Systems and methods for providing multiple lumens within a single sample probe of an autosampler system are described. In an aspect, a sample probe for an autosampler system includes, but is not limited to, a tube enclosing at least a portion of a plurality of lumens; and a controller communicatively coupled with a fluid handling system to introduce or draw one or more fluids through each of the plurality of lumens, wherein during a droplet purge operation, the controller is configured to expel a gas from a tip of one of the lumens to purge a droplet of fluid from the tip.
Systems and methods are described to concentrate and homogenize a remote sample for analysis. A sample concentration and homogenization system embodiment includes, but is not limited to, at least a first valve, at least a first column fluidically coupled to the first valve, a flow meter fluidically coupled with the first column when the first valve is in a first flow path configuration to measure an amount of the liquid sample passed through the first column, and a homogenization valve including a sample homogenizing loop in which the concentrated sample is homogenized.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for transporting sample using a first vacuum configuration and subsequently isolating the sample at a valve prior to introduction to an analysis system, where a second vacuum configuration transports other fluids through the system. A system embodiment can include, but is not limited to, a valve system including a first valve in fluid communication with a sample reservoir and a second valve having at least a first vacuum configuration to fluidically couple a first vacuum line with the first valve and having a second vacuum configuration to fluidically couple a second vacuum line with the first valve; a sensor system configured to detect presence or absence of a fluid at the first valve; and a controller configured to control operation of the second valve to block access of the first vacuum line to the first valve upon detection of the fluid at the first valve.
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
G01N 1/20 - Devices for withdrawing samples in the liquid or fluent state for flowing or falling materials
4.
Systems and methods for automatic adjustment of mixed gas flow for an injector coordinated with the acquistion of particular groups of chemical elements for analysis
Systems and methods are described for automatically adjusting the composition of a spray chamber matrix gas flow coordinated with an analysis of a particular chemical element or groups of elements. A system can include a spray chamber configured to be coupled to an analytical system, the spray chamber having a nebulizer gas port configured to receive a nebulizer gas; and an inlet for receiving a gas from at least one gas source. The system also includes a controller operably coupled to the spray chamber, the controller configured to adjust a gas flow rate of the gas from the at least one gas source in coordination with analysis of a particular chemical element by the analytical system.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 30/04 - Preparation or injection of sample to be analysed
H01J 49/00 - Particle spectrometers or separator tubes
Systems and methods are described for preventing the release of metal particles from an autosampler that could otherwise be detected within a sample during sample analysis. In an example implementation, an autosampler systems includes, but is not limited to, a sample probe support structure; a z-axis support; an outer shuttle coupled with an outer surface of the z-axis support; and an inner shuttle linearly moveable within an interior volume of the z-axis support, the inner shuttle magnetically coupled with the outer shuttle to translate linear motion of the inner shuttle to the outer shuttle.
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
7.
AUTOMATED INLINE NANOPARTICLE STANDARD MATERIAL ADDITION
Systems and methods for automated handling and maintaining nanoparticle standard solutions in a substantially homogenous state with controlled introduction to a fluid sample are described. A system embodiment includes, but is not limited to, an agitator configured to mix a nanoparticle standard solution in a container to provide a mixed nanoparticle standard having a substantially homogenous distribution of nanoparticles; and a fluid preparation system fluidically coupled with the container to receive the mixed nanoparticle standard and direct the mixed nanoparticle standard to a fluid sample stream for inline mixing therewith.
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
9.
AUTOMATIC SAMPLING OF HOT PHOSPHORIC ACID FOR THE DETERMINATION OF CHEMICAL ELEMENT CONCENTRATIONS AND CONTROL OF SEMICONDUCTOR PROCESSES
Systems and methods for automatic sampling of a sample for the determination of chemical element concentrations and control of semiconductor processes are described. A system embodiment includes a remote sampling system configured to collect a sample of phosphoric acid at a first location, the remote sampling system including a remote valve having a holding loop coupled thereto; and an analysis system configured for positioning at a second location remote from the first location, the analysis system coupled to the remote valve via a transfer line, the analysis system including an analysis device configured to determine a concentration of one or more components of the sample of phosphoric acid and including a sample pump at the second location configured to introduce the sample from the holding loop into the transfer line for analysis by the analysis device.
A sample analysis system is available that can include a remote sampling system, at least one analyzer, and a controller. The remote sampling system can include a plurality of sample sources for providing a corresponding sample therefrom; and a plurality of sample collection devices selectively coupled to any of the plurality of sample sources for receiving at least one of the samples therefrom. The at least one analyzer can be coupled to the plurality of the sample collection devices for receiving at least one of the samples therefrom. The controller can be coupled with the remote sampling system and the at least one analyzer, the controller configured to control which of the sample sources is actively coupled to a given sample collection device at a given time.
A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
Systems and methods are described for isolating a sample at a valve prior to introduction to an analysis system, such as sample analysis via ICP-MS. A system embodiment can include, but is not limited to, a valve system including a first valve in fluid communication with a sample reservoir and a second valve configured to permit and block access of a vacuum source to the first valve; a sensor system configured to detect presence or absence of a fluid at the first valve; and a controller configured to control operation of the second valve to block access of the vacuum source to the first valve upon detection of the fluid at the first valve to isolate the fluid within the sample reservoir.
Systems and methods are described for automatically utilizing multiple data processing methods on a given spectrometry dataset for the determination of nanoparticle detection factors including nanoparticle baseline and detection threshold.
Systems and methods for iterative removal of outlier data from spectrometry data to determine one or more of a particle baseline and a detection threshold for nanoparticles are described. Ion signal intensity values that exceed an outlier threshold value associated with a sum of a first multiple of an average of the count distribution of ion signal intensity and a first multiple of a standard deviation of the count distribution of ion signal intensity are iteratively removed from the raw data set until no outliers remain, providing a background data set. A nanoparticle baseline intensity value is set as a sum of a second multiple of an average of the background data set and a second multiple of a standard deviation of the background data set to differentiate between signal intensity values that are associated with background interference and that are associated with the presence of nanoparticles in the sample.
Systems and methods are described for analyzing local minimum data from spectrometry data for the determination of nanoparticle detection thresholds are described. In aspects, a histogram of the spectrometry data is used to search for potential local minimum values, which are subsequently validated to establish a nanoparticle detection threshold for the spectrometry data, with ion intensity values less than the nanoparticle detection threshold being attributable to signal background.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
16.
ATMOSPHERIC PURGE SYSTEM AND METHOD FOR LASER ABLATION SAMPLE PROCESSING
Systems and methods are described for controlling flow of a purge gas introduced to an ablation cell between samples to remove atmospheric gas. A system embodiment includes, but is not limited to, a spray chamber including a spray chamber body, a transfer gas inlet configured to receive gas from a laser ablation sample cell, a first outlet line configured to transfer gas from the spray chamber to an inductively-coupled plasma torch, and a second outlet line coupled to the spray chamber body, the second gas outlet having a larger internal cross-sectional area than an internal cross-sectional area of the first outlet line; and a valve fluidically coupled to the second outlet line, the valve configured to transition between at least an open configuration configured to permit transfer gas through the second outlet line and a closed configuration configured to prevent transfer of gas through the second outlet line.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
17.
