Hitachi High-Tech Corporation

Japan

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Trademark
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NICE Class
09 - Scientific and electric apparatus and instruments 2
11 - Environmental control apparatus 2
07 - Machines and machine tools 1
Found results for  trademarks

1.

ZONETEM

      
Application Number 156733200
Status Registered
Filing Date 2012-03-06
Registration Date 2013-02-27
Owner Hitachi High-Tech Corporation (Japan)
NICE Classes  ? 11 - Environmental control apparatus

Goods & Services

(1) UV cleaning and sanitizing equipment for laboratory specimen samples and microscopes.

2.

ZONESEM

      
Application Number 156733300
Status Registered
Filing Date 2012-03-06
Registration Date 2013-02-27
Owner Hitachi High-Tech Corporation (Japan)
NICE Classes  ? 11 - Environmental control apparatus

Goods & Services

(1) UV cleaning and sanitizing equipment for laboratory specimen samples and microscopes.

3.

FLATMILLING

      
Application Number 139848400
Status Registered
Filing Date 2008-06-06
Registration Date 2011-10-24
Owner Hitachi High-Tech Corporation (Japan)
NICE Classes  ?
  • 07 - Machines and machine tools
  • 09 - Scientific and electric apparatus and instruments

Goods & Services

(1) Ion milling machines for preparing cross sections of specimens for observation with an electron microscope; software for use with ion milling machines for preparing cross sections of specimens for observations with an electron microscope.

4.

nanoDUE'T

      
Application Number 131040400
Status Registered
Filing Date 2006-07-13
Registration Date 2012-03-06
Owner Hitachi High-Tech Corporation (Japan)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

(1) Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semiconductors; compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors (2) SEM (Scanning Electron Microscope), STEM (Scanning Transmission Electron Microscope), FIB (Focused Ion Beam system); compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors