There are provided a sample conveying device and a sample conveyance method capable of determining a cause of an abnormality in a conveyance speed more quickly than in the related art. In a conveying device 501, a general conveyance speed of a conveying container 102 is obtained from a position of the conveying container 102 detected by a position detection unit 110 to determine whether the general conveyance speed is abnormal, and when it is determined that the general conveyance speed is abnormal, an inspection conveying container 105 is conveyed, and the cause of the abnormality in the general conveyance speed is determined based on the conveyance speed of the inspection conveying container 105.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
2.
Container Holder, Analyzer, and Method for Manufacturing Container Holder
The purpose of the present invention is to provide a container holder with which it is possible to hold a container in a non-tilted manner and which has a draft angle for smoothly extracting a die used when manufacturing the container holder through injection-molding. A hole in which the container holder according to the present invention accommodates a container has a first wall section and a second wall section, the first wall section having a shape such that the hole widens from an opening section toward a bottom section, and the second wall section having a shape such that the hole widens from the bottom section toward the opening section (refer to FIG. 4).
To provide an automatic analyzer which stabilizes light quantity before measurement in a short period while prolonging a long life of light source. An automatic analyzer of the present invention includes a light source with two or more LED elements each having a different wavelength, an analysis section for executing analysis based on light radiated to a reaction vessel, and a current adjustment section for adjusting quantity of current supplied to each of the LED elements. The current adjustment section reduces the quantity of current to each of the LED elements in a non-analytical state individually to be smaller than the quantity of current in an analytical state.
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
The performance of a power supply module is to be improved. The occurrence of discharge in the power supply module is to be prevented, and the size of the power supply module is to be reduced. In a power supply module, substrates are provided being stacked in a planar view. A low voltage circuit and a high voltage circuit are formed on a first substrate such that a distance is kept for preventing surface discharge, and a low voltage circuit is formed on a second substrate. A distance between a component of a high voltage alternating current circuit on the high voltage circuit and a component of the low voltage circuit is three times a shortest distance, at which space discharge does not occurs, between a component that constitutes a high voltage direct current circuit on the high voltage circuit and a component that constitutes the low voltage circuit.
A flow path washing method and apparatus for an auto sampler in which, when a cleaning fluid supplied to a flow path which is switched between a first flow path including a nozzle for aspirating a sample and a sample loop for holding the aspirated sample, and a second flow path including a washing tub for washing at least an outer wall of the nozzle, a control unit changes a flow velocity of the cleaning fluid supplied between measurement of a first measurement item and measurement of a second measurement item based on washing information showing washing patterns corresponding to measurement items of the sample, including at least one of first washing information showing a washing pattern corresponding to the first measurement item of the sample and second washing information showing a washing pattern corresponding to the second measurement item to be measured subsequent to the first measurement item.
In an automatic analyzer, an influence due to a disturbance component on a measurement result can be appropriately prevented. An automatic analyzer 1 includes: a first light source 102 configured to emit light toward a sample 44; a drive circuit 101 configured to supply a first drive current I3 whose frequency changes from f1 to f2 intermittently or continuously to the first light source 102; a light receiver 113 configured to output a light detection signal IR based on the light transmitted through the sample 44; and a signal processing circuit 111 configured to demodulate the light detection signal IR in accordance with the frequency f1 to f2 of the first drive current I3 and output a measurement signal VL based on a demodulation result.
G01N 21/77 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
The present invention provides a mobile robot that can simultaneously absorb an impact received from an uneven road surface while moving and estimate the position or orientation of the mobile robot while functioning. The mobile robot according to the present invention has an operation mechanism having a multi-jointed arm, and a movement mechanism that causes the operation mechanism to move, the mobile robot being characterized in that: the movement mechanism has a first support part and a second support part, which support the weight of the movement mechanism; and the second support part is installed at a position that is nearer to an outer peripheral section, in terms of the movement direction of the movement mechanism, than is the installation position of the first support part.
B60G 17/016 - Resilient suspensions having means for adjusting the spring or vibration-damper characteristics, for regulating the distance between a supporting surface and a sprung part of vehicle or for locking suspension during use to meet varying vehicular or s the regulating means comprising electric or electronic elements characterised by their responsiveness, when the vehicle is travelling, to specific motion, a specific condition, or driver input
B25J 5/00 - Manipulators mounted on wheels or on carriages
B60G 3/00 - Resilient suspensions for a single wheel
A defect inspection device in which an optical axis of a detection optical system is inclined with respect to a surface of a sample, and an imaging sensor is inclined with respect to the optical axis, a height variation amount of an illumination spot in a normal direction of the surface of the sample is calculated based on an output of a height measuring unit, a deviation amount of the focusing position with respect to the light receiving surface in an optical axis direction of the detection optical system is calculated based on the height variation amount of the illumination spot, the deviation amount of the focusing position being generated accompanying a height variation of the illumination spot, and the focus actuator is controlled based on the deviation amount of the focusing position, and scattered light intensities at the same coordinates of the sample are added.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
Provided are a sample collection call time prediction system and a sample collection call time prediction method, with which it is possible to improve the accuracy of predicting the time at which a patient is called for sample collection. This call time prediction system includes a first processor that predicts, by machine learning, the time at which a patient is called for sample collection, the prediction being made on the basis of at least one of reception time information indicating the reception time for a patient from whom a sample is to be collected, sample type information indicating the type of the sample to be collected from the patient, a reception number indicating the order of reception of the patient, inpatient/outpatient classification information indicating whether the patient is an inpatient or an outpatient, and the number of waiting patients waiting to be called for sample collection at the reception time.
There is provided an automatic analyzer that stops a back-flowing waste fluid from reaching a cleaning tank when bubbles are produced in a waste fluid pipe. An automatic analyzer includes: a cleaning tank in which cleaning using a detergent is performed with analysis operation of a specimen; and a waste fluid pipe through which a waste fluid flowing from the cleaning tank is discharged. The waste fluid pipe has an upward pipe branched upward. At a tip end of the upward pipe, opening is provided. The opening is disposed blow from the cleaning tank.
The present invention controls liquid shaking during transportation while maintaining high-precision with respect to the stopping position of a specimen at the time of device start-up. This specimen carrying device includes a plurality of coils that transport a transportation container of a specimen, a coil drive unit, and a control unit, wherein: the control unit includes a liquid shaking determination unit that determines liquid shaking of the specimen from a velocity fluctuation of the specimen; the control unit sets, near a stopping coil 3 that is nearest to the stopping position of the specimen, a first section S1 on a side separated from the stopping coil 3 and a second section S2 on a side nearer to the stopping coil 3 than the first section S1, and sets a first current as a current that energizes the stopping coil 3 when the specimen is in the first section S1 and a second current as a current that energizes the stopping coil 3 when the specimen is in the second section S2; and the first current is set, on the basis of determination information of the liquid shaking determination unit 65, to a magnitude whereby the liquid shaking of the specimen is controlled, and the second current is set to a current value larger than that of the first current.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
Problem
Provided is an electrolyte analyzer that allows reducing a load of a user in a replacement work compared with conventional one.
Problem
Provided is an electrolyte analyzer that allows reducing a load of a user in a replacement work compared with conventional one.
Solution
An electrolyte analyzer includes an ISE electrode 1 that includes at least one electrode, a reference electrode 2 that includes at least one electrode different from the ISE electrode 1, and a housing 200 that houses the electrodes of the ISE electrode 1 and the reference electrode 2. The housing 200 includes a pressing unit that presses the electrodes to one another, a first press switching unit 210 that switches the ISE electrode 1 between a secured state and a released state, and a second press switching unit 215 that switches the reference electrode 2 between a secured state and a released state. The ISE electrode 1 and the reference electrode 2 are each switched between the secured state and the released state. Selected Drawing: FIG. 3
G01N 27/411 - Cells and probes with solid electrolytes for investigating or analysing of liquid metals
G01N 27/30 - Electrodes, e.g. test electrodes; Half-cells
G01N 27/42 - Measuring deposition or liberation of materials from an electrolyte; Coulometry, i.e. measuring coulomb-equivalent of material in an electrolyte
In order to execute stable processing by suppressing plasma diffusion and non-stationary discharge generation, there is provided a plasma processing device which includes a processing chamber in which a sample stage is provided for placing a sample thereon, an exhaust unit for evacuating the processing chamber, a magnetic field forming mechanism for forming a magnetic field in the processing chamber, and a power supply unit that supplies radio frequency power for generating plasma to the inside of the processing chamber evacuated by the exhaust unit and has the magnetic field formed by the magnetic field forming mechanism. The processing chamber includes a shielding section which divides an inner part of the processing chamber into a first area at a side for supplying the radio frequency power from the power supply unit and a second area at a side where the sample stage is disposed. The shielding section includes a first shielding plate disposed at the side that faces the first area, in which a first opening is formed, a second shielding plate disposed at the side that faces the second area, in which a second opening is formed at the center, and a third shielding plate disposed between the first and the second shielding plates.
An analysis system includes an analyzer configured to separate a sample including a plurality of components labeled with any of M kinds of fluorescent substances by chromatography and acquire first time-series data of fluorescence signals detected in N kinds (M>N) of wavelength bands in a state in which at least a part of the plurality of components is not completely separated; and a computer configured to compare the first time-series data with the second time-series data, and determine which kind of fluorescent substance of M kinds of fluorescent substances individually labels each of the plurality of components.
There is provided an automatic analyzer that keeps a temperature of alight emitting element of alight source constant and has high accuracy analysis performance. A light source for an automatic analyzer includes: a substrate including a light source; a temperature adjustment unit configured to adjust a temperature of the light source; a first optical element configured to emit light from the light source to an outside; and a member configured to cover the light source, in which the temperature adjustment unit, the substrate, the member, and the first optical element are arranged in this order, the optical element is assembled so as to be accommodated in the member, and the temperature adjustment unit puts the light source, the member, and the optical element under the same temperature control.
G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
16.
Thin Film Damage Detection Function and Charged Particle Beam Device
National Institute of advanced Industrial Science and Technology (Japan)
Inventor
Hatano, Michio
Nakamura, Mitsuhiro
Ogura, Toshihiko
Abstract
A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holder 101 holding a sample includes: a sample chamber including a first insulating thin film 110 and a second insulating thin film 111 that sandwich and hold the sample 200 in a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrode 820 disposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unit 50 connected to the detection electrode. Before the surrounding atmosphere of the sample holder is evacuated from an atmospheric pressure to a vacuum, the charged particle beam device receives a detection signal from the signal detection unit via a connector and detects an abnormality of the sample chamber based on the detection signal.
G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
17.
Microscope Slide and Method for Selecting the Same
Provided is an efficient method for attaching a tissue section. In the invention, one of problems is solved by changing attachment conditions of the tissue section depending on an organ from which the tissue section is derived. A technique of achieving good adhesiveness between a microscope slide and a section by introducing unevenness on a front surface of the microscope slide using reactive ion etching as one of the attachment conditions is provided. Further, a technique of optimizing the attachment of the section using a machine learning technique or the like is provided.
There is provided a housing box that prevents breakage of a rod-shaped member like a nozzle use for an automatic analyzer at the time of transportation. A housing box in which a rod-shaped member used for an automatic analyzer is housed, the housing box includes: a base provided with a housing part in a groove shape on which the rod-shaped member is placed; and a cover put on the base, wherein the housing part has a step on which a projection is caught, the projection being provided on a bottom of the rod-shaped member, the projection projecting in a radial direction, and a space between a tip end and an inner wall of the rod-shaped member.
B65D 85/38 - Containers, packaging elements or packages, specially adapted for particular articles or materials for articles particularly sensitive to damage by shock or pressure for delicate optical, measuring, calculating or control apparatus
B65D 1/36 - Trays or like shallow containers with moulded compartments or partitions
B65D 43/16 - Non-removable lids or covers hinged for upward or downward movement
B65D 51/26 - Closures not otherwise provided for combined with auxiliary devices for non-closing purposes with means for keeping contents in position, e.g. resilient means
B65D 81/05 - Containers, packaging elements, or packages, for contents presenting particular transport or storage problems, or adapted to be used for non-packaging purposes after removal of contents specially adapted to protect contents from mechanical damage maintaining contents at spaced relation from package walls, or from other contents
B65D 85/24 - Containers, packaging elements or packages, specially adapted for particular articles or materials for incompressible or rigid rod-shaped or tubular articles for needles, nails or like elongate small articles
National Institute of Advanced Industrial Science and Technology (Japan)
Inventor
Hatano, Michio
Nakamura, Mitsuhiro
Ogura, Toshihiko
Abstract
A sample holder reliably holds a liquid or gel sample, and the yield of observation with a charged particle beam device is improved. A sample holder 101 includes a first member 102 that has a lid member 111 and a first chip 105 provided with a first window 123 where a laminated film including a first insulating thin film 104 is formed, and a second member 103 that has a base material 127 having a first bottom seal surface 203 and a second bottom seal surface 200, an electrode 108 disposed on the base material, and a second chip 107 provided with a second window 124 where a second insulating thin film 106 is formed and held on the second bottom seal surface via a second seal material 119 such that the second window faces the electrode, in which a region inside a first seal material is maintained airtightly from a region outside the first seal material by the first member and the second member being combined and the first seal material being crushed between the first bottom seal surface and an upper seal surface of the lid member.
An evaporation concentration mechanism is realized that can control a depressurization rate by an inexpensive and simple mechanism to inhibit bumping at the time of evaporation and concentration. The evaporation concentration mechanism includes a reaction vessel that holds a sample solution, a depressurization channel connected to the reaction vessel, and a depressurization source that is connected to the reaction vessel via the depressurization channel and depressurizes the inside of the reaction vessel. The evaporation concentration mechanism further includes at least one of solenoid valves provided in the depressurization channel, and a control unit 8 that controls an operation of the solenoid valves. The control unit 8 intermittently opens and closes the solenoid valves during a depressurization period in which the inside of the reaction vessel is depressurized by the depressurization source.
There are provided a sample conveyance system and a sample conveyance method capable of conveying a sample in a more stable manner than in the related art corresponding to a conveyance method using an electromagnetic actuator. A driving unit 208 applies a first voltage to a first coil 207a located on a front side in a traveling direction of a holder 202, which is selected to attract or repel the holder 202, to excite the first coil 207a and applies a second voltage having a polarity opposite to a polarity of the first voltage to at least one or more of second coils 207b among coils 207 adjacent to the first coil 207a except for the coils 207 in the front side in the traveling direction to excite the second coil 207b, and a control unit 210A estimates a position of the holder 202 based on a value of a current flowing through a winding 206 of the first coil 207a.
B65G 54/02 - Non-mechanical conveyors not otherwise provided for electrostatic, electric, or magnetic
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
22.
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS SYSTEM
Provided is an automatic analysis device in which safety is ensured, and operability is improved. The automatic analysis device includes: an operation unit that receives voice input from a microphone or a mobile device; and a measurement unit that analyzes a sample. The operation unit has: an equipment state acquisition unit that acquires equipment state data for the measurement unit; a voice detection/recognition unit that acquires voice data and converts the voice data into voice instruction text; and a unit for determining device operability that, in cases in which the voice instruction text includes operation instructions for the measurement unit, determines the executability of the operation instructions included in the voice instruction text, on the basis of the equipment state data for the measurement unit acquired by the equipment state acquisition unit, and on the basis of the accuracy of the voice instruction text.
To provide an automatic analyzer with no need to control a residual amount of a quality control sample. An automatic analyzer includes an input unit which receives a container including a specimen and a quality control sample, an ID reader which reads ID attached to the container, a control unit which assigns measurement items to the ID and controls each unit, and an analysis unit which dispenses the specimen and the quality control sample from the container and performs analysis based on the measurement items, in which when a liquid amount of a first container including the quality control sample is not enough, the control unit assigns measurement items not yet performed, of measurement items assigned to ID of the first container, to ID of a second container including the quality control sample and controls the analysis unit to perform analysis.
