HORIBA, Ltd.

Japan

Back to Profile

1-100 of 368 for HORIBA, Ltd. and 4 subsidiaries Sort by
Query
Patent
World - WIPO
Excluding Subsidiaries
Aggregations Reset Report
Owner / Subsidiary
[Owner] HORIBA, Ltd. 368
HORIBA STEC, Co., Ltd. 4
Horiba ABX SAS 3
Horiba Europe GmbH 2
Horiba Instruments Incorporated 2
Date
New (last 4 weeks) 4
2024 October (MTD) 1
2024 September 3
2024 August 1
2024 July 6
See more
IPC Class
G01M 17/007 - Wheeled or endless-tracked vehicles 40
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence 38
G01N 1/22 - Devices for withdrawing samples in the gaseous state 36
G01N 15/02 - Investigating particle size or size distribution 35
G01N 1/00 - Sampling; Preparing specimens for investigation 28
See more
Found results for  patents
  1     2     3     4        Next Page

1.

TEST SPECIMEN DISPLAY RECOGNITION DEVICE, TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DISPLAY SETTING DEVICE, TEST SPECIMEN DISPLAY RECOGNITION METHOD, AND TEST SPECIMEN DISPLAY RECOGNITION PROGRAM

      
Application Number JP2024013028
Publication Number 2024/204704
Status In Force
Filing Date 2024-03-29
Publication Date 2024-10-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Michikita, Toshiyuki
  • Yoshinaka, Yuji
  • Prasad, Rohit Shiv
  • Yabushita, Hirotaka
  • Matsueda, Atsuo
  • Otake, Ryoga

Abstract

The present invention provides a test specimen display recognition device for identifying a test specimen display for indicating a state of a test specimen, from an image obtained by imaging a meter panel of the test specimen by means of a camera, the test specimen display recognition device comprising: a setting information accepting unit for accepting a selection signal indicating the type of an image recognition algorithm for identifying the test specimen display from the image; a setting information storage unit for storing the selection signal accepted by the setting information accepting unit as setting information; and a test sample display recognition unit for acquiring the setting information from the setting information storage unit and identifying an instructed value indicated by test specimen display on the basis of the setting information.

IPC Classes  ?

2.

CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT APPARATUS AND CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT METHOD

      
Application Number JP2024005978
Publication Number 2024/190313
Status In Force
Filing Date 2024-02-20
Publication Date 2024-09-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamaguchi, Tetsuji
  • Igushi, Tatsuo
  • Sato, Yusui
  • Yashiki, Shota

Abstract

With the purpose of enabling multiple kinds of substances contained in a sample to be analyzed all at once without requiring replacement of light sources and other such labor by using a centrifugal sedimentation-type measurement apparatus, this invention additionally involves a second light source that illuminates a cell with light having a wavelength different from the wavelength of light from a first light source, and a second detector that detects secondary light generated due to the sample being illuminated with the light from the second light source.

IPC Classes  ?

  • G01N 15/04 - Investigating sedimentation of particle suspensions

3.

SPECIMEN ANALYZER, SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN DISPENSING METHOD

      
Application Number JP2024007536
Publication Number 2024/190437
Status In Force
Filing Date 2024-02-29
Publication Date 2024-09-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Hirata Katsuki
  • Sano Tomoki

Abstract

This specimen analyzer is provided with a specimen measuring cell and a dispensing mechanism for dispensing a specimen. The dispensing mechanism dispenses a specimen into the specimen measuring cell and a test device that is held at a different position from the specimen measuring cell.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
  • G01N 37/00 - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES - Details not covered by any other group of this subclass

4.

ELEMENTAL ANALYSIS DEVICE AND ELEMENTAL ANALYSIS METHOD

      
Application Number JP2024005932
Publication Number 2024/181221
Status In Force
Filing Date 2024-02-20
Publication Date 2024-09-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamada, Takahiro
  • Kawakami, Shun
  • Park, Sangwoon

Abstract

An elemental analysis device 100 comprises: a heating furnace 1 that heats a sample to generate a sample gas G; a flow path L1 through which the sample gas G flows; a flow rate adjusting unit 3 provided in the flow path L1 to adjust the flow rate of the sample gas G; an oxidizer 4 provided downstream of the flow rate adjusting unit 3 in the flow path L1 to oxidize the sample gas G; and an analyzing unit 5 provided downstream of the oxidizer 4 in the flow path L1 to analyze elements contained in the sample gas G.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups; Apparatus specially adapted for such methods using combustion
  • G01N 31/00 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups; Apparatus specially adapted for such methods

5.

PARTICLE DIAMETER DISTRIBUTION MEASUREMENT DEVICE, PARTICLE DIAMETER DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE DIAMETER DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024002288
Publication Number 2024/166705
Status In Force
Filing Date 2024-01-25
Publication Date 2024-08-15
Owner HORIBA, LTD. (Japan)
Inventor Sugasawa, Hirosuke

Abstract

A particle diameter distribution measurement device 100 comprising an imaging means 3 that images particles in a cell 1 and an analysis unit 41 that calculates a particle diameter distribution by calculating diffusion velocity due to Brownian motion of the particles in imaging data obtained by the imaging means 3, said particle diameter distribution measurement device 100 being provided with: a data group acquisition unit 43 that acquires, at each of a plurality of focus positions in the cell 1, an imaging data group which comprises a plurality of pieces of imaging data obtained by the imaging means 3; a variable value calculation unit 44 that calculates a variable value of a prescribed evaluation parameter obtained from each of the plurality of pieces of imaging data constituting the imaging data groups; and a focus position determination unit 45 that, on the basis of variable values respectively corresponding to the plurality of focus positions, determines a measurement focus position to be used during measurement.

IPC Classes  ?

6.

ANALYSIS DEVICE, ANALYSIS METHOD, AND OZONE DECOMPOSER

      
Application Number JP2023041259
Publication Number 2024/142653
Status In Force
Filing Date 2023-11-16
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Otsuka, Gaku
  • Yamada, Ryusuke
  • Mizumoto, Kazunori

Abstract

The present invention addresses the problem of generating, from a sample gas, a suitable reference gas from which components other than ozone are not excessively removed. An analysis device (100) comprises: a measurement cell (1) into which a sample gas (Gs) and a reference gas (Gr) are alternately introduced; a light source (3) that outputs measurement light (L); a detection unit (5) that detects measurement light (L) which has passed through the measurement cell (1); a computation unit (91) that analyzes the ozone contained in the sample gas (Gs); and an ozone decomposer (71) that generates the reference gas (Gr) from the sample gas (Gs) by means of heating. The ozone decomposer (71) includes: an introduction tube (71a) for introducing the sample gas (Gs); a heating unit (71b) that heats the introduction tube (71a); and a porous first filling material (71c) that is filled into the heated portion of the introduction tube (71a) heated by the heating unit (71b), and that comprises a substance which is inert to sulfur dioxide.

IPC Classes  ?

  • G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
  • G01N 21/61 - Non-dispersive gas analysers

7.

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

      
Application Number JP2023045761
Publication Number 2024/143122
Status In Force
Filing Date 2023-12-20
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Wakabayashi, Satoru
  • Uchigashima, Mikiko
  • Naka, Nobuyuki

Abstract

Provided are a spectroscopic analysis device and a spectroscopic analysis method that can analyze components in a liquid sample over a wide concentration range. The spectroscopic analysis device comprises: a first analysis unit that performs fluorescence spectroscopic analysis and/or absorption spectroscopic analysis on a first component contained in a liquid sample by using secondary light generated from the liquid sample irradiated with primary light; a second analysis unit that performs Raman spectroscopic analysis on a second component contained in the liquid sample by using the secondary light generated from the liquid sample irradiated with primary light; a concentration measurement unit that measures the concentration of the first component and the second component contained in the liquid sample; and a control unit. The control unit causes the first analysis unit or the second analysis unit to perform analysis in accordance with the concentration measured by the concentration measurement unit.

IPC Classes  ?

  • G01N 21/65 - Raman scattering
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/64 - Fluorescence; Phosphorescence

8.

VEHICLE DIAGNOSIS DEVICE, VEHICLE DIAGNOSIS METHOD, AND VEHICLE DIAGNOSIS PROGRAM

      
Application Number JP2023037166
Publication Number 2024/142547
Status In Force
Filing Date 2023-10-13
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiota Aoi
  • Kawazoe Hiroshi
  • Saito Takashi
  • Tanaka Sayaka
  • Nishikawa Masahiro

Abstract

This vehicle diagnosis device comprises: a feature data acquisition unit for acquiring a plurality of items of feature data included in a prescribed output pattern of a vehicle; a real data acquisition unit for acquiring output data based on real travel by the vehicle in a prescribed period in the past, and real measured data indicating real measured quantities with regard to a parameter required for vehicle diagnosis during travel of the vehicle in the prescribed period; an equivalent pattern generation unit for generating an equivalent output pattern regarded as equivalent to the prescribed output pattern by splicing out, from the output data of the prescribed period, points or segments similar to the plurality of items of feature data; and a real measured quantity extraction unit for extracting the real measured quantities of each of the points or each of the segments included in the equivalent output pattern from the real measured data in the prescribed period.

IPC Classes  ?

  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • B60L 3/00 - Electric devices on electrically-propelled vehicles for safety purposes; Monitoring operating variables, e.g. speed, deceleration or energy consumption
  • B60L 15/20 - Methods, circuits or devices for controlling the propulsion of electrically-propelled vehicles, e.g. their traction-motor speed, to achieve a desired performance; Adaptation of control equipment on electrically-propelled vehicles for remote actuation from a stationary place, from alternative parts of the vehicle or from alternative vehicles of the same vehicle train for control of the vehicle or its driving motor to achieve a desired performance, e.g. speed, torque, programmed variation of speed
  • B60L 50/60 - Electric propulsion with power supplied within the vehicle using propulsion power supplied by batteries or fuel cells using power supplied by batteries
  • B60L 58/12 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to state of charge [SoC]
  • B60L 58/16 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to battery ageing, e.g. to the number of charging cycles or the state of health [SoH]
  • F02D 45/00 - Electrical control not provided for in groups
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

9.

GAS MEASUREMENT SYSTEM AND GAS MEASUREMENT METHOD

      
Application Number JP2023040601
Publication Number 2024/142622
Status In Force
Filing Date 2023-11-10
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Oida Takuji
  • Ishida Kentaro
  • Yokota Yoshihiro
  • Fujiwara Masahiko

Abstract

A gas measurement system comprising a first oxygen concentration sensor which measures, as a first oxygen concentration, the concentration of oxygen in an exhaust gas exhausted from a test specimen on the basis of a pressure difference between the oxygen in the exhaust gas and a first reference gas in which the concentration of oxygen is a first predetermined concentration, a first reference gas supply unit which supplies the first reference gas to the first oxygen concentration sensor, and a calculation unit which calculates an oxygen consumption amount of the test specimen on the basis of a flow amount of the exhaust gas and the first oxygen concentration. The first predetermined concentration of the first reference gas is set within a first predetermined range with respect to the first oxygen concentration.

IPC Classes  ?

  • B60L 58/30 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling fuel cells
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 27/74 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables of fluids

10.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2023041258
Publication Number 2024/142652
Status In Force
Filing Date 2023-11-16
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Okuda, Tatsuya
  • Otsuka, Gaku
  • Mizumoto, Kazunori
  • Nagasawa, Kenya

Abstract

12111) is inputted, declines to or below a prescribed threshold (Th).

IPC Classes  ?

  • G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
  • G01N 21/61 - Non-dispersive gas analysers

11.

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

      
Application Number JP2023045769
Publication Number 2024/143124
Status In Force
Filing Date 2023-12-20
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor Wakabayashi, Satoru

Abstract

Provided are a spectroscopic analysis device and a spectroscopic analysis method, whereby the precision of spectroscopic analysis can be enhanced by more accurately performing correction of detection results. The spectroscopic analysis device comprises: an imaging element that has a first region and a second region different from the first region, and detects light that is incident on the first region and the second region; a first optical system that radiates primary light to a sample and causes secondary light generated from the sample to be incident on the first region; a second optical system that causes reference light to be incident on the second region; and an analysis unit that corrects a result of detection of the secondary light incident on the first region, on the basis of a result of detection of the reference light incident on the second region.

IPC Classes  ?

12.

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND PROGRAM FOR OPTICAL ANALYSIS DEVICE

      
Application Number JP2023026667
Publication Number 2024/134949
Status In Force
Filing Date 2023-07-20
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor Saito, Takashi

Abstract

Provided is an optical analysis device 1 that analyses a component of interest by leading, to a measuring cell 4, light which has been emitted from a light source 2 and detecting, with a detector, light which has passed through the measuring cell 4, said optical analysis device 1 comprising: a moving mirror 8 that reflects the light emitted from the light source 2 while reciprocating; a moving mechanism 9 that reciprocates the moving mirror 8; a movement control unit 11a that controls the application voltage or application current to the moving mechanism 9; and a cause inference unit 11f that uses actual waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time, and reference waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time and which has been obtained in advance, to infer a cause of an anomaly which affects the moving mirror.

IPC Classes  ?

  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01J 3/45 - Interferometric spectrometry
  • G01N 21/45 - Refractivity; Phase-affecting properties, e.g. optical path length using Schlieren methods
  • G02B 26/06 - Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

13.