MEMBRANE-BASED PURGE GAS AND SAMPLE TRANSFER FOR LASER ABLATION SAMPLE PROCESSING
Systems and methods are described for transferring gas from an ablation cell to an inductively coupled plasma analysis system via a gas exchange membrane transfer line to exchange gas introduced to the ablation cell with a sweep gas. A system embodiment includes, but is not limited to, a laser ablation cell configured to generate a sample transfer stream through laser ablation of a sample and introduction of a carrier gas to flow the ablated sample from the laser ablation cell; an inductively-coupled plasma analysis device configured to measure one or more analytes in the sample transfer stream; and a gas exchange membrane transfer line fluidically coupled between the laser ablation cell and the inductively-coupled plasma analysis device, the gas exchange membrane transfer line configured to replace gas in the sample transfer stream with sweep gas via gas exchange across a membrane of the gas exchange membrane transfer line.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
An analysis system includes a degassing cell, at least one first valve, and at least one second valve. The at least one first valve is fluidly coupled with a top of the degassing cell, the at least one first valve configured selectably connect the degassing cell to a displacement gas flow and to a vacuum source. The at least one second valve is fluidly connected with a lateral side of the degassing cell and separately fluidly connected with a bottom of the degassing cell. The at least one second valve is selectably coupled with any of a source of a sample-carrying fluid, a transfer line configured to deliver a sample to an analysis device, or a waste output.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described to determine a prioritization schedule for samples handled by a system with multiple remote sampling systems. A system embodiment includes, but is not limited to, an analysis system at a first location; one or more remote sampling systems at remote from the first location, the one or more remote sampling systems configured to receive a liquid segment and transfer a liquid sample to the analysis system via a transfer line; and a controller communicatively coupled with the analysis system and the one or more remote sampling systems, the controller configured to assign a priority value to a sample for analysis by the analysis system and to manage a queue of samples received from at the one or more remote sampling systems on the basis of the assigned priority value.
Rotary valve systems with integrated sensors are described that facilitate stabilizing electrical connection from a valve actuator. A valve system includes a rotary valve comprising one or more ports configured to receive one or more fluids. The valve system further includes an actuator attached to the rotary valve, wherein the actuator comprises a power connection fed from electronics associated with the actuator. The valve system further includes an actuator cap attached to the actuator, the actuator cap configured to allow the power connection to pass through, wherein the actuator cap comprises one or more apertures, a valve collar with an integrated press-on connector configured to be attached to the actuator cap, wherein the valve collar comprises an electronic feedthrough passage for the power connection, a retainer portion comprising one or more retainer pins, wherein the one or more retainer pins are configured to mate with the one or more apertures on the actuator cap, the retainer portion configured to allow electrical connection between the power connector and a sensor connector when the one or more retainer pins fit within the one or more apertures on the actuator cap, and a sensor housing adjacent to the rotary valve and configured to support one or more sensors disposed with respect to one or more fluid lines coupled to the one or more ports of the rotary valve, the sensor connector configured to transmit signals from the one or more sensors to the actuator.
F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
F16K 11/074 - Multiple-way valves, e.g. mixing valves; Pipe fittings incorporating such valves; Arrangement of valves and flow lines specially adapted for mixing fluid with all movable sealing faces moving as one unit comprising only sliding valves with pivoted closure members with flat sealing faces
21.
Spray chamber having dual input ports for impingement gas and sensitivity enhancement gas addition
Systems and methods are described for introducing an impingement gas and an enhancement gas to an aerosolized sample within a spray chamber. A system embodiment includes, but is not limited to, a chamber body; an input port coupled to the chamber body, the input port configured to receive an aerosolized sample and direct the aerosolized sample into the chamber body; an exit port coupled to the chamber body, the exit port configured to receive at least a portion of the aerosolized sample from the chamber body; an impingement gas port coupled to the exit port and configured to introduce an impingement gas to the at least a portion of the aerosolized sample; and an enhancement gas port coupled to the exit port configured to introduce an enhancement gas to the exit port.
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
Valve assemblies are described that provide magnetic coupling between a valve actuator and a valve body housing the valve rotor and stator. A valve assembly embodiment, includes, but is not limited to, a valve body, the valve body including at least one magnet, and a rotor and a stator configured to define a plurality of fluid flow passageways; a valve actuator configured to drive the rotor via a drive shaft; and an actuator mount coupled to the valve actuator and configured to magnetically couple with the at least one magnet of the valve body to magnetically couple the valve body and the valve actuator.
F16K 31/06 - Operating means; Releasing devices magnetic using a magnet
F16K 31/08 - Operating means; Releasing devices magnetic using a magnet using a permanent magnet
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described to maintain a liquid sample segment of a sample transmitted through a transfer line from a remote sampling to an analysis system. A system embodiment includes, but is not limited to, a sample transfer line configured to transport a liquid sample from a remote sampling system via gas pressure; a sample loop fluidically coupled with the sample transfer line, the sample loop configured to hold a sample fluid; and a backpressure chamber fluidically coupled with a gas pressure source and with the sample transfer line, the backpressure chamber configured to supply a backpressure against the liquid sample during transport through the sample transfer line.
Systems and methods are described for determining whether liquid remains on a wafer surface following a scanning operation. A system embodiment includes, but is not limited to, a first system configured for positioning adjacent a transfer line coupled with a scanning nozzle to dispense fluid onto a wafer surface and to recover the fluid from the wafer surface, the first system configured to detect a gas/liquid transition of the fluid and determine a volume of liquid sample dispensed; a second system configured for positioning adjacent a second line downstream from the scanning nozzle, the second system configured to detect a gas/liquid transition of fluid flowing through the second line and determine a volume of liquid sample recovered from the wafer surface; and a controller configured to generate an alert if the volume of liquid sample recovered is not within a threshold amount compared to the volume of liquid sample dispensed.
Systems and methods for automated cap removal with an autosampler system are described. In an aspect, an autosampler system includes, but is not limited to, a sample rack; a sample vessel stabilizer configured to transition the sample rack between a load/unload state and a lock state; an uncapper supported by a first z-axis support; and a sample probe supported by a second z-axis support, wherein the uncapper is configured to remove a cap from a sample vessel held by the sample rack when the sample rack is in the lock state, and wherein the uncapper is configured to change the position of the removed cap to permit access to an interior of the sample vessel by the sample probe without removing the sample vessel from the sample rack.
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
27.
Valve having integrated sensor and stabilized electrical connection
Rotary valve systems with integrated sensors are described that facilitate stabilizing electrical connection from a valve actuator. A valve system embodiment includes, but is not limited to, a multi-port rotary valve; an actuator attached to the multi-port rotary valve, wherein the actuator comprises a power connection fed from electronics associated with the actuator; an actuator cap attached to the actuator, the actuator cap configured to allow the power connection to pass through; a valve collar with an integrated press-on connector, wherein the valve collar comprises an electronic feedthrough passage for the power connection; and a retainer portion comprising two retainer pins, wherein the two retainer pins are configured to mate with apertures on the actuator cap, the retainer portion configured to allow electrical connection between the power connector and a sensor connector when the two retainer pins fit within the two apertures on the actuator cap.
