Systems and methods for providing multiple lumens within a single sample probe of an autosampler system are described. In an aspect, a sample probe for an autosampler system includes, but is not limited to, a tube enclosing at least a portion of a plurality of lumens; and a controller communicatively coupled with a fluid handling system to introduce or draw one or more fluids through each of the plurality of lumens, wherein during a droplet purge operation, the controller is configured to expel a gas from a tip of one of the lumens to purge a droplet of fluid from the tip.
Systems and methods are described to concentrate and homogenize a remote sample for analysis. A sample concentration and homogenization system embodiment includes, but is not limited to, at least a first valve, at least a first column fluidically coupled to the first valve, a flow meter fluidically coupled with the first column when the first valve is in a first flow path configuration to measure an amount of the liquid sample passed through the first column, and a homogenization valve including a sample homogenizing loop in which the concentrated sample is homogenized.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for transporting sample using a first vacuum configuration and subsequently isolating the sample at a valve prior to introduction to an analysis system, where a second vacuum configuration transports other fluids through the system. A system embodiment can include, but is not limited to, a valve system including a first valve in fluid communication with a sample reservoir and a second valve having at least a first vacuum configuration to fluidically couple a first vacuum line with the first valve and having a second vacuum configuration to fluidically couple a second vacuum line with the first valve; a sensor system configured to detect presence or absence of a fluid at the first valve; and a controller configured to control operation of the second valve to block access of the first vacuum line to the first valve upon detection of the fluid at the first valve.
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
G01N 1/20 - Devices for withdrawing samples in the liquid or fluent state for flowing or falling materials
4.
Systems and methods for automatic adjustment of mixed gas flow for an injector coordinated with the acquistion of particular groups of chemical elements for analysis
Systems and methods are described for automatically adjusting the composition of a spray chamber matrix gas flow coordinated with an analysis of a particular chemical element or groups of elements. A system can include a spray chamber configured to be coupled to an analytical system, the spray chamber having a nebulizer gas port configured to receive a nebulizer gas; and an inlet for receiving a gas from at least one gas source. The system also includes a controller operably coupled to the spray chamber, the controller configured to adjust a gas flow rate of the gas from the at least one gas source in coordination with analysis of a particular chemical element by the analytical system.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 30/04 - Preparation or injection of sample to be analysed
H01J 49/00 - Particle spectrometers or separator tubes
Systems and methods are described for preventing the release of metal particles from an autosampler that could otherwise be detected within a sample during sample analysis. In an example implementation, an autosampler systems includes, but is not limited to, a sample probe support structure; a z-axis support; an outer shuttle coupled with an outer surface of the z-axis support; and an inner shuttle linearly moveable within an interior volume of the z-axis support, the inner shuttle magnetically coupled with the outer shuttle to translate linear motion of the inner shuttle to the outer shuttle.
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
7.
AUTOMATED INLINE NANOPARTICLE STANDARD MATERIAL ADDITION
Systems and methods for automated handling and maintaining nanoparticle standard solutions in a substantially homogenous state with controlled introduction to a fluid sample are described. A system embodiment includes, but is not limited to, an agitator configured to mix a nanoparticle standard solution in a container to provide a mixed nanoparticle standard having a substantially homogenous distribution of nanoparticles; and a fluid preparation system fluidically coupled with the container to receive the mixed nanoparticle standard and direct the mixed nanoparticle standard to a fluid sample stream for inline mixing therewith.
Systems and methods for automated handling and maintaining nanoparticle standard solutions in a substantially homogenous state with controlled introduction to a fluid sample are described. A system embodiment includes, but is not limited to, an agitator configured to mix a nanoparticle standard solution in a container to provide a mixed nanoparticle standard having a substantially homogenous distribution of nanoparticles; and a fluid preparation system fluidically coupled with the container to receive the mixed nanoparticle standard and direct the mixed nanoparticle standard to a fluid sample stream for inline mixing therewith.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
9.
SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTING WAFER
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
10.
AUTOMATIC SAMPLING OF HOT PHOSPHORIC ACID FOR THE DETERMINATION OF CHEMICAL ELEMENT CONCENTRATIONS AND CONTROL OF SEMICONDUCTOR PROCESSES
Systems and methods for automatic sampling of a sample for the determination of chemical element concentrations and control of semiconductor processes are described. A system embodiment includes a remote sampling system configured to collect a sample of phosphoric acid at a first location, the remote sampling system including a remote valve having a holding loop coupled thereto; and an analysis system configured for positioning at a second location remote from the first location, the analysis system coupled to the remote valve via a transfer line, the analysis system including an analysis device configured to determine a concentration of one or more components of the sample of phosphoric acid and including a sample pump at the second location configured to introduce the sample from the holding loop into the transfer line for analysis by the analysis device.
A sample analysis system is available that can include a remote sampling system, at least one analyzer, and a controller. The remote sampling system can include a plurality of sample sources for providing a corresponding sample therefrom; and a plurality of sample collection devices selectively coupled to any of the plurality of sample sources for receiving at least one of the samples therefrom. The at least one analyzer can be coupled to the plurality of the sample collection devices for receiving at least one of the samples therefrom. The controller can be coupled with the remote sampling system and the at least one analyzer, the controller configured to control which of the sample sources is actively coupled to a given sample collection device at a given time.
A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
Systems and methods are described for isolating a sample at a valve prior to introduction to an analysis system, such as sample analysis via ICP-MS. A system embodiment can include, but is not limited to, a valve system including a first valve in fluid communication with a sample reservoir and a second valve configured to permit and block access of a vacuum source to the first valve; a sensor system configured to detect presence or absence of a fluid at the first valve; and a controller configured to control operation of the second valve to block access of the vacuum source to the first valve upon detection of the fluid at the first valve to isolate the fluid within the sample reservoir.
Systems and methods are described for automatically utilizing multiple data processing methods on a given spectrometry dataset for the determination of nanoparticle detection factors including nanoparticle baseline and detection threshold.
Systems and methods are described for analyzing local minimum data from spectrometry data for the determination of nanoparticle detection thresholds are described. In aspects, a histogram of the spectrometry' data is used to search for potential local minimum values, which are subsequently validated to establish a nanoparticle detection threshold for the spectrometry' data, with ion intensity' values less than the nanoparticle detection threshold being attributable to signal background.
