Particle Measuring Systems, Inc.

United States of America

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Date
2024 August 1
2024 July 2
2024 June 1
2024 (YTD) 6
2023 4
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IPC Class
G01N 15/14 - Electro-optical investigation 21
G01N 15/02 - Investigating particle size or size distribution 20
G01N 15/06 - Investigating concentration of particle suspensions 18
G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials 17
G01N 1/22 - Devices for withdrawing samples in the gaseous state 12
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Status
Pending 15
Registered / In Force 52
Found results for  patents

1.

POLYDISPERSED PARTICLE CHALLENGE SAMPLE VOLUME CALIBRATION OF OPTICAL PARTICLE COUNTERS

      
Application Number 18432267
Status Pending
Filing Date 2024-02-05
First Publication Date 2024-08-08
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor Knollenberg, Brian A.

Abstract

A method of calibrating an optical particle counter may include performing first and second calibration procedures. The first calibration procedure may include performing sensitivity calibration and/or channel size calibration of the optical particle counter under calibration using a monodispersed particle standard. The second calibration procedure may include sample volume calibration. The sample volume calibration may include: flowing a polydispersed particle calibration sample dispersed in a fluid through the optical particle counter under calibration to produce a first signal output; flowing the polydispersed particle calibration sample dispersed in the fluid through a reference optical particle counter to produce a reference signal output; comparing the first signal output with the reference signal output; and adjusting, in response to the comparing, an effective sample volume parameter stored in a computer readable memory of the optical particle counter under calibration.

IPC Classes  ?

2.

ADVANCED SYSTEMS AND METHODS FOR INTERFEROMETRIC PARTICLE DETECTION AND DETECTION OF PARTICLES HAVING SMALL SIZE DIMENSIONS

      
Application Number 18496570
Status Pending
Filing Date 2023-10-27
First Publication Date 2024-07-11
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Ellis, Timothy A.
  • Bonino, Chris
  • Knollenberg, Brian A.
  • Lumpkin, James
  • Rodier, Daniel
  • Sehler, Dwight
  • Moghaddam, Mehran Vahdani
  • Ramin, Thomas

Abstract

The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.

IPC Classes  ?

3.

ROBOTIC CONTROL FOR PARTICLE SAMPLING AND MONITORING

      
Application Number 18543884
Status Pending
Filing Date 2023-12-18
First Publication Date 2024-07-04
Owner
  • PARTICLE MEASURING SYSTEMS, INC. (USA)
  • PHARMA INTEGRATION S.R.L (Italy)
Inventor
  • Scialò, Giovanni
  • Recchia, Davide
  • Bechini, Claudio

Abstract

Provided herein are systems and methods for sampling of controlled environments, including automated and/or robotically controlled sampling. The present systems and methods are useful for determining the presence of, quantity, size, concentration, viability, species or characteristics of particles, including viable biological particles, within a controlled environment. The described systems and methods may utilize rotational motion via robotics, automation and/or control systems to reduce, or eliminate, some or all of the steps carried out by human operators in traditional particle collection and/or analysis methodologies. The described systems and methods may rotational motion via robotics, automation and/or control systems to provide for particle sampling over time periods that are well-defined for an individual impactor and/or sequential sampling via a plurality of impactors.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor

4.

PARTICLE SAMPLING SYSTEMS AND METHODS FOR ROBOTIC CONTROLLED MANUFACTURING BARRIER SYSTEMS

      
Application Number 18419901
Status Pending
Filing Date 2024-01-23
First Publication Date 2024-06-06
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Scialo, Giovanni
  • Recchia, Davide

Abstract

Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/075 - by optical means
  • G01N 15/14 - Electro-optical investigation
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor

5.

ROBOTIC CONTROL FOR ASEPTIC PROCESSING

      
Application Number 18390118
Status Pending
Filing Date 2023-12-20
First Publication Date 2024-05-16
Owner
  • PARTICLE MEASURING SYSTEMS, INC. (USA)
  • PHARMA INTEGRATION S.R.L (Italy)
Inventor
  • Scialò, Giovanni
  • Recchia, Davide
  • Bechini, Claudio

Abstract

Devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors including a sampling head comprising one or more intake apertures, a selectively removable cover, an impactor base connected to the sampling head, and one or more magnets fixed to the sampling head, the selectively removable cover and/or the impactor base. The one or more magnets allow for robotic manipulation of the impactor devices.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
  • B25J 9/00 - Programme-controlled manipulators
  • B25J 11/00 - Manipulators not otherwise provided for
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/12 - Apparatus for enzymology or microbiology with sterilisation, filtration, or dialysis means
  • C12Q 1/04 - Determining presence or kind of microorganism; Use of selective media for testing antibiotics or bacteriocides; Compositions containing a chemical indicator therefor
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state

6.

SYSTEM AND METHOD FOR PARTICLES MEASUREMENT

      
Application Number 18448563
Status Pending
Filing Date 2023-08-11
First Publication Date 2024-01-25
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Karasikov, Nir
  • Weinstein, Ori
  • Shwartz, Shoam
  • Moghaddam, Mehran Vahdani
  • Dubin, Uri

Abstract

An optical system for particle size and concentration analysis, includes: at least one laser that produces an illuminating beam; a focusing lens that focuses the illuminating beam on particles that move relative to the illuminating beam at known or pre-defined angles to the illuminating beam through the focal region of the focusing lens; and at least two forward-looking detectors, that detect interactions of particles with the illuminating beam in the focal region of the focusing lens. The focusing lens is a cylindrical lens that forms a focal region that is: (i) narrow in the direction of relative motion between the particles and the illuminating beam, and (ii) wide in a direction perpendicular to a plane defined by an optical axis of the system and the direction of relative motion between the particles and the illuminating beam. Each of the two forward-looking detectors is comprised of two segmented linear arrays of detectors.

IPC Classes  ?

7.

ENHANCED DUAL-PASS AND MULTI-PASS PARTICLE DETECTION

      
Application Number 18156583
Status Pending
Filing Date 2023-01-19
First Publication Date 2023-07-27
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Moghaddam, Mehran Vahdani
  • Knollenberg, Brian A.
  • Sehler, Dwight

Abstract

A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particle interrogation zone may be disposed in the path of the interrogation beam. The reflecting surface may be configured to reflect the interrogation beam back on itself. The second beam splitter may be configured to: (i) receive the reference beam and side scattered light from one or more particles interacting with the interrogation beam in the particle interrogation zone; and (ii) produce a first component beam and second component beam. The first photodetector may be configured to detect the first component beam. The second photodetector may be configured to detect the second component beam.

IPC Classes  ?

8.

USER ACCESS-RESTRICTIVE SYSTEMS AND METHODS FOR OPERATING PARTICLE SAMPLING DEVICES

      
Application Number 18065169
Status Pending
Filing Date 2022-12-13
First Publication Date 2023-04-13
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Michaelis, Matt
  • Pandolfi, Daniele
  • Haley, Brett

Abstract

Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up. Embodiments of the disclosure facilitate various efficiency improvements for manufacturing operations reliant on particle sampling devices.

IPC Classes  ?

  • H04W 12/08 - Access security
  • H04W 12/06 - Authentication
  • H04W 12/033 - Protecting confidentiality, e.g. by encryption of the user plane, e.g. user’s traffic
  • H04W 12/47 - Security arrangements using identity modules using near field communication [NFC] or radio frequency identification [RFID] modules
  • H04W 12/63 - Location-dependent; Proximity-dependent

9.