A technique for replacing a separation column includes: a driving device supporting a first pipe along a first direction; a fixing member that fixes a second pipe to be opposed to the first pipe along the first direction; a column case between the first pipe and the second pipe, having a first and second holes communicating with the first and second pipes, respectively; and an interlocking mechanism that moves the column case in the first direction in conjunction with movement of the first pipe. The column case allows a column cartridge retaining a separation column to be connected and disconnected. The driving device moves the first pipe and the interlocking mechanism such that two states are reversibly taken; a closed state in which the separation column is between the first and second pipes and an open state in which the first and second pipes are positioned outside the column case.
A mass spectrometry device can reduce a deviation in a mass axis due to the generation of heat from an AC voltage control circuit; and a method for controlling the mass spectrometry device. The mass spectrometry device has a quadrupole electrode, to which a controlled AC voltage is applied, and uses the quadrupole electrode as a mass filter. Before measurement, the mass spectrometry device applies an AC voltage of a prescribed amplitude V1 to the multipole electrode for a prescribed time T1, and a heating value J1 that is generated when the AC voltage of the prescribed amplitude V1 is applied to the multipole electrode for the prescribed time T1 is equivalent to a heating value that is generated when the AC voltage of the amplitude that is applied during the measurement is applied until a thermally steady state is reached (see FIG. 3A).
Provided is a spectroscopic measurement device capable of improving detection sensitivity to a change in a physical property value such as expansion of a sample to which energy is applied by an infrared ray or the like. The spectroscopic measurement device includes: a stage on which a sample is to be placed; an energy source configured to generate an energy beam to be emitted to a predetermined region of the sample; an electromagnetic wave source configured to generate an electromagnetic wave to be emitted to the sample; an objective lens configured to focus the electromagnetic wave in the predetermined region; two confocal detectors configured to detect the electromagnetic wave reflected by the sample; and a calculation unit configured to calculate, based on each of outputs of the confocal detectors, a change in a physical property value of the sample when the energy beam is emitted to the predetermined region.
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
Provided are an electrolyte analysis device and a method for identifying an abnormality in the same that make it possible to detect an abnormality in an ion-selective electrode at an early stage. The electrolyte analysis device comprises an ion-selective electrode that generates a sample potential that is a potential corresponding to the ion concentration of a sample, a reference electrode that generates a reference potential that is a potential to serve as a reference, and a concentration calculation unit that calculates the ion concentration on the basis of the potential difference between the sample potential and the reference potential. The electrolyte analysis device is characterized by additionally comprising an abnormality determination unit for determining whether there is an abnormality on the basis of an evaluation value that has been calculated using a detergent potential that is a potential generated by the ion-selective electrode when a detergent was supplied.
Provided is an analyzer column cartridge that can control the temperature of an analysis column while saving resources and costs. An analyzer column cartridge 1 includes: metal blocks 7, 8 that accommodate an analysis column 10 used in a liquid chromatography; and housings 2, 3 that accommodate the metal blocks 7, 8. A plurality of holes 11A, 11B, 11C, 11D, and 11E that communicate with an accommodation space of the analysis column 10 are formed in the metal block 8. The housing has a plurality of windows 6A, 6B, 6C, 6D, and 6E formed at positions facing the plurality of holes 11A, 11B, 11C, 11D, and 11E formed in the metal block 8.
B01D 15/16 - Selective adsorption, e.g. chromatography characterised by constructional or operational features relating to the conditioning of the fluid carrier
The purpose of the present invention is to provide a charged particle beam device that can specify irradiation conditions for primary charged particles that can obtain a desired charged state without adjusting the acceleration voltage. The charged particle beam device according to the present invention specifies the irradiation conditions for a charged particle beam in which the charged state of a sample is switched between a positive charge and a negative charge, and adjusts the irradiation conditions according to the relationship between the specified irradiation conditions and the irradiation conditions when an observation image of the sample has been acquired (see FIG. 8).
H01J 37/02 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof - Details
H01J 37/28 - Electron or ion microscopes; Electron- or ion-diffraction tubes with scanning beams
H01J 37/244 - Detectors; Associated components or circuits therefor
H01J 37/22 - Optical or photographic arrangements associated with the tube
There is provided a gas supply apparatus that can effectively suppress a trouble caused by backflow of a process gas to the upstream side when processing is performed by using the process gas inside a chamber. The gas supply apparatus supplies gas to a processing chamber in which a sample is processed. The gas supply apparatus includes: ports respectively connected to gas sources of a plurality of types of gases containing a purging gas and a processing gas; and a collective pipe in which the plurality of types of gases supplied from the ports are joined and flowed. A gas flow path through which gas supplied from the port connected to the gas source for the purging gas flows is formed on an uppermost stream side of the collective pipe.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
32.
PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
A plasma processing apparatus having an improved yield includes a metal base member having a disk shape or a cylindrical shape arranged inside a sample table; a refrigerant flow path arranged multiple times in a concentrical shape around a center of the base member; at least one temperature sensor; and a controller configured to detect a temperature of the base member or the wafer using the temperature sensor. The controller is configured to detect the temperature of the base member or the wafer based on one of a plurality of linear functions indicating a relation between an error and a set temperature of the refrigerant, and the linear functions are different corresponding to regions of a plurality of continuous temperature ranges within an adjustable temperature range of the refrigerant, and the plurality of linear functions include the same coefficient and have a point where the error is 0.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
33.
ION SOURCE, MASS SPECTROMETER, AND CAPILLARY INSERTION METHOD
Provided is a technique for realizing high analysis reproducibility. An ion source of the present disclosure includes a capillary and a gas spray tube into which the capillary is inserted, the gas spray tube spraying a gas to an outer side of the capillary, and the gas spray tube having a deflection site, which deflects a downstream end of the capillary with respect to a central axis of a tip hole of the gas spray tube, on an upstream side of the tip hole of the gas spray tube.
Provided is a calibration sample that can be used for three-dimensional structures and is unlikely to change over time. To this end, the calibration sample is a calibration sample for an autofocus target position in an optical microscope, and comprises a light-transmissive resin sample container that accommodates a first layer, which is disposed on a bottom side along the optical axis direction of the optical microscope and in which a target object having contrast with respect to a light-transmitting first resin is disposed inside the light-transmitting first resin, and a second layer which is disposed so as to cover the first layer and is composed of a light-transmitting second resin.
When arraying laser-irradiation portions of a plurality of capillaries on the same array plane, simultaneous irradiation of the capillaries with a laser beam incident from the side is enabled by filling the capillaries with a separation medium having a low refractive index of n3<1.36 and by setting n1=1.00, n2=1.46, R/r<5.9, and ΔZ≤9 μm, wherein a distance in a direction perpendicular to the array plane between two capillaries, which are farthest from each other in the perpendicular direction among the capillaries in the laser-irradiation portions, is denoted by 2×ΔZ, wherein an outer radius, an inner radius, a refractive index of an external medium, a refractive index of a material, and a refractive index of an internal medium of each of the capillaries in the laser-irradiation portions are denoted by R, r, n1, n2, and n3, respectively.
G02F 1/167 - Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on translational movement of particles in a fluid under the influence of an applied field characterised by the electro-optical or magneto-optical effect by electrophoresis
G02F 1/1677 - Structural association of cells with optical devices, e.g. reflectors or illuminating devices
36.
Aseptic Sampling Apparatus and Aseptic Sampling Method
The aseptic sampling apparatus according to the present invention includes: a sampling channel for pulling out a culture solution in a culture tank to supply the same to an analytical unit; and a pressure-applying unit for applying a pressure to the inside of the sampling channel. The pressure-applying unit controls the flow pressure or fluid flow rate of a fluid in the sampling channel such that a pressure gradient toward the outlet-side open end nozzle of the sampling channel is not less than 1 kPa/m.
A charged particle beam device includes a sample stage on which a sample is mounted and moved, a charged particle beam irradiation optical system irradiating with a charged particle beam, a sample piece movement unit holding and conveying a sample piece extracted from the sample, a holder fixing table holding a sample piece holder to which the sample piece is transferred, and a computer. When allowing the sample piece movement unit to approach the sample piece, the computer selects a matching region for performing image matching between a reference image obtained in advance by irradiating the sample with the charged particle beam and a comparison image obtained by irradiating the sample, which is an extraction target for the sample piece, with the charged particle beam.