Systems and methods are described for automatically utilizing multiple data processing methods on a given spectrometry dataset for the determination of nanoparticle detection factors including nanoparticle baseline and detection threshold.
Systems and methods for iterative removal of outlier data from spectrometry data to determine one or more of a particle baseline and a detection threshold for nanoparticles are described. Ion signal intensity values that exceed an outlier threshold value associated with a sum of a first multiple of an average of the count distribution of ion signal intensity and a first multiple of a standard deviation of the count distribution of ion signal intensity are iteratively removed from the raw data set until no outliers remain, providing a background data set. A nanoparticle baseline intensity value is set as a sum of a second multiple of an average of the background data set and a second multiple of a standard deviation of the background data set to differentiate between signal intensity values that are associated with background interference and that are associated with the presence of nanoparticles in the sample.
Systems and methods are described for analyzing local minimum data from spectrometry data for the determination of nanoparticle detection thresholds are described. In aspects, a histogram of the spectrometry data is used to search for potential local minimum values, which are subsequently validated to establish a nanoparticle detection threshold for the spectrometry data, with ion intensity values less than the nanoparticle detection threshold being attributable to signal background.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
22.
NANOPARTICLE BASELINE AND PARTICLE DETECTION THRESHOLD DETERMINATION THROUGH ITERATIVE OUTLIER REMOVAL
Systems and methods for iterative removal of outlier data from spectrometry data to determine one or more of a. particle baseline and a detection threshold for nanoparticles are described. Ion signal intensity values that exceed an outlier threshold value associated with a sum of a first multiple of an average of the count distribution of ion signal intensity and a first multiple of a standard deviation of the count distribution of ion signal intensity are iteratively removed from the raw data set until no outliers remain, providing a background data set. A nanoparticle baseline intensity value is set as a sum of a second multiple of an average of the background data set and a second multiple of a standard deviation of the background data set to differentiate between signal intensity values that are associated with background interference and that are associated with the presence of nanoparticles in the sample.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
09 - Scientific and electric apparatus and instruments
Goods & Services
Scientific equipment for use in induced coupled plasma systems and mass spectrometers; Scientific equipment for use in induced coupled plasma systems and mass spectrometers for the purpose of hydride analysis and separation; Chemical and biological analytical equipment, namely, automated sample analysis systems; Chemical and biological analytical equipment, namely, automated sample analysis systems for hydride analysis and separation; Chemical and biological analytical equipment, namely, automated sample analysis systems for hydride analysis and separation for induced coupled plasma systems; Chemical and biological analytical equipment, namely, automated sample analysis systems for hydride analysis and separation for mass spectrometers; Laboratory instruments, namely, sample analysis apparatus; Laboratory instruments, namely, automated sample analysis apparatus for hydride analysis and separation; Laboratory instruments, namely, automated sample analysis apparatus for hydride analysis and separation for induced plasma coupled systems; Laboratory instruments, namely, automated sample analysis apparatus for hydride analysis and separation for mass spectrometers
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample dilution systems; Chemical and biological analytical equipment, namely, automated sample dilution systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample rinse systems; Chemical and biological analytical equipment, namely, automated sample rinse systems for mass spectrometer systems; Laboratory instruments, namely, autosamplers and automated sample processing apparatus; Laboratory instruments, namely, autosamplers and automated sample processing apparatus for mass spectrometer systems; Laboratory instruments, namely, automated sample dilution systems; Laboratory instruments, namely, automated sample dilution systems for mass spectrometer systems; Laboratory instruments, namely, automated sample rinse systems; Laboratory instruments, namely, automated sample rinse systems for mass spectrometer systems; Scientific research equipment for use in mass spectrometers for the purpose of sample introduction; Computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications; Computer software for use with measuring chemical, biological, and analytical information in data acquisition applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample dilution systems; Chemical and biological analytical equipment, namely, automated sample dilution systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample rinse and autocorrecting systems; Chemical and biological analytical equipment, namely, automated sample rinse and autocorrrecting systems for mass spectrometer systems; Laboratory instruments, namely, autosamplers and automated sample processing apparatus; Laboratory instruments, namely, autosamplers and automated sample processing apparatus for mass spectrometer systems; Laboratory instruments, namely, automated sample dilution systems; Laboratory instruments, namely, automated sample dilution systems for mass spectrometer systems; Laboratory instruments, namely, automated sample rinse and autocorrecting systems; Laboratory instruments, namely, automated sample rinse and autocorrecting systems for mass spectrometer systems; Scientific research equipment for use in mass spectrometers for the purpose of sample introduction; Computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications; Computer software for use with measuring chemical, biological, and analytical information in data acquisition applications
26.
MEMBRANE-BASED PURGE GAS AND SAMPLE TRANSFER FOR LASER ABLATION SAMPLE PROCESSING
Systems and methods are described for transferring gas from an ablation cell to an inductively coupled plasma, analysis system via. a gas exchange membrane transfer line to exchange gas introduced to the ablation cell with a sweep gas. A system embodiment includes, but is not limited to, a laser ablation cell configured to generate a sample transfer stream through laser ablation of a sample and introduction of a carrier gas to flow the ablated sample from the laser ablation cell; an inductively-coupled plasma analysis device configured to measure one or more analytes in the sample transfer stream; and a gas exchange membrane transfer line fluidically coupled between the laser ablation cell and the inductively-coupled plasma analysis device, the gas exchange membrane transfer line configured, to replace gas in the sample transfer stream with sweep gas via gas exchange across a membrane of the gas exchange membrane transfer line.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for controlling flow of a purge gas introduced to an ablation cell between samples to remove atmospheric gas. A system embodiment includes, but is not limited, to, a. spray chamber including a spray chamber body, a. transfer gas inlet configured to receive gas from a laser ablation sample cell, a first outlet line configured to transfer gas from the spray chamber to an inductively-coupled plasma torch, and a second outlet line coupled, to the spray chamber body, the second gas outlet having a larger internal cross- sectional area, than an internal cross-sectional area of the first outlet line; and a valve fluidically coupled to the second outlet line, the valve configured to transition between at least an open configuration configured to permit transfer gas through the second outlet line and a closed configuration configured to prevent transfer of gas through the second outlet line.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for controlling flow of a purge gas introduced to an ablation cell between samples to remove atmospheric gas. A system embodiment includes, but is not limited to, a spray chamber including a spray chamber body, a transfer gas inlet configured to receive gas from a laser ablation sample cell, a first outlet line configured to transfer gas from the spray chamber to an inductively-coupled plasma torch, and a second outlet line coupled to the spray chamber body, the second gas outlet having a larger internal cross-sectional area than an internal cross-sectional area of the first outlet line; and a valve fluidically coupled to the second outlet line, the valve configured to transition between at least an open configuration configured to permit transfer gas through the second outlet line and a closed configuration configured to prevent transfer of gas through the second outlet line.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
29.
