material which is provided with: a base plating layer that is provided on the surface of a base material, while being composed of Ni or an Ni alloy; and a surface layer that is provided on the base plating layer, while being composed of an Sn-In-Cu alloy.
Provided are an indium phosphide substrate in which the development of concave defects is suppressed, a semiconductor epitaxial wafer, a method for producing an indium phosphide single crystal ingot, and a method for producing an indium phosphide substrate. The present invention is an indium phosphide substrate having zero concave defects detected by topography channel on the surface when the diameter is 100 mm or less and at least one surface is irradiated with laser light having a wavelength of 405 nm by S polarization and inspected.
The present invention provides a method for producing an aqueous tin methanesulfonate solution by dissolving tin (II) oxide in an aqueous methanesulfonic acid solution, wherein if A is the number of moles of the tin (II) oxide and B is the number of moles of the methanesulfonic acid, the value of B/2A is within the range of from 1.0 to 1.4. This method for dissolving tin (II) oxide into an aqueous methanesulfonic acid solution is able to achieve a high tin ion concentration.
C25D 3/32 - Electroplating; Baths therefor from solutions of tin characterised by the organic bath constituents used
C07C 303/32 - Preparation of esters or amides of sulfuric acids; Preparation of sulfonic acids or of their esters, halides, anhydrides or amides of salts of sulfonic acids
C25D 21/14 - Controlled addition of electrolyte components
C07C 309/04 - Sulfonic acids having sulfo groups bound to acyclic carbon atoms of an acyclic saturated carbon skeleton containing only one sulfo group
67.
SURFACE-TREATED COPPER FOIL, COPPER-CLADDED LAMINATE PLATE, AND PRINTED WIRING BOARD
A surface-treated copper foil comprising a copper foil and a surface-treating layer formed on at least one surface of the copper foil. The surface-treating layer has an Sku of 2.50-4.50 and an Str of 0.20-0.40.
C23C 28/00 - Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of main groups , or by combinations of methods provided for in subclasses and
C25D 3/38 - Electroplating; Baths therefor from solutions of copper
C25D 3/58 - Electroplating; Baths therefor from solutions of alloys containing more than 50% by weight of copper
C25D 5/16 - Electroplating with layers of varying thickness
A surface-treated copper foil which comprises: a copper foil; and a surface treatment layer that is formed on at least one surface of the copper foil. The surface treatment layer has an Sku of from 2.50 to 4.50 and an Str of from 0.20 to 0.40.
C23C 28/00 - Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of main groups , or by combinations of methods provided for in subclasses and
C25D 3/38 - Electroplating; Baths therefor from solutions of copper
C25D 3/58 - Electroplating; Baths therefor from solutions of alloys containing more than 50% by weight of copper
C25D 5/16 - Electroplating with layers of varying thickness
Provided are an indium phosphide substrate, a method for manufacturing an indium phosphide substrate, and a semiconductor epitaxial wafer that make it possible to suppress cracking in an indium phosphide substrate caused by irregularities and processing damage in an edge part. The surface roughness of the entire edge-part surface of the indium phosphide substrate has a maximum height Sz of 2.1 μm or less, as measured by a laser microscope.
Provided is an indium phosphide substrate which has suppressed sharpness of a wafer edge when polishing is carried out from the back surface of the wafer by a method such as back lapping. An indium phosphide substrate, wherein when planes A each parallel to a main surface are taken in a wafer, the phosphide substrate has an angle θ on the main surface side of 0°<θ≤110° for all of the planes A where a distance from the main surface is 100 μm or more and 200 μm or less, wherein the angle θ is formed by a plane B, the plane B including an intersection line of an wafer edge with each of the planes A and being tangent to the wafer edge, and an plane of each of the planes A extending in a wafer outside direction, and wherein in a cross section orthogonal to the wafer edge, the indium phosphide substrate has an edge round at least on the main surface side, and the edge round on the main surface side has a radius of curvature Rf of from 200 to 350 μm.