For a machine learning model that receives control parameters of a semiconductor processing device and outputs shape parameters that express a processed shape of a semiconductor sample processed by the semiconductor processing device, an experiment point obtaining learning data is recommended. A contribution of each control parameter to the prediction of the machine learning model is evaluated from feature quantity data that is a value of a control parameter of the learning data used for learning of the machine learning model, and the experiment point is recommended based on a stability evaluation and an uncertainty evaluation of the prediction by the machine learning model in a space defined by the control parameters selected based on the contribution as axes.
An optical foreign matter inspection device includes a rotation stage; a laser light source; a sensor that is a charge accumulation type sensor; a detecting circuit; a light emission timing signal generating circuit configured to generate a light emission timing synchronizing signal synchronized with laser emission; a trigger signal generating circuit configured to receive a first signal (a stage encoder signal) indicating a rotation state of a sample, and generate a trigger signal synchronized with the light emission timing synchronizing signal; a number-of-emitted-pulse calculating circuit configured to receive the light emission timing synchronizing signal and the first signal, and calculate the number of pulses in each period corresponding to a position in a radial direction of the sample; and a processing system configured to measure a state of each position on a surface of the sample by using a detection signal and the number of pulses.
G01N 21/94 - Investigating contamination, e.g. dust
G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
There is provided an automatic analyzer and a method of storing reagents in an automatic analyzer, in which restrictions on installation of reagent packs are smaller than those of the device in the related art. The automatic analyzer includes a reagent storage 105 that stores reagent packs 201, 301 containing reagents. The reagent storage 105 includes: a first holding unit 403 capable of holding only an immune reagent pack 201 containing a first reagent among the reagents; a second holding unit 404 capable of holding only a biochemical reagent pack 301 containing a second reagent that is different from the first reagent; and a third holding unit 405 capable of holding both the immune reagent pack 201 and the biochemical reagent pack 301.
A plasma treatment apparatus includes a treatment chamber 2 and a gas supply device 30 for supplying a treatment gas into the treatment chamber 2. The gas supply device 30 includes: a mass flow controller box 40 having an intake port 41 and an exhaust port 42; a plurality of pipes 43 to each of which a mass flow controller (43a) is attached; and a plurality of pipes 52 which are connected to the pipes 43 in the mass flow controller box 40 and connected to a plurality of pipes 54 as supply sources of the treatment gas by a plurality of joints 53 outside the mass flow controller box. At least one of the joints 53 is covered by a pipe cover 60 so that the joint 53 is hermetically sealed. The inside of the pipe cover 60 and the inside of the mass flow controller box 40 are communicated by a communicating member (circumferential pipe 61, tube 62).
Embodied is a flow cell that is for analysis of nucleic acid and that is capable of inhibiting complication of data processing without a reduction in throughput. The flow cell for analysis of nucleic acid comprises: a flow path formation body that has a flow path into which a nucleic acid sample flows; and a flow path formation body support member that has a region in which nucleic acid in a nucleic acid sample flowing into the flow path is to be adsorbed. The flow path formation body support member has the nucleic acid adsorption region in which nucleic acid is to be adsorbed, and a fluorescent particle adsorption region which is separated from the nucleic acid adsorption region, and in which fluorescent particles are to be adsorbed. In the fluorescent particle adsorption region, a blocking substance that can be specifically adsorbed to the fluorescent particle adsorption region is adsorbed.
When laser-irradiation portions of N capillaries with capillary numbers n=1, 2, . . . , and N are arranged on a same plane, a laser-irradiation intensity of each capillary is denoted by L(n), and an output intensity of each capillary by a computer when a light emitting substance having an equal concentration exists inside each capillary is denoted by H(n), an absolute value of an average value of a second derivative of H(n) becomes smaller than an absolute value of an average value of a second derivative of L(n) for any refractive index n3 of a separation medium in a range of 1.33≤n3≤1.41 by digital correction by the computer, which changes according to the refractive index n3 (see FIG. 11).
The plasma processing device according to the present invention includes a processing chamber in which a sample is plasma processed, a radio frequency power supply which supplies radio frequency power for generating plasma, and a sample stand on which the sample is placed. The plasma processing device includes a control device which measures a thickness of a protective film selectively formed on a desired material of the sample using an interference light reflecting from the sample which has been irradiated with an ultraviolet-ray, or determines selectivity of the protective film using the interference light reflecting from the sample which has been irradiated with the ultraviolet-ray.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
A plasma processing apparatus includes a sample stage including a placement surface on which a semiconductor wafer is placed, a ring-shaped thin film electrode surrounding the sample stage, and a susceptor ring made of a dielectric covering the thin film electrode, in which the thin film electrode includes a first portion located lower than the rear surface of the semiconductor wafer, a second portion located higher than the main surface of the semiconductor wafer, and a third portion connecting the first portion and the second portion, and the first portion of the thin film electrode has an overlap region that overlaps the semiconductor wafer in a plan view.
Provided is an etching technique providing higher uniformity of etching amount and a higher yield of etching processing. An etching method for etching a film layer as a processing object containing nitride of transition metal, the film layer being disposed on a surface of a wafer, includes a step of supplying reactive particles containing fluorine and hydrogen but containing no oxygen to a surface of the film layer to form a reaction layer on the surface of the film layer, and a step of eliminating the reaction layer by heating the film layer.
A plasma processing apparatus including a processing chamber; a wafer stage on which a processing target wafer is placed; an electrostatic chuck including a film-shaped electrostatic attraction electrode which is disposed in a dielectric film covering an upper surface of the wafer stage; a radio frequency electrode which is disposed inside the wafer stage; and a lift pin which is disposed inside the wafer stage and which moves the wafer up and down by movement thereof, a lower portion of the lift pin being connected to a member made of a conductor, in which a voltage value Eps of the lower portion of the lift pin and an average value Eesc of the potential of the electrostatic attraction electrode are adjusted during the processing of the wafer so as to match the predicted value Vdcs of the self-bias voltage of the wafer.
H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping
H01L 21/687 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
48.
Biochemical Analysis Device, Reaction Unit, and Cassette Guide
This biochemical analysis device has a configuration in which a reaction unit is installed on a device body, the reaction unit including: a test tube unit having a plurality of test tubes or a test tube unit in which a plurality of test tubes can be installed; a cassette guide; and a cassette box that allows attachment/detachment of the cassette guide. The cassette guide includes a flange part, a ventilation opening provided in the flange part, and a test tube insertion part provided to the flange part. The test tube insertion part is a closed structure, the flange part is installed on the upper surface section of the cassette box, and the ventilation opening suctions air above the flange part via negative pressure generated by an internal space of the cassette box. The foregoing provides a biochemical analysis device in which it is possible to stabilize descending air flow even in a case where a cassette is provided only to a section of the cassette guide, and with which it is possible to easily exchange the cassette guide if the cassette guide becomes contaminated
The present invention provides a cancer test method and a cancer test system for evaluating cancer in a subject. Specifically, the present invention provides a method for testing cancer in a subject, including: preparing a database that has stored a marker panel on which information of multiple cancer markers with respect to multiple healthy subjects and cancer patients is registered, the database including discrimination information that classifies a measured value of each cancer marker, into any of three groups: within the reference range, higher than the reference range, and lower than the reference range; analyzing, with respect to measured values of one or more cancer markers of the subject, and evaluating cancer in the subject on the basis of a result of the analysis.
The present invention provides a thermal cycler capable of rapidly and efficiently heating and cooling a reaction liquid. The thermal cycler according to the present invention comprises: a temperature control block where a reaction vessel can be installed, a thermoelectric conversion unit capable of heating and cooling, a temperature sensor that measures the temperature of the temperature control block, an insulating substrate that is in contact at one surface with the thermoelectric conversion unit, and a heat radiating unit that is provided on the other surface of the insulating substrate and serves for discharging the heat of the thermoelectric conversion unit to the outside, wherein the temperature control block is heated and cooled by controlling a current or voltage supplied to the thermoelectric conversion unit on the basis of the temperature of the temperature adjustment block measured by the temperature sensor.