TEST-SUBJECT-TESTING SYSTEM, TEST-SUBJECT-TESTING METHOD, AND TEST-SUBJECT-TESTING PROGRAM

      
Application Number JP2023037562
Publication Number 2024/135072
Status In Force
Filing Date 2023-10-17
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor Kawazoe, Hiroshi

Abstract

The present invention is a test-subject-testing system that tests a test subject while spraying water droplets in accordance with the velocity of the test subject and recreating rainfall or snowfall, the test-subject-testing system testing a test subject that is a vehicle or a part thereof, the test-subject-testing system comprising: a test device on which the test subject is placed or to which the test subject is connected; a spray unit for spraying water droplets towards the test subject from the surroundings of the test subject; and a changing unit for changing the spray speed, the position, or the angle of the spray unit according to the velocity of the test subject.

IPC Classes  ?

14.

GAS MEASURING SYSTEM, GAS MEASURING METHOD, AND GAS MEASURING PROGRAM

      
Application Number JP2023040600
Publication Number 2024/135153
Status In Force
Filing Date 2023-11-10
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Oida Takuji
  • Nakatani Shigeru
  • Ishida Kentaro

Abstract

This gas measuring system comprises: a flowmeter for measuring a flow rate of a gas flowing through a pipe, to acquire flow rate information comprising time-series data; a first gas sensor for measuring a concentration of a prescribed gas component contained in the gas, to acquire first concentration information comprising time-series data; a second gas sensor for measuring the concentration of the prescribed gas component contained in the gas, to acquire second concentration information comprising time-series data; and a computing unit for calculating a time difference between measuring times of the concentrations of the prescribed gas component contained in the gas, on the basis of the first concentration information and the second concentration information, and correcting a time deviation in the first concentration information or the second concentration information with respect to the flow rate information on the basis of the calculated time difference.

IPC Classes  ?

  • G01N 27/26 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by using electrolysis or electrophoresis

15.

TEST SPECIMEN TESTING SYSTEM AND TEST SPECIMEN TESTING METHOD

      
Application Number JP2023041298
Publication Number 2024/135178
Status In Force
Filing Date 2023-11-16
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor Kawazoe, Hiroshi

Abstract

The present invention provides a test specimen testing system 100 for testing a test specimen while reproducing splashing generated from a vehicle traveling at the periphery thereof, the test specimen testing system being used to test a test specimen W, which is a vehicle or part thereof, and comprising: a testing device 2 having the test specimen W installed therein or connected thereto; and a splash simulating device 3 for simulating splashing from another vehicle.

IPC Classes  ?

16.

SPECTROSCOPIC ANALYSIS DEVICE, SPECTROSCOPIC ANALYSIS METHOD, SPECTROSCOPIC ANALYSIS PROGRAM, LEARNING DEVICE, LEARNING METHOD, AND LEARNING PROGRAM

      
Application Number JP2023043717
Publication Number 2024/135369
Status In Force
Filing Date 2023-12-06
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Saito, Takashi
  • Gyoten, Yuji
  • Nishimura, Katsumi

Abstract

The present invention provides a spectroscopic analysis device with which a concentration of a measurement target component is measured accurately from a measured spectrum without obtaining a calibration curve for each spectroscopic analysis device, the spectroscopic analysis device comprising: a spectrum generating unit 51 for generating a spectrum of light that has been transmitted through a sample; a storage unit 52 for storing a standard calibration curve created by a standard device 200 and a standard spectrum generated by the standard device 200, the standard spectrum serving as a standard for the spectroscopic analysis device; a correcting unit 53 for correcting either a measured spectrum, which is the spectrum of the sample generated by the spectrum generating unit 51, or the standard calibration curve, on the basis of a comparison result between a reference spectrum, which is a spectrum of a standard gas, generated by the spectrum generating unit 51, and the standard spectrum; and a concentration calculating unit 54 for calculating the concentration of the measurement target component on the basis of either the standard calibration curve and the corrected measured spectrum, or the corrected standard calibration curve and the measured spectrum.

IPC Classes  ?

  • G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection

17.

EQUIPMENT FOR CALIBRATING PARTICLE COUNT MEASUREMENT DEVICE, CALIBRATION PROGRAM, METHOD FOR DETERMINING PARTICLE SIZE FOR CALIBRATION, AND METHOD FOR CALIBRATING PARTICLE COUNT MEASUREMENT DEVICE

      
Application Number JP2023044809
Publication Number 2024/135520
Status In Force
Filing Date 2023-12-14
Publication Date 2024-06-27
Owner
  • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Kojima Kentarou
  • Murashima Yoshiko
  • Sakurai Hiromu

Abstract

Provided are equipment for calibrating a particle count measurement device, a calibration program, a method for determining particle size for calibration, and a method for calibrating a particle count measurement device with which it is possible to reduce the effect of a post-classification particle size change and perform a more accurate calibration. The calibration equipment 1 is provided with: a particle generation unit 10; an input unit 51; a particle classification unit 20; a particle-sensing unit 30; a computation unit 52 that obtains, on the basis of the particle size distribution of the particles at the particle-sensing unit 30a or a physical quantity factor that causes a change in the particle size at the particle-sensing unit 30, a degree of change by which the particle size of particles arriving at the particle-sensing unit 30 has changed from a target particle size, and calculates, on the basis of the degree of change, a corrective amount for the particle size extracted by the particle classification unit 20 such that the particle size arriving at the particle-sensing unit 30 matches the target particle size; and a correction command unit 53 for issuing, on the basis of the corrective amount calculated by the computation unit 52, a command to the particle classification unit 20 so as to change the particle size of the particles extracted by the particle classification unit 20 to a particle size for calibration.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

18.

MEASUREMENT DEVICE MANAGEMENT APPARATUS, MANAGEMENT METHOD, MANAGEMENT PROGRAM, AND MANAGEMENT SYSTEM

      
Application Number JP2023044863
Publication Number 2024/135532
Status In Force
Filing Date 2023-12-14
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Nakane Ikuya
  • Sakuta Hiromichi
  • Nishimori Masashi
  • Nakajima Kyosuke

Abstract

This measurement device management apparatus comprises a data reception unit that accepts, from a measurement device, data concerning recording of at least one of a first action after input of power to the measurement device and a second action prior to shut-down of operation of the measurement device, and a report creation unit that creates a report including a predetermined period of the data accepted by the data reception unit.

IPC Classes  ?

  • G16H 40/40 - ICT specially adapted for the management or administration of healthcare resources or facilities; ICT specially adapted for the management or operation of medical equipment or devices for the management of medical equipment or devices, e.g. scheduling maintenance or upgrades
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G06Q 10/20 - Administration of product repair or maintenance

19.

VEHICLE TEST SYSTEM, VEHICLE TEST SYSTEM CABLE, AND VEHICLE TEST METHOD

      
Application Number JP2023043705
Publication Number 2024/128100
Status In Force
Filing Date 2023-12-06
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor Togawa, Susumu

Abstract

A vehicle test system 100 for testing a product X under test, which is a vehicle or part thereof, the vehicle test system including a test unit 10 that is provided in one of the inside or outside of the product X under test, a control unit 20 that is provided in the other of the inside or outside of the product X under test and controls the test unit 10, a cable 30 that connects the test unit 10 and control unit 20 and has a shielding layer 43 for noise shielding, and a leakage detection circuit 50 connected to the shielding layer 43.

IPC Classes  ?

  • G01R 31/58 - Testing of lines, cables or conductors
  • G01R 31/52 - Testing for short-circuits, leakage current or ground faults

20.

BATTERY EVALUATION DEVICE, MACHINE LEARNING DEVICE, BATTERY EVALUATION PROGRAM, BATTERY EVALUATION METHOD, MACHINE LEARNING PROGRAM, AND MACHINE LEARNING METHOD

      
Application Number JP2023044163
Publication Number 2024/128174
Status In Force
Filing Date 2023-12-11
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Ding, Li
  • Saito, Takashi
  • Yabushita, Hirotaka
  • Hirose, Jun

Abstract

The present invention makes it possible to accurately calculate the degradation state of a battery from EIS data of the battery, and comprises: a correlation data storage unit that stores correlation data indicating the correlation between DRT data related to relaxation time distribution obtained from EIS data of batteries and degradation states of the batteries; a DRT data acquisition unit that acquires DRT data of an EUT battery being evaluated; and a degradation state calculation unit that calculates the degradation state of the EUT battery on the basis of the DRT data acquired by the DRT data acquisition unit and the correlation data.

IPC Classes  ?

  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

21.

ANALYSIS DEVICE, MACHINE LEARNING DEVICE, CALCULATION DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM

      
Application Number JP2023042471
Publication Number 2024/127968
Status In Force
Filing Date 2023-11-28
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Gyoten, Yuji
  • Saito, Takashi

Abstract

The present invention highly accurately estimates the concentration of a measurement target component included in a measurement sample. The present invention comprises: a measurement sensor that measures a measurement sample and outputs a sensor signal; a correlation data storage unit that stores first correlation data and second correlation data which indicate a correlation between the concentration of the measurement target component included in the measurement sample and the sensor signal or a feature amount determined by the sensor signal and which differ from each other; a first concentration calculation unit that calculates a first concentration of the measurement target component on the basis of the first correlation data and of the sensor signal or the feature amount; a second concentration calculation unit that calculates a second concentration of the measurement target component on the basis of the second correlation data and of the sensor signal or the feature amount; and a third concentration calculation unit that synthesizes a prescribed frequency component of the first concentration and a prescribed frequency component of the second concentration and calculates a third concentration of the measurement target component.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

22.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2023044958
Publication Number 2024/128301
Status In Force
Filing Date 2023-12-15
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Murata, Shunsuke
  • Valiev, Ildar

Abstract

Provided are a signal processing method, a signal processing device, a radiation detecting device, and a computer program for obtaining an accurate radiation spectrum in a stable manner. The signal processing method involves: measuring a slope of a non-response line, which is a part, other than a staircase wave generated in response to radiation detection, included in a signal that includes the staircase wave; measuring a wave height of the staircase wave; and correcting the wave height in accordance with the slope.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation

23.

MEASUREMENT METHOD, MEASUREMENT SYSTEM AND TEST REAGENT KIT

      
Application Number JP2023035443
Publication Number 2024/095648
Status In Force
Filing Date 2023-09-28
Publication Date 2024-05-10
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ABX SAS (France)
Inventor
  • Manio Mark Christian Carizon
  • Nishimura Tanikawa Jun Ivan
  • Igushi Tatsuo
  • Donnarumma Dario

Abstract

A measurement method for determining the concentration of reticulocytes or nucleated red blood cells contained in a blood specimen, the measurement method including a staining step, a removal step and a measurement step. In the staining step, reticulocytes or nucleated red blood cells, among red blood cells contained in the blood specimen, are stained. In the removal step, a surfactant is added to the blood specimen to take out hemoglobin from the red blood cells. In the measurement step, the concentration of the reticulocytes or nucleated red blood cells contained in the blood specimen is determined using the blood specimen after the staining and removal steps.

IPC Classes  ?

  • G01N 33/49 - Physical analysis of biological material of liquid biological material blood

24.

ANALYSIS DEVICE, METHOD FOR DRIVING LASER ELEMENT, AND ANALYSIS METHOD

      
Application Number JP2023032392
Publication Number 2024/090042
Status In Force
Filing Date 2023-09-05
Publication Date 2024-05-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Terakado, Tomoji
  • Adachi, Masayuki
  • Nakatani, Shigeru

Abstract

The present invention provides a high performance analysis device while utilizing a laser element that oscillates in a plurality of longitudinal modes. This analysis device comprises a laser element 31 that irradiates a sample with laser light L1, a drive unit 4 that drives the laser element 31, and a photodetector 5 that detects the laser light L1 that has passed through the sample. The laser element 31 oscillates in a plurality of longitudinal modes to emit the laser light L1 having a plurality of oscillation wavelengths. The drive unit 4 pulses the laser element 31 and causes the laser element 31 to sweep through the plurality of oscillation wavelengths for each pulse.

IPC Classes  ?

  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

25.

INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM

      
Application Number JP2023035235
Publication Number 2024/090109
Status In Force
Filing Date 2023-09-27
Publication Date 2024-05-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Someya, Shota
  • Iida, Hiroshi
  • Kanzaki, Toyoki
  • Nakagawa, Kazuya

Abstract

The present invention comprises: a light irradiation unit 2 that irradiates a light-transmissive and film-like test object W with inspection light L1; a scattered light detection unit 3 for detecting scattered light L2 which is produced from the test object W; a diffracted light detection section 4 for detecting diffracted light L3 which is produced from the test object W; and a signal processing unit 5 that determines, on the basis of a scattered light intensity signal from the scattered light detection unit 3 and a diffracted light intensity signal from the diffracted light detection unit 4, the presence or absence of foreign matter S which has adhered to the test object W and the presence or absence of a pinhole P which has been formed in the test object W.

IPC Classes  ?

  • G03F 1/62 - Pellicles or pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
  • G01N 21/894 - Pinholes

26.

BATTERY PERFORMANCE ESTIMATION METHOD, BATTERY PERFORMANCE ESTIMATION DEVICE, AND BATTERY PERFORMANCE ESTIMATION PROGRAM

      
Application Number JP2023035784
Publication Number 2024/080171
Status In Force
Filing Date 2023-09-29
Publication Date 2024-04-18
Owner HORIBA, LTD. (Japan)
Inventor Yoshida, Kotaro

Abstract

According to the present invention, the performance of a battery manufactured using carbon as a negative electrode active material is estimated with high accuracy from the physical properties of the carbon. A method for estimating the performance of a battery manufactured using carbon as a negative electrode active material from the physical properties of the carbon is characterized in that the performance of the battery is estimated using a machine learning model obtained on the basis of training data including the following physical properties (a) and (b) of carbon, and values related to the battery performance measured for the battery manufactured using the carbon as the negative electrode active material. (a) The ratio (ID/IG) of the peak top intensity (ID) of the D band calculated from the Raman spectrum to the peak top intensity (IG) of the G band or a value relating to the ratio (b) The width of the G band calculated from the Raman spectrum or a value relating to the width

IPC Classes  ?