MEMBRANE-BASED PURGE GAS AND SAMPLE TRANSFER FOR LASER ABLATION SAMPLE PROCESSING
Systems and methods are described for transferring gas from an ablation cell to an inductively coupled plasma analysis system via a gas exchange membrane transfer line to exchange gas introduced to the ablation cell with a sweep gas. A system embodiment includes, but is not limited to, a laser ablation cell configured to generate a sample transfer stream through laser ablation of a sample and introduction of a carrier gas to flow the ablated sample from the laser ablation cell; an inductively-coupled plasma analysis device configured to measure one or more analytes in the sample transfer stream; and a gas exchange membrane transfer line fluidically coupled between the laser ablation cell and the inductively-coupled plasma analysis device, the gas exchange membrane transfer line configured to replace gas in the sample transfer stream with sweep gas via gas exchange across a membrane of the gas exchange membrane transfer line.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
An analysis system includes a degassing cell, at least one first valve, and at least one second valve. The at least one first valve is fluidly coupled with a top of the degassing cell, the at least one first valve configured selectably connect the degassing cell to a displacement gas flow and to a vacuum source. The at least one second valve is fluidly connected with a lateral side of the degassing cell and separately fluidly connected with a bottom of the degassing cell. The at least one second valve is selectably coupled with any of a source of a sample-carrying fluid, a transfer line configured to deliver a sample to an analysis device, or a waste output.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
09 - Scientific and electric apparatus and instruments
Goods & Services
Class 009: Chemical and biological analytical equipment, namely, automated sample introduction systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for online analysis and online monitoring for organic contaminants; Laboratory instruments, namely, autosamplers and automated sample processing apparatus; Laboratory instruments, namely, autosamplers and automated sample processing apparatus for mass spectrometer systems; Laboratory instruments, namely, autosamplers and automated sample processing apparatus for online analysis and online monitoring for organic contaminants; Computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications; Computer software for use with measuring chemical, biological, and analytical information in data acquisition applications; Computer software for online analysis and online monitoring in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Class 009: Chemical and biological analytical equipment, namely, automated sample introduction systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for online analysis and online monitoring for nanoparticles and total metals; Laboratory instruments, namely, autosamplers and automated sample processing apparatus; Laboratory instruments, namely, autosamplers and automated sample processing apparatus for mass spectrometer systems; Laboratory instruments, namely, autosamplers and automated sample processing apparatus for online analysis and online monitoring for nanoparticles and total metals; Computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications; Computer software for use with measuring chemical, biological, and analytical information in data acquisition applications; Computer software for online analysis and online monitoring in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Cleaning system for nebulizers for scientific use; Desolvating nebulizer system for scientific use; Cleaning system for Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Sample introduction system for nebulizers for scientific use; Desolvating nebulizer system for scientific use; Sample introduction system for Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Nebulizers for scientific use; Sample introduction system for nebulizers for scientific use; Cleaning system for nebulizers for scientific use; Desolvating nebulizer system for scientific use; Cleaning system for Desolvating nebulizer system for scientific use; Sample introduction system for Desolvating nebulizer system for scientific use; Nebulizer parts for scientific use with argon nebulizer gas humidifiers; Nebulizer parts for scientific use with nitrogen nebulizer gas humidifiers; Nebulizer for use with humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma mass spectrometry system; Nebulizer for use with argon nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; Nebulizer for use with nitrogen nebulizer gas humidifiers for scientific use, namely, analysis of a sample in an induced coupled plasma optical emission spectometry system; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for use in mass spectrometers; scientific research equipment for use in mass spectrometers for the purpose of sample introduction; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in data acquisition applications; laboratory equipment, namely, automated sampling introduction devices for the analysis of soil
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; laboratory instruments, namely, autosamplers and automated sample processing apparatus; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems; computer software for measuring and dispensing chemical and biological samples in analysis applications; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; laboratory instruments, namely, autosamplers and automated sample processing apparatus; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; Chemical and biological analytical equipment, namely, automated sample introduction systems for use in mass spectrometers; scientific research equipment for use in mass spectrometers for the purpose of sample introduction; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in data acquisition applications; laboratory equipment, namely, automated sampling introduction devices for analysis
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, mass spectrometers; scientific research equipment for use in mass spectrometers for the purpose of sample introduction; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in data acquisition applications; scientific apparatus, namely, mass spectrometers and parts and fittings therefor; laboratory equipment, namely, automated sampling introduction devices for the analysis of radium
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; laboratory instruments, namely, autosamplers and automated sample processing apparatus; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems; Chemical and biological analytical equipment, namely, automated sample dilution systems; laboratory instruments, namely, autosamplers and automated sample processing apparatus; Chemical and biological analytical equipment, namely, automated sample dilution systems for mass spectrometer systems
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; laboratory instruments, namely, autosamplers and automated sample processing apparatus; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, automated sample introduction systems; laboratory instruments, namely, autosamplers and automated sample processing apparatus; Chemical and biological analytical equipment, namely, automated sample introduction systems for mass spectrometer systems
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, mass spectrometers; scientific research equipment for use in mass spectrometers for the purpose of sample introduction; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in data acquisition applications; scientific apparatus, namely, mass spectrometers and parts and fittings therefor; laboratory equipment, namely, automated sampling introduction devices for the analysis of seawater and other high matrix systems
09 - Scientific and electric apparatus and instruments
Goods & Services
Chemical and biological analytical equipment, namely, inductively coupled plasma optical emission spectroscopy; scientific research equipment for use in inductively coupled plasma optical emission spectroscopy for the purpose of sample introduction; computer software for generating graphs in connection with measuring chemical, biological, and analytical information in analysis applications; scientific apparatus, namely, inductively coupled plasma optical emission spectroscopy and parts and fittings therefor; laboratory equipment, namely, automated sampling introduction devices for the analysis of brine and other high matrix systems
51.