In a two-dimensional conveyance line employing an electromagnetic conveyance technique, carriers are conveyed in consideration of the length of a group of stagnated carriers, so as to reduce idle positions and ensure conveyance efficiency of a specimen inspection system and maximize the number of carriers conveyed simultaneously. Current is supplied to a winding of an electromagnetic circuit and an electromagnetic force is generated between the winding and a carrier with a magnet that holds a test tube to move the carrier. The processing efficiency of a specimen inspection system is improved by changing the current of the electromagnetic circuit to change a conveyance speed of the carrier to which the specimen sample is mounted, and by shortening the conveyance time, and reducing the conveyance speed of the carrier and increasing the number of carriers that are conveyed simultaneously as an alternative to detouring the carrier during congestion.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
B65G 54/02 - Non-mechanical conveyors not otherwise provided for electrostatic, electric, or magnetic
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
52.
Mechanism for Adjusting Angle of Incidence on Charged Particle Beam Aperture, and Charged Particle Beam Device
Provided is a charged particle beam device capable of stably obtaining an effect of improving the depth of focus or the effect of correcting spherical aberration. The charged particle beam device includes an aperture having an annular slit or an electrode having an annular slit and is provided with means for adjusting the incident angle at which the charged particle beam is incident on the aperture or the electrode. Since the incident angle at which the charged particle beam is incident on the aperture or electrode having an annular slit can be made closer to perpendicular, the effect of improving the depth of focus or the effect of correcting spherical aberration can be stably obtained.
This inspection system 100 comprises: an electron source 102 which irradiates a sample 200 with an inspection beam; a detector 105 which detects secondary electrons obtained by irradiating the sample 200 with the inspection beam and outputs a detection signal; a laser device 107 which emits an action laser that changes the amount of secondary electrons; an electron gun 106 which emits an action electron beam that changes the amount of secondary electrons; and a computer system 140 which generates an image of the sample 200 on the basis of the detection signal. The computer system 140 generates an inspection image I1 related to the emission of the inspection beam, acquires the dimensions and the like related to a pattern on the sample 200 on the basis of the inspection image I1, generates an inspection image I2 related to the emission of the action laser and the inspection beam, acquires the material characteristics related to the pattern on the basis of the inspection image I2, generates an inspection image I3 related to the emission of the action electron beam and the inspection beam, and acquires the electrical characteristics related to the pattern on the basis of the inspection image I3.
There is provided an automatic analysis system that freely sets length or width dimensions to a traveling surface and that affects no influence on the layout of an automatic analyzer. In front of the automatic analyzer, a rail line is installed, and a transfer robot moves on the rail line. The rail line restrains roll, pitch, and yaw rotation directions, and thus the transfer robot does not fall. The rail line is fixed to a first jack and a second jack, each jack is in contact with the automatic analyzer and a body with no gap, and thus the roll, pitch, and yaw rotation directions of the rail line that is fixed to the jack are restrained. As a result, the length or width dimensions of a moving mechanism to the traveling surface are freely settable.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
Provided is an automatic analyzer which smoothly discards a used reaction container while preventing space restrictions. The automatic analyzer in this invention includes a housing portion which houses a used container; a hollow discarding cylinder which guides the container to the housing portion in a vertical direction; a container gripping mechanism which grips the container by moving a plurality of gripping pieces close to each other in a horizontal direction and lets the container fall by separating the plural gripping pieces from each other in the horizontal direction; and a control section which controls the container gripping mechanism. A discarding hole in the upper end of the discarding cylinder is formed by a container guide portion for guiding the container and a gripping piece separating portion forming a space for the plural gripping pieces to be separated from each other.
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
The purpose of the present disclosure is to provide a defect inspection device with which it is possible to suppress variation in an output signal occurring when an imaging operation condition for an image sensor is changed. The defect inspection device according to the present disclosure comprises a detector that outputs a detection signal for signal light generated by irradiating a sample with light. The detector is controlled so that a first operation state of the detector in a first signal acquisition condition and a second operation state of the detector in a second signal acquisition condition are the same.
In order to enable use of novel immunostaining for a pathological diagnosis and research, the invention provides a sample exchange chamber including: a container 2 into which a substrate on which a sample is placed can be introduced; a specific solution inlet 3, which is a staining mechanism that stains the sample; a cleaning liquid inlet 4, which is a cleaning mechanism that cleans the sample; an evacuation port 5, which is an evacuation mechanism that evacuates the container; a drain port 6; and a sterilization mechanism 7 that sterilizes the sample and inside of the container.
A system is provided in which electrical characteristics of an element formed on a sample can be evaluated. In order to achieve the above-described object, disclosed is a system including: an image acquisition tool; and a computer system that includes one or more processors and is configured to be communicable with the image acquisition tool, in which electrical characteristic are derived by receiving information regarding two or more characteristics of a specific pattern that is included in a plurality of images acquired from the image acquisition tool under at least two different image acquisition conditions and by referring to, for the information, relation information between information regarding two or more characteristics and electrical characteristics of an element formed on a sample, the characteristics being extracted from at least two pieces of image data acquired from the image acquisition tool under at least two image acquisition conditions.
The analyzing apparatus includes a unit to acquire a plurality of first images captured with first visible light in time-series during a culturing step, the plurality of first images acquired by capturing an interior of the sampling container having undergone a process of sampling microorganisms in a monitored environment, a first specifying unit to detect occurrence of a colony of the microorganisms or an existence of the colony having occurred already in the time-series from time-series variations of the plurality of the first images, and to specify a shape of the colony with its occurrence or existence being detected, a second specifying unit to specify the shape of the colony of the microorganisms from a second image acquired by capturing the interior of the sampling container with second visible light, and a unit to display a state of the colony of the microorganisms.
Provided is an automated analysis device with which sufficient reaction process data can be acquired irrespective of the scale of the device, and with which it is possible to ensure freedom of the device configuration. An automated analysis device 100 is provided with: a reaction disk 1 which circumferentially accommodates a plurality of reaction vessels 2; a specimen dispensing mechanism 11 which dispenses a specimen into the reaction vessels 2; a reagent dispensing mechanism 7 which dispenses a reagent into the reaction vessels 2; a measuring unit 4 which measures a reaction process of a mixture of the specimen and the reagent in the reaction vessels 2; and a cleaning mechanism 3 which cleans the reaction vessels 2 after measurement. Further, the automated analysis device 100 includes a controller 21 which controls the drive of the reaction disk 1 such that in one cycle the reaction vessels 2 move by an amount A in the circumferential direction in such a way that N and A are mutually prime, B and C are mutually prime, and the relationship A×B=N×C±1 holds, where N is the total number of reaction vessels 2 accommodated in the reaction disk 1, the reaction disk 1 moves through C (where C>1) rotations+an amount equivalent to one reaction vessel after B (where B>2) cycles, and the number of reaction vessels 2 moved in one cycle is A (where N>A>N/B+1).
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
61.
EVAPORATIVE CONCENTRATION MECHANISM, ANALYZER INCLUDING THE SAME, AND METHOD OF CONTROLLING EVAPORATIVE CONCENTRATION MECHANISM
An evaporative concentration mechanism is achieved, which accurately evaporates and concentrates a small quantity of a sample liquid for a short period of time, regardless of the composition of the sample liquid or the surrounding environmental conditions. The evaporative concentration mechanism includes a container that accommodates a sample liquid; a heating unit that heats the container; a liquid level sensor that detects a liquid level height of the sample liquid accommodated in the container; and a control unit that controls a temperature of the heating unit, in which the control unit controls the temperature of the heating unit based on a liquid level of the sample liquid detected by the liquid level sensor. Accordingly, a small quantity of a sample liquid can be accurately evaporated and concentrated for a short period of time, regardless of the composition of the sample liquid or the surrounding environmental conditions.