Provided is a method for processing electronic and electrical device component scrap according to an embodiment of the present invention includes a smelting raw material sorting step of sorting a processing raw material containing valuable metals processable in a smelting step from the electronic and electrical device component scrap, wherein the method comprises removing lump copper wire scrap contained in the electronic and electrical device component scrap using a parallel link robot.
Provided are an indium phosphide substrate, a method for manufacturing an indium phosphide substrate, and a semiconductor epitaxial wafer, which enable control of contamination that occurs on the surface of an indium phosphide substrate due to residue at an edge section thereof. The indium phosphide substrate is configured such that an edge section of the substrate has a surface roughness of 0.15 μm or less in a root-mean-square height Sq on the entire surface of the edge section, measured by a laser microscope.
The purpose of the present invention is to provide a surface-treated copper foil (1) with which it is possible to reduce peeling from a substrate and to form a fine-pitched circuit pattern. This surface-treated copper foil (1) has a copper coil (2), a first surface treatment layer (3) formed on one surface of the copper coil (2), and a second surface treatment layer (4) formed on the other surface of the copper coil (2). The ratio of the amount of Ni adhering to the first surface treatment layer (3) relative to the amount of Ni adhering to the second surface treatment layer (4) is 0.01-2.0. The surface-treated copper foil (1) has a tensile strength of 235-290 MPa. The copper coil (2) is made of at least 99.0 mass% of Cu, the balance being unavoidable impurities.
Provided is a stable CdZnTe monocrystalline substrate having a small leakage current even when a high voltage is applied and having a lower variation in resistivity with respect to variations in applied voltage values. A semiconductor wafer comprising a cadmium zinc telluride monocrystal having a zinc concentration of 4.0 at % or more and 6.5 at % or less and a chlorine concentration of 0.1 ppm by mass or more and 5.0 ppm by mass or less, wherein the semiconductor wafer has a resistivity of 1.0×107 Ωcm or more and 1.0×108 Ωcm or less when a voltage of 900 V is applied, and wherein a ratio (variation ratio) of the resistivity at application of 0 V to the resistivity at application of a voltage of 900 V is 20% or less.
H01L 31/0296 - Inorganic materials including, apart from doping material or other impurities, only AIIBVI compounds, e.g. CdS, ZnS, HgCdTe
H01L 31/08 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
H01L 31/18 - Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
Provided is a method for processing lithium ion battery waste, which can effectively precipitate aluminum ions and iron ions in the solution by neutralization and relatively easily separate the precipitate. The method for processing lithium ion battery waste includes: a leaching step of leaching battery powder in an acid, the battery powder containing at least aluminum and iron and being obtained from lithium ion battery waste, and removing a leached residue by solid-liquid separation to obtain a leached solution containing at least aluminum ions and iron ions; and a neutralization step of adding phosphoric acid and/or a phosphate salt and an oxidizing agent to the leached solution, increasing a pH of the leached solution to a range of 2.0 to 3.5, precipitating the aluminum ions and the iron ions in the leached solution as aluminum phosphate and iron phosphate, respectively, and removing a neutralized residue by solid-liquid separation to obtain a neutralized solution.
Provided is an indium phosphide substrate having good accuracy of flatness of the orientation flat, and a method for producing the indium phosphide substrate. An indium phosphide substrate having a main surface and an orientation flat, wherein a difference between maximum and minimum values of a maximum height Pz in each of four cross-sectional curves is less than or equal to 1.50/10000 of a length in a longitudinal direction of an orientation flat end face, wherein the four cross-sectional curves are set at intervals of one-fifth of a thickness of the substrate on a surface excluding a width portion of 3 mm inward from both ends of the orientation flat end face in the longitudinal direction of the orientation flat end face, and the maximum height Pz in each of the four cross-sectional curves is measured in accordance with JIS B 0601:2013.