SYSTEM FOR PRIORITIZATION OF COLLECTING AND ANALYZING LIQUID SAMPLES
Systems and methods are described to determine a prioritization schedule for samples handled by a system with multiple remote sampling systems. A system embodiment includes, but is not limited to, an analysis system at a first location; one or more remote sampling systems at remote from the first location, the one or more remote sampling systems configured to receive a liquid segment and transfer a liquid sample to the analysis system via a transfer line; and a controller communicatively coupled with the analysis system and the one or more remote sampling systems, the controller configured to assign a priority value to a sample for analysis by the analysis system and to manage a queue of samples received from at the one or more remote sampling systems on the basis of the assigned priority value.
Systems and methods for safe collection and transportation of fluid samples for analysis are described. A system embodiment includes, but is not limited to, a housing defining an interior region to introduce a fluid sample to a sample vessel; a support platform to hold the sample vessel and laterally position the sample vessel to a plurality of locations within the interior region; an uncapper configured to automatically remove a cap of the sample vessel from a base of the sample vessel prior to introduction of the fluid sample to the base and to automatically replace the cap to the vessel base subsequent to introduction of the fluid sample to the base; and. a. fluid sample probe configured to fluidically couple with a. fluid sample source and to dispense fluid from the fluid sample source into the vessel base.
Rotary valve systems with integrated sensors are described that facilitate stabilizing electrical connection from a valve actuator. A valve system includes a rotary valve comprising one or more ports configured to receive one or more fluids. The valve system further includes an actuator attached to the rotary valve, wherein the actuator comprises a power connection fed from electronics associated with the actuator. The valve system further includes an actuator cap attached to the actuator, the actuator cap configured to allow the power connection to pass through, wherein the actuator cap comprises one or more apertures, a valve collar with an integrated press-on connector configured to be attached to the actuator cap, wherein the valve collar comprises an electronic feedthrough passage for the power connection, a retainer portion comprising one or more retainer pins, wherein the one or more retainer pins are configured to mate with the one or more apertures on the actuator cap, the retainer portion configured to allow electrical connection between the power connector and a sensor connector when the one or more retainer pins fit within the one or more apertures on the actuator cap, and a sensor housing adjacent to the rotary valve and configured to support one or more sensors disposed with respect to one or more fluid lines coupled to the one or more ports of the rotary valve, the sensor connector configured to transmit signals from the one or more sensors to the actuator.
F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
F16K 11/074 - Multiple-way valves, e.g. mixing valves; Pipe fittings incorporating such valves; Arrangement of valves and flow lines specially adapted for mixing fluid with all movable sealing faces moving as one unit comprising only sliding valves with pivoted closure members with flat sealing faces
54.
Spray chamber having dual input ports for impingement gas and sensitivity enhancement gas addition
Systems and methods are described for introducing an impingement gas and an enhancement gas to an aerosolized sample within a spray chamber. A system embodiment includes, but is not limited to, a chamber body; an input port coupled to the chamber body, the input port configured to receive an aerosolized sample and direct the aerosolized sample into the chamber body; an exit port coupled to the chamber body, the exit port configured to receive at least a portion of the aerosolized sample from the chamber body; an impingement gas port coupled to the exit port and configured to introduce an impingement gas to the at least a portion of the aerosolized sample; and an enhancement gas port coupled to the exit port configured to introduce an enhancement gas to the exit port.
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
Valve assemblies are described that provide magnetic coupling between a valve actuator and a valve body housing the valve rotor and stator. A valve assembly embodiment, includes, but is not limited to, a valve body, the valve body including at least one magnet, and a rotor and a stator configured to define a plurality of fluid flow passageways; a valve actuator configured to drive the rotor via a drive shaft; and an actuator mount coupled to the valve actuator and configured to magnetically couple with the at least one magnet of the valve body to magnetically couple the valve body and the valve actuator.
F16K 31/06 - Operating means; Releasing devices magnetic using a magnet
F16K 31/08 - Operating means; Releasing devices magnetic using a magnet using a permanent magnet
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Valve assemblies are described that provide magnetic coupling between a valve actuator and a valve body housing the valve rotor and stator. A valve assembly embodiment, includes, but is not limited to, a valve body, the valve body including at least one magnet, and a rotor and a stator configured to define a plurality of fluid flow passageways; a valve actuator configured to drive the rotor via a drive shaft: and an actuator mount coupled to the valve actuator and configured, to magnetically couple with the at least one magnet of the valve body to magnetically couple the valve body and the valve actuator.
Systems and methods are described to maintain a liquid sample segment of a sample transmitted through a transfer line from a remote sampling to an analysis system. A system embodiment includes, but is not limited to, a sample transfer line configured to transport a liquid sample from a remote sampling system via gas pressure; a sample loop fluidically coupled with the sample transfer line, the sample loop configured to hold a sample fluid; and a backpressure chamber fluidically coupled with a gas pressure source and with the sample transfer line, the backpressure chamber configured to supply a backpressure against the liquid sample during transport through the sample transfer line.
Systems and methods are described for determining whether liquid remains on a wafer surface following a scanning operation. A system embodiment includes, but is not limited to, a first system configured for positioning adjacent a transfer line coupled with a scanning nozzle to dispense fluid onto a wafer surface and to recover the fluid from the wafer surface, the first system configured to detect a gas/liquid transition of the fluid and determine a volume of liquid sample dispensed; a second system configured for positioning adjacent a second line downstream from the scanning nozzle, the second system configured to detect a gas/liquid transition of fluid flowing through the second line and determine a volume of liquid sample recovered from the wafer surface; and a controller configured to generate an alert if the volume of liquid sample recovered is not within a threshold amount compared to the volume of liquid sample dispensed.