OPTICAL ISOLATOR STABILIZED LASER OPTICAL PARTICLE DETECTOR SYSTEMS AND METHODS

      
Application Number 17950334
Status Pending
Filing Date 2022-09-22
First Publication Date 2023-03-23
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Knollenberg, Brian A.
  • Sehler, Dwight
  • Rostami, Saeid

Abstract

A particle detection system may include a laser optical source providing a beam of electromagnetic radiation, one or more beam shaping elements for receiving the beam of electromagnetic radiation, an optical isolator disposed in the path of the beam, between the laser source and the one or more beam shaping elements, a particle interrogation zone disposed in the path of the beam, wherein particles in the particle interrogation zone interact with the beam of electromagnetic radiation, and a first photodetector configured to detect light scattered and/or transmitted from the particle interrogation zone, a second photodetector configured to monitor power of the beam, and a controller configured to adjust the beam power based on a signal from the second photodetector, wherein the optical isolator is configured to filter optical feedback from the particle detection system out of an optical path leading to the second photodetector. The particle detection system may be configured to have a lower detection limit of 5 nm to 50 nm effective particle diameter. The laser optical source may have a laser power of 300 milliwatts to 100 watts.

IPC Classes  ?

  • G01N 15/14 - Electro-optical investigation
  • G02F 1/09 - Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on magneto-optical elements, e.g. exhibiting Faraday effect

10.

LIQUID IMPINGER SAMPLING SYSTEMS AND METHODS

      
Application Number 17848751
Status Pending
Filing Date 2022-06-24
First Publication Date 2023-01-12
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Scialò, Giovanni
  • Recchia, Davide

Abstract

Disclosed is a liquid impinger, for example a liquid impinger, particularly a disposable liquid impinger. The liquid impinger comprises, for example, at least one nozzle positioned in the interior and attached to the bottom portion. In some aspects, the liquid impinger comprises a polymeric material. Also disclosed are methods of making the liquid impinger comprising, for example, forming at least two components, assembling the at least two components into the liquid impinger, filling the liquid impinger with liquid, and exposing the filled liquid impinger to radiation for sterilization prior to use. Also disclosed are methods of using the liquid impinger, for example, by transporting a gas comprising analytes through the liquid impinger and transferring at least a portion of the analytes from the gas into the liquid contained therein. The method further comprises, for example, after transferring analytes form the gas into the liquid, incubating and/or detecting at least a portion of the analytes in the liquid without removing the liquid from the liquid impinger.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 33/497 - Physical analysis of biological material of gaseous biological material, e.g. breath

11.

CONDENSATION PARTICLE COUNTERS AND METHODS OF USE

      
Application Number 17839565
Status Pending
Filing Date 2022-06-14
First Publication Date 2022-12-15
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Yates, Edward
  • Hertert, Cary
  • Knollenberg, Brian A.

Abstract

Disclosed is a method for detecting and/or growing particles, comprising controlling the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Also disclosed is an apparatus or system for detecting and/or growing particles, comprising a fluidics system configured to control the surface area exposed to the saturator region by monitoring at least one of a depth of the working liquid on the saturator surface, the surface area exposed to the saturator region, or a volume of the working liquid on the saturator surface. Certain aspects do not employ one or more porous structures for vapor generation, nor a separate carrier fluid flow or inlet comprising a carrier fluid and vaporized working liquid for combining with the sample flow in the saturator region.

IPC Classes  ?

12.

COMPACT INTELLIGENT AEROSOL AND FLUID MANIFOLD

      
Application Number 17839897
Status Pending
Filing Date 2022-06-14
First Publication Date 2022-12-15
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Yates, Edward
  • Hertert, Cary
  • Knollenberg, Brian A.
  • Skuba, Jonathan

Abstract

A manifold system and methods of collecting samples, where the manifold system comprises multiple input sample ports and a preferably rotatable flow focusing element. The manifold system is able to sample aerosols and gases from multiple sample points, such as from cleanrooms and manufacturing environments, for collection and analysis. The flow focusing element reduces cross talk and cross contamination of particles, including nanoparticles, between different samples.

IPC Classes  ?

  • G01N 1/26 - Devices for withdrawing samples in the gaseous state with provision for intake from several spaces

13.