F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
F16K 11/074 - Multiple-way valves, e.g. mixing valves; Pipe fittings incorporating such valves; Arrangement of valves and flow lines specially adapted for mixing fluid with all movable sealing faces moving as one unit comprising only sliding valves with pivoted closure members with flat sealing faces
28.
Systems and methods for indirect detection of a missed sample
Systems and methods are described for indirect detection of a missed sample from an autosampler. A method embodiment includes, but is not limited to, drawing a fluid through operation of an autosampler; directing the fluid via a fluid line to a valve of a fluid handling system, the valve including or being adjacent to a sensor to detect a presence or absence of liquid sample; directing the fluid from the valve into a holding line coupled to the valve; determining whether a threshold amount of liquid sample is present in the fluid in the holding line; and when it is determined that liquid sample is present in the fluid in the holding line in an amount less than the threshold amount, transferring a carrier fluid having a marker component to an analytic detector, the marker component present in the carrier fluid in an amount indicative of a missed sample.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
A cap assembly includes a base cap, a chemical resistant sheet, and a closure assembly. The closure assembly is configured for carrying the chemical resistant sheet. The closure assembly is mounted in the base cap. The base cap and the closure assembly together define a central cap assembly aperture therethrough.
An inductively coupled plasma (ICP) torch is described that facilitates laminar flow of a cooling gas introduced by a plurality of input ports between an outer tube and an inner tube configured to surround an injector for introduction of an aerosolized sample to a plasma. A system embodiment includes, but is not limited to, an inner tube; and an outer tube surrounding at least a portion of the inner tube to form an annular space, the outer tube defining a plurality of inlet ports for introduction of a cooling gas into the annular space as a laminar flow via each inlet port of the plurality of inlet ports.
An inductively coupled plasma (ICP) torch is described that includes an injector protector to shield an injector end. A system embodiment includes, but is not limited to, a tubular sample injector configured to receive an aerosolized sample in an interior defined by walls of the tubular sample injector; an injector protector surrounding at least a portion of the tubular sample injector; an inner tube surrounding at least a portion of the injector protector to form a first annular space between the inner tube and the injector protector, the inner tube defining at least one inlet port for introduction of an auxiliary gas into the first annular space; and an outer tube surrounding at least a portion of the inner tube to form a second annular space, the outer tube defining at least one inlet port for introduction of a cooling gas into the second annular space.
H05H 1/22 - Arrangements for confining plasma by electric or magnetic fields; Arrangements for heating plasma for injection heating
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H05H 1/30 - Plasma torches using applied electromagnetic fields, e.g. high-frequency or microwave energy
H05H 1/34 - Plasma torches using an arc - Details, e.g. electrodes, nozzles
32.
INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH FLARED OUTLET
An inductively coupled plasma (ICP) torch is described that includes a tapered outer end. A system embodiment includes, but is not limited to, a tubular sample injector configured to receive an aerosolized sample in an interior defined by walls of the tubular sample injector; an inner tube surrounding at least a portion of the tubular sample injector to form a first annular space between the inner tube and the walls of the tubular sample injector, the inner tube defining at least one inlet port for introduction of an auxiliary gas into the first annular space; and an outer tube surrounding at least a portion of the inner tube to form a second annular space, the outer tube defining at least one inlet port for introduction of a cooling gas into the second annular space, the outer tube having a flared region at an outlet of the outer tube.
An analysis system includes a degassing cell, at least one first valve, and at least one second valve. The at least one first valve is fluidly coupled with a top of the degassing cell, the at least one first valve configured selectably connect the degassing cell to a displacement gas flow and to a vacuum source. The at least one second valve is fluidly connected with a lateral side of the degassing cell and separately fluidly connected with a bottom of the degassing cell. The at least one second valve is selectably coupled with any of a source of a sample-carrying fluid, a transfer line configured to deliver a sample to an analysis device, or a waste output.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods for automatic preparation of samples through evaporative sampling for subsequent analysis are described. A system embodiment includes, but is not limited to, a sample source configured to supply a sample; an evaporation container fluidically coupled with the sample source to receive the sample; a temperature control element operably coupled with the evaporation container to vaporize a liquid portion of the sample within the evaporation container, the evaporation container fluidically coupled with a gas input to receive a gas to transport vapor from the evaporation container; and a cooling system configured to receive the vapor from the evaporation container and to condense the vapor for collection.
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
G01N 21/85 - Investigating moving fluids or granular solids
G01N 1/22 - Devices for withdrawing samples in the gaseous state
An autosampler system can include a z-axis mount, a carriage, an autosampler arm, and a compression nut. The carriage can be axially positioned on the z-axis mount. The autosampler arm can define an arm extension and an autosampler arm mount. The autosampler arm mount can define an arm mount aperture, an arm mount inner ledge, and an arm mount compressible section, the arm mount aperture configured to receive the z-axis mount and the carriage therethrough. The arm mount inner ledge can extend from an interior of the arm mount aperture, with the arm mount inner ledge configured to receive the z-axis mount therethrough and be supported on the carriage. The arm mount compressible section can define a set of compressible section threading and at least one compressible section slot. The compression nut can be affixed to the arm mount compressible section via the set of compressible section threading.
Systems and methods are described to determine whether a sample transmitted through a transfer line from a remote sampling system contains a suitable sample to analyze by an analysis system. A system embodiment includes, but is not limited to, a sample receiving line configured to receive a liquid segment a first detector configured to detect the liquid segment at a first location in the sample receiving line; a second detector configured to detect the liquid segment at a second location in the sample receiving line downstream from the first location; and a controller configured to register a continuous liquid segment in the sample receiving line when the first detector and the second detector match detection states prior to the controller registering a change of state of the first detector.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
Sample preparation systems and methods are described having pump control, valve configurations, and control logic that facilitate automatic, inline preparation dilutions of a sample according to at least two dilution operating modes. A system embodiment includes, but is not limited to a first pump configured to drive a carrier fluid; a second pump configured to drive a diluent; and a plurality of selection valves fluidically coupled with the first pump and the second pump, the plurality of selection valves being configured to direct fluid flows from the first pump and the second pump according to at least two modes of operation to provide a single-stage sample dilution according to a first operating mode and to provide a dual-stage sample dilution according to a second operating mode.
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
38.
Autosampler arm with automated pipet securing and unsecuring
A fluid handling assembly for selectively coupling and decoupling with a pipet tip can include a sampling arm, an arm cover, a probe carrier unit, a probe, and a biasing spring. The arm cover can be carried by the sampling arm. The probe carrier unit can be movably mounted within the arm cover, with the probe carrier unit including a probe release structure and a main probe carrier. The probe release structure and the main probe carrier can be interconnected. The probe can be carried by the main probe carrier and movable through a probe opening in the arm cover. The probe can be configured to releasably carry a pipet tip. The biasing spring can be carried within the arm cover and can contact the probe release structure. The biasing spring can bias the probe release structure to push the probe down toward the probe opening in the arm cover.