H01L 29/06 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions
H01L 29/20 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only AIIIBV compounds
H01L 21/02 - Manufacture or treatment of semiconductor devices or of parts thereof
The present invention provides a method for processing lithium ion battery waste, said method being capable of effectively precipitating aluminum ions and iron ions in a liquid by means of neutralization and being capable of relatively easily separating the precipitate. A method for processing lithium ion battery waste, said method comprising: a leaching step wherein a battery powder, which is obtained from lithium ion battery waste and contains at least aluminum and iron, is subjected to leaching with use of an acid, and the leaching residue is removed by means of solid-liquid separation, thereby obtaining a leachate that contains at least aluminum ions and iron ions; and a neutralization step wherein a phosphoric acid and/or a phosphate as well as an oxidant are added to the leachate so as to increase the pH thereof to a value within the range of from 2.0 to 3.5, thereby having the aluminum ions and the iron ions in the leachate respectively precipitate as aluminum phosphate and iron phosphate, and a post-neutralization solution is subsequently obtained by removing the neutralization residue by means of solid-liquid separation.
Provided is an indium phosphide substrate having good linearity accuracy of a ridge line where the main surface is in contact with the orientation flat, and a method for producing the indium phosphide substrate. An indium phosphide substrate having a main surface and an orientation flat, wherein a maximum value of deviation is less than 1/1000 of a length of a ridge line where the main surface is in contact with the orientation flat, when a plurality of measurement points are set at intervals of 2 mm from a start point to an end point at the ridge line, except for a length portion of 3 mm inward from both ends of the ridge line, and based on a reference line which is a straight line connecting the start point and the end point, a distance of each measurement point from the reference line is defined as the deviation of each measurement point.
Provided is a sputtering target capable of reducing generation of particles, and a method for producing the same. The sputtering target includes: 10 mol % or more and 85 mol % or less of Co, 0 mol % or more and 47 mol % or less of Pt, and 0 mol % or more and 47 mol % or less of Cr, as metal components; and at least B6O as an oxide component.
C22C 5/04 - Alloys based on a platinum group metal
C22C 19/07 - Alloys based on nickel or cobalt based on cobalt
C22C 30/00 - Alloys containing less than 50% by weight of each constituent
C22C 32/00 - Non-ferrous alloys containing at least 5% by weight but less than 50% by weight of oxides, carbides, borides, nitrides, silicides or other metal compounds, e.g. oxynitrides, sulfides, whether added as such or formed in situ
81.
SORTING MACHINE AND METHOD FOR TREATING ELECTRONIC/ELECTRIC DEVICE COMPONENT SCRAPS
Provided is a sorting machine capable of more easily and efficiently sorting specific parts having a specific shape from raw materials containing various substances having different shapes, and a method for treating electronic and electric device component scraps using the sorting machine. The sorting machine includes a conveying device 1 having a conveying surface 13 which conveys raw materials containing substances having different shapes from a raw material inlet 11 to a receiving port 12; and a gate device 2 provided with a cylindrical roll portion 21 having a rotating function arranged at a certain distance d on the conveying surface to allow at least a part of the raw materials 100 to pass through to the receiving port 12.
B03C 1/23 - Magnetic separation acting directly on the substance being separated with material carried by travelling fields, e.g. generated by stationary magnetic coils; Eddy-current separators, e.g. sliding ramp
B03C 1/18 - Magnetic separation acting directly on the substance being separated with material carriers in the form of belts with magnets moving during operation
82.
METHOD FOR PROCESSING ELECTRONIC/ELECTRICAL DEVICE COMPONENT SCRAPS
Provided is a method for processing electronic and electrical device component scraps, which can selectively recover a substrate scrap including a substance intended to be recovered. A method for processing electronic and electrical device component scraps, including separating a substrate with lead wires contained in the electronic and electrical device component scraps before sorting the electronic and electrical device component scraps by magnetic sorting.
B07B 9/00 - Combinations of apparatus for screening or sifting or for separating solids from solids using gas currents; General arrangement of plant, e.g. flow sheets
B07B 4/08 - Separating solids from solids by subjecting their mixture to gas currents while the mixtures are supported by sieves, screens, or like mechanical elements
B03C 1/23 - Magnetic separation acting directly on the substance being separated with material carried by travelling fields, e.g. generated by stationary magnetic coils; Eddy-current separators, e.g. sliding ramp
Provided is a method for processing electronic and electrical device component scrap, which can improve an efficiency of sorting of raw materials fed to the smelting step from electronic and electrical device component scrap, and reduce losses of valuable metals. A method for processing electronic and electrical device component scrap which includes removing powdery objects contained in electronic and electrical device component scrap prior to a step of separating non-metal objects or metal objects from the electronic and electrical device component scrap containing the metal objects and the non-metal objects, using a metal sorter including: a metal sensor, a color camera, an air valve, and a conveyor.