Systems and methods are described for determining whether liquid remains on a wafer surface following a scanning operation. A system embodiment includes, but is not limited to, a first system configured for positioning adjacent a transfer line coupled with a scanning nozzle to dispense fluid onto a wafer surface and. to recover the fluid from the wafer surface, the first system configured to detect a gas/liquid transition of the fluid and determine a volume of liquid sample dispensed; a second system configured for positioning adjacent a second line downstream from the scanning nozzle, the second system configured to detect a gas/liquid transition of fluid flowing through the second line and determine a volume of liquid sample recovered from the wafer surface; and a controller configured to generate an alert if the volume of liquid sample recovered is not within a threshold amount compared to the volume of liquid sample dispensed.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods for automated cap removal with an autosampler system are described. In an aspect, an autosampler system includes, but is not limited to, a sample rack; a sample vessel stabilizer configured to transition the sample rack between a load/ unload state and a lock state: an uncapper supported by a first z-axis support: and a sample probe supported by a second z-axis support, wherein the uncapper is configured to remove a cap from a sample vessel held by the sample rack when the sample rack is in the lock state, and wherein the uncapper is configured to change the position of the removed cap to permit access to an interior of the sample vessel by the sample probe without removing the sample vessel from the sample rack.
Systems and methods for automated cap removal with an autosampler system are described. In an aspect, an autosampler system includes, but is not limited to, a sample rack; a sample vessel stabilizer configured to transition the sample rack between a load/unload state and a lock state; an uncapper supported by a first z-axis support; and a sample probe supported by a second z-axis support, wherein the uncapper is configured to remove a cap from a sample vessel held by the sample rack when the sample rack is in the lock state, and wherein the uncapper is configured to change the position of the removed cap to permit access to an interior of the sample vessel by the sample probe without removing the sample vessel from the sample rack.
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
63.
Valve having integrated sensor and stabilized electrical connection
Rotary valve systems with integrated sensors are described that facilitate stabilizing electrical connection from a valve actuator. A valve system embodiment includes, but is not limited to, a multi-port rotary valve; an actuator attached to the multi-port rotary valve, wherein the actuator comprises a power connection fed from electronics associated with the actuator; an actuator cap attached to the actuator, the actuator cap configured to allow the power connection to pass through; a valve collar with an integrated press-on connector, wherein the valve collar comprises an electronic feedthrough passage for the power connection; and a retainer portion comprising two retainer pins, wherein the two retainer pins are configured to mate with apertures on the actuator cap, the retainer portion configured to allow electrical connection between the power connector and a sensor connector when the two retainer pins fit within the two apertures on the actuator cap.
F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
F16K 11/074 - Multiple-way valves, e.g. mixing valves; Pipe fittings incorporating such valves; Arrangement of valves and flow lines specially adapted for mixing fluid with all movable sealing faces moving as one unit comprising only sliding valves with pivoted closure members with flat sealing faces
64.
Systems and methods for indirect detection of a missed sample
Systems and methods are described for indirect detection of a missed sample from an autosampler. A method embodiment includes, but is not limited to, drawing a fluid through operation of an autosampler; directing the fluid via a fluid line to a valve of a fluid handling system, the valve including or being adjacent to a sensor to detect a presence or absence of liquid sample; directing the fluid from the valve into a holding line coupled to the valve; determining whether a threshold amount of liquid sample is present in the fluid in the holding line; and when it is determined that liquid sample is present in the fluid in the holding line in an amount less than the threshold amount, transferring a carrier fluid having a marker component to an analytic detector, the marker component present in the carrier fluid in an amount indicative of a missed sample.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
A cap assembly includes a base cap, a chemical resistant sheet, and a closure assembly. The closure assembly is configured for carrying the chemical resistant sheet. The closure assembly is mounted in the base cap. The base cap and the closure assembly together define a central cap assembly aperture therethrough.
An inductively coupled plasma (ICP) torch is described that facilitates laminar flow of a cooling gas introduced by a plurality of input ports between an outer tube and an inner tube configured to surround an injector for introduction of an aerosolized sample to a plasma. A system embodiment includes, but is not limited to, an inner tube; and an outer tube surrounding at least a portion of the inner tube to form an annular space, the outer tube defining a plurality of inlet ports for introduction of a cooling gas into the annular space as a laminar flow via each inlet port of the plurality of inlet ports.
An inductively coupled plasma (TCP) torch is described that includes an injector protector to shield an injector end. A system embodiment includes, but is not limited to, a tabular sample injector configured to receive an aerosolized sample in an interior defined by walls of the tubular sample injector; an injector protector surrounding at least a portion of the tabular sample injector; an inner tube surrounding at least a portion of the injector protector to form a first annular space between the inner tube and the injector protector, the inner tube defining at least one inlet port for introduction of an auxiliary gas into the first annular space; and an outer tube surrounding at least a portion of the inner tube to form a second annular space, the outer tube defining at least one inlet port for introduction of a cooling gas into the second annular space.
An inductively coupled plasma (ICP) torch is described that includes a tapered outer end. A system embodiment includes, but is not limited to, a tubular sample injector configured to receive an aerosolized sample in an interior defined by walls of the tubular sample injector; an inner tube surrounding at least a portion of the tubular sample injector to form a first annular space between the inner tube and the walls of the tubular sample injector, the inner tube defining at least one inlet port for introduction of an auxiliary gas into the first annular space; and an outer tube surrounding at least a. portion of the inner tube to form a. second annular space, the outer tube defining at least one inlet port for introduction of a cooling gas into the second, annular space, the outer tube having a flared region at an outlet of the outer tube.