  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/387 - Determining ampere-hour charge capacity or SoC
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

27.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, AND RADIATION DETECTION DEVICE

      
Application Number JP2023033568
Publication Number 2024/070737
Status In Force
Filing Date 2023-09-14
Publication Date 2024-04-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Ishikura, Koji
  • Okubo, Yuji
  • Matsunaga, Daisuke

Abstract

Provided are a radiation detection element, a radiation detector, and a radiation detection device with which it is possible to increase a sensitive region. This radiation detection element comprises: a semiconductor part having an incident surface on which radiation is incident; a first electrode which is provided on a surface on the rear side of the incident surface, and into which charges, generated inside the semiconductor part by the incidence of radiation, flow; and a second electrode which is disposed on the incident surface and positioned on the rear side of the first electrode, and to which a voltage required for the inflow of the charges to the first electrode, wherein the radiation detection element includes a third electrode provided on the incident surface and disposed at a position surrounding the second electrode, the third electrode is electrically connected to the second electrode, and a voltage is applied across the second electrode and the third electrode such that the potential changes from the third electrode to the second electrode.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

28.

TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN TESTING METHOD, AND TEST SPECIMEN TESTING PROGRAM

      
Application Number JP2023034178
Publication Number 2024/070865
Status In Force
Filing Date 2023-09-21
Publication Date 2024-04-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Yoshinaka, Yuji
  • Koyama, Satoshi

Abstract

The objective of the present invention is to reduce the number of man-hours required for testing a vehicle that includes an automated driving system or an advanced driving assistance system, and to enable a development period for the same to be reduced, and to this end, the present invention provides a test specimen testing system 100 for testing a test specimen W, which is a vehicle including an ADAS or an AD, or a portion of said vehicle, the test specimen testing system 100 comprising a dynamometer 2 for causing the test specimen W to run in a simulated manner, an ambient environment input device 3 for inputting an ambient environment to the test piece W, and an automated driving robot 4 for performing a brake operation, an accelerator operation, or a steering wheel operation of the test specimen W, wherein, on the basis of an input from the ambient environment input device 3, the automated driving robot 4 causes an active running state in which the test specimen W runs actively by means of the ADAS or the AD, and a passive running state in which the test specimen W runs passively by means of the brake operation, the accelerator operation or the steering wheel operation, to be linked together.

IPC Classes  ?

29.

FLUORESCENCE ANALYSIS CELL, FLUORESCENCE ANALYSIS DEVICE, FLUORESCENCE ANALYSIS METHOD, AND METHOD FOR MANUFACTURING CELL TO BE SUBJECTED TO ANALYSIS

      
Application Number JP2023030431
Publication Number 2024/062833
Status In Force
Filing Date 2023-08-24
Publication Date 2024-03-28
Owner HORIBA, LTD. (Japan)
Inventor
  • Kitagawa, Yuichi
  • Higuchi,seiji
  • Mimura, Susumu

Abstract

Provided is a fluorescence analysis cell 10 for use in fluorescence analysis on a liquid X of interest, the fluorescence analysis cell 10 comprising a pair of translucent portions 11a, 11b opposed to each other with an internal space containing the liquid X of interest therebetween and a spacer portion 12 provided to surround the internal space so that the distance between opposed surfaces 111a, 111b of the pair of translucent portions 11a, 11b is 500 nm to 1 mm inclusive.

IPC Classes  ?

30.

SAMPLE INSERTING DEVICE, SAMPLE INSERTING SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, AND SAMPLE INSERTING METHOD

      
Application Number JP2023032788
Publication Number 2024/058063
Status In Force
Filing Date 2023-09-08
Publication Date 2024-03-21
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

The present invention provides a sample inserting device for automating the insertion of a powder sample into a sample introduction unit of a particle size distribution measuring device, while performing the insertion reliably, the sample inserting device comprising: a movement mechanism 31 for causing a holding tube 41, which is capable of holding a powder sample S in a tip end opening portion 41x, to move between a collecting position P at which the tip end opening portion 41x is inserted into the powder sample S in a sample container 10 to collect the powder sample S, and an insertion position Q for inserting the powder sample S into the sample introduction unit 21; and a pushing out mechanism 32 which, in a state in which the holding tube 41 is at the insertion position Q, pushes the powder sample S held in the tip end opening portion 41x from the tip end opening portion 41x to the outside.

IPC Classes  ?

  • G01N 1/00 - Sampling; Preparing specimens for investigation
  • G01N 15/02 - Investigating particle size or size distribution

31.

ANALYSIS SYSTEM AND ANALYSIS METHOD

      
Application Number JP2023029084
Publication Number 2024/053328
Status In Force
Filing Date 2023-08-09
Publication Date 2024-03-14
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsumoto, Erika
  • Sando, Shota
  • Hirose, Jun

Abstract

The present invention chronologically monitors the environment within a prescribed facility at short time intervals. This analysis system (100) comprises a data acquisition unit (1) and an analysis unit (35). The data acquisition unit (1) collects, at prescribed intervals, particulate matter that is present within a prescribed facility, and calculates chronological data (RD) relating to the collected particulate matter. The analysis unit (35) acquires, on the basis of the data (RD) relating to the particulate matter calculated by the data acquisition unit (1), environment information relating to the environment within the prescribed facility. The data (RD) relating to the particulate matter includes element data relating to elements contained in the particulate matter.

IPC Classes  ?

  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/10 - Investigating individual particles
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 1/02 - Devices for withdrawing samples

32.

VERIFICATION-CYCLE GENERATION METHOD, VERIFICATION-CYCLE GENERATION SYSTEM, AND VERIFICATION-CYCLE GENERATION PROGRAM

      
Application Number JP2023024823
Publication Number 2024/029257
Status In Force
Filing Date 2023-07-04
Publication Date 2024-02-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Bates, Luke
  • Tabata, Kunio
  • Roberts, Philip
  • Whelan, Steven

Abstract

The present invention is a verification-cycle generation method for generating a verification cycle for automobile development, the verification cycle being realistic and satisfying boundary conditions for a plurality of automobiles, wherein a plurality of data sets concerning a driving cycle are input, the plurality of data sets are individually clustered and classified into a plurality of data groups, a plurality of verification cycles concerning automobile development are generated on the basis of the plurality of clustered data groups, each of the plurality of verification cycles is executed through simulation or with a real automobile, and a representative cycle, which best satisfies a criterion defined by a user, is selected from among the plurality of verification cycles.

IPC Classes  ?

33.

GAS ANALYZING DEVICE

      
Application Number JP2023026187
Publication Number 2024/019029
Status In Force
Filing Date 2023-07-18
Publication Date 2024-01-25
Owner HORIBA, LTD. (Japan)
Inventor
  • Nishimura, Katsumi
  • Nakatani, Shigeru

Abstract

The present invention is provided with: a multi-reflection cell 30 into which sample gas comprising a plurality of components is introduced; a first analyzing mechanism 10 that causes first light to enter the multi-reflection cell 30, that detects the first light passed through the multi-reflection cell 30, and that analyzes the components of the sample gas according to a first principle; and a second analyzing mechanism 20 that causes second light to enter the multi-reflection cell 30, that detects the second light passed through the multi-reflection cell, and that analyzes the components of the sample gas according to a second principle, which is different from the first principle.

IPC Classes  ?

  • G01J 3/02 - Spectrometry; Spectrophotometry; Monochromators; Measuring colours - Details
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/61 - Non-dispersive gas analysers

34.

GAS ANALYZING DEVICE, PRESSURE CONTROL METHOD, AND PROGRAM

      
Application Number JP2023021331
Publication Number 2024/009680
Status In Force
Filing Date 2023-06-08
Publication Date 2024-01-11
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagasawa, Kenya
  • Yamada, Ryusuke
  • Mizumoto, Kazunori

Abstract

The objective of the present invention is to suppress pressure variations in a reaction unit. A gas analyzing device (100) comprises a reaction unit (1), an evacuating unit (3), a first gas line (L1), a pressure control unit (5), a pressure measuring unit (7), and a control unit (9). The reaction unit (1) causes an analysis target gas to interact with a luminescence-inducing gas. The evacuating unit (3) evacuates the reaction unit (1). The first gas line (L1) connects the reaction unit (1) and the evacuating unit (3). The pressure control unit (5) is connected to the first gas line (L1) and is capable of introducing an external gas into the first gas line (L1), and controls the pressure in the reaction unit (1) by controlling a flow rate of the gas introduced into the first gas line (L1). The pressure measuring unit (7) measures the absolute pressure in the reaction unit (1). The control unit (9) controls the pressure control unit (5) on the basis of the absolute pressure in the reaction unit (1) measured by the pressure control unit (7), thereby controlling the flow rate of the gas introduced into the first gas line (L1) such that the pressure in the reaction unit (1) is a predetermined pressure.

IPC Classes  ?

  • G01N 1/00 - Sampling; Preparing specimens for investigation
  • G01N 21/76 - Chemiluminescence; Bioluminescence

35.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2023021332
Publication Number 2024/009681
Status In Force
Filing Date 2023-06-08
Publication Date 2024-01-11
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizumoto, Kazunori
  • Kagawa, Akifumi

Abstract

The present invention reduces the frequency of maintenance of a gas analysis device. A gas analysis device (100) comprises: a cell (1); a light source (3); a detection unit (5); and a control unit (7). The cell (1) has a sample gas (SG) introduced thereinto. The light source (3) emits measurement light (L1) onto the cell (1) at prescribed light-emitting intervals (T). The detection unit (5) detects light (L2) generated by causing the measurement light (L1) to enter the cell (1). The control unit (7) controls the gas analysis device (100). The control unit (7) changes the light-emitting interval (T) for the measurement light (L1) in accordance with the concentration of a gas to be analyzed which is included in the sample gas (SG).

IPC Classes  ?

  • G01N 21/64 - Fluorescence; Phosphorescence
  • G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

36.

THICKNESS MEASUREMENT METHOD, X-RAY ANALYSIS DEVICE, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2023023772
Publication Number 2024/005006
Status In Force
Filing Date 2023-06-27
Publication Date 2024-01-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Miyamoto, Shohei
  • Ohashi, Satoshi
  • Aoyama, Tomoki
  • Hirose, Jun

Abstract

Provided are a thickness measurement method, an X-ray analysis device, an information processing device, and a computer program, with which it is possible to measure the thickness of each layer of a multilayer material that heretofore has been difficult to measure. In this thickness measurement method, a material that includes a plurality of layers is irradiated with X-rays such that the X-rays pass through the plurality of layers; fluorescence X-rays generated from the material are detected; transmitted X-rays that have passed through the material are detected; a first relational expression and a second relational expression are created, the first relational expression representing the relationship between the intensity of the detected transmitted X-rays and the thickness of each layer, the second relational expression representing the relationship between the ratio between the theoretical intensities of the fluorescence X-rays and the transmitted X-rays and the ratio between the intensities of the fluorescence X-rays and the transmitted X-rays having been detected, the theoretical intensities being in accordance with the thickness of each layer; and a thickness is calculated for each layer so that the thickness satisfies both the first relational expression and the second relational expression at the same time.

IPC Classes  ?

  • G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
  • G01N 23/087 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

37.

THICKNESS MEASURING METHOD, X-RAY ANALYSIS DEVICE, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2023023738
Publication Number 2024/004990
Status In Force
Filing Date 2023-06-27
Publication Date 2024-01-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Ohashi, Satoshi
  • Miyamoto, Shohei
  • Aoyama, Tomoki
  • Miyasaka, Shintaro
  • Nagura, Makoto
  • Hirose, Jun
  • Matsunaga, Daisuke

Abstract

Provided are a thickness measuring method, an X-ray analysis device, an information processing device, and a computer program that can measure the thicknesses of more multilayer samples as compared to conventional means. This thickness measuring method comprises: irradiating a sample including a first layer and a second layer which are laminated, with X-rays such that the X-rays transmit through the first layer and the second layer in the stated order; detecting fluorescent X-rays generated from the first layer; detecting transmitting X-rays that have transmitted through the sample; identifying the density of the first layer and the absorption coefficient of X-rays at the first layer through elementary analysis based on the fluorescent X-rays; and calculating the thickness of the first layer on the basis of the absorption coefficient and the density, and the intensities of the transmitting X-rays at two different energies.

IPC Classes  ?

  • G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
  • G01N 23/087 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

38.

GAS CONTINUOUS ANALYSIS SYSTEM, AND GAS CONTINUOUS ANALYSIS METHOD

      
Application Number JP2023021728
Publication Number 2023/243598
Status In Force
Filing Date 2023-06-12
Publication Date 2023-12-21
Owner HORIBA, LTD. (Japan)
Inventor
  • Tachibana, Kohei
  • Ido, Takuya
  • Ishizaki, Yukihiro
  • Tsukatani, Kosuke
  • Nakamura, Keishi

Abstract

The present invention reduces time for calibration or validation of an analyzer for analyzing a sample gas containing an adsorbable component, and comprises a main flow passage through which the sample gas containing the adsorbable component flows, an analyzer for analyzing the adsorbable component in the sample gas flowing through the main flow passage, a reference gas flow passage for supplying a reference gas for performing calibration or validation of the analyzer, and a purge gas flow passage for supplying a purge gas containing moisture to the analyzer, wherein: the sample gas is introduced into the main flow path, and the sample gas is continuously analyzed by the analyzer; midway through the continuous analysis the purge gas is supplied to the analyzer from the purge gas flow passage to purge the analyzer; and then the reference gas is supplied to the analyzer from the reference gas flow passage and the analyzer is calibrated or validated.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 1/00 - Sampling; Preparing specimens for investigation
  • G01N 30/04 - Preparation or injection of sample to be analysed

39.