Provided is a method for processing electronic and electrical device component scrap, which can improve an efficiency of sorting of raw materials fed to the smelting step from electronic and electrical device component scrap, and reduce losses of valuable metals. A method for processing electronic and electrical device component scrap which includes sorting electronic and electrical device component scrap by wind powder sorting to remove plate-shaped materials containing valuable metals included in the electronic and electrical device component scrap, and then sorting the resulting sorted objects by magnetic sorting.
B07B 4/02 - Separating solids from solids by subjecting their mixture to gas currents while the mixtures fall
B07B 9/00 - Combinations of apparatus for screening or sifting or for separating solids from solids using gas currents; General arrangement of plant, e.g. flow sheets
B02C 23/20 - Adding fluid, other than for crushing or disintegrating by fluid energy after crushing or disintegrating
B03C 1/24 - Magnetic separation acting directly on the substance being separated with material carried by travelling fields, e.g. generated by stationary magnetic coils; Eddy-current separators, e.g. sliding ramp with material carried by travelling fields
Provided is a titanium sputtering target having a recrystallized structure having an average crystal grain diameter of 1 μm or less. Also provided is a method for producing a titanium sputtering target, the method comprising the steps of: subjecting a cut titanium ingot to large strain processing to provide a processed sheet; subjecting the processed sheet to cold rolling at a rolling ratio of 30% or more to provide a rolled sheet; and subjecting the rolled sheet to a heat treatment at a temperature of 320° C. or less.
Provided is a niobium sputtering target having improved film thickness uniformity throughout the target life.
Provided is a niobium sputtering target having improved film thickness uniformity throughout the target life.
In the niobium sputtering target, a rate of change in a {111} area ratio of each of an upper, central, and lower portions of the sputtering target, as represented by the following equation (2), is 2.5 or less, and the {111} area ratio of each of the upper, central and lower portions is determined by dividing a cross section of a plate-shaped sputtering target perpendicular to a sputtering surface into three equal portions: the upper portion, the central portion and the lower portion from a sputtering surface side in a normal direction of the sputtering surface at an intermediate position between a center and an outer circumference of the sputtering surface of the plate-shaped sputtering target, and measuring a crystal orientation distribution of each of measured regions of the upper portion, the central portion, and the lower portion using an EBSD method:
Provided is a niobium sputtering target having improved film thickness uniformity throughout the target life.
In the niobium sputtering target, a rate of change in a {111} area ratio of each of an upper, central, and lower portions of the sputtering target, as represented by the following equation (2), is 2.5 or less, and the {111} area ratio of each of the upper, central and lower portions is determined by dividing a cross section of a plate-shaped sputtering target perpendicular to a sputtering surface into three equal portions: the upper portion, the central portion and the lower portion from a sputtering surface side in a normal direction of the sputtering surface at an intermediate position between a center and an outer circumference of the sputtering surface of the plate-shaped sputtering target, and measuring a crystal orientation distribution of each of measured regions of the upper portion, the central portion, and the lower portion using an EBSD method:
the {111} area ratio=total area of crystal grains having a {111} plane oriented in the normal direction in the measured regions/total area of the measured regions Equation (1);
Provided is a niobium sputtering target having improved film thickness uniformity throughout the target life.
In the niobium sputtering target, a rate of change in a {111} area ratio of each of an upper, central, and lower portions of the sputtering target, as represented by the following equation (2), is 2.5 or less, and the {111} area ratio of each of the upper, central and lower portions is determined by dividing a cross section of a plate-shaped sputtering target perpendicular to a sputtering surface into three equal portions: the upper portion, the central portion and the lower portion from a sputtering surface side in a normal direction of the sputtering surface at an intermediate position between a center and an outer circumference of the sputtering surface of the plate-shaped sputtering target, and measuring a crystal orientation distribution of each of measured regions of the upper portion, the central portion, and the lower portion using an EBSD method:
the {111} area ratio=total area of crystal grains having a {111} plane oriented in the normal direction in the measured regions/total area of the measured regions Equation (1);
the rate of change=[maximum value−minimum value]/minimum value Equation (2).