A method of controlling a liquid chromatograph that estimates the maximum value of the pressure reached during measurement before actually measuring a sample. The method includes a pump having a gradient function that feeds liquid while changing the composition of a plurality of eluents, according to gradient liquid feeding conditions, a sample filling unit for filling a sample, a separation column, an analysis flow channel connecting the pump to the separation column, and a pressure sensor which detects a pressure within the analysis flow channel during liquid feeding by the pump. A maximum pressure presumed during measurement is calculated based on an initial pressure as a pressure within the analysis flow channel when the pump starts feeding liquid and the gradient liquid feeding conditions and that when the maximum pressure presumed is determined to be a predetermined upper pressure limit, the sample filling is not performed.
G01N 30/32 - Control of physical parameters of the fluid carrier of pressure or speed
B01D 15/16 - Selective adsorption, e.g. chromatography characterised by constructional or operational features relating to the conditioning of the fluid carrier
A plasma processing apparatus includes: a processing chamber; a first radio frequency power supply configured to supply a first radio frequency power; a second radio frequency power supply configured to supply a second radio frequency power; and a control device configured to, when the first radio frequency power is modulated by a first waveform having a first period and a second period adjacent to the first period, and the second radio frequency power supply is modulated by a second waveform having a period A and a period B, control the second radio frequency power supply such that each second radio frequency power in the period A is supplied in the first period and the second period, in which an amplitude in the second period is smaller than an amplitude in the first period, and an amplitude in the period A is larger than an amplitude in the period B.
A plasma processing apparatus includes: a processing chamber in which a sample is subjected to plasma processing, including, at an upper side therein, a dielectric plate, through which microwaves are transmitted; a radio frequency power supply which supplies radio frequency power for the microwaves; a cavity resonator which resonates microwaves transmitted from the radio frequency power supply through a waveguide and is placed above the dielectric plate; and a magnetic field forming mechanism which forms a magnetic field in the processing chamber. The plasma processing apparatus further includes: a ring-shaped conductor placed inside the cavity resonator; and a circular conductor which is placed inside the cavity resonator and placed in an opening at the center of the ring-shaped conductor.
An automatic analyzer: includes a washing tank in which an exterior of a probe is washed with washing water, a pump to supply washing water stored in a tank to the washing tank through a first flow channel, and a flow channel switching mechanism to switch between supplying washing water to the washing tank through the first flow channel and returning washing water to the tank through a second flow channel connecting the first flow channel and the tank; and sets a washing period when washing water is supplied to the washing tank through the first flow channel and the probe is washed with washing water in a cycle constituting a sequence of the automatic analyzer; and controls the flow channel switching mechanism so as to return washing water to the tank through the second flow channel during the washing period in a cycle of not washing the probe.
An automatic analyzer performs a dispensing operation with high throughput while reducing a risk of carry-over of a reagent that includes first and second dispensing operations. The second dispensing operation includes a first procedure of aspirating a sample accommodated by a dispensing nozzle, a second procedure of discharging the aspirated sample to a first reaction container, a third procedure in which a cleaning tank cleans an inner side and an outer side of the dispensing nozzle after the second procedure, a fourth procedure of aspirating the reagent accommodated in a reagent container after the third procedure, a fifth procedure B5 in which the cleaning tank cleans the outer side of the dispensing nozzle after the fourth procedure, a sixth procedure of aspirating the sample accommodated in the first reaction container after the fifth procedure, and a seventh procedure of discharging the reagent and the sample to a second reaction container.
The present disclosure relates to a computer implemented method of managing sample processing priorities in a diagnostic laboratory comprising at least one sample processing device connected to a host system. The method comprises generating a communication message between the host system and the at least one sample processing device related to a sample processing order received in association with a sample, the message comprising one of at least two priority identifiers (R, S) indicative of respective sample processing priorities from lower priority to higher priority according to the received sample processing order. The method further comprises identifying the sample by the at least one sample processing device and processing the sample by the at least one sample processing device according to the sample processing priority (S, R) in the message. In case of receiving a subsequent request for change of sample processing priority for the sample from a lower priority to a higher priority after transmission of the message and before the sample is processed, the method comprises changing the message and processing the sample as a higher priority sample instead of as a lower priority sample, wherein changing the message comprises changing the lower priority identifier (R) to an identifier (CS) indicative of a change of priority but different from an equivalent higher priority identifier (S) in order to maintain the sample and the sample processing order uniquely identifiable and traceable by both the host system and the at least one sample processing device. A respective system for managing sample processing priorities is herein also disclosed.
G16H 10/40 - ICT specially adapted for the handling or processing of patient-related medical or healthcare data for data related to laboratory analysis, e.g. patient specimen analysis
G06F 9/48 - Program initiating; Program switching, e.g. by interrupt
The charged particle beam apparatus includes a charged particle source generating a charged particle beam, a deflector deflecting the charged particle beam, a detector detecting secondary electrons emitted from an irradiation target in response to irradiation with the charged particle beam, and a processor system. The processor system (A) acquires a first time-series change in secondary electron detection-related quantity by repeatedly performing the following (A1) and (A2), (A1) directly or indirectly, maintains or changes the control amount applied to the deflector to a first control amount, and (A2) acquires the secondary electron detection-related quantity based on an output from the detector, and (B) acquires a time-series change in variation of the beam diameter of the charged particle beam based on the first time-series change.
A column connection method of a liquid chromatograph and a liquid chromatograph capable of keeping a mistakenly installed column by an operator as an unused column are provided. The column connection method of the liquid chromatograph includes: a first step of installing a column at a column installation part and obtaining a first reading result by reading identification information of the column before connecting the column with an analysis flow path; and a second step of connecting the column with the analysis flow path and obtaining a second reading result by reading identification information of the column, in which the first reading result is compared with the second reading result to judge identity of the column.
There is provided an automatic analysis system and an information takeover method in the automatic analysis system, in which repair and maintenance can be accurately executed at an appropriate timing even when a change occurs in a system configuration. The automatic analysis system includes: two or more analyzers of a biochemical analyzer 110 and an immunoassay analyzer 210, which have unique identification information and cumulative information associated with the unique identification information, and analyze a sample; and a control device 300 that controls operations of the biochemical analyzers 110 and the immunoassay analyzer 210 and manages the unique identification information and the cumulative information of each of the biochemical analyzer 110 and the immunoassay analyzer 210, and when the biochemical analyzer 110 and the immunoassay analyzer 210 in a system are rearranged, the control device 300 takes over the cumulative information that the newly introduced biochemical analyzer 110 and immunoassay analyzer 210 have in a pre-rearrangement system based on the unique identification information, and manages cumulative information in a new system based on the taken-over cumulative information.
Representative features which are representative features for deciding the types or states of objects are extracted, the types or states of the objects are identified on the basis of the representative features to classify the objects, and the object classification results and the representative features are output in association with an image.
G06T 7/62 - Analysis of geometric attributes of area, perimeter, diameter or volume
G06V 10/44 - Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
G06V 10/75 - Image or video pattern matching; Proximity measures in feature spaces using context analysis; Selection of dictionaries
G06V 10/764 - Arrangements for image or video recognition or understanding using pattern recognition or machine learning using classification, e.g. of video objects
G06V 10/771 - Feature selection, e.g. selecting representative features from a multi-dimensional feature space
G06F 3/0482 - Interaction with lists of selectable items, e.g. menus
A method for controlling a mass spectrometer capable of identifying an abnormal location in a device is provided. A method for controlling a mass spectrometer including an ion source that ionizes a compound in a sample, a mass spectrometry unit that separates ions based on a mass-to-charge ratio, and a plurality of electrodes that form an electric field that transports ions generated by the ion source to the mass spectrometry unit includes ionizing the sample by the ion source, detecting, based on a change in ion permeability over time, ions accumulated in the electrodes and quadrupole mass filters forming the mass spectrometry unit, and detecting a change in ionization efficiency of the ion source based on a change in an amount of ions with respect to a gas flow rate for the ion source or a voltage of the ion source.
An automatic analyzer capable of positioning in a short time is provided. The automatic analyzer includes: a rotation mechanism configured to rotate, in a circumferential direction in a horizontal plane, a nozzle configured to perform at least one of aspiration of a fluid in a container accommodated in an accommodation portion disposed on a trajectory during rotation and discharge of the fluid to the container; a height positioning mechanism configured to position a position adjustment tool accommodated in the accommodation portion in a height direction by driving the nozzle; and a circumferential positioning mechanism configured to position the accommodation portion accommodating the position adjustment tool in a circumferential direction by bringing the nozzle into contact with the position adjustment tool from a side thereof after a height position of the position adjustment tool is determined.