An inductively coupled plasma (ICP) torch is described that includes an injector protector to shield an injector end. A system embodiment includes, but is not limited to, a tubular sample injector configured to receive an aerosolized sample in an interior defined by walls of the tubular sample injector; an injector protector surrounding at least a portion of the tubular sample injector; an inner tube surrounding at least a portion of the injector protector to form a first annular space between the inner tube and the injector protector, the inner tube defining at least one inlet port for introduction of an auxiliary gas into the first annular space; and an outer tube surrounding at least a portion of the inner tube to form a second annular space, the outer tube defining at least one inlet port for introduction of a cooling gas into the second annular space.
H05H 1/22 - Arrangements for confining plasma by electric or magnetic fields; Arrangements for heating plasma for injection heating
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H05H 1/30 - Plasma torches using applied electromagnetic fields, e.g. high-frequency or microwave energy
H05H 1/34 - Plasma torches using an arc - Details, e.g. electrodes, nozzles
70.
INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH FLARED OUTLET
An inductively coupled plasma (ICP) torch is described that includes a tapered outer end. A system embodiment includes, but is not limited to, a tubular sample injector configured to receive an aerosolized sample in an interior defined by walls of the tubular sample injector; an inner tube surrounding at least a portion of the tubular sample injector to form a first annular space between the inner tube and the walls of the tubular sample injector, the inner tube defining at least one inlet port for introduction of an auxiliary gas into the first annular space; and an outer tube surrounding at least a portion of the inner tube to form a second annular space, the outer tube defining at least one inlet port for introduction of a cooling gas into the second annular space, the outer tube having a flared region at an outlet of the outer tube.
An analysis system includes a degassing cell, at least one first valve, and at least one second valve. The at least one first valve is fluidly coupled with a top of the degassing cell, the at least one first valve configured selectably connect the degassing cell to a displacement gas flow and to a vacuum source. The at least one second valve is fluidly connected with a lateral side of the degassing cell and separately fluidly connected with a bottom of the degassing cell. The at least one second valve is selectably coupled with any of a source of a sample-carrying fluid, a transfer line configured to deliver a sample to an analysis device, or a waste output.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods for automatic preparation of samples through evaporative sampling for subsequent analysis are described. A system embodiment includes, but is not limited to, a sample source configured to supply a sample; an evaporation container fluidically coupled with the sample source to receive the sample; a temperature control element operably coupled with the evaporation container to vaporize a liquid portion of the sample within the evaporation container, the evaporation container fluidically coupled with a gas input to receive a gas to transport vapor from the evaporation container; and a cooling system configured to receive the vapor from the evaporation container and to condense the vapor for collection.
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
G01N 21/85 - Investigating moving fluids or granular solids
G01N 1/22 - Devices for withdrawing samples in the gaseous state
An autosampler system can include a z-axis mount, a carriage, an autosampler arm, and a compression nut. The carriage can be axially positioned on the z-axis mount. The autosampler arm can define an arm extension and an autosampler arm mount. The autosampler arm mount can define an arm mount aperture, an arm mount inner ledge, and an arm mount compressible section, the arm mount aperture configured to receive the z-axis mount and the carriage therethrough. The arm mount inner ledge can extend from an interior of the arm mount aperture, with the arm mount inner ledge configured to receive the z-axis mount therethrough and be supported on the carriage. The arm mount compressible section can define a set of compressible section threading and at least one compressible section slot. The compression nut can be affixed to the arm mount compressible section via the set of compressible section threading.
Systems and methods are described to determine whether a sample transmitted through a transfer line from a remote sampling system contains a suitable sample to analyze by an analysis system. A system embodiment includes, but is not limited to, a sample receiving line configured to receive a liquid segment a first detector configured to detect the liquid segment at a first location in the sample receiving line; a second detector configured to detect the liquid segment at a second location in the sample receiving line downstream from the first location; and a controller configured to register a continuous liquid segment in the sample receiving line when the first detector and the second detector match detection states prior to the controller registering a change of state of the first detector.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
Sample preparation systems and methods are described having pump control, valve configurations, and control logic that facilitate automatic, inline preparation dilutions of a sample according to at least two dilution operating modes. A system embodiment includes, but is not limited to a first pump configured to drive a carrier fluid; a second pump configured to drive a diluent; and a plurality of selection valves fluidically coupled with the first pump and the second pump, the plurality of selection valves being configured to direct fluid flows from the first pump and the second pump according to at least two modes of operation to provide a single-stage sample dilution according to a first operating mode and to provide a dual-stage sample dilution according to a second operating mode.
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
76.
Autosampler arm with automated pipet securing and unsecuring
A fluid handling assembly for selectively coupling and decoupling with a pipet tip can include a sampling arm, an arm cover, a probe carrier unit, a probe, and a biasing spring. The arm cover can be carried by the sampling arm. The probe carrier unit can be movably mounted within the arm cover, with the probe carrier unit including a probe release structure and a main probe carrier. The probe release structure and the main probe carrier can be interconnected. The probe can be carried by the main probe carrier and movable through a probe opening in the arm cover. The probe can be configured to releasably carry a pipet tip. The biasing spring can be carried within the arm cover and can contact the probe release structure. The biasing spring can bias the probe release structure to push the probe down toward the probe opening in the arm cover.
Systems and methods are described to concentrate and homogenize a remote sample for analysis. A sample concentration and homogenization system embodiment includes, but is not limited to, at least a first valve, at least a first column fluidically coupled to the first valve, a flow meter fluidically coupled with the first column when the first valve is in a first flow path configuration to measure an amount of the liquid sample passed through the first column, and a homogenization valve including a sample homogenizing loop in which the concentrated sample is homogenized.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
The present disclosure is directed to an auto-sampling system with syringe, valve configurations, and control logic that allow automatic, inline matrix matching of calibration standards to samples. In implementations, this can be accomplished with three independent syringes connected to a valve system to dynamically introduce a carrier, diluent, and ultrapure stock matrix flows for each blank, standard, or sample.
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
A sample agitation system for an automated sampling device is described. In an example implementation, the sample agitation system includes a sample probe configured to contact a sample positioned within a sample vessel. Further, the sample agitation system includes an actuator coupled to the sample probe that is configured to stir the sample positioned within the sample vessel in one or more rotational directions. The directions may include, but are not limited to, clockwise motion, anti-clockwise motion, or the like. In some implementations, a sample probe support arm can be coupled to the sample probe and/or the actuator. The actuator can move the sample probe support arm in a translational, a rotational, and/or a vertical direction to rotate the sample probe and stir the sample.