Systems and methods are described to concentrate and homogenize a remote sample for analysis. A sample concentration and homogenization system embodiment includes, but is not limited to, at least a first valve, at least a first column fluidically coupled to the first valve, a flow meter fluidically coupled with the first column when the first valve is in a first flow path configuration to measure an amount of the liquid sample passed through the first column, and a homogenization valve including a sample homogenizing loop in which the concentrated sample is homogenized.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
The present disclosure is directed to an auto-sampling system with syringe, valve configurations, and control logic that allow automatic, inline matrix matching of calibration standards to samples. In implementations, this can be accomplished with three independent syringes connected to a valve system to dynamically introduce a carrier, diluent, and ultrapure stock matrix flows for each blank, standard, or sample.
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
A sample agitation system for an automated sampling device is described. In an example implementation, the sample agitation system includes a sample probe configured to contact a sample positioned within a sample vessel. Further, the sample agitation system includes an actuator coupled to the sample probe that is configured to stir the sample positioned within the sample vessel in one or more rotational directions. The directions may include, but are not limited to, clockwise motion, anti-clockwise motion, or the like. In some implementations, a sample probe support arm can be coupled to the sample probe and/or the actuator. The actuator can move the sample probe support arm in a translational, a rotational, and/or a vertical direction to rotate the sample probe and stir the sample.
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
B01F 27/90 - Mixers with rotary stirring devices in fixed receptacles; Kneaders with stirrers rotating about a substantially vertical axis with paddles or arms
B01F 101/23 - Mixing of laboratory samples e.g. in preparation of analysing or testing properties of materials
42.
SHAPED-CHANNEL SCANNING NOZZLE FOR SCANNING OF A MATERIAL SURFACE
Systems and methods are described for introducing one or more fluid streams from a nozzle having one or more shaped channels to one or more material surfaces and removing the fluid streams for scanning for chemical species of interest. A nozzle embodiment includes, but is not limited to, a nozzle body configured to couple to a positionable nozzle arm support for positioning the nozzle with respect to a material surface, the nozzle body defining at least one fluid port to receive a fluid; and a nozzle hood coupled to the nozzle body, the nozzle hood defining an elongated shaped channel having a first fluid channel and a second fluid channel extending from the at least one fluid port, the first fluid channel and the second fluid channel configured to direct fluid along the material surface within at least a portion of each of the fluid channels.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
A sample introduction system provides mixing of a sample and a diluent within the container via gas injection. In one or more implementations, the sample introduction system causes a probe of an autosampler to be inserted into a container containing a sample and a diluent so that an end of the probe is submerged beneath a surface of the diluent and the sample. Gas is then injected through the probe to mix the sample and the diluent within the container. An aliquot of the mixed sample and diluent is then withdrawn through the probe.
G01N 1/22 - Devices for withdrawing samples in the gaseous state
B01F 33/40 - Mixers using gas or liquid agitation, e.g. with air supply tubes
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/00 - Particle spectrometers or separator tubes
G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
45.
Humidification of laser ablated sample for analysis
Humidification systems and methods to introduce water vapor to a laser-ablated sample prior to introduction to an ICP torch are described. A system embodiment includes, but is not limited to, a water vapor generator configured to control production of a water vapor stream and to transfer the water vapor stream to at least one of a sample chamber of a laser ablation device or a mixing chamber in fluid communication with the laser ablation device, wherein the mixing chamber is configured to receive a laser-ablated sample from the laser ablation device and direct the laser-ablated sample to an inductively coupled plasma torch.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
B01L 9/02 - Laboratory benches or tables; Fittings therefor
The present disclosure is directed to a system and a method for hydride generation. In some embodiments, the system includes an assembly for introducing hydride generation reagents into a mixing path or mixing container, where the assembly includes first chamber configured to contain a first hydride generation reagent and a second chamber configured to contain a second hydride generation reagent. A first plunger is configured to translate within the first chamber and cause a displacement of the first hydride generation reagent, and a second plunger is configured to translate within the second chamber and cause a displacement of the second hydride generation reagent. The assembly further includes base coupling the first plunger and the second plunger together.
H02P 25/18 - Arrangements or methods for the control of AC motors characterised by the kind of AC motor or by structural details characterised by the circuit arrangement or by the kind of wiring with arrangements for switching the windings, e.g. with mechanical switches or relays
C01B 6/00 - Hydrides of metals; Monoborane or diborane; Addition complexes thereof
H02K 16/04 - Machines with one rotor and two stators
B63H 21/20 - Use of propulsion power plant or units on vessels the vessels being powered by combinations of different types of propulsion units
B63H 23/10 - Transmitting power from propulsion power plant to propulsive elements with mechanical gearing for transmitting drive from more than one propulsion power unit
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H02K 21/02 - Synchronous motors having permanent magnets; Synchronous generators having permanent magnets - Details
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
Systems and methods for heating a spray chamber outlet are described. A system embodiment includes, but is not limited to, a conductive body portion defining an aperture to receive a spray chamber outlet; and an internal cartridge heater coupled to the conductive body portion, the internal cartridge heater configured to regulate a temperature of the conductive body portion to inhibit condensate formation within the spray chamber outlet.
H05B 3/42 - Heating elements having the shape of rods or tubes non-flexible
B05B 7/22 - Spraying apparatus for discharge of liquids or other fluent materials from two or more sources, e.g. of liquid and air, of powder and gas incorporating means for heating the material to be sprayed electrically, e.g. by arc
49.
Abrasive sampling system and method for representative, homogeneous, and planarized preparation of solid samples for laser ablation
Systems and methods are described for providing a representative, homogeneous, and planarized target for solid sample laser ablation. A method embodiment includes, but is not limited to, removing portions of a solid sample with an abrasive sampling system, the abrasive sampling system including at least one of a plurality of abrasive particles configured to hold the portions of the solid sample on an abrasive substrate between the abrasive particles or a texturized surface configured to hold the portions of the solid sample on the texturized surface; transferring the abrasive sampling system holding the portions of the solid sample to a laser ablation system; and ablating the portions of the solid sample held by the abrasive sampling system with the laser ablation system.
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
Systems and methods are described for securing fabric, paper, and film samples for analysis by laser ablation. A method embodiment includes, but is not limited to, securing a thin, solid sample with a sample holder system, the sample holder system configured to hold the thin, solid sample in a taut configuration between a piston and a sample holder base; transferring the sample holder system to a laser ablation system; and ablating at least a portion of the thin, solid sample in the taut configuration with the laser ablation system to provide an ablated sample.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 1/04 - Devices for withdrawing samples in the solid state, e.g. by cutting
51.
Purifying an element from a sample matrix for isotopic analysis
A method includes supplying a reagent to a column, where the column is configured to purify an element from a sample matrix for isotopic analysis. The method also includes loading the column with the sample matrix, and supplying a second reagent to collect the element retained by the column. The method further includes loading the column with a second sample mixture, and collecting an element from the second sample mixture retained by the column. A column configured to separate an element from a sample matrix for isotopic analysis includes a resin configured to retain the element. The column also includes a first frit disposed of a first end of the column and a second frit disposed of a second end of the column. The column is configured to receive a first reagent in a first flow direction and a second reagent in a second flow direction different from the first flow direction.