Provided is a CdZnTe monocrystalline substrate which has a small leakage current even when a voltage is applied from a low voltage to a high voltage, and which has a lower variation in resistivity with respect to applied voltage changes from 0 to 900 V, and which can maintain a stable resistivity. A semiconductor wafer comprising a cadmium zinc telluride monocrystal having a zinc concentration of 4.0 at % or more and 6.5 at % or less and a chlorine concentration of 0.1 ppm by weight or more and 5.0 ppm by weight or less, wherein when a voltage is applied in a range of from 0 to 900 V, the semiconductor wafer has a resistivity for each applied voltage value of 1.0×107 Ωcm or more and 7.0×108 Ωcm or less, and wherein a relative variation coefficient of each resistivity to the applied voltages in a range of from 0 to 900 V is 100% or less.
Provided are: an electronic component scrap sorting method with which it is possible to appropriately determine a scrap mixture including multiple types of components; and an electronic component scrap processing method. This electronic component scrap sorting method comprises: a location/shape identification step for identifying the location and shape of each electronic component scrap from among multiple pieces of electronic component scraps having different shapes so as to obtain location/shape identification information that contains location information and shape information of the respective electronic component scraps; a feature analysis step for analyzing at least two features from each of the electronic component scraps so as to obtain feature analysis information; and a sorting step for, on the basis of the location/shape identification information and the feature analysis information, sorting the respective electronic component scraps by predetermined component types by using at least two features associated with one certain type of electronic component scraps that have the same shape and are at the same location.
A method for recovering at least cobalt of valuable metals, cobalt and nickel, from an acidic solution obtained by subjecting waste containing positive electrode materials for lithium ion secondary batteries to a wet process, the acidic solution comprising cobalt ions, nickel ions and impurities, the method including: a first extraction step for Co recovery, the first extraction step being for extracting cobalt ions by solvent extraction from the acidic solution and stripping the cobalt ions; and a second extraction step for Co recovery, the second extraction step being for extracting cobalt ions by solvent extraction from a stripped solution obtained in the first extraction step for Co recovery and stripping the cobalt ions, wherein the first extraction step for Co recovery includes: a solvent extraction process for extracting cobalt ions in the acidic solution into a solvent; a scrubbing process for scrubbing the solvent that has extracted the cobalt ions; and a stripping process for stripping the cobalt ions in the solvent after the scrubbing into a solution.
C30B 11/08 - Single-crystal-growth by normal freezing or freezing under temperature gradient, e.g. Bridgman- Stockbarger method adding crystallising materials or reactants forming it in situ to the melt every component of the crystal composition being added during the crystallisation
H01L 31/10 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
91.
SULFIDE-BASED SOLID ELECTROLYTE AND ALL-SOLID-STATE LITHIUM ION BATTERY
H01B 1/06 - Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances
H01B 1/10 - Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of other non-metallic substances sulfides
A method for recovering at least cobalt of valuable metals, cobalt and nickel, from an acidic solution obtained by subjecting waste containing positive electrode materials for lithium ion secondary batteries to a wet process, the acidic solution comprising cobalt ions, nickel ions and impurities, wherein the method includes: a first extraction step for Co recovery, the first extraction step being for extracting cobalt ions by solvent extraction from the acidic solution and stripping the cobalt ions; an electrolytic step for Co recovery, the electrolytic step being for providing electrolytic cobalt by electrolysis using a stripped solution obtained in the first extraction step for Co recovery as an electrolytic solution; a dissolution step for Co recovery, the dissolution step being for dissolving the electrolytic cobalt in an acid; and a second extraction step for Co recovery, the second extraction step being for extracting cobalt ions by solvent extraction from a cobalt dissolved solution obtained in the dissolution step for Co recovery and stripping the cobalt ions.