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
B01F 27/90 - Mixers with rotary stirring devices in fixed receptacles; Kneaders with stirrers rotating about a substantially vertical axis with paddles or arms
B01F 101/23 - Mixing of laboratory samples e.g. in preparation of analysing or testing properties of materials
80.
SHAPED-CHANNEL SCANNING NOZZLE FOR SCANNING OF A MATERIAL SURFACE
Systems and methods are described for introducing one or more fluid streams from a nozzle having one or more shaped channels to one or more material surfaces and removing the fluid streams for scanning for chemical species of interest. A nozzle embodiment includes, but is not limited to, a nozzle body configured to couple to a positionable nozzle arm support for positioning the nozzle with respect to a material surface, the nozzle body defining at least one fluid port to receive a fluid; and a nozzle hood coupled to the nozzle body, the nozzle hood defining an elongated shaped channel having a first fluid channel and a second fluid channel extending from the at least one fluid port, the first fluid channel and the second fluid channel configured to direct fluid along the material surface within at least a portion of each of the fluid channels.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
81.
SHAPED-CHANNEL SCANNING NOZZLE FOR SCANNING OF A MATERIAL SURFACE
Systems and methods are described for introducing one or more fluid streams from a nozzle having one or more shaped channels to one or more material surfaces and removing the fluid streams for scanning for chemical species of interest. A nozzle embodiment includes, but is not limited to, a nozzle body configured to couple to a positionable nozzle arm support for positioning the nozzle with respect to a material surface, the nozzle body defining at least one fluid port to receive a fluid; and a nozzle hood coupled to the nozzle body, the nozzle hood defining an elongated shaped channel having a first fluid channel and a second fluid channel extending from the at least one fluid port, the first fluid channel and the second fluid channel configured to direct fluid along the material surface within at least a portion of each of the fluid channels.
A sample introduction system provides mixing of a sample and a diluent within the container via gas injection. In one or more implementations, the sample introduction system causes a probe of an autosampler to be inserted into a container containing a sample and a diluent so that an end of the probe is submerged beneath a surface of the diluent and the sample. Gas is then injected through the probe to mix the sample and the diluent within the container. An aliquot of the mixed sample and diluent is then withdrawn through the probe.
G01N 1/22 - Devices for withdrawing samples in the gaseous state
B01F 33/40 - Mixers using gas or liquid agitation, e.g. with air supply tubes
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01J 49/00 - Particle spectrometers or separator tubes
G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
84.
Humidification of laser ablated sample for analysis
Humidification systems and methods to introduce water vapor to a laser-ablated sample prior to introduction to an ICP torch are described. A system embodiment includes, but is not limited to, a water vapor generator configured to control production of a water vapor stream and to transfer the water vapor stream to at least one of a sample chamber of a laser ablation device or a mixing chamber in fluid communication with the laser ablation device, wherein the mixing chamber is configured to receive a laser-ablated sample from the laser ablation device and direct the laser-ablated sample to an inductively coupled plasma torch.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
A sample identification system for an automated sampling device is described. A system embodiment includes, but is not limited to, a sample holder having a plurality of apertures configured to receive a plurality of sample vessels therein, the sample holder having one or more corresponding sample holder identifiers positioned proximate to the sample holder; and an identifier capture device configured to detect the one or more sample holder identifiers positioned proximate to the sample holder and generate a data signal in response thereto, the data signal corresponding to at least an orientation of the sample holder relative to a surface on which the sample holder is positioned.
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
B01L 9/02 - Laboratory benches or tables; Fittings therefor
The present disclosure is directed to a system and a method for hydride generation. In some embodiments, the system includes an assembly for introducing hydride generation reagents into a mixing path or mixing container, where the assembly includes first chamber configured to contain a first hydride generation reagent and a second chamber configured to contain a second hydride generation reagent. A first plunger is configured to translate within the first chamber and cause a displacement of the first hydride generation reagent, and a second plunger is configured to translate within the second chamber and cause a displacement of the second hydride generation reagent. The assembly further includes base coupling the first plunger and the second plunger together.
H02P 25/18 - Arrangements or methods for the control of AC motors characterised by the kind of AC motor or by structural details characterised by the circuit arrangement or by the kind of wiring with arrangements for switching the windings, e.g. with mechanical switches or relays
C01B 6/00 - Hydrides of metals; Monoborane or diborane; Addition complexes thereof
H02K 16/04 - Machines with one rotor and two stators
B63H 21/20 - Use of propulsion power plant or units on vessels the vessels being powered by combinations of different types of propulsion units
B63H 23/10 - Transmitting power from propulsion power plant to propulsive elements with mechanical gearing for transmitting drive from more than one propulsion power unit
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H02K 21/02 - Synchronous motors having permanent magnets; Synchronous generators having permanent magnets - Details
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
87.
AUTOSAMPLER SYSTEM WITH AUTOMATED SAMPLE CONTAINER COVER REMOVAL AND SAMPLE PROBE POSITIONING
Systems and methods are described for integrated sample container cover removal and sample probe positioning. In an example implementation, an autosampler system includes, but is not limited to, a z-axis support rotatable about a z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe to withdraw a fluid-containing sample held within a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support with respect to the sample probe support structure, the sample cap remover configured to lift a cap from the sample container to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure.
Systems and methods for heating a spray chamber outlet are described. A system embodiment includes, but is not limited to, a conductive body portion defining an aperture to receive a spray chamber outlet; and an internal cartridge heater coupled to the conductive body portion, the internal cartridge heater configured to regulate a temperature of the conductive body portion to inhibit condensate formation within the spray chamber outlet.
H05B 3/42 - Heating elements having the shape of rods or tubes non-flexible
B05B 7/22 - Spraying apparatus for discharge of liquids or other fluent materials from two or more sources, e.g. of liquid and air, of powder and gas incorporating means for heating the material to be sprayed electrically, e.g. by arc
89.