A method for detecting material in a sample using an ICP instrument includes preparing the sample for analysis by the ICP instrument using hydrogen gas. For example, hydrogen gas can be generated by initiating a hydride generation reaction with the sample. Further, hydrogen gas can be introduced to a component part of the sample. For instance, hydrogen gas can be added to an injector gas in a spray chamber of the ICP instrument.
Systems and methods are described to determine whether a sample transmitted through a transfer line from a remote sampling system contains a suitable sample to analyze by an analysis system. A system embodiment includes, but is not limited to, a sample receiving line configured to receive a liquid segment a first detector configured to detect the liquid segment at a first location in the sample receiving line; a second detector configured to detect the liquid segment at a second location in the sample receiving line downstream from the first location; and a controller configured to register a continuous liquid segment in the sample receiving line when the first detector and the second detector match detection states prior to the controller registering a change of state of the first detector.
A system includes an analysis system at a first location and one or more remote sampling systems at a second location remote from the first location. A sampling system can be configured to receive a remote liquid sample. The system also includes a sample transfer line configured to transport gas from the second location to the first location. The sample transfer line is configured to selectively couple with a remote sampling for supplying a continuous liquid sample segment to the sample transfer line. The system can further include a sample receiving line at the first location. The sample receiving line is configured to selectively couple with the sample transfer line and the analysis system to receive the continuous liquid sample segment and supply the sample to an analysis device.
G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 1/00 - Sampling; Preparing specimens for investigation
55.
Systems for integrated decomposition and scanning of a semiconducting wafer
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
Systems and methods are described for integrated sample container cover removal and sample probe positioning. In an example implementation, an autosampler system includes, but is not limited to, a z-axis support rotatable about a z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe to withdraw a fluid-containing sample held within a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support with respect to the sample probe support structure, the sample cap remover configured to lift a cap from the sample container to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
57.
Auto-sampling system with inline preparation of concentrated sulfuric acid and phosphoric acid for analytic elemental determination
The present disclosure is directed to an auto-sampling system with syringe, valve configurations, and control logic that allow automatic, inline preparation of concentrated sulfuric acid and concentrated phosphoric acid for analytic analyses. In implementations, the auto-sampling system includes independent syringe pumps connected to a valve system to dynamically introduce carrier, diluent, buffer, and eluent flows according to one or more modes of operation.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
Systems and methods are described for integrated decomposition and scanning of a material, such as a semiconducting wafer, a scanning nozzle includes, but is not limited to, a nozzle body defining one or more nozzle ports to receive fluid for introduction to the surface of the material and to recover fluid from the surface of the material, and a nozzle hood extending from the nozzle body, the nozzle hood defining an inner channel longitudinally disposed along the nozzle body, the nozzle hood further defining one or more outer channels longitudinally disposed along the nozzle body, the inner channel fluidically coupled with the one or more outer channels via one or more gaps defined by the nozzle hood.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for calibrating an analytical instrument analyzing a plurality of sample matrices in series. A system embodiment can include, but is not limited to, a sample analysis device configured to receive a plurality of samples from a plurality of remote sampling systems and to determine an intensity of one or more species of interest contained in each of the plurality of samples; and a controller configured to generate a primary calibration curve based on analysis of a first standard solution having a first sample matrix by the sample analysis device and generate at least one secondary calibration curve based on analysis of a second standard solution having a second sample matrix by the sample analysis device, the controller configured to associate the at least one secondary calibration curve with the primary calibration curve according to a matrix correction factor.
G01N 21/27 - Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
60.
Autosampler rail system with magnetic coupling for linear motion
Systems and methods are described for preventing the release of metal particles from an autosampler that could otherwise be detected within a sample during sample analysis. In an example implementation, an autosampler systems includes, but is not limited to, a sample probe support structure; a z-axis support; an outer shuttle coupled with an outer surface of the z-axis support; and an inner shuttle linearly moveable within an interior volume of the z-axis support, the inner shuttle magnetically coupled with the outer shuttle to translate linear motion of the inner shuttle to the outer shuttle.
The present disclosure is directed to an auto-sampling system with syringe, valve configurations, and control logic that allow automatic, inline matrix matching of calibration standards to samples. In implementations, this accomplished with three independent syringes connected to a valve system to dynamically introduce carrier, diluent, and ultrapure stock matrix flows for each blank, standard, or sample.
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
62.
Automated system for detection of silicon species in phosphoric acid
Systems and methods are described to provide speciation of silicon species present in a remote sample for analysis. A method embodiment includes, but is not limited to, receiving a fluid sample containing inorganic silicon in the presence of bound silicon from a remote sampling system via a fluid transfer line; transferring the fluid sample to an inline chromatographic separation system; separating the inorganic silicon from the bound silicon via the inline chromatographic separation system; transferring the separated inorganic silicon and bound silicon to a silicon detector in fluid communication with the inline chromatographic separation system; and determining an amount of one or more of the inorganic silicon or the bound silicon in the fluid sample via the silicon detector.
Systems and methods for controlled, inline introduction of chemical agents to an inline fluid sample are described. A method embodiment includes, but is not limited to, receiving a fluid sample with a valve; receiving a chemical agent with the valve; introducing the fluid sample and the chemical agent inline via a mixing port of the valve to produce a mixed sample; transferring the mixed sample to a second valve; directing the mixed sample to a sample holding loop fluidically coupled with the second valve; holding the mixed sample within the sample holding loop for a holding period of time to permit a reaction between the fluid sample and the chemical agent; and directing the mixed sample from the sample holding loop to an analytic instrument following expiration of the holding period of time.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
H01J 49/16 - Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
Systems and methods for automatically packing resin into and unpacking resin from a reusable separation column for sample analysis are described. A reusable sample separation column embodiment includes, but is not limited to, a column body having a first end and a distal second end and defining an interior fluid flow pathway; a first port adjacent the first end and coupled to an inlet coupled to an expanded interior region, the inlet positioned between the first port and the expanded interior region to introduce resin slurry; an outlet coupled to a frit positioned between the outlet and the first port, the frit configured to retain resin of the resin slurry within the expanded interior region; and a second port coupled to a channel having a smaller cross-section than the second port, the channel configured to introduce a jet of fluid to resin positioned in the expanded interior region.
B01D 15/20 - Selective adsorption, e.g. chromatography characterised by constructional or operational features relating to the conditioning of the sorbent material
A system for controlling peristaltic pumps includes a first peristaltic pump configured to drive a carrier fluid, a second peristaltic pump configured to drive a diluent fluid, a third peristaltic pump configured to drive an internal standard, spike or matrix solution, and a controller for adjusting respective flow rates of the first, second, and third peristaltic pumps. The controller is configured to run the second peristaltic pump at least at a minimum predetermined flow rate whenever the third peristaltic pump is active.
F04B 43/12 - Machines, pumps, or pumping installations having flexible working members having peristaltic action
F04B 49/20 - Control of, or safety measures for, machines, pumps, or pumping installations, not otherwise provided for in, or of interest apart from, groups by changing the driving speed
G05D 11/02 - Controlling ratio of two or more flows of fluid or fluent material
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
66.