RADIATION DETECTION DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM

      
Application Number JP2023019420
Publication Number 2023/234154
Status In Force
Filing Date 2023-05-25
Publication Date 2023-12-07
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Aoyama, Tomoki

Abstract

Provided are a radiation detection device in which malfunctioning of the radiation detection device can be suppressed, an information processing method, and a computer program. The radiation detection device comprises an illumination unit that turns on to illuminate a sample, a radiation detection element for detecting radiation generated from the sample, a voltage application unit that applies a voltage to the radiation detection element, and a control unit. The control unit, after causing the voltage application unit to stop voltage application to the radiation detection element, turns on the illumination unit, and, after turning off the illumination unit, causes the voltage application unit to start voltage application to the radiation detection element.

IPC Classes  ?

  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01T 7/00 - MEASUREMENT OF NUCLEAR OR X-RADIATION - Details of radiation-measuring instruments
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

40.

RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

      
Application Number JP2023019416
Publication Number 2023/234153
Status In Force
Filing Date 2023-05-25
Publication Date 2023-12-07
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Aoyama, Tomoki

Abstract

Provided are a radiation detection device, a control method, and a computer program which make it possible to suppress failure of a radiation detector. This radiation detection device comprises: a sample chamber which can be opened and closed and inside of which a sample is to be disposed; a radiation detector which is disposed inside the sample chamber and which detects radiation generated from the sample; an atmosphere adjustment unit which makes atmosphere adjustment for reducing the pressure inside the sample chamber in a closed state or filling the inside with a specific gas and which introduces air outside the sample chamber into the inside of the sample chamber in a state where atmosphere adjustment has been made; and a control unit. The radiation detector has: a radiation detection element; a temperature adjustment unit for adjusting the temperature of the radiation detection element; and a temperature sensor for measuring the temperature of the inside of the radiation detector. The control unit, on the basis of the temperature measured by the temperature sensor, controls the atmosphere adjustment unit so as to adjust a timing for introducing air outside the sample chamber into the inside of the sample chamber.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01T 7/00 - MEASUREMENT OF NUCLEAR OR X-RADIATION - Details of radiation-measuring instruments
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

41.

MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

      
Application Number JP2023018105
Publication Number 2023/228795
Status In Force
Filing Date 2023-05-15
Publication Date 2023-11-30
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Nagaoka, Makoto

Abstract

The present invention simplifies the reproduction of loads such as road gradient resistance when traveling on an actual road, and comprises: a training data acquisition unit 51 that acquires training data comprising load data including the amount of fluctuation in travel resistance due to vehicle behavior and road gradient resistance of the travel route, and vehicle travel data including the vehicle speed, amount of accelerator pedal operation, and amount of brake pedal operation when the vehicle traveled on the travel route; and a machine learning unit 52 that machine learns correlations between the load data and the vehicle travel data, and generates a simulated gradient prediction model that shows the correlations between the load data and the vehicle travel data.

IPC Classes  ?

42.

VEHICLE-MOUNTED DRAIN SEPARATOR, AND VEHICLE-MOUNTED EXHAUST GAS ANALYSIS DEVICE

      
Application Number JP2023013691
Publication Number 2023/218795
Status In Force
Filing Date 2023-03-31
Publication Date 2023-11-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Sato, Miho
  • Onda, Yoshihisa

Abstract

A vehicle-mounted drain separator 100 used in a vehicle-mounted exhaust gas analysis device 200, the vehicle-mounted drain separator 100 comprising: an exhaust gas flow path EL through which exhaust gas flows; and a dilution air flow path AL through which air drawn in from the exterior in order to dilute the exhaust gas flows, the dilution air flow path AL converging with the exhaust gas flow path EL at a convergence point CP provided at a downstream end section. The vehicle-mounted drain separator 100 is configured such that heat exchange is performed between the exhaust gas flowing through the exhaust gas flow path EL and the air flowing through the dilution air flow path AL at least at a location upstream from the convergence point CP.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

43.

INFRARED GAS ANALYZER, AND INFRARED GAS ANALYSIS METHOD

      
Application Number JP2023016587
Publication Number 2023/218983
Status In Force
Filing Date 2023-04-27
Publication Date 2023-11-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakakura, Seiji
  • Imamura, Yuki

Abstract

The present invention provides an infrared gas analyzer with which running costs are reduced by eliminating the need for a catalyst, which is a consumable, the infrared gas analyzer comprising: a measuring cell 2 into which a sample gas is introduced; an infrared light source 3 for emitting infrared light into the measuring cell 2; an infrared detector 4 for detecting infrared light that has been transmitted through the measuring cell 2; and a gas filter 5 filled with a plurality of interference components that interfere with a measurement component in the sample gas.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

44.

CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

      
Application Number JP2023013580
Publication Number 2023/210259
Status In Force
Filing Date 2023-03-31
Publication Date 2023-11-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Tatewaki, Yasuhiro
  • Mori, Tetsuya

Abstract

In order to provide a conveyance device that is more convenient than a conventional device, and to further improve workability, the conveyance device 102 which conveys containers Z having stored therein samples to an analyzer 101 is configured to comprise: a pallet 10 provided with a plurality of installation places 11 in which the containers Z are installed; sensors 20 that are provided corresponding to the respective installation places 11 and that acquire container information obtained upon installation of the containers Z; a conveyance means 30 for picking up the containers Z installed in the pallet 10 and for conveying the containers to the analyzer 101; and a conveyance control unit 42 that causes the conveyance means 30 to pick up the containers in a picking-up order determined on the basis of the container information.

IPC Classes  ?

  • G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
  • G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations

45.

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

      
Application Number JP2023016267
Publication Number 2023/210633
Status In Force
Filing Date 2023-04-25
Publication Date 2023-11-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Minowa, Hiroki

Abstract

Provided are a radiation detection device and a radiation detector that keep photoelectrons and illumination light from entering a radiation detection element therein. This radiation detection device comprises an illumination unit that illuminates a sample, an irradiation unit that irradiates the sample with an X-ray, and a radiation detection element that detects an X-ray generated from the sample. The radiation detection device also comprises a magnetic field generation unit that generates a magnetic field in a portion of a space from the sample to the radiation detection element and a block that holds the magnetic field generation unit. The block is disposed in a position that blocks light from the illumination unit to the radiation detection element.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

46.

PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

      
Application Number JP2023007791
Publication Number 2023/189169
Status In Force
Filing Date 2023-03-02
Publication Date 2023-10-05
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

In particle analysis employing a PTA method, in order to enable each particle to be analyzed by type while limiting an increase in device size and cost, even if excitation wavelengths of fluorescent markers or particles having autofluorescent properties overlap one another, this particle analyzing device is configured to comprise: a light emitting unit (2) for emitting exciting light onto a sample that emits fluorescence in a plurality of colors; one or a plurality of filters (5) that transmit the fluorescence in the plurality of colors while cutting the exciting light; an imaging unit (3) having a color discrimination capability, for imaging the fluorescence transmitted through the filters (5); and an analyzing unit (43) for analyzing a physical property of the particles contained in the sample by obtaining a diffusion speed, by Brownian motion, of the particles from fluorescence image data obtained by means of the imaging unit (3).

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 21/64 - Fluorescence; Phosphorescence

47.

PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

      
Application Number JP2023012555
Publication Number 2023/190534
Status In Force
Filing Date 2023-03-28
Publication Date 2023-10-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sugasawa, Hirosuke
  • Tatewaki, Yasuhiro
  • Igushi, Tatsuo

Abstract

A particle analysis device 100 which, in order to ensure sufficient observation time using a PTA method and without being affected by the fading of particles having fluorescent markers or autofluorescence properties, can operate in a fluorescence observation mode in which fluorescent markers added to particles or fluorescence emitted by the particles themselves are imaged by irradiating the particles with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particles with light is imaged, said particle analysis device comprising: a particle identification unit 41 that identifies particles to which fluorescent markers have been added or particles emitting fluorescence from fluorescence image data obtained in the fluorescence observation mode; and an analysis unit 42 that analyzes the properties of the particles by finding the diffusion speed due to Brownian motion of the particles identified by the particle identification unit 41 from scattered light image data obtained in the scattered light observation mode, which has a higher frame rate than the fluorescence observation mode.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 21/64 - Fluorescence; Phosphorescence
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/34 - Measuring or testing with condition measuring or sensing means, e.g. colony counters

48.

PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

      
Application Number JP2023007823
Publication Number 2023/181835
Status In Force
Filing Date 2023-03-02
Publication Date 2023-09-28
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutani, Naoto
  • Nagaoka, Makoto
  • Inoue, Kentaro
  • Uraoka, Masaru
  • Iseki, Hirotaka

Abstract

The present invention, which limits the effect of a flow rate distribution due to the shape of a flow path on the upstream side of a pitot tube flowmeter, comprises a pitot tube 21 that has total pressure holes H1 for detecting the total pressure P1 of a fluid and static pressure holes H2 for detecting the static pressure P2 of the fluid and a differential pressure sensor 22 that is connected to the pitot tube 21 and that detects the differential pressure ΔP between the total pressure P1 and the static pressure P2, wherein: the pitot tube 21 has a main tube part 211 that has connection ports CP1, CP2 to which the differential pressure sensor 22 is connected and that has the total pressure holes H1 and the static pressure holes H2 formed therein, and a plurality of branch tube parts 212 that branch off from the main tube part 211 and that have the total pressure holes H1 and the static pressure holes H2 formed therein; and each of the main tube part 211 and the plurality of branch tube parts 212 have a shape that mitigates pressure loss.

IPC Classes  ?

49.

METHOD FOR VERIFYING DISEASE USING EXTRACELLULAR VESICLE SURFACE MOLECULES, AND VERIFICATION KIT

      
Application Number JP2023011891
Publication Number 2023/182508
Status In Force
Filing Date 2023-03-24
Publication Date 2023-09-28
Owner
  • INTERNATIONAL UNIVERSITY OF HEALTH AND WELFARE (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Umemura, Tsukuru
  • Shibuta, Tatsuki
  • Saito, Kensuke
  • Irikura, Daisuke

Abstract

The present invention provides a verification method for assessing whether or not a subject has contracted heart disease, type 2 diabetes, or SARS-CoV-2 infection, wherein the method is characterized in that the expression amount of surface molecules in extracellular vesicles derived from a biological sample harvested from the subject is measured, and a specific surface factor that significantly increases or decreases in each disease is detected.

IPC Classes  ?

  • G01N 33/68 - Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing involving proteins, peptides or amino acids
  • G01N 33/543 - Immunoassay; Biospecific binding assay; Materials therefor with an insoluble carrier for immobilising immunochemicals

50.

PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

      
Application Number JP2023001312
Publication Number 2023/149206
Status In Force
Filing Date 2023-01-18
Publication Date 2023-08-10
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

This particle size distribution measuring device comprises: a measuring cell having a sample accommodating space for accommodating a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means for stirring the sample by suctioning and discharging the sample inside a measurement cell; a light irradiation unit for irradiating, with light, the sample in the measurement cell; a light detection unit for detecting scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit for measuring the particle size distribution of a particle group composed of the plurality of particles by using a detection signal obtained by the light detection unit.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

51.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Application Number JP2023001117
Publication Number 2023/140235
Status In Force
Filing Date 2023-01-17
Publication Date 2023-07-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Sugasawa, Hirosuke
  • Koshikawa, Hiroyuki
  • Saihara, Koji

Abstract

In order to make it possible to automatically adjust a focus position in a short time in particle size distribution measurement by a PTA method, there is provided a particle size distribution measurement device 100 comprising an imaging means 3 for capturing an image of particles in a cell 1, and an analysis unit 41 for calculating a particle size distribution by calculating the diffusion velocity due to Brownian motion of the particles on the basis of imaging data obtained by the imaging means, the particle size distribution measurement device 100 further comprising: an upper/lower-limit focus position determination unit 45 for determining a lower-limit focus position which is the focus position at which particles begin to appear as the focus of the imaging means 2 is moved from the front to the back side of the cell 1, and an upper-limit focus position which is the focus position at which particles begin to appear as the focus of the imaging means 3 is moved from the back to the front side of the cell 1; a measurement focus position calculation unit 46 for calculating a measurement focus position which is used during measurement and is between the lower-limit focus position and the upper-limit focus position, on the basis of the lower-limit focus position and the upper-limit focus position; and an autofocus unit 42 for adjusting the focus of the imaging means to the measurement focus position during measurement.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

52.

PARTICLE ANALYSIS DEVICE

      
Application Number JP2023001141
Publication Number 2023/140244
Status In Force
Filing Date 2023-01-17
Publication Date 2023-07-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell C through which a sample including particles flows, a light source 10 for radiating light to the particles in the flow cell C, a photodetector 20 for detecting secondary light from the particles, and a computation circuit 30 for detecting an autocorrelation function from a light intensity signal outputted from the photodetector 20 and analyzing the autocorrelation function or the particles included in the sample, an optical system unit U1 including the flow cell C and the light source 10, and a control unit U2 including the photodetector 20 and the computation circuit 30 being separate from each other and connected via a light guiding member L1 for guiding the secondary light to the photodetector 20.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

53.

DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Application Number JP2023001142
Publication Number 2023/140245
Status In Force
Filing Date 2023-01-17
Publication Date 2023-07-27
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya
  • Habu, Kazunori

Abstract

In order to make it possible to precisely control the concentration of particles included in a sample even when the particle size distribution of the particles included in the sample fluctuates, so as to guarantee measurement precision in particle size distribution measurement using a dynamic light scattering method, there is provided a dilution mechanism (10) used together with a particle size distribution measurement device (20) for measuring a particle size distribution by a dynamic light scattering method, the dilution mechanism (10) being configured so as to comprise a sample line (L1) for leading a sample including particles to the particle size distribution measurement device (20), a dilution line (L2) which merges with the sample line (L1) and in which a diluent flows, a concentration adjustment means (11) for adjusting the concentration of the particles included in the diluted sample, an electrical conductivity measurement means (12) for measuring the electrical conductivity of the diluted sample, and a control unit (13) for controlling the concentration adjustment means (11) so that an electrical conductivity-related value which is the electrical conductivity measured by the electrical conductivity measurement means (12) or a value calculated from the electrical conductivity is a prescribed target value.

IPC Classes  ?

  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 15/02 - Investigating particle size or size distribution

54.

CLEANING DEVICE, SAMPLE ANALYZING DEVICE, AND CLEANING METHOD

      
Application Number JP2022047122
Publication Number 2023/127646
Status In Force
Filing Date 2022-12-21
Publication Date 2023-07-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Ikeda Motohide
  • Osawa Kenta
  • Oku Narihiro
  • Maeda Takuto
  • Ishii Yuki

Abstract

This cleaning device for cleaning a suction unit comprises: a first passage portion through the inside of which a suction pipe for sucking a sample moves; a first cleaning liquid supply flow passage portion and a cleaning liquid discharge flow passage portion that intersect the first passage portion; a hollow body including a second passage portion which is joined to the first passage portion in a movement direction of the suction pipe and through the inside of which the suction pipe moves; and a wall portion having an inside surface positioned surrounding an outside surface of the hollow body across a gap. The suction unit includes the suction pipe and the hollow body. The wall portion includes a second cleaning liquid supply flow passage portion which penetrates through an inside surface of the wall portion. The cleaning device cleans at least one of the suction pipe and the hollow body.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices

55.

MACHINE LEARNING DEVICE, EXHAUST GAS ANALYSIS DEVICE, MACHINE LEARNING METHOD, EXHAUST GAS ANALYSIS METHOD, MACHINE LEARNING PROGRAM, AND EXHAUST GAS ANALYSIS PROGRAM

      
Application Number JP2022039964
Publication Number 2023/127262
Status In Force
Filing Date 2022-10-26
Publication Date 2023-07-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagaoka, Makoto
  • Saito, Takashi

Abstract

222 concentration obtained by an analyzer which is different than the exhaust gas analysis device, and also includes at least one of the spectrum data obtained by irradiating the exhaust gas with light, an individual component concentration which is selected on the basis of an elemental balance equation for obtaining the specific component concentration, and a calculated value of the specific component concentration which is calculated via the elemental balance equation by using the individual component concentration; and a machine learning unit 62 which, by using the training data, causes machine learning for the relationship between the reference value of the specific component concentration and the spectrum data, the individual component concentration or the calculated value of the specific component concentration.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

56.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022045406
Publication Number 2023/120231
Status In Force
Filing Date 2022-12-09
Publication Date 2023-06-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Ishida, Kentaro
  • Oida, Takuji

Abstract

The present invention makes it possible to analyze a plurality of components to be measured in a sample while simplifying an optical system, and provides an analysis device 100 that analyzes the concentration of components to be measured in the sample, the analysis device 100 comprising: a measuring cell 2 into which the sample is introduced; a light source 3 that irradiates the measuring cell 2 with light; a photodetector 4 that detects the light transmitted through the measuring cell 2; a variable filter 5 that is provided between the measuring cell 2 and the light source 3 or the photodetector 4, and changes the transmission wavelength depending on the light incident position; a filter moving mechanism 6 that moves the variable filter 5 to change the wavelength of light detected by the photodetector 4; and a concentration calculation unit 7 that calculates, on the basis of a detection signal of the photodetector 4, the concentration of the components to be measured.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

57.

EXHAUST GAS ANALYSIS DEVICE, EXHAUST GAS ANALYSIS METHOD, AND EXHAUST GAS ANALYSIS PROGRAM

      
Application Number JP2022043386
Publication Number 2023/120015
Status In Force
Filing Date 2022-11-24
Publication Date 2023-06-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Kondo, Yosuke
  • Komatsu, Yoji

Abstract

The present invention provides an exhaust gas analysis device 100 that reduces cold spots of a sampling probe without providing the sampling probe with a heater and heating the sampling probe and that analyzes an exhaust gas exhausted from a vehicle or part of the vehicle. The exhaust gas analysis device 100 is provided with: a sampling probe 3 that samples an exhaust gas from a main flow path 2 through which the exhaust gas flows; a gas analyzer 5 that measures a component concentration in the exhaust gas sampled by the sampling probe 3; a heated gas supply mechanism 9 that supplies a heated gas to the sampling probe 3; and a control unit COM that controls an operation related to analysis of the exhaust gas. The control unit COM supplies the gas heated by the heated gas supply mechanism 9 to the sampling probe 3 before the sampling of the exhaust gas by means of the sampling probe 3 is started and starts the sampling of the exhaust gas by means of the sampling probe 3 in a state in which the sampling probe 3 has been heated.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state

58.

GAS ANALYSIS DEVICE, EXHAUST GAS ANALYSIS SYSTEM, AND GAS ANALYSIS METHOD

      
Application Number JP2022042840
Publication Number 2023/112597
Status In Force
Filing Date 2022-11-18
Publication Date 2023-06-22
Owner HORIBA, LTD. (Japan)
Inventor
  • Nishigai, Hiroki
  • Hanada, Takaaki
  • Nagura, Naoki

Abstract

Provided is a gas analysis device for analyzing the concentration of a component to be measured that is included in a sample gas, the gas analysis device comprising: a measurement cell; a gas introduction flow channel for introducing the sample gas to the measurement cell; a gas lead-out flow channel for leading the sample gas out from the measurement cell; a pressure sensor for measuring the pressure inside the measurement cell; a light source for radiating light to the measurement cell; a concentration calculation unit for calculating the concentration of a component to be measured that is included in the sample gas, on the basis of the light intensity of light transmitted through the measurement cell; and a concentration correction unit for correcting the calculated concentration of the component to be measured, on the basis of the pressure measured by the pressure sensor, the pressure sensor being provided with a sensor body and a communication tube for communicating the sensor body and the measurement cell, and the distal end of the communication tube being installed in the vicinity of an introduction port for the gas introduction flow channel or a lead-out port for the gas lead-out flow channel, formed in the measurement cell.

IPC Classes  ?

  • G01N 21/61 - Non-dispersive gas analysers
  • G01N 21/03 - Cuvette constructions
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

59.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022044356
Publication Number 2023/106196
Status In Force
Filing Date 2022-12-01
Publication Date 2023-06-15
Owner HORIBA, LTD. (Japan)
Inventor
  • Tsukatani, Kosuke
  • Hotta, Kohei
  • Yamamoto, Tomomi
  • Ido, Takuya
  • Shibuya, Kyoji

Abstract

Provided is an analysis device for radiating light to a measurement cell in which a sample is introduced, and detecting light transmitted through the measurement cell to analyze a component to be measured that is included in the sample, the analysis device comprising: two or more types of laser light sources selected from a first laser light source which is a quantum cascade laser, a second laser light source which is an interband cascade laser, and a third laser light source which is a semiconductor laser other than a quantum cascade laser and an interband cascade laser; a photodetector for detecting light emitted from each laser light source and transmitted through the measurement cell; and a light source control unit for causing pulse oscillation of laser light sources at mutually different timings.

IPC Classes  ?

  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

60.

ANALYSIS SYSTEM, SERVER, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2022043916
Publication Number 2023/100854
Status In Force
Filing Date 2022-11-29
Publication Date 2023-06-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamaguchi, Kazuki
  • Sando, Shota
  • Matsumoto, Erika
  • Nishizawa, Kyohei

Abstract

In the present invention, extraction of features included in data pertaining to particulate matter is performed efficiently and accurately. An analysis system (100) comprises a data acquisition unit (1), a feature extraction unit (35), and an output unit (37). The data acquisition unit (1) acquires related data (RD) related to the particulate matter. The feature extraction unit (35) executes prescribed feature extraction processing that takes the related data (RD) as input to extract features included in the related data (RD). The output unit (37) outputs information relating to the features extracted by the feature extraction unit (35).

IPC Classes  ?

  • G01W 1/10 - Devices for predicting weather conditions
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 1/02 - Devices for withdrawing samples

61.

OUTPUT DEVICE, BLOOD ANALYSIS DEVICE, BLOOD ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2022043722
Publication Number 2023/100790
Status In Force
Filing Date 2022-11-28
Publication Date 2023-06-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Nishimori Masashi
  • Ohashi Akika
  • Nakagawa Yohei

Abstract

This output device comprises: a measurement information reception unit that receives measurement information including a measuring result of a blood specimen; a code information generation unit that adds the measurement information to browsing destination information indicating a browsing destination of the measurement information and generates code information; and an output unit that outputs the code information.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor

62.

BLOOD ANALYZER, BLOOD ANALYSIS METHOD AND PROGRAM

      
Application Number JP2022043724
Publication Number 2023/100791
Status In Force
Filing Date 2022-11-28
Publication Date 2023-06-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Isshiki Ryota
  • Ikeda Motohide
  • Osawa Kenta

Abstract

A blood analyzer that comprises: a container information acquiring unit that acquires container information relating to the type of a specimen container to be used; a needle for aspirating a blood specimen contained in the specimen container and discharging the same; a blood analysis unit provided with a chamber for receiving the blood specimen that is aspirated from the specimen container and discharged by the needle; and a control unit that controls the aspiration and discharge of the blood specimen by the needle on the basis of the container information. The control unit sets the amount of the blood specimen to be aspirated by the needle on the basis of the container information.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices

63.

ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

      
Application Number JP2022043508
Publication Number 2023/095864
Status In Force
Filing Date 2022-11-25
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor
  • Shibuya, Kyoji
  • Hamauchi, Shota
  • Tsukatani, Kosuke
  • Niina, Kodai
  • Ido, Takuya

Abstract

The present invention is for precisely measuring the concentration of a component to be measured in a processed gas. According to the present invention, the concentration of carbon dioxide is calculated on the basis of absorption at 4.23-4.24 μm or 4.34-4.35 μm by carbon dioxide, the concentration of carbon monoxide is calculated on the basis of absorption at 4.59-4.61 μm by carbon monoxide, the concentration of water is calculated on the basis of absorption at 5.89-6.12 μm by water, the concentration of acetylene is calculated on the basis of absorption at 7.56-7.66 μm or 7.27-7.81 μm by acetylene, the concentration of methane is calculated on the basis of absorption at 7.67-7.80 μm or 8.10-8.14 μm by methane, the concentration of ethylene is calculated on the basis of absorption at 8.46-8.60 μm by ethylene, the concentration of ethane is calculated on the basis of absorption at 6.13-6.14 μm or 6.09-6.45 μm by ethane, the concentration of ammonia is calculated on the basis of absorption at 6.06-6.25 μm or 8.62-9.09 μm by ammonia, and the concentration of methanol is calculated on the basis of absorption at 9.35-9.62 μm by methanol.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

64.

ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

      
Application Number JP2022043575
Publication Number 2023/095881
Status In Force
Filing Date 2022-11-25
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor
  • Shibuya, Kyoji
  • Hamauchi, Shota
  • Hanada, Takaaki
  • Fukushiro, Kensuke
  • Hara, Kenji
  • Nagura, Naoki
  • Tsukatani, Kosuke
  • Nina, Kodai
  • Ido, Takuya

Abstract

The present invention provides an analysis device 100 that employs light absorption to analyze a measurement target component contained in a sample, and that accurately measures a concentration of the measurement target component by reducing fluctuations in a modulation width of an oscillation wavelength of a laser light source resulting from ambient temperature variations, the analysis device 100 comprising: a laser light source 2 for emitting reference light onto the sample; an optical detector 5 for detecting the intensity of sample light, which is the reference light that has been transmitted through the sample; a temperature regulating unit 3 for regulating the temperature of the laser light source; a temperature sensor 4 for detecting the ambient temperature around the laser light source; a relationship data storage unit 73 for storing modulation correction relationship data representing a relationship between the ambient temperature around the laser light source 2 and a correction parameter for correcting a modulation width deviation relative to a default modulation width of the laser light source for measuring the measurement target component; and a control unit 7 for using the detected temperature from the temperature sensor 4 and the modulation correction relationship data to change a target temperature of the temperature regulating unit 3, or to change at least one of a drive voltage or a drive current that is applied for wavelength modulation of the laser light source 2.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

65.

INSPECTION METHOD FOR EXHAUST GAS ANALYSIS DEVICE, INSPECTION DEVICE, AND INSPECTION SYSTEM

      
Application Number JP2022043364
Publication Number 2023/095832
Status In Force
Filing Date 2022-11-24
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor Naya, Hiroshi

Abstract

The present invention is designed to objectively evaluate the accuracy of an exhaust gas analysis device, and comprises: an analysis step for supplying inspection gas to an exhaust gas analysis device from a gas container filled with inspection gas at an undisclosed concentration, and analyzing the inspection gas by means of the exhaust gas analysis device; and an inspection step for acquiring the analysis result from the exhaust gas analysis device and a reference gas concentration, and inspecting the exhaust gas analysis device by comparing the analysis result and the reference gas concentration.