Abrasive sampling system and method for representative, homogeneous, and planarized preparation of solid samples for laser ablation
Systems and methods are described for providing a representative, homogeneous, and planarized target for solid sample laser ablation. A method embodiment includes, but is not limited to, removing portions of a solid sample with an abrasive sampling system, the abrasive sampling system including at least one of a plurality of abrasive particles configured to hold the portions of the solid sample on an abrasive substrate between the abrasive particles or a texturized surface configured to hold the portions of the solid sample on the texturized surface; transferring the abrasive sampling system holding the portions of the solid sample to a laser ablation system; and ablating the portions of the solid sample held by the abrasive sampling system with the laser ablation system.
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
Systems and methods are described for securing fabric, paper, and film samples for analysis by laser ablation. A method embodiment includes, but is not limited to, securing a thin, solid sample with a sample holder system, the sample holder system configured to hold the thin, solid sample in a taut configuration between a piston and a sample holder base; transferring the sample holder system to a laser ablation system; and ablating at least a portion of the thin, solid sample in the taut configuration with the laser ablation system to provide an ablated sample.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 1/04 - Devices for withdrawing samples in the solid state, e.g. by cutting
91.
ABRASIVE SAMPLING SYSTEM AND METHOD FOR REPRESENTATIVE HOMOGENEOUS, AND PLANARIZED PREPARATION OF SOLID SAMPLES FOR LASER ABLATION
Systems and methods are described for providing a representative, homogeneous, and planarized target for solid sample laser ablation, A method embodiment includes, but is not limited to, removing portions of a solid sample with an abrasive sampling system, the abrasive sampling system including at least one of a plurality of abrasive particles configured to hold tire portions of the solid sample on an abrasive substrate between the abrasive particles or a texturized surface configured to hold the portions of the solid sample on the texturized surface; transferring the abrasive sampling system holding the portions of the solid sample to a laser ablation system; and ablating the portions of the solid sample held by the abrasive sampling system with the laser ablation system.
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
G01N 27/68 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
H01J 49/26 - Mass spectrometers or separator tubes
92.
SYSTEMS AND METHODS FOR SECURING FABRIC, PAPER, AND FILM SAMPLES FOR ANALYSIS BY LASER ABLATION
Systems and methods are described for securing fabric, paper, and film samples for analysis by laser ablation, A method embodiment includes, but is not limited to, securing a thin, solid sample with a sample holder system, the sample holder system configured to hold the thin, solid sample in a taut configuration between a piston and a sample holder base; transferring the sample holder system to a laser ablation system; and ablating at least a portion of the thin, solid sample in the taut configuration with the laser ablation system to provide an ablated sample.
G01N 21/71 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
G01N 27/68 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
H01J 49/26 - Mass spectrometers or separator tubes
93.
Purifying an element from a sample matrix for isotopic analysis
A method includes supplying a reagent to a column, where the column is configured to purify an element from a sample matrix for isotopic analysis. The method also includes loading the column with the sample matrix, and supplying a second reagent to collect the element retained by the column. The method further includes loading the column with a second sample mixture, and collecting an element from the second sample mixture retained by the column. A column configured to separate an element from a sample matrix for isotopic analysis includes a resin configured to retain the element. The column also includes a first frit disposed of a first end of the column and a second frit disposed of a second end of the column. The column is configured to receive a first reagent in a first flow direction and a second reagent in a second flow direction different from the first flow direction.
A method for detecting material in a sample using an ICP instrument includes preparing the sample for analysis by the ICP instrument using hydrogen gas. For example, hydrogen gas can be generated by initiating a hydride generation reaction with the sample. Further, hydrogen gas can be introduced to a component part of the sample. For instance, hydrogen gas can be added to an injector gas in a spray chamber of the ICP instrument.
Systems and methods are described to determine whether a sample transmitted through a transfer line from a remote sampling system contains a suitable sample to analyze by an analysis system. A system embodiment includes, but is not limited to, a sample receiving line configured to receive a liquid segment a first detector configured to detect the liquid segment at a first location in the sample receiving line; a second detector configured to detect the liquid segment at a second location in the sample receiving line downstream from the first location; and a controller configured to register a continuous liquid segment in the sample receiving line when the first detector and the second detector match detection states prior to the controller registering a change of state of the first detector.
A system includes an analysis system at a first location and one or more remote sampling systems at a second location remote from the first location. A sampling system can be configured to receive a remote liquid sample. The system also includes a sample transfer line configured to transport gas from the second location to the first location. The sample transfer line is configured to selectively couple with a remote sampling for supplying a continuous liquid sample segment to the sample transfer line. The system can further include a sample receiving line at the first location. The sample receiving line is configured to selectively couple with the sample transfer line and the analysis system to receive the continuous liquid sample segment and supply the sample to an analysis device.
G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
G01N 1/00 - Sampling; Preparing specimens for investigation
97.
Systems for integrated decomposition and scanning of a semiconducting wafer
Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
H01L 21/66 - Testing or measuring during manufacture or treatment
G01N 21/73 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
H01L 21/677 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for conveying, e.g. between different work stations
Systems and methods are described for integrated sample container cover removal and sample probe positioning. In an example implementation, an autosampler system includes, but is not limited to, a z-axis support rotatable about a z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe to withdraw a fluid-containing sample held within a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support with respect to the sample probe support structure, the sample cap remover configured to lift a cap from the sample container to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure.
G01N 35/04 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations - Details of the conveyor system
Semiconductor wafer processing systems, namely, semiconductor wafer processing machines and parts therefor; Semiconductor wafer analysis systems, namely, semiconductor wafer processing equipment and parts therefor; Systems, namely, semiconductor wafer processing equipment for semiconductor wafer processing and analysis by means of phase decomposition; Equipment and systems, namely, semiconductor wafer processing equipment for semiconductor wafer processing and analysis
Semiconductor wafer processing systems, namely, semiconductor wafer processing machines and parts therefor; Semiconductor wafer analysis systems, namely, semiconductor wafer processing equipment and parts therefor; Systems, namely, semiconductor wafer processing equipment for semiconductor wafer processing and analysis by means of phase decomposition; Equipment and systems, namely, semiconductor wafer processing equipment for semiconductor wafer processing and analysis