Valve for controlled shuttle of liquid into microtiter plates and mixing
Valve assemblies are described that provide segmented shuttle of liquid into sample vessels and automatic mixing via bubbles in the segmented liquid. A valve assembly includes a first valve member having ports configured to receive a pressurized gas, a first fluid, and a second fluid. The valve assembly also includes a second valve member coupled adjacent to the first valve member. The second valve member comprises a plurality of channels configured to interface with the first valve member. In a first configuration, the first fluid is loaded into an external loop. In the second configuration, the second fluid is eluted from the column into a vial in a segmented stream via bubbles of pressurized gas. Bubbles of gas automatically mix the eluted sample fluid.
F16K 11/074 - Multiple-way valves, e.g. mixing valves; Pipe fittings incorporating such valves; Arrangement of valves and flow lines specially adapted for mixing fluid with all movable sealing faces moving as one unit comprising only sliding valves with pivoted closure members with flat sealing faces
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 30/00 - Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography
67.
TEMPERATURE-CONTROLLED SAMPLE INTRODUCTION SYSTEM FOR ANALYSIS OF VISCOUS SAMPLES
A sample introduction system is described that provides temperature-controlled handling and transfer of a sample from an autosampler, through a transfer line, to a heated environment proximate an analytical device. A system embodiment includes, but is not limited to, an autosampler including a temperature-controlled deck to support one or more sample containers; a heating unit including one or more heating elements to one or more fluids to be introduced to a sample removed from the one or more sample containers; a transfer line fluidically coupled with the autosampler and including a heating element configured to transfer heat to fluid flowing through the transfer line; and a sample handling system fluidically coupled with the transfer line and configured to fluidically couple with an analysis device, the sample handling system including a housing and a heating element configured to control a temperature of an environment defined by the housing.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
68.
AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITIES IN SEMICONDUCTOR GRADE CHEMICALS
An embodiment of an analysis system can include an initial multi-port valve, at least one intermediate multi-port valve, a further multi-port valve, and a time-of-flight mass spectrometer (TOF-MS). The initial multi-port valve can be configured to receive a sample. The at least one intermediate multi-port valve can be fluidly connected to the initial multi-port valve and configured to receive the sample from the initial multi-port valve. A given intermediate multi-port valve can have an ion-exchange column associated therewith. The given intermediate multi-port valve can be configured selectably to one of direct the sample through the ion-exchange column associated therewith (in a speciation mode) or bypass the ion-exchange column (in an infusion mode). The further multi-port valve can be fluidly connected with the at least one intermediate multi-port valve and configured to receive the sample from therefrom. The time-of-flight mass spectrometer (TOF-MS) can be fluidly connected to the further multi-port valve.
H01J 49/00 - Particle spectrometers or separator tubes
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
69.
System for collecting liquid samples and transporting over distances while maintaining a liquid sample segment
Systems and methods are described to maintain a liquid sample segment of a sample transmitted through a transfer line from a remote sampling to an analysis system. A system, embodiment includes, but is not limited to, a sample transfer line configured to transport a liquid sample from a remote sampling system via gas pressure; a sample loop fluidically coupled with the sample transfer line, the sample loop configured to hold a sample fluid; and a backpressure chamber fluidically coupled with a gas pressure source and with the sample transfer line, the backpressure chamber configured to supply a backpressure against the liquid sample during transport through the sample transfer line.
Sample preparation systems and methods are described having pump control, valve configurations, and control logic that facilitate automatic, inline preparation dilutions of a sample according to at least two dilution operating modes. A system embodiment includes, but is not limited to a first pump configured to drive a carrier fluid; a second pump configured to drive a diluent; and a plurality of selection valves fluidically coupled with the first pump and the second pump, the plurality of selection valves being configured to direct fluid flows from the first pump and the second pump according to at least two modes of operation to provide a single-stage sample dilution according to a first operating mode and to provide a dual-stage sample dilution according to a second operating mode.
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
71.
Remote automated chemical crossover system for use with an automated sampling device
A sample analysis system is available that can include a remote sampling system, at least one analyzer, and a controller. The remote sampling system can include a plurality of sample sources for providing a corresponding sample therefrom; and a plurality of sample collection devices selectively coupled to any of the plurality of sample sources for receiving at least one of the samples therefrom. The at least one analyzer can be coupled to the plurality of the sample collection devices for receiving at least one of the samples therefrom. The controller can be coupled with the remote sampling system and the at least one analyzer, the controller configured to control which of the sample sources is actively coupled to a given sample collection device at a given time.
An analysis system includes a degassing cell, at least one first valve, and at least one second valve. The at least one first valve is fluidly coupled with a top of the degassing cell, the at least one first valve configured selectably connect the degassing cell to a displacement gas flow and to a vacuum source. The at least one second valve is fluidly connected with a lateral side of the degassing cell and separately fluidly connected with a bottom of the degassing cell. The at least one second valve is selectably coupled with any of a source of a sample-carrying fluid, a transfer line configured to deliver a sample to an analysis device, or a waste output.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
73.
Automatic column sparging for preconcentration columns
The present disclosure is directed to systems and methods for automated column sparging of preconcentration columns for analytic testing. A system embodiment includes, but is not limited to, a selection valve fluidically coupled with a gas source and with an eluent source, the selection valve including a mixing portion to mix gas from the gas source and eluent from the eluent source to provide a bubbled eluent stream; and a preconcentration column in fluid communication with the selection valve, the preconcentration column configured to receive the bubbled eluent stream from the selection valve and direct the bubbled eluent stream into an interior of the preconcentration column.
Systems and methods are described for isolating a sample at a valve prior to introduction to an analysis system, such as sample analysis via ICP-MS. A system embodiment can include, but is not limited to, a valve system including a first valve in fluid communication with a sample reservoir and a second valve configured to permit and block access of a vacuum source to the first valve; a sensor system configured to detect presence or absence of a fluid at the first valve; and a controller configured to control operation of the second valve to block access of the vacuum source to the first valve upon detection of the fluid at the first valve to isolate the fluid within the sample reservoir.
Humidification systems and methods to introduce water vapor to a laser-ablated sample prior to introduction to an ICP torch are described. A system embodiment includes, but is not limited to, a water vapor generator configured to control production of a water vapor stream and to transfer the water vapor stream to at least one of a sample chamber of a laser ablation device or a mixing chamber in fluid communication with the laser ablation device, wherein the mixing chamber is configured to receive a laser-ablated sample from the laser ablation device and direct the laser-ablated sample to an inductively coupled plasma torch.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
76.