IPC Classes  ?

  • G06Q 50/10 - Services
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

66.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022043560
Publication Number 2023/095876
Status In Force
Filing Date 2022-11-25
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor
  • Hanada, Takaaki
  • Nagura, Naoki
  • Shibuya, Kyoji
  • Hara, Kenji

Abstract

The present invention provides an analysis device and an analysis method, each of which measures the concentration of a component to be measured in a combustion gas with high accuracy, wherein: the concentration of nitrogen monoxide is calculated on the basis of absorption of nitrogen monoxide of 5.24 to 5.26 µm; the concentration of nitrogen dioxide is calculated on the basis of absorption of nitrogen dioxide of 6.14 to 6.26 µm; the concentration of nitrous oxide is calculated on the basis of absorption of nitrous oxide of 7.84 to 7.91 µm; the concentration of ammonia is calculated on the basis of absorption of ammonia of 9.38 to 9.56 µm; the concentration of ethane is calculated on the basis of absorption of ethane of 3.33 to 3.36 µm; the concentration of formaldehyde or acetaldehyde is calculated on the basis of absorption of formaldehyde or acetaldehyde of 5.65 to 5.67 µm; the concentration of sulfur dioxide is calculated on the basis of absorption of sulfur dioxide of 7.38 to 7.42 µm; the concentration of methane is calculated on the basis of absorption of methane of 7.50 to 7.54 µm; and the concentration of methanol or ethanol is calculated on the basis of absorption of methanol or ethanol of 9.45 to 9.47 µm.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

67.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Application Number JP2022036925
Publication Number 2023/063136
Status In Force
Filing Date 2022-10-03
Publication Date 2023-04-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagura, Naoki
  • Kawabuchi, Yasushi
  • Takahashi, Daichi
  • Hara, Kenji
  • Kikuta, Takayuki
  • Yoshioka, Masaya
  • Nakamura, Kotaro

Abstract

This gas analysis device comprises: a sample cell into which a sample gas is introduced; a light source that radiates light onto the sample cell; a photodetector that detects the light intensity of the light that has been emitted by the light source and passed through the sample cell; a concentration calculation unit that calculates the concentration of a component to be measured included in the sample gas on the basis of the light intensity output from the photodetector; and a light intensity output unit that outputs a calibration-time light intensity detected by the photodetector during calibration such that the calibration-time light intensity can be compared with a reference light intensity set in advance.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

68.

EXHAUST GAS SAMPLING DEVICE, EXHAUST GAS ANALYSIS SYSTEM, EXHAUST GAS SAMPLING METHOD, AND PROGRAM FOR EXHAUST GAS SAMPLING DEVICE

      
Application Number JP2022036938
Publication Number 2023/063139
Status In Force
Filing Date 2022-10-03
Publication Date 2023-04-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Kimura, Takeshi
  • Kuriaki, Kazunori
  • Higuchi, Masahiro
  • Komatsu, Yoji
  • Tomita, Jun

Abstract

Provided is an exhaust gas sampling device which collects, in a sampling bag, an exhaust gas discharged from a vehicle including an engine or a part thereof, wherein the exhaust gas sampling device comprises: a main channel through which the exhaust gas flows; a main valve which opens and closes the main channel; a dilution gas channel which is connected to a downstream side of the main valve in the main channel, and introduces a dilution gas to the main channel; a purge gas channel which is branched from the dilution gas channel, and a downstream end of which is in a downstream side of the main valve in the main channel, and is connected to an upstream side of the junction of the dilution gas channel; and a purge pump which is provided in the purge gas channel, suctions a portion of the dilution gas that flows through the dilution gas channel, and delivers the portion of the dilution gas as a purge gas to the main channel.

IPC Classes  ?

  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state

69.

SPECIMEN TESTING SYSTEM, SPECIMEN TESTING PROGRAM, AND SPECIMEN TESTING METHOD

      
Application Number JP2022030777
Publication Number 2023/026873
Status In Force
Filing Date 2022-08-12
Publication Date 2023-03-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Furukawa, Kazuki
  • Shiomi, Kenji
  • Kikuta, Takayuki

Abstract

The present invention is a specimen testing system 100 which not only performs long-term testing by automatically performing a charging process of an electric vehicle or a part thereof, but also tests the specimen under conditions that reproduce actual road driving, and which tests a specimen W, which is an electric vehicle or a part thereof, by charging the specimen W by means of a power supply device 3. The specimen testing system 100 comprises: a dynamometer 2 that applies a load to the specimen W; an information acquisition unit 6 that acquires information on the specimen W; and a test control unit 7 that controls the test of the specimen W on the basis of the information on the specimen W, wherein the test control unit 7 stops the operation of the specimen W and charges the specimen W by means of the power supply device 3 when the information on the specimen W satisfies a first condition, and stops the charging of the specimen W by means of the power supply device 3 and restarts the operation of the specimen W when the information on the specimen W satisfies a second condition.

IPC Classes  ?

  • G01R 31/387 - Determining ampere-hour charge capacity or SoC
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC

70.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

      
Application Number JP2022031152
Publication Number 2023/026939
Status In Force
Filing Date 2022-08-18
Publication Date 2023-03-02
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

Provided are a radiation detection element in which the precision of radiation detection is stabilized, a radiation detector, a radiation detection device, and a method for manufacturing a radiation detection element. The present invention provides a radiation detection element comprising a semiconductor part having an incidence surface on which radiation to be detected is incident, a first electrode provided to the incidence surface, and a second electrode provided to the incidence surface and disposed in a position surrounding the periphery of the first electrode, wherein the radiation detection element is a silicon drift-type radiation detection element, and comprises an insulating protective film for covering the second electrode.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

71.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2022030812
Publication Number 2023/017866
Status In Force
Filing Date 2022-08-12
Publication Date 2023-02-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Murata, Shunsuke
  • Valiev, Ildar

Abstract

Provided are a signal processing method, a signal processing device, a radiation detection device, and a computer program that allow sufficient elimination of a sum peak from a spectrum of radiation. This signal processing method for processing a signal containing an answering wave to be generated in response to detection of radiation executes correction processing including: measuring a feature amount corresponding to a time for which the answering wave or an answering wave group formed by a plurality of answering waves continues; counting, for each wave height, the number of the answering waves or the answering wave groups containing the measured feature amount within a predetermined first range containing the feature amount of a single answering wave; and deducting a specific value from the counted number in accordance with the answering wave or the answering wave group not containing the feature amount within the first range.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

72.

TEST SYSTEM, TEST METHOD, AND PROGRAM RECORDING MEDIUM FOR TEST SYSTEM

      
Application Number JP2022028632
Publication Number 2023/008373
Status In Force
Filing Date 2022-07-25
Publication Date 2023-02-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Michikita, Toshiyuki
  • Kawazoe, Hiroshi
  • Furukawa, Kazuki
  • Hirose, Yoku
  • Shiomi, Kenji

Abstract

The present invention provides a test system for testing a vehicle provided with an electronic control device or a test piece that is a part of the vehicle. The test system is provided with: a driving test device for performing a driving test of the test piece; an automatic operation robot that operates the test piece; and a signal control unit that is connected to the test piece by wire or wirelessly and that transmits, to the electronic control device, a test signal for evaluating the electronic control device.

IPC Classes  ?

73.

VEHICLE ELEMENT RESPONSE LEARNING METHOD, VEHICLE ELEMENT RESPONSE CALCULATION METHOD, VEHICLE ELEMENT RESPONSE LEARNING SYSTEM, AND VEHICLE ELEMENT RESPONSE LEARNING PROGRAM

      
Application Number JP2022029238
Publication Number 2023/008547
Status In Force
Filing Date 2022-07-29
Publication Date 2023-02-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Tabata, Kunio
  • Roberts, Phillip
  • Bates, Luke
  • Whelam, Steven

Abstract

The present invention accurately obtains response data of a vehicle element in a desired traveling environment by means of simulation without actual road traveling, and pertains to a vehicle element response learning method which generates a trained model pertaining to a response of a vehicle or a vehicle element that is a portion of the vehicle, wherein the method comprises: (1) an input step for imparting, to the vehicle element, inputs including parameters related to a vehicle speed, a load, and a temperature that presuppose actual traveling; (2) an acquisition step for acquiring response data of the vehicle element, and acquiring, as training data, the response data and input data that indicates the inputs; and (3) a generation step for generating, from the training data, a trained model pertaining to the response of the vehicle element by using machine-learning.

IPC Classes  ?

  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases
  • H01M 8/00 - Fuel cells; Manufacture thereof
  • H01M 8/0432 - Temperature; Ambient temperature
  • H01M 8/0438 - Pressure; Ambient pressure; Flow
  • H01M 8/04537 - Electric variables
  • H01M 8/04992 - Processes for controlling fuel cells or fuel cell systems characterised by the implementation of mathematical or computational algorithms, e.g. feedback control loops, fuzzy logic, neural networks or artificial intelligence

74.

MICROCHIP, SPECIMEN-TESTING DEVICE, AND SPECIMEN-TESTING METHOD

      
Application Number JP2022027569
Publication Number 2023/002898
Status In Force
Filing Date 2022-07-13
Publication Date 2023-01-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsuda Yasunori
  • Hirata Katsuki

Abstract

A microchip (3) has a fluid circuit therein. The fluid circuit is provided with: a specimen introduction part (31) into which a specimen is introduced; a component separation part (32) that, when a centrifugal force occurs in the microchip (3) in a first direction (D1), separates a component contained in the specimen introduced into the specimen introduction part (31), by the centrifugal force in the first direction (D1); and a reagent reaction part (33) that has a support (330) supporting a reagent, and that causes a portion of the component introduced to the support (330) from the component separation part (32) to react with the reagent. When a centrifugal force occurs in the microchip (3) in a second direction (D2) different from the first direction (D1), the component separated by the component separation part (32) is introduced to the support (330) from the component separation part (32) by the centrifugal force in the second direction (D2).

IPC Classes  ?

  • G01N 37/00 - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES - Details not covered by any other group of this subclass
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis

75.

TESTING SYSTEM, TESTING METHOD, AND PROGRAM RECORDING MEDIUM FOR TESTING SYSTEM

      
Application Number JP2022026669
Publication Number 2023/286656
Status In Force
Filing Date 2022-07-05
Publication Date 2023-01-19
Owner HORIBA, LTD. (Japan)
Inventor Hirai, Seiji

Abstract

This testing system for testing a heat management system for managing heat generated from one or a plurality of heat source components installed in a vehicle comprises: a simulated vehicle body simulating a vehicle body of the vehicle; simulated heat source bodies which are situated in the simulated vehicle body to thermally simulate the heat source components; a heat supply device for supplying heat to the simulated heat source bodies; a heat amount calculating unit for calculating an amount of heat generated from the heat source components of the vehicle while traveling, on the basis of a vehicle model that models the vehicle; a heat source body control unit for controlling the heat supply device on the basis of the calculated amount of heat, to thermally simulate the heat source components by means of the simulated heat source bodies; and an operating state acquiring unit for acquiring an operating state of the heat management system.

IPC Classes  ?

76.

GAS ANALYZER CALIBRATION METHOD, GAS ANALYZER PRESSURE CORRECTING METHOD, GAS ANALYZER INSPECTION METHOD, PRESSURE VARIATION METHOD, PRESSURE VARIATION APPARATUS, AND GAS ANALYSIS SYSTEM

      
Application Number JP2022024578
Publication Number 2023/276762
Status In Force
Filing Date 2022-06-20
Publication Date 2023-01-05
Owner HORIBA, LTD. (Japan)
Inventor Mohara, Haruhisa

Abstract

The present invention enables accurate calculation of a pressure correction coefficient while reproducing the pressurized state in a gas analyzer, and involves: connecting, to a sample gas introduction port P1 and a gas discharge port P2 of a gas analyzer 2, a pressure variation apparatus 3 having a pressurizing mechanism 31 and a gas discharge mechanism 32; varying the pressure at the sample gas introduction port P1 and at the gas discharge port P2 by the pressurizing mechanism 31 of the pressure variation apparatus 3; introducing, in the pressure varied state, a calibration gas from a calibration gas introduction port P0 of the gas analyzer 2, and causing the calibration gas flowing out of the sample gas introduction port P1 or the gas discharge port P2 to be discharged by means of the gas discharge mechanism 32 of the pressure variation apparatus 3; and calculating the pressure correction coefficient of the gas analyzer 2 by using measurement results of the gas analyzer 3 on the calibration gas.

IPC Classes  ?

  • G01N 1/00 - Sampling; Preparing specimens for investigation

77.

PARTICLE IMAGE ANALYSIS APPARATUS, PARTICLE IMAGE ANALYSIS SYSTEM, PARTICLE IMAGE ANALYSIS METHOD, AND PROGRAM FOR PARTICLE IMAGE ANALYSIS APPARATUS

      
Application Number JP2022014559
Publication Number 2023/276361
Status In Force
Filing Date 2022-03-25
Publication Date 2023-01-05
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

Provided is a particle analysis apparatus that analyzes particle characteristics on the basis of an original image obtained by imaging a particle or a particle group, for providing a particle image analysis apparatus capable of acquiring information from an individual particle image not only for particles with high appearing frequency but also for particles with low appearing frequency while suppressing data capacity required to save the individual particle image. The particle analysis apparatus includes: an individual particle image generation unit 52 that extracts an individual particle from the original image and generates an individual particle image PI; a particle characteristic calculation unit 54 that calculates one or a plurality of types of particle characteristics of a particle in the individual particle image PI on the basis of the individual particle image PI; a classification unit 56 that classifies, with regard to a plurality of classes prescribed by part or all of one or the plurality of types of particle characteristics, the particle into a corresponding class of the calculated particle characteristic; and an individual particle image preservation unit 57 that is configured to save the individual particle image PI of the particle belonging to each class in a storage S in the number equal to or lower than a saving upper limit set to each of the plurality of classes.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

78.