An aberration corrector includes: a first multipole and a second multipole configured to form a hexapole field; and a transfer optics including a plurality of round lenses. The transfer optics is disposed between the first multipole and the second multipole, and acts on a charged particle beam such that an absolute value of a slope of the charged particle beam passing through the first multipole is different from an absolute value of a slope of the charged particle beam passing through the second multipole.
An input and output device includes: an instruction analysis unit configured to generate a conversation document in which a conversation uttered by a user is converted into character string data and recognize, based on the conversation document, a conversation intention of the user including an instruction to an image acquisition device; a history retention unit configured to record, as history information, the conversation document, the conversation intention, and a response of the image acquisition device to the instruction to the image acquisition device; a difference analysis unit configured to divide a report creation period using a timing when the user issues, to the image acquisition device, an instruction including an intention to save a captured image as a boundary and output report creation information in which history information divided for each of the report creation periods, and a captured image and a differential condition corresponding to the history information are associated with each other; and a report retention unit configured to create a report for each of the report creation periods based on the report creation information and record the created report.
To provide a control method of a sample pretreatment apparatus capable of maintaining measurement precision in a mass spectrometer without newly installing a component part and without largely changing a measurement process by an automatic analyzer. A control method of a sample pretreatment apparatus 1 of a sample inspection automation system to which a sample pretreatment apparatus applying pretreatment to a sample used in mass spectrometry, a mass spectrometer, and another automatic analyzer are connected, includes: determining serum information by referring to a measurement result of the sample by the other automatic analyzer or previous value information; determining conditions of a washing process of eliminating impurities contained in the sample at the time of the sample pretreatment based on the serum information; and dispensing a cleaning fluid into a reaction container for mixing the sample and a reagent based on the conditions.
An ion source includes: an atomizer configured to continuously introduce a liquid sample and atomize the liquid sample; a heating and mixing chamber configured to vaporize the atomized liquid sample; and a charge supply unit configured to ionize the vaporized liquid sample. The charge supply unit has a positive pressure with respect to the heating and mixing chamber. The vaporized liquid sample and a gaseous seed ion supplied from the charge supply unit are mixed in the heating and mixing chamber. An auxiliary gas for adjusting a gas flow rate in the heating and mixing chamber can be introduced into the heating and mixing chamber. The heating and mixing chamber has a chamber outlet configured to introduce the ionized liquid sample into a mass spectrometer. The chamber outlet is connected to a first pore of the mass spectrometer.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
A charged particle beam device for irradiating a sample arranged in a sample chamber to be observed with an electron beam includes: a plasma generation device to which a bias voltage is applicable to generate plasma containing charged particles for applying charges onto a side wall of a pattern of the sample; and a guide that guides the charged particles in the plasma generated by the plasma generation device to the pattern of the sample.
An automatic analyzer comprises a reagent storage unit, a reaction promotion unit, and an unused container providing unit. The reaction promotion unit is between the reagent storage unit and the unused container providing unit in a left-right direction, and is on a rear side from the reagent storage unit and the unused container providing unit in a front-rear direction. In the automatic analyzer, a cover covering the reaction promotion unit is with a first fitting portion, a second fitting portion, and a third fitting portion located between the first and the second fitting portion in the left-right direction and a handle that is between the first and the second fitting portion in the left-right direction and on a rear side of the third fitting portion in the front-rear direction. The first and the second fitting portion are high in positioning functionality. The third fitting portion is low in positioning functionality.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
A method of controlling an automatic analyzer includes searching for a substitute stream that can be substituted, in a case where an abnormality of a stream is detected for a liquid chromatograph having multiple streams, after setting an analysis schedule; and modifying the analysis schedule, if a substitute stream exists, so that a sample scheduled to be introduced into the stream which has the abnormality is introduced into the substitute stream, and treatment timings of the sample which has passed through the substitute stream and the sample which has passed through another normal stream in the detector do not overlap with each other, in which the automatic analyzer includes a pretreatment unit that purifies a sample; a separation unit; and a detector that detects a separated sample, and a treatment timing of the sample in the separation unit and the detector is controlled based on the analysis schedule.
An automatic analyzer maintains accuracy of analysis of a specimen even when a liquid spills on an expendable item case. The automatic analyzer has an expendable item case which accommodates expendable items including a dispensing tip used for dispensing a specimen and a reaction cell used for reaction between the specimen and a reagent, and a conveyance portion which conveys the expendable items from the expendable item case. A body cover covers the analysis unit, the expendable item case, and the expendable item conveyance portion. The expendable item case includes a tray in which the expendable items are arrayed, and an expendable item cover which covers the tray and in which an open portion through which the expendable item conveyance portion passes is provided on a side surface thereof, and the expendable item cover includes a barrier portion protruding upward at an end on a side of the open portion.
The present disclosure makes it possible to shorten the time required for measurement of a sample and to measure the sample with high throughput. A charged particle beam apparatus includes a storage device that stores a correction value table corresponding to a recipe and a computer system that executes measurement on a plurality of measurement points of a sample according to a measurement order determined in the recipe. The computer system stores, when executing the recipe on a first sample, an adjustment result of one or more imaging conditions in the correction value table at each of a plurality of measurement points of the first sample, and adjusts, when executing the recipe on a second sample different from the first sample, the imaging condition based on the adjustment result of the one or more imaging conditions stored in the correction value table at each of the plurality of measurement points.
A charged particle beam device includes: a plasma generation device attached to a sample chamber through a connecting member; a guide including a hollow portion configured to guide a plasma generated by the plasma generation device in a direction toward a stage; a first voltage source configured to apply a voltage to the stage; and a second voltage source configured to adjust the plasma generation device and the guide to a predetermined potential, in which the guide is disposed to avoid an opening of an objective lens through which a charged particle beam passes and to position a tip of the guide between the objective lens and the stage.
H01J 37/02 - Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof - Details
H01J 37/28 - Electron or ion microscopes; Electron- or ion-diffraction tubes with scanning beams
An automatic analysis device is provided with: a sample disk for holding a sample container that accommodates a sample; a reagent disk for holding a reagent container that accommodates a reagent; at least two different measuring units that respectively perform different types of analyses; a control part that controls the measuring units; and a display part that displays: a work flow area in which the flow of operation of the two or more measuring units is displayed; and an overview area in which the usable or unusable states of the respective measuring units are displayed, wherein the overview area has a unit necessity-of-use selection part that can select whether using each of the measuring units is necessary, and the control part controls the display part so as to change the display of the work flow area on the basis of the information set in the unit necessity-of-use selection part.
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
86.
AUTOSAMPLER OF LIQUID CHROMATOGRAPH AND LIQUID CHROMATOGRAPH INCLUDING THE SAME
Provided is an autosampler of a liquid chromatograph that can manage a sample container even in a case where the throughput of a pretreatment unit exceeds the throughput of the autosampler.
Provided is an autosampler of a liquid chromatograph that can manage a sample container even in a case where the throughput of a pretreatment unit exceeds the throughput of the autosampler.
An autosampler of a liquid chromatograph includes a plurality of sample aspiration nozzles that aspirates a sample from sample containers installed at respective sample aspiration points; a sample transfer means that transfers the sample containers to the respective sample aspiration points; and a retraction point where one of the sample containers is put into the autosampler and one of the sample containers collected from the sample aspiration points can be held.
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
87.
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND PLASMA PROCESSING METHOD
A semiconductor device manufacturing method for manufacturing a semiconductor device including Gate All Around type Field effect transistors includes a step of removing an organic film on an n-type channel; a step of removing a work function control metal film on a bottom surface between channels; a step of forming a protective film onto an organic film on a p-type channel; and a step of removing a work function control metal film on the n-type channel.