Automatic control of flow rate for sample introduction system responsive to sample intensity
A system embodiment includes, but is not limited to, a syringe pump operably coupled to a desolvation unit, the desolvation unit coupled to a sample analyzer configured to measure an intensity of one or more analytes in a sample solution provided through operation of the syringe pump; and a controller operably coupled to the syringe pump, the controller configured to receive the intensity of the one or more analytes measured by the sample analyzer, determine whether the intensity exceeds a threshold difference of an intensity of at least one standard measured by the sample analyzer, and adjust one or more control parameters of the syringe pump when the intensity of the one or more analytes exceeds the threshold difference to control a flow rate of the sample solution introduced to the sample analyzer.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for heating sample transfer lines between a source of a sample and a detection system to detect analytes of interest in the sample, where the sample is maintained in a heated state to maintain dissolved analytes of interest in solution.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods for safe collection and transportation of fluid samples for analysis are described to avoid exposure of hazardous materials to personnel during collection and transfer of samples to laboratory processing equipment. A system embodiment includes, but is not limited to, a sample module including an enclosure configured to separate a sample from an external environment; a filling station defining a compartment into which the sample module can be received, the filling station configured to direct a fluid sample into the sample module and to rinse fluid connections between the filling station and the sample module prior to decoupling of the sample module from the filling station; and a sample transfer station configured to receive the sample module and to transfer sample from the sample module and direct the sample into a sample container.
Systems and methods for automatically packing resin into and unpacking resin from a reusable separation column for sample analysis are described. A method embodiment includes, but is not limited to, introducing a slurry of resin to a reusable sample separation column to pack the reusable column with resin; introducing a sample solution to the reusable sample separation column; and unpacking the resin from the reusable sample separation column with a flow of liquid unpacking reagent and gaseous material.
B01D 15/20 - Selective adsorption, e.g. chromatography characterised by constructional or operational features relating to the conditioning of the sorbent material
B01D 15/14 - Selective adsorption, e.g. chromatography characterised by constructional or operational features relating to the introduction of the feed to the apparatus
Systems and methods are described to determine whether a sample transmitted through a transfer line from a remote sampling system contains a suitable sample to analyze by an analysis system. A system embodiment includes, but is not limited to, a sample receiving line configured to receive a liquid segment a first detector configured to detect the liquid segment at a first location in the sample receiving line; a second detector configured to detect the liquid segment at a second location in the sample receiving line downstream from the first location; and a controller configured to register a continuous liquid segment in the sample receiving line when the first detector and the second detector match detection states prior to the controller registering a change of state of the first detector.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
B01L 9/02 - Laboratory benches or tables; Fittings therefor
A connector is described that comprises a connector body with a connector end extending longitudinally from the connector body. The connector end comprises a generally cylindrical outer surface and a generally cylindrical inner surface. The generally cylindrical outer surface has a protrusion (e.g., a bulbous protrusion) providing a thickened cross-sectional area in the region of the connector end proximate to the protrusion so that the connector end can be connected to a second connector by inserting the second connector into the connector end. The second connector can also comprise a bulbous protrusion, and may be a nebulizer. A tube can be connected to the connector body (e.g., using a threaded connector).
A plasma torch assembly (e.g., for an ICP-MS or ICP-AES instrument) with a retractable injector is disclosed. In implementations, the torch assembly includes an injector that can be extended or retracted relative to an auxiliary gas tube of the torch assembly. The injector can be slidably coupled to a torch body that supports the auxiliary gas tube, such that the injector can be moved forward and backward through a passage of the torch body, causing it to extend/retract relative to the auxiliary gas tube.
Systems and methods are described to determine whether a sample transmitted through a transfer line from a remote sampling system contains a suitable sample to analyze by an analysis system. A system embodiment includes, but is not limited to, a sample receiving line configured to receive a liquid segment a first detector configured to detect the liquid segment at a first location in the sample receiving line; a second detector configured to detect the liquid segment at a second location in the sample receiving line downstream from the first location; and a controller configured to register a continuous liquid segment in the sample receiving line when the first detector and the second detector match detection states prior to the controller registering a change of state of the first detector.
In accordance with embodiments of this disclosure, a gas humidifier system includes a reservoir of liquid with at least one selectively permeable tube at least partially submerged within the liquid. A gas stream may be fed into the selectively permeable tube that passes through the liquid reservoir. The selectively permeable tube may be substantially impermeable to the gas flowing therethrough but permeable to vapor (e.g., water vapor) entering the selectively permeable tube from the liquid. Thus, vapor from the liquid reservoir can enter the selectively permeable tube and humidify the gas flowing therethrough.
A sample introduction system providing variable online dilution of a sample is described. In one or more implementations, a device includes a spectrometry analysis system that employs example techniques in accordance with the present disclosure includes an inline dilution environment, including a first valve assembly configured to prepare a sample by accepting at least one of the sample, a diluent, a carrier, or an internal standard, where the first valve assembly includes a first sample loop; and a second valve assembly configured to prepare the sample by accepting the sample from the first valve assembly, where the second valve assembly is coupled to the first valve assembly, and where the second valve assembly includes a second sample loop.
G01N 1/38 - Diluting, dispersing or mixing samples
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
H01J 49/00 - Particle spectrometers or separator tubes
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
A system includes a sample selector device, a chromatographic column selectively connectable to the sample selector device, and a spectrometry analysis device selectively connectable to the sample selector device. The sample selector device is configured to supply multiple individual samples to the chromatographic column to separate components of the individual samples. The sample selector device is also configured to store the separated components of the individual samples. The sample selector device is further configured to supply the separated components of the individual samples to the spectrometry analysis device. In embodiments of the disclosure, the components of the individual samples can be chromatographically separated while the spectrometry analysis device is offline.
Systems and methods are described for rapid throughput of samples from a plurality of sample sources to a nebulizer for analysis, such as a sample analysis via ICP-MS. A system embodiment can include, but is not limited to, a valve in fluid communication with a fluid transfer line to receive a plurality of samples from a plurality of sample sources from an autosampler unit and direct the sample into a valve channel; a first pump to draw sample into the valve channel, a sensor positioned adjacent a nebulizer to detect respective samples of the plurality of samples and generate one or more signals in response thereto; a second pump to push the sample from the valve channel to the nebulizer; and a controller configured to coordinate operation of the first pump, the second pump, and the valve based at least on the one or more signals.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
89.
Automated system for remote inline concentration and homogenization of ultra-low concentrations in pure chemicals
Systems and methods are described to concentrate and homogenize a remote sample for analysis. A sample concentration and homogenization system embodiment includes, but is not limited to, at least a first valve, at least a first column fluidically coupled to the first valve, a flow meter fluidically coupled with the first column when the first valve is in a first flow path configuration to measure an amount of the liquid sample passed through the first column, and a homogenization valve including a sample homogenizing loop in which the concentrated sample is homogenized.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Sample preparation systems and methods are described having pump control, valve configurations, and control logic that facilitate automatic, inline preparation dilutions of a sample according to at least two dilution operating modes. A system embodiment includes, but is not limited to a first pump configured to drive a carrier fluid; a second pump configured to drive a diluent; and a plurality of selection valves fluidically coupled with the first pump and the second pump, the plurality of selection valves being configured to direct fluid flows from the first pump and the second pump according to at least two modes of operation to provide a single-stage sample dilution according to a first operating mode and to provide a dual-stage sample dilution according to a second operating mode.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
A sample identification system for an automated sampling and dispensing device is described. In an example implementation, the sample identification system includes a sample probe configured to contact a sample positioned within a sample vessel. Further, the sample identification system includes an identifier capture device configured to measure a sample identifier associated with the sample vessel and generate a data signal in response thereto, where the data signal corresponds to an identity of the at least one sample. During operation, the identifier capture device scans a sample holder, a sample vessel, or a table top of the automated sampling and dispensing device to measure the sample identifier and to generate the data signal in response thereto.