TRANSMISSION X-RAY INSPECTING DEVICE, AND TRANSMISSION X-RAY INSPECTING METHOD

      
Application Number JP2022025838
Publication Number 2023/277039
Status In Force
Filing Date 2022-06-28
Publication Date 2023-01-05
Owner HORIBA, LTD. (Japan)
Inventor Aoyama, Tomoki

Abstract

The present invention provides a transmission X-ray inspecting device having improved detection sensitivity with respect to foreign matter in a specimen, the transmission X-ray inspecting device comprising: an X-ray source 2 for emitting X-rays including a plurality of mutually different energy ranges; an optical element 3 for dispersing X-rays in one energy range from the X-rays, and condensing the same toward a specimen W; and a transmitted X-ray detector 4 for detecting transmitted X-rays that have been transmitted through the specimen W.

IPC Classes  ?

  • G01N 23/18 - Investigating the presence of defects or foreign matter
  • G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
  • G01N 23/087 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays

79.

GAS ANALYSIS DEVICE

      
Application Number JP2022021337
Publication Number 2022/270201
Status In Force
Filing Date 2022-05-25
Publication Date 2022-12-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Oida, Takuji
  • Ishida, Kentaro
  • Yokota, Yoshihiro
  • Fujiwara, Masahiko

Abstract

A gas analysis device (100) is provided with a measurement cell (1), a light source (3), a separation member (5), a first sensor unit (7, 7', 7''), a second sensor unit (9, 9', 9''), and a calculation unit (111). A sample gas (Gs) is introduced into the measurement cell (1). The light source (3) radiates measurement light (Lm) inside the measurement cell (1). The separation member (5) splits the measurement light (Lm) having passed through the measurement cell (1) into first component light (CL1) that includes a component in a first wavelength range and third component light (CL3) that includes at least second component light including a component in a second wavelength range. The calculation unit (111) calculates information relating to a component gas in a low concentration range, on the basis of the intensity of the first component light (CL1) measured by the first sensor unit (7, 7', 7''). In addition, the calculation unit (111) calculates information relating to the component gas in a high concentration range, on the basis of the intensity of the second component light (CL2) measured by the second sensor unit (9, 9', 9'').

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

80.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022021338
Publication Number 2022/270202
Status In Force
Filing Date 2022-05-25
Publication Date 2022-12-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Tachibana, Kohei
  • Nakamura, Keishi
  • Niina, Kodai
  • Miyawaki, Daisuke
  • Watanabe, Tsuyoshi
  • Ido, Takuya

Abstract

The present invention appropriately performs explosion-proof measures for an analysis device while suppressing the consumption amount of a purge gas. This analysis device (100) comprises a filling part (3), an irradiation part (5), a propagation part (7), a housing (1), a purge gas introduction part (40), and an explosion-proof gas introduction part (20). The filling part (3) is filled with a sample gas (SG) containing a gas to be measured. The irradiation part (5) emits measurement light (L) used to analyze the gas to be measured. The propagation part (7) is provided between the filling part (3) and the irradiation part (5), and forms a propagation space (TS) for causing the measurement light (L) emitted from the irradiation part (5) to propagate toward the filling part (3). The housing (1) stores the filling part (3), the irradiation part (5), and the propagation part (7). The purge gas introduction part (40) introduces a purge gas (PG) into the propagation space (TS). The explosion-proof gas introduction part (20) introduces an explosion-proof gas (EP) into the internal space of the housing (1).

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

81.

POLYMER COMPOUND ANALYSIS METHOD AND ANALYSIS SYSTEM

      
Application Number JP2022015106
Publication Number 2022/264620
Status In Force
Filing Date 2022-03-28
Publication Date 2022-12-22
Owner
  • SHIMADZU CORPORATION (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Nagai, Yusuke
  • Watabe, Yoshiyuki
  • Wakabayashi, Satoru
  • Nakano, Hitomi
  • Akaji, Sakiko

Abstract

This polymer compound analysis method includes: a first step of employing size exclusion chromatography to separate a polymer compound contained in a sample and to acquire a chromatogram; a second step of fractionating an eluted component corresponding to one peak that includes the polymer compound, in the chromatogram, into a plurality of parts for each elution time; and a third step of employing Raman spectroscopy to measure the Raman spectrum of the fractionated eluted component.

IPC Classes  ?

  • G01N 30/74 - Optical detectors
  • G01N 30/80 - Fraction collectors
  • G01N 30/88 - Integrated analysis systems specially adapted therefor, not covered by a single one of groups

82.

BENCH TEST DEVICE AND BENCH TEST METHOD

      
Application Number JP2022021687
Publication Number 2022/255237
Status In Force
Filing Date 2022-05-27
Publication Date 2022-12-08
Owner HORIBA, LTD. (Japan)
Inventor Kawazoe, Hiroshi

Abstract

The present invention is to inexpensively constitute a bench test device equipped with a steering function for testing a vehicle. A bench test device 100 for testing a test body W, which is a vehicle or a part thereof, the device comprising: rotary bodies 21 on which a wheel W1, which is a steering wheel of the test body W, is placed; a support table 31 for supporting the rotary bodies 21 so as to be rotatable as the wheel W1 rotates; and a moving mechanism 4 that moves the support table 31 on an installation surface P by utilizing rotational force of the wheel W1.

IPC Classes  ?

83.

ION ANALYSIS DEVICE AND FUEL CELL EVALUATION SYSTEM

      
Application Number JP2022022465
Publication Number 2022/255446
Status In Force
Filing Date 2022-06-02
Publication Date 2022-12-08
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor
  • Okada, Yoichi
  • Tanaka, Yoshinori
  • Sasai, Kohei
  • Watanabe, Shunta
  • Miyamura, Kazuhiro

Abstract

The purpose of the present invention is to provide a fuel cell evaluation system capable of evaluating a condition of a fuel cell that changes moment by moment via ion concentration measurement, with as good response as possible, and capable of reducing, as much as possible, the falling of measurement accuracy due to a condensate being insufficient and the influence on the ion concentration measurement of the amount of the condensate temporarily increasing in fuel cell evaluation in which the ion concentration of discharge water discharged from the fuel cell is measured. This ion analysis device comprises a sampling unit that samples a condensate of discharge gas flowing through a discharge gas flow path of a fuel cell, and a sensor unit that measures the ion concentration of the condensate. The sampling unit either samples the condensate from a first storage part that is formed in the discharge gas flow path and that stores the condensate of the discharge gas, or samples the discharge gas from the discharge gas flow path and stores the condensate of the sampled discharge gas in a second storage part.

IPC Classes  ?

  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/04313 - Processes for controlling fuel cells or fuel cell systems characterised by the detection or assessment of failure or abnormal function
  • H01M 8/0444 - Concentration; Density
  • H01M 8/04694 - Processes for controlling fuel cells or fuel cell systems characterised by variables to be controlled

84.

TEST OBJECT TESTING SYSTEM, TRAVEL RESISTANCE CALCULATION DEVICE, TRAVEL RESISTANCE CALCULATION PROGRAM, AND TEST OBJECT TESTING METHOD

      
Application Number JP2022021209
Publication Number 2022/250042
Status In Force
Filing Date 2022-05-24
Publication Date 2022-12-01
Owner HORIBA, LTD. (Japan)
Inventor Kawazoe, Hiroshi

Abstract

The present invention highly precisely reproduces, with a bench test device, on-road driving in the real world, and is a test object testing device 100 for testing a test object W which is a vehicle or a part thereof, said test object testing device 100 comprising: a dynamometer 2 that applies a load to the test object W; a travel route setting unit 3 that uses a map M1 to set a travel route R; a road information acquisition unit 4 that acquires road information of the travel route R from a map M2; a travel resistance calculation unit 6 that calculates the travel resistance of the test object W on the basis of the road information; and a dynamometer control unit 7 that controls the dynamometer 2 on the basis of the travel resistance.

IPC Classes  ?

85.

RADIATION DETECTOR AND RADIATION DETECTION DEVICE

      
Application Number JP2022015111
Publication Number 2022/230538
Status In Force
Filing Date 2022-03-28
Publication Date 2022-11-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Ikawa, Seiji
  • Okubo, Yuji

Abstract

Provided are a radiation detector and radiation detection device capable of suppressing performance degradation. This radiation detector, which comprises a radiation detection element, a circuit element, and a housing for accommodating the radiation detection element and the circuit element, also comprises an enclosed space. The housing includes an unclosed opening, the enclosed space is disposed inside the housing, the circuit element is disposed inside the enclosed space, and the enclosed space is either depressurized or sealed with an inert gas or dry gas therein.

IPC Classes  ?

  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01T 7/00 - MEASUREMENT OF NUCLEAR OR X-RADIATION - Details of radiation-measuring instruments
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

86.

RADIATION DETECTOR, AND RADIATION DETECTING DEVICE

      
Application Number JP2022015113
Publication Number 2022/230539
Status In Force
Filing Date 2022-03-28
Publication Date 2022-11-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Okubo, Yuji
  • Ikawa, Seiji
  • Yasui, Kengo
  • Aoyama, Junichi

Abstract

Provided are a radiation detector and a radiation detecting device in which the use of wire bonding is reduced, and which allows a radiation detecting element to be replaced. This radiation detector includes a radiation detecting element, and a first board on a surface of which the radiation detecting element is mounted, and is provided with: a second board arranged in parallel with the first board; and a connector which is interposed between the first board and the second board, and which detachably fixes the first board to the second board. The connector comprises a first connector component connected to the first board, and a second connector component which is connected to the second board and to which the first connector component is detachably attached. The first board and the second board are electrically connected by way of the connector.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

87.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, AND RADIATION DETECTION DEVICE

      
Application Number JP2022012397
Publication Number 2022/224654
Status In Force
Filing Date 2022-03-17
Publication Date 2022-10-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Ishikura, Koji
  • Ohashi, Satoshi

Abstract

Provided are a radiation detection element, radiation detector, and radiation detection device that make it possible to suppress reduction in the sensitivity of radiation detection. This radiation detection element comprising a flat-plate-shaped semiconductor part comprises: a doping layer that is provided on one surface of the semiconductor part, is doped with a dopant, and comprises a semiconductor of a type that is different from that of the semiconductor part; an insulation layer that covers the doping layer; and a metal layer that is laid over the insulation layer. The electric potential of the doping layer and the electric potential of the metal layer are different.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

88.

SIGNAL PROCESSING METHOD, COMPUTER PROGRAM, SIGNAL PROCESSING DEVICE, AND RADIATION DETECTION DEVICE

      
Application Number JP2022012394
Publication Number 2022/224653
Status In Force
Filing Date 2022-03-17
Publication Date 2022-10-27
Owner HORIBA, LTD. (Japan)
Inventor Murata, Shunsuke

Abstract

Provided are a signal processing method, a computer program, a signal processing device, and a radiation detection device for improving the efficiency of detecting radiation. The signal processing method counts, by wave height, stepped waves that are based on detection of radiation or pulse waves obtained by converting the stepped waves, wherein in order to cancel out a distortion of a waveform caused by a signal delay included in first stepped waves obtained on the basis of detection of radiation, a plurality of signal values constituting signals containing the first stepped waves are converted into a plurality of signal values constituting signals containing second stepped waves, and the second stepped waves or pulse waves obtained by converting the second stepped waves are counted by wave height.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

89.

EVALUATION DEVICE, EVALUATION METHOD, AND PROGRAM FOR EVALUATION DEVICE

      
Application Number JP2022017471
Publication Number 2022/220213
Status In Force
Filing Date 2022-04-11
Publication Date 2022-10-20
Owner HORIBA, LTD. (Japan)
Inventor Itaya, Takahiro

Abstract

Provided is an evaluation device 100 which evaluates the performance of a predetermined object W to be evaluated while changing temperature conditions, said evaluation device 100 comprising: a heating furnace 1 that has an in-furnace space 1s which accommodates the object W to be evaluated; a temperature adjustment mechanism C that carries out temperature adjustment by heating or cooling the object W to be evaluated or the surroundings of the object W; a temperature acquisition unit 34 that acquires the temperature of a plurality of points of the object W to be evaluated or a plurality of points around the object W; and a temperature adjustment mechanism control unit 35 that controls the temperature adjustment mechanism C so as to keep the absolute value of the difference between the plurality of temperatures which have been obtained by the temperature acquisition unit 34 a predetermined value or less.

IPC Classes  ?

  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/0432 - Temperature; Ambient temperature
  • H01M 8/04701 - Temperature
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/12 - Fuel cells with solid electrolytes operating at high temperature, e.g. with stabilised ZrO2 electrolyte

90.