An automatic analyzer includes: an analysis unit performing analysis of a sample; a thin waste fluid tank housing a waste fluid produced by a process of analyzing the sample; an attention attraction thin waste fluid height sensor detecting that the waste fluid has reached a predetermined reference amount, the waste fluid being housed in the thin waste fluid tank; a timer unit starting counting time when the attention attraction thin waste fluid height sensor detects that the waste fluid has reached the reference amount; and a control unit controlling operation of the analysis unit. The control unit determines, when an operator instructs starting analysis, whether to permit starting analysis by the analysis unit based on whether a count result obtained by the timer unit reaches predetermined reference time. Accordingly, it is possible to operate the analyzer while workflows are easily considered and unexpected measurement stops are avoided.
The present disclosure discloses a technique, which reduces influence of not only environmental temperature but also environmental humidity, thereby preventing shortening of life of each electric element forming a power supply of a mass spectrometric instrument. The disclosure therefore provides a mass spectrometric instrument including: a circuit board on which electric elements are disposed; a gas supply unit; and a mechanism that controls humidity and temperature of gas supplied from the gas supply unit and applies the gas with the humidity and temperature controlled to at least part of the circuit board.
A defect inspection apparatus includes: a feature value calculation unit calculating a feature value based on a captured image of a sample; an image information reduction unit generating a latent variable by reducing an information quantity of the feature value; a statistic value estimation unit estimating an image statistic value that can be taken by a normal image based on the latent variable; and a defect detection unit detecting a defect in an inspection image based on the image statistic value and the inspection image of the sample.
To provide an optical nuclear magnetic resonance apparatus in which a cleaning mechanism that can be mounted on an apparatus for performing an optical magnetic resonance method and can remove deposits on a sensor surface is mounted, and removal of contamination of the sensor surface can be determined. In a component analysis apparatus according to the present invention, a sensor includes therein a defect having an electron spin that causes electron spin resonance, an orientation of the electron spin can be optically detected, and an ozone generation device and an oxygen radical generation device are driven during washing of the sensor.
G01N 24/00 - Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
G01N 24/08 - Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using nuclear magnetic resonance
92.
Vacuum Treatment Apparatus and Vacuum Treatment Method
Provided are a vacuum treatment device and a vacuum treatment method with which it is possible to suppress deterioration of the degree of vacuum in a conveyance destination vacuum chamber when conveying a sample between two vacuum chambers. In this regard, a control device 30 controls conveyance of a wafer 600 from LC 102 to SC 101 via a LC-SC gate valve 510. At this time, the control device stops vacuum evacuation, which is being performed by a TMP 401A for a first duration of time, after having controlled the LC-SC gate valve 510 to close, measures an internal pressure of the LC 102 by using a pressure gauge 103 in a condition in which the vacuum evacuation is stopped, and controls the LC-SC gate valve 510 to open if the measured internal pressure has reached a first reference value.
The apparatus includes: a photocathode including a substrate and a photoelectric film formed on the substrate; a light source configured to emit a pulsed excitation light; a condenser lens facing the substrate of the photocathode and configured to condense the pulsed excitation light toward the photocathode; a first anode electrode and a second anode electrode facing the photoelectric film of the photocathode; a first power supply configured to apply a first control voltage between the first anode electrode and the second anode electrode; and a second power supply configured to apply an acceleration voltage between the photocathode and the second anode electrode. The first anode electrode is disposed between the photocathode and the second anode electrode. A surface of the first anode electrode facing the second anode electrode has a recessed shape, and a surface of the second anode electrode facing the first anode electrode has a protruding shape.
Provided is a technique for efficiently mixing a plurality of liquids by using only a single liquid feeding device. This liquid mixer comprises: a first inflow flow path into which a first liquid flows; a second inflow flow path into which a second liquid flows; a liquid merging part where the first liquid and the second liquid merge; an outflow flow path which is connected to the liquid merging part and through which the first liquid and the second liquid flow out; and a single liquid feeding device. The liquid merging part has a first flow path connected to the first inflow flow path, and a second flow path connected to the second inflow flow path, the first flow path branches into at least two flow paths, and the second flow path branches into at least two flow paths. One among the flow paths branched from the first flow path and one among the flow paths branched from the second flow path are connected and merged with each other. Another one of the flow paths branched from the first flow path and another one among the flow paths branched from the second flow path are connected and merged with each other on the downstream side, and are connected to the outflow flow path.
Provided are an etching method and an etching apparatus that allow etching processing of a silicon nitride film to be performed at a high etching rate, while maintaining high processing dimension controllability at an atomic layer level, high uniformity in a pattern depth direction, and high selectivity to silicon dioxide. An etching method includes a first step of supplying an etchant containing hydrogen to a sample having a surface at which a silicon nitride is exposed to form a first modified layer in which the hydrogen is bonded to the silicon nitride, a second step of supplying an etchant containing fluorine to the sample to form, over the first modified layer, a second modified layer in which the hydrogen and the fluorine are bonded to the silicon nitride, and a third step of irradiating the first modified layer and the second modified layer with an infrared ray.
Provided is a high-voltage control circuit capable of shortening a time required for voltage bucking with a simple configuration without requiring a complicated control algorithm. A high-voltage control circuit 1 includes: a high-voltage rectifier circuit 100 configured to convert an AC voltage into a DC high voltage; a smoothing capacitor 140 configured to smooth the DC high voltage output from the high-voltage rectifier circuit 100; a switch circuit 102 connected in parallel to the smoothing capacitor 140; a feedback circuit 103 including an error amplifier 133 configured to amplify a differential voltage Vdf between a command voltage Viv and a divided voltage Vdv following the DC high voltage, and configured to control the high-voltage rectifier circuit 100 based on an output signal of the error amplifier 133; and an amplifier 105 configured to amplify the differential voltage Vdf. The switch circuit 102 is controlled by an output signal of the amplifier 105.
H02M 3/335 - Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only
H02M 1/14 - Arrangements for reducing ripples from dc input or output
To correct a difference in signal intensity due to a difference in hardware, for example, temporal deterioration of the hardware in the same device, or a difference in signal intensity between different devices. An adjustment method according to the disclosure specifies an amplification gain with which the same detection signal intensity as that of a comparison target is obtained by comparing correspondence relationships between the detection signal intensity and the amplification gain at different time points in the same charged particle beam device or among different charged particle beam devices.
H01J 37/244 - Detectors; Associated components or circuits therefor
H01J 37/28 - Electron or ion microscopes; Electron- or ion-diffraction tubes with scanning beams
H03G 3/30 - Automatic control in amplifiers having semiconductor devices
G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]
Provided is a technology for reducing the capacity of a liquid feeding pump and enabling liquid feeding with little pulsation. A liquid feeding pump according to the present disclosure is provided with: a first plunger pump having a first plunger; a second plunger pump having a second plunger and connected in series with the first plunger pump; a pressure sensor disposed downstream of the second plunger pump; and a control unit that accepts the input of a liquid discharge pressure measured by the pressure sensor and that controls the driving of the first plunger and the driving of the second plunger. The control unit calculates the rate of change in the pressure of the liquid on the basis of the past compression distances of the plunger for when the liquid was compressed by the first plunger pump and the pressure at the completion of compression, predicts the compression distance of the first plunger on the basis of the rate of change in pressure and the present discharge pressure, and determines the timing at which the compression performed by the first plunger will be completed on the basis of the predicted compression distance.
The present invention provides a system that makes a recommendation, to an operator, of a countermeasure method considered appropriate from a precursory stage of abnormality. This recommended action notification system comprises: a plurality of automatic analyzers 51 that include a first automatic analyzer; and a learning device 52 that is connected to a network 53. The recommended action notification system is for making a recommendation to an operator for an action to be executed on the first automatic analyzer. Said recommended action notification system is provided with: a processing portion 63 that receives specimen analysis result data or maintenance result data from the first automatic analyzer, that inputs related device data including the specimen analysis result data or the maintenance result data to learning models 72, and that, when a probability value that is for recommending execution of a predetermined action and that is outputted by a learning model is equal to or higher than a predetermined threshold value, makes a recommendation to the operator for the predetermined action to be executed on the first automatic analyzer; and an update portion 71 that updates the learning model on the basis of the learning dataset from the plurality of automatic analyzers.