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G06K 7/10 - Methods or arrangements for sensing record carriers by corpuscular radiation
G06K 7/14 - Methods or arrangements for sensing record carriers by corpuscular radiation using light without selection of wavelength, e.g. sensing reflected white light
G06K 19/06 - Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
A system can include a nebulizer having a tip and a spray chamber configured to be in fluid communication with the nebulizer. The tip of the nebulizer and/or an interior of the spray chamber can have a treated surface. The nebulizer and/or the spray chamber can be treated using a physical abrasion technique, chemically etched, and so forth. In some embodiments, treated surfaces of the nebulizer and the spray chamber can be proximate to one another. The spray chamber can include a drain ridge, which can project into an interior of the spray chamber, be depressed away from an interior of the spray chamber, and/or include a treated surface. The spray chamber can also include an output port having a treated surface. In some embodiments, the output port can include an additional port so that rinse liquid can flow through the spray chamber (e.g., continuously and/or intermittently).
A61M 11/00 - Sprayers or atomisers specially adapted for therapeutic purposes
B05B 1/02 - Nozzles, spray heads or other outlets, with or without auxiliary devices such as valves, heating means designed to produce a jet, spray, or other discharge of particular shape or nature, e.g. in single drops
B05B 15/55 - Arrangements for cleaning; Arrangements for preventing deposits, drying-out or blockage; Arrangements for detecting improper discharge caused by the presence of foreign matter using cleaning fluids
A61M 11/06 - Sprayers or atomisers specially adapted for therapeutic purposes of the injector type
Systems and methods for managing a sample preparation and analysis system based on detected unique sample identities and locations is described. A system embodiment includes, but is not limited to, a sample analysis information system communicatively connected with each of a sample data manager, a sample logging manager, and a sample preparation system, wherein the sample data manager stores on the sample analysis information system a sample type with a sample type protocol for execution by the sample preparation system, the sample logging manager assigns the sample type with a unique identifier positioned on a sample container, and the sample preparation system includes an identifier capture device to identify the unique identifier, access the sample type protocol from the sample analysis information system, and execute the sample type protocol responsive to a queue associated with a sample order assigned to the sample type via the sample data manager.
G16H 10/40 - ICT specially adapted for the handling or processing of patient-related medical or healthcare data for data related to laboratory analysis, e.g. patient specimen analysis
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
94.
AUTOMATIC SAMPLE AND STANDARD PREPARATION BASED ON RECOGNITION OF SAMPLE IDENTITY AND SAMPLE TYPE
Systems and methods for managing a sample preparation and analysis system based on detected unique sample identities and locations is described. A method embodiment includes, but is not limited to, storing on a sample analysis information system a sample type and a sample type protocol for execution by a sample preparation system via a sample data manager; storing on the sample analysis information system an association between a unique identifier positioned on a sample container and the sample type with a sample logging manager; identifying the unique identifier at the sample preparation system with an identifier capture device of the sample preparation system; accessing from the sample analysis information system the sample type protocol based on the sample type associated with the unique identifier; and queuing a sampling procedure to execute the sample type protocol based on a sample order assigned to the sample type via the sample data manager.
G16H 10/40 - ICT specially adapted for the handling or processing of patient-related medical or healthcare data for data related to laboratory analysis, e.g. patient specimen analysis
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
95.
Ultraclean autosampler with syringe delivery for mass spectrometry
A system can include a valve assembly including a first valve and a second valve in fluid communication with the first valve. The valve assembly can be configured to deliver one or more of a sample, a chemical (e.g., an acid, a base, an organic chemical, etc.), and a standard via flow of a working fluid facilitated by one or more syringe pumps. Further, the one or more of the sample, the chemical, and the standard can maintain a physical separation from the one or more syringe pumps during delivery of the one or more of the sample, the chemical, and the standard.
F17D 3/01 - Arrangements for supervising or controlling working operations for controlling, signalling, or supervising the conveyance of a product
B01D 15/36 - Selective adsorption, e.g. chromatography characterised by the separation mechanism involving ionic interaction, e.g. ion-exchange, ion-pair, ion-suppression or ion-exclusion
F15D 1/06 - Influencing the flow of fluids in pipes or conduits by influencing the boundary layer
An ultrapure water (UPW) generation and verification system can include a cleaning chemical station, a cleanup column, a conductivity verification station, and a holding reservoir, in fluid communication with one another. The cleaning chemical station can be configured to selectably permit a flow of water to pass therethrough to the cleanup column or to block the flow of water and instead deliver a cleaning chemical to the cleanup column. The conductivity verification station can be configured to selectably perform at least one of the following: permit water to flow from the cleanup column to the holding reservoir; direct fluid to waste; or test the conductivity of the water for a purity level.
C02F 1/00 - Treatment of water, waste water, or sewage
C02F 1/42 - Treatment of water, waste water, or sewage by ion-exchange
G01N 27/06 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a liquid
Systems and methods for automatic sampling of a sample for the determination of chemical element concentrations and control of semiconductor processes are described. A system embodiment includes a remote sampling system configured to collect a sample of phosphoric acid at a first location, the remote sampling system including a remote valve having a holding loop coupled thereto; and an analysis system configured for positioning at a second location remote from the first location, the analysis system coupled to the remote valve via a transfer line, the analysis system including an analysis device configured to determine a concentration of one or more components of the sample of phosphoric acid and including a sample pump at the second location configured to introduce the sample from the holding loop into the transfer line for analysis by the analysis device.
A sample introduction system provides mixing of a sample and a diluent within the container via gas injection. In one or more implementations, the sample introduction system causes a probe of an autosampler to be inserted into a container containing a sample and a diluent so that an end of the probe is submerged beneath a surface of the diluent and the sample. Gas is then injected through the probe to mix the sample and the diluent within the container. An aliquot of the mixed sample and diluent is then withdrawn through the probe.
B01F 13/02 - Mixers with gas agitation, e.g. with air supply tubes
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods for automatic preconcentration of fluid samples using alternating dual holding loops are described. A system embodiment includes, but is not limited to, a first sample loop and a second sample loop alternately fluidically coupled with a sample source; a first valve to alternately introduce fluid from the sample source to the first sample loop and the second sample loop; a second valve to alternately receive fluid from the first sample loop and the second sample loop and to alternately provide access to the preconcentration column to fluid received from the first sample loop and the second sample loop; and a pump system configured to alternately introduce sample held in the first sample loop and sample held in the second sample loop to the preconcentration column via the first valve and the second valve.
A capillary tube holder is provided for holding a capillary tube. The capillary tube holder includes a holder insert and a holder base. The holder insert includes a capillary groove configured for receiving the capillary tube. The holder base is configured for slidably receiving and retaining the holder insert therein.
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