RADIATION TEMPERATURE MEASUREMENT DEVICE AND RADIATION TEMPERATURE MEASUREMENT METHOD

      
Application Number JP2022010056
Publication Number 2022/215417
Status In Force
Filing Date 2022-03-08
Publication Date 2022-10-13
Owner HORIBA, LTD. (Japan)
Inventor
  • Fujino, Sho
  • Tominaga, Koji

Abstract

This radiation temperature measurement device 3 for accurately measuring the temperature of an object W under measurement comprises two infrared detection units 4a, 4b that each detect a different infrared wavelength band, a spectral characteristic data storage unit 7 for storing spectral characteristic data indicating the transmittance and reflectance of each object W under measurement, and a temperature calculation unit 6 for calculating the temperature of each object W under measurement on the basis of the amounts of infrared light detected by the two infrared detection units 4a, 4b and the transmittance and reflectance of each object W under measurement.

IPC Classes  ?

  • G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J 5/60 - Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature

91.

SYSTEM FOR MEASURING AMOUNT OF CONSUMED HYDROGEN

      
Application Number JP2022016943
Publication Number 2022/211111
Status In Force
Filing Date 2022-03-31
Publication Date 2022-10-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Oida, Takuji
  • Nakatani, Shigeru
  • Aoyama, Junichi
  • Yokota, Yoshihiro

Abstract

Provided is a measurement system with which it is possible to precisely derive the amount of consumed hydrogen in a fuel cell without modifying a vehicle, etc., even when there is a possibility that leaked hydrogen is included in exhaust gas from the fuel cell or from a hydrogen engine. Provided is a system for measuring the amount of consumed hydrogen in a body under test, which is a moving body that is provided with a hydrogen reactor for chemically reacting hydrogen and that uses energy obtained through the chemical reaction, or which is a component of the moving body, the system for measuring the amount of consumed hydrogen comprising: an oxygen concentration sensor that measures the concentration of oxygen included in exhaust gas from the body under test; an oxidation catalyst disposed between the hydrogen reactor and the oxygen concentration sensor, the oxidation catalyst oxidizing hydrogen contained in the exhaust gas by using oxygen included in the exhaust gas; and a hydrogen consumption amount calculation unit that calculates the amount of consumed hydrogen on the basis of the oxygen concentration measured by the oxygen concentration sensor.

IPC Classes  ?

  • G01M 3/20 - Investigating fluid tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
  • H01M 8/00 - Fuel cells; Manufacture thereof
  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/04313 - Processes for controlling fuel cells or fuel cell systems characterised by the detection or assessment of failure or abnormal function
  • H01M 8/0438 - Pressure; Ambient pressure; Flow
  • H01M 8/0444 - Concentration; Density
  • H01M 8/04492 - Humidity; Ambient humidity; Water content
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/12 - Fuel cells with solid electrolytes operating at high temperature, e.g. with stabilised ZrO2 electrolyte
  • G01M 17/007 - Wheeled or endless-tracked vehicles

92.

ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM FOR ANALYSIS SYSTEM

      
Application Number JP2021047819
Publication Number 2022/209073
Status In Force
Filing Date 2021-12-23
Publication Date 2022-10-06
Owner
  • SHIMADZU CORPORATION (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Nagai, Yusuke
  • Wakabayashi, Satoru
  • Kitamura, Hiroyuki

Abstract

To make it possible to ascertain a drying time for fractionated liquid that has been fractionated onto a plate, an analysis system 100—which comprises a liquid chromatograph 10 for separating each component of a liquid sample, a fraction collector 20 for fractionating the liquid sample S separated by the liquid chromatograph 10 onto a plurality of locations on a plate PL together with a mobile phase Z, and an analysis device 30 for analyzing the fractionated liquid SS fractionated by the fraction collector 20 after the fractionated liquid SS has been dried—is made to comprise a drying time calculation unit 41 for calculating the drying time required to dry the fractionated liquid SS and an output unit 43 for outputting the drying time calculated by the drying time calculation unit 41 or information that makes it possible to ascertain the drying time.

IPC Classes  ?

93.

ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM FOR ANALYSIS SYSTEM

      
Application Number JP2021047820
Publication Number 2022/209074
Status In Force
Filing Date 2021-12-23
Publication Date 2022-10-06
Owner
  • SHIMADZU CORPORATION (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Nagai, Yusuke
  • Wakabayashi, Satoru
  • Kitamura, Hiroyuki

Abstract

This analysis system is provided with a liquid chromatograph for separating a liquid sample into components and performing analysis thereof, a fraction collector that fractionates the liquid sample having passed through the liquid chromatograph and that drops a fractionated liquid having undergone fractionation to a sample holding body having a plurality of sample holding parts; an analysis device that analyzes the sample components contained in the fractionated liquid, which had been dropped onto the sample holding parts; and a setting screen display part for displaying, on a display, a drop range setting screen for setting a range of sample holding parts, which are among the plurality of sample holding parts and onto which a fractionated liquid is to be dropped by the fraction collector. The setting screen display part simultaneously displays, on the drop range setting screen, a setting chromatogram for setting a fractionation range of the liquid sample and a sample holding body symbol having a plurality of sample holding part symbols mimicking the sample holding parts, displays the fractionation range of the liquid sample on the setting chromatogram, and displays, on the sample holding body symbol, the sample holding part symbols corresponding to the fractionation range.

IPC Classes  ?

94.

ANALYSIS SYSTEM, DISPLAY METHOD FOR ANALYSIS SYSTEM, AND PROGRAM FOR ANALYSIS SYSTEM

      
Application Number JP2021047818
Publication Number 2022/209072
Status In Force
Filing Date 2021-12-23
Publication Date 2022-10-06
Owner
  • SHIMADZU CORPORATION (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Nagai, Yusuke
  • Tsujii, Kanya
  • Wakabayashi, Satoru
  • Miura, Tetsusaburo
  • Kitamura, Hiroyuki

Abstract

In order to provide an analysis system that is user-friendly and allows easy comparison of a corresponding chromatogram and Raman spectrum even when multiple devices perform control or analysis with individual software, the present invention comprises: a chromatograph 10 that separates a liquid sample S into components and analyzes the same; a fraction collector 20 that collects liquid fractions SS containing a sample component of the aforementioned liquid sample or a mobile phase that has passed through a component detector of the chromatograph 10; a Raman spectroscopic analyzer 30 that uses Raman spectroscopy to analyze the liquid fractions SS collected by the fraction collector 20; and an analysis summary display unit 45 that displays an analysis summary screen SC4 containing data elements comprising, aligned in a prescribed direction, a sample identifier indicating the liquid sample S, a chromatogram of the liquid sample S, which is the analysis results of the chromatograph, and the Raman spectrum of the liquid fractions SS, which is the analysis results of the Raman spectroscopic analyzer.

IPC Classes  ?

95.

ANALYSIS SYSTEM AND PROGRAM FOR ANALYSIS SYSTEM

      
Application Number JP2021047821
Publication Number 2022/209075
Status In Force
Filing Date 2021-12-23
Publication Date 2022-10-06
Owner
  • SHIMADZU CORPORATION (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Nagai, Yusuke
  • Wakabayashi, Satoru,
  • Kitamura, Hiroyuki

Abstract

Provided is an analysis system with which, even when a specimen holding body comprising a plurality of specimen holding parts is used across a plurality of liquid chromatographies, it is possible to reduce the burden on the user with regard to managing an operation log relating to each specimen holding part of the specimen holding body and to suppress contamination of fractionated liquids due to human error, analysis omissions due to a selection error of a well being analysed, or the like. This analysis system comprises: a liquid chromatograph that separates a liquid specimen by component; a fraction collector that fractionates liquids, which contain the specimen components separated by the liquid chromatograph, into specimen holding parts formed by a specimen holding body; and an analysis device that analyses the specimen components contained in the respective fractionated liquids fractionated by the fraction collector. Said analysis system is characterised by comprising a storage unit which stores an operation log for each specimen holding part.

IPC Classes  ?

96.

FOREIGN MATTER INSPECTION DEVICE AND FOREIGN MATTER INSPECTION METHOD

      
Application Number JP2022004593
Publication Number 2022/201910
Status In Force
Filing Date 2022-02-07
Publication Date 2022-09-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Someya, Shota
  • Kanzaki, Toyoki

Abstract

The present invention reduces erroneous detection due to diffraction of light by a pattern, and provides a foreign matter inspection device 100 for inspecting foreign matter attached on a substrate W having patterns formed thereon. The foreign matter inspection device 100 comprises: a light irradiation unit 2 for irradiating the substrate W with laser light LB to linearly scan the same; a first light detecting unit 3A and a second light detecting unit 3B for detecting light reflected by the substrate W; and a foreign matter detecting unit 4 for detecting foreign matter on the basis of output signals from the first light detecting unit 3A and the second light detecting unit 3B. The first light detecting unit 3A and the second light detecting unit 3B are arranged such that a light-receiving elevation angle α with respect to the surface of the substrate W and a light-receiving horizontal angle β with respect to a scan direction of the laser light LB differ from each other. The first light detecting unit 3A detects diffracted light from a pattern forming a predetermined angle with the scan direction. The second light detecting unit 3B detects diffracted light from a pattern forming an angle other than the predetermined angle with the scan direction.

IPC Classes  ?

  • H01L 21/66 - Testing or measuring during manufacture or treatment
  • G01N 21/956 - Inspecting patterns on the surface of objects

97.

FUEL CELL EVALUATION SYSTEM AND FUEL CELL EVALUATION METHOD

      
Application Number JP2022011441
Publication Number 2022/196657
Status In Force
Filing Date 2022-03-14
Publication Date 2022-09-22
Owner HORIBA, LTD. (Japan)
Inventor
  • Okada, Yoichi
  • Tanaka, Yoshinori
  • Sasai, Kohei
  • Watanabe, Shunta

Abstract

The present invention is a fuel cell evaluation system (100) that derives an actual gas consumption quantity in a fuel cell in real time with high precision, and that calculates a fuel gas consumption quantity in a fuel cell (FV), the fuel cell evaluation system (100) comprising: a fuel gas supply path (2) for supplying a fuel gas at a first flow rate to the fuel cell (FV); a fuel gas exhaust path (4) for discharging the fuel gas from the fuel cell (FV); inert gas introduction paths (6, 8) for introducing an inert gas at a second flow rate into the fuel gas exhaust path (4) or the fuel gas supply path (2); a first fuel gas concentration meter (7) for measuring the fuel gas concentration in a mixed gas composed of the fuel gas and the inert gas flowing in the fuel gas exhaust path (4); and a fuel gas consumption quantity calculation unit (10) for calculating the fuel gas consumption quantity in the fuel cell (FV) on the basis of the first flow rate, the second flow rate, and the fuel gas concentration measured by the first fuel gas concentration meter (7).

IPC Classes  ?

  • H01M 8/04313 - Processes for controlling fuel cells or fuel cell systems characterised by the detection or assessment of failure or abnormal function
  • H01M 8/0444 - Concentration; Density
  • H01M 8/04746 - Pressure; Flow
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/12 - Fuel cells with solid electrolytes operating at high temperature, e.g. with stabilised ZrO2 electrolyte

98.

ELEMENT ANALYSIS DEVICE, OPERATION METHOD FOR ELEMENT ANALYSIS DEVICE, AND WORK PROGRAM FOR ELEMENT ANALYSIS DEVICE

      
Application Number JP2021042816
Publication Number 2022/190466
Status In Force
Filing Date 2021-11-22
Publication Date 2022-09-15
Owner HORIBA, LTD. (Japan)
Inventor
  • Inoue, Takahito
  • Uchihara, Hiroshi

Abstract

A degasification mechanism 4 is configured so as to comprise: a pumping channel 41 that pumps a purge gas to a heating furnace 1; a discharge channel 42 that communicates the heating furnace 1 with outside air and that discharges, to the outside air, the purge gas pumped into the heating furnace 1; and a purge gas flow rate adjusting mechanism 43 that regulates the flow rate of the purge gas by changing, in a plurality of steps or continuously, the channel resistance of the discharge channel 42.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroups; Apparatus specially adapted for such methods using combustion

99.

SEMICONDUCTOR LASER DEVICE

      
Application Number JP2022006960
Publication Number 2022/185970
Status In Force
Filing Date 2022-02-21
Publication Date 2022-09-09
Owner HORIBA, LTD. (Japan)
Inventor
  • Awane, Yusuke
  • Matsuhama, Makoto
  • Tsukatani, Kosuke
  • Niina, Kodai
  • Ido, Takuya

Abstract

The present invention suppresses as much as possible an individual difference in the strength of output laser light for each semiconductor device while suppressing the occurrence of stray light inside a package of a semiconductor laser device. This semiconductor laser device used for optical analysis is characterized by comprising: a package which accommodates therein a semiconductor laser element; and a light reflection reducing member which is provided inside the package and suppresses the reflection of the light output from the semiconductor laser element, wherein the light reflection reducing member is adhered to the inner surface of the package.

IPC Classes  ?

  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • H01S 5/022 - Mountings; Housings

100.

METHOD FOR MEASURING VIRAL PARTICLE, AND DEVICE FOR MEASURING VIRAL PARTICLE

      
Application Number JP2021036935
Publication Number 2022/185592
Status In Force
Filing Date 2021-10-06
Publication Date 2022-09-09
Owner HORIBA, LTD. (Japan)
Inventor
  • Mori, Tetsuya
  • Nakayama, Hideki
  • Irikura, Daisuke

Abstract

The present invention efficiently quantifies the particle size distribution of viral particles, and has a staining step for adding a membrane-permeable fluorescent dye to a sample that includes viral particles to fluorescently stain contents of the viral particles, and, subsequent to the staining step, a measurement step for detecting luminescence of the membrane-permeable fluorescent dye to measure the particle size distribution of the viral particles.

IPC Classes  ?

  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 21/64 - Fluorescence; Phosphorescence
  1     2     3     4        Next Page