MODULAR PARTICLE COUNTER WITH DOCKING STATION

      
Application Number 17839839
Status Pending
Filing Date 2022-06-14
First Publication Date 2022-12-15
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Knollenberg, Brian A.
  • Yates, Edward
  • Rodier, Daniel

Abstract

Modular docking station and methods for sampling and monitoring gas and other fluids, where a sampling device is able to be removably attached to the docking station, thereby allowing the sampling device to be replaced without having to remove or disconnect the docking station from the rest of the sampling system. This allows the docking station to remain connected to the rest of the system with minimal or no interruption and reduces maintenance costs and time when replacing the sampling device.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

14.

Particle sampling systems and methods for robotic controlled manufacturing barrier systems

      
Application Number 17566197
Grant Number 11927509
Status In Force
Filing Date 2021-12-30
First Publication Date 2022-07-28
Grant Date 2024-03-12
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Scialo, Giovanni
  • Recchia, Davide

Abstract

Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/14 - Electro-optical investigation
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

15.

DETECTION SCHEME FOR PARTICLE SIZE AND CONCENTRATION MEASUREMENT

      
Application Number 17570228
Status Pending
Filing Date 2022-01-06
First Publication Date 2022-07-21
Owner Particle Measuring Systems, Inc. (USA)
Inventor Shamir, Joseph

Abstract

The present invention provides a system and method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, structured laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/14 - Electro-optical investigation
  • G01N 15/06 - Investigating concentration of particle suspensions

16.

Particle detection systems and methods for on-axis particle detection and/or differential detection

      
Application Number 17553216
Grant Number 11946852
Status In Force
Filing Date 2021-12-16
First Publication Date 2022-05-19
Grant Date 2024-04-02
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Rodier, Daniel
  • Lumpkin, James
  • Sehler, Dwight
  • Knollenberg, Brian

Abstract

Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.

IPC Classes  ?

  • G01N 15/14 - Electro-optical investigation
  • G01N 15/1434 - Optical arrangements
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

17.

Calibration verification for optical particle analyzers

      
Application Number 17290494
Grant Number 11385161
Status In Force
Filing Date 2020-04-27
First Publication Date 2021-12-30
Grant Date 2022-07-12
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Bates, Thomas A.
  • Michaelis, Matt
  • Haley, Brett

Abstract

Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer, including independently of the presence or absence of particles. The method and analyzers include use of distinct and non-interfering time frequency domains: a middle frequency time domain and a low frequency time domain, and optionally a high frequency time domain. The high frequency time domain generates a laser facet drive current frequency modulation to prevent the laser facet from spatial-mode hopping. The middle frequency time domain is for particle detection. The low frequency time domain is for calibration status, including laser-pulse-light self-diagnostics, for the health or calibration status of the analyzer. By carefully selecting the frequency time domain ranges, there is non-interference, with the ability to self-diagnose the instrument that is particle-independent.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/10 - Investigating individual particles
  • G01N 15/14 - Electro-optical investigation

18.

PARTICLE DETECTION VIA SCATTERED LIGHT COMBINED WITH INCIDENT LIGHT

      
Application Number 17341998
Status Pending
Filing Date 2021-06-08
First Publication Date 2021-12-09
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Rodier, Daniel
  • Moghaddam, Mehran Vahdani
  • Bonino, Christopher A.

Abstract

Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.

IPC Classes  ?

19.

Particle detectors with remote alarm monitoring and control

      
Application Number 17224599
Grant Number 11250684
Status In Force
Filing Date 2021-04-07
First Publication Date 2021-09-23
Grant Date 2022-02-15
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Maclaughlin, Scott
  • Michaelis, Matt
  • Knollenberg, Brian A.

Abstract

The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.

IPC Classes  ?

  • G08B 21/00 - Alarms responsive to a single specified undesired or abnormal condition and not otherwise provided for
  • G08B 21/14 - Toxic gas alarms
  • G08B 27/00 - Alarm systems in which the alarm condition is signalled from a central station to a plurality of substations
  • G08B 21/18 - Status alarms

20.