C22B 3/00 - Extraction of metal compounds from ores or concentrates by wet processes
C22B 7/00 - Working-up raw materials other than ores, e.g. scrap, to produce non-ferrous metals or compounds thereof
H01M 10/54 - Reclaiming serviceable parts of waste accumulators
H01M 10/0525 - Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodes; Lithium-ion batteries
C25C 1/08 - Electrolytic production, recovery or refining of metals by electrolysis of solutions of iron group metals, refractory metals or manganese of nickel or cobalt
93.
COPPER POWDER, AND METHOD FOR MANUFACTURING COPPER POWDER
A copper powder containing copper particles, such that, in a solution that has a copper ion concentration of 10 g/L and that is obtained by the copper particles of the copper powder being dissolved by nitric acid, the number of particles having a grain diameter of 1.5 μm or greater as measured using a liquid particle counter is 10000 or less per 10 mL.
B22F 9/24 - Making metallic powder or suspensions thereof; Apparatus or devices specially adapted therefor using chemical processes with reduction of metal compounds starting from liquid metal compounds, e.g. solutions
H01B 1/02 - Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
H01B 5/00 - Non-insulated conductors or conductive bodies characterised by their form
H01B 13/00 - Apparatus or processes specially adapted for manufacturing conductors or cables
B22F 1/00 - Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
The present invention provides: a plated material which has low insertion force (low friction) and durability at high temperatures; and an electronic component. A plated material which is provided with: a base plating layer that is composed of Ni or an Ni alloy, and is provided on the surface of a base material; an intermediate layer that is composed of an In-Ni-Sn alloy, and is provided on the base plating layer; and a surface layer that is composed of an In-Sn alloy, and is provided on the intermediate layer.
There is provided a more versatile technique that is useful for enhancing the sintering delay property of a metal powder. A metal powder surface-treated with at least one coupling agent comprising Si, Ti, Al or Zr, wherein a total adhesion amount of Si, Ti, Al and Zr is 200 to 10,000 μg with respect to 1 g of the surface-treated metal powder, wherein a 1% by mass aqueous solution of the coupling agent indicates a pH of 7 or less, and wherein a sintering starting temperature is 500° C. or higher.
H01B 1/22 - Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
B22F 1/145 - Chemical treatment, e.g. passivation or decarburisation
H01B 1/02 - Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors mainly consisting of metals or alloys
H01B 5/14 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
B22F 1/103 - Metallic powder containing lubricating or binding agents; Metallic powder containing organic material containing an organic binding agent comprising a mixture of, or obtained by reaction of, two or more components other than a solvent or a lubricating agent
The present invention involves an arsenic flotation step of subjecting, to flotation, slurry in which mineral ores including a copper mineral substance and an arsenic mineral substance are mixed without adding a collector or with a collector added thereto in an amount of 10 g or less per 1 ton of the mineral ores to obtain: a floating ore including the arsenic mineral substance; and a tailing ore including the copper mineral substance.
Provided is a cylindrical sputtering target made of a metal material, which has reduced particles. The sputtering target includes at least a target material, wherein the target material includes one or more metal elements, and has a crystal grain size of 10 μm or less.
A method for processing positive electrode active material waste of lithium ion secondary batteries, the waste containing cobalt, nickel, manganese and lithium, the method including: a carbon mixing step of mixing the positive electrode active material waste in the form of powder with carbon to obtain a mixture having a ratio of a mass of carbon to a total mass of the positive electrode active material waste and the carbon of from 10% to 30%; a roasting step of roasting the mixture at a temperature of from 600° C. to 800° C. to obtain roasted powder; a dissolution step including a first dissolution process of dissolving lithium in the roasted powder in water or a lithium-containing solution, and a second dissolution process of dissolving the lithium in a residue obtained in the first dissolution process in water; and an acid leaching step of leaching a residue obtained in the lithium dissolution step with an acid.
Provided is a cylindrical sputtering target made of a metal material, which has reduced particles. The sputtering target includes at least a target material, wherein the target material comprises one or more metal elements, the target material has a crystal grain size of 50 μm or less, and the target material has an oxygen concentration of 1000 ppm by mass or less.