Robotic control for aseptic processing

      
Application Number 17151899
Grant Number 11892462
Status In Force
Filing Date 2021-01-19
First Publication Date 2021-07-22
Grant Date 2024-02-06
Owner
  • Pharma Integration SRL (Italy)
  • Particle Measuring Systems, Inc. (USA)
Inventor
  • Scialò, Giovanni
  • Recchia, Davide
  • Bechini, Claudio

Abstract

Devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors including a sampling head comprising one or more intake apertures, a selectively removable cover, an impactor base connected to the sampling head, and one or more magnets fixed to the sampling head, the selectively removable cover and/or the impactor base. The one or more magnets allow for robotic manipulation of the impactor devices.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/12 - Apparatus for enzymology or microbiology with sterilisation, filtration, or dialysis means
  • C12Q 1/04 - Determining presence or kind of microorganism; Use of selective media for testing antibiotics or bacteriocides; Compositions containing a chemical indicator therefor
  • B25J 9/00 - Programme-controlled manipulators
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • B25J 11/00 - Manipulators not otherwise provided for

21.

Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions

      
Application Number 16953987
Grant Number 11988593
Status In Force
Filing Date 2020-11-20
First Publication Date 2021-07-08
Grant Date 2024-05-21
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Ellis, Timothy A
  • Bonino, Chris
  • Knollenberg, Brian A.
  • Lumpkin, James
  • Rodier, Daniel
  • Sehler, Dwight
  • Moghaddam, Mehran Vahdani
  • Ramin, Thomas

Abstract

The present invention relates to interferometric detection of particles and optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided exhibiting enhanced alignment and stability for interferometric detection of particles and/or optical detection of particles having size dimensions less than or equal to 100 nm. Systems and methods are provided that include compensation means for mitigating the impact of internal and external stimuli and changes in operating conditions that can degrade the sensitivity and reliability of particle detection via optical methods, including interferometric-based techniques and/or systems for optical detection of particles having size dimensions less than or equal to 100 nm.

IPC Classes  ?

22.

Slurry monitor coupling bulk size distribution and single particle detection

      
Application Number 17136682
Grant Number 11428617
Status In Force
Filing Date 2020-12-29
First Publication Date 2021-06-24
Grant Date 2022-08-30
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Knollenberg, Brian A.
  • Rodier, Daniel

Abstract

Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/06 - Investigating concentration of particle suspensions

23.

Detecting nanoparticles on production equipment and surfaces

      
Application Number 17153573
Grant Number 11428619
Status In Force
Filing Date 2021-01-20
First Publication Date 2021-05-13
Grant Date 2022-08-30
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Knollenberg, Brian A.
  • Rodier, Daniel Robert

Abstract

Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 21/05 - Flow-through cuvettes
  • B82Y 35/00 - Methods or apparatus for measurement or analysis of nanostructures
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

24.

Mobile monitoring device for controlled contamination areas

      
Application Number 17087906
Grant Number 11540248
Status In Force
Filing Date 2020-11-03
First Publication Date 2021-05-06
Grant Date 2022-12-27
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Scialò, Giovanni
  • Recchia, Davide
  • Bechini, Claudio

Abstract

A mobile monitoring device for monitoring controlled contamination areas may include a motorized mobile structure, a sampling unit, and a central management and control unit. The motorized mobile structure is configured to move within an area to be monitored. The sampling unit is positioned on said mobile structure, and configured to perform sampling operations of air and/or surfaces of said area and obtain sampling data. The central management and control unit is operatively connected to the mobile structure and to said sampling unit. The mobile structure may be controlled by the central unit to reach predefined points of the area to be monitored. The sampling unit may be selectively activated and/or deactivated by said central unit in correspondence with said predefined starting points of said sampling operations.

IPC Classes  ?

  • H04W 64/00 - Locating users or terminals for network management purposes, e.g. mobility management
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

25.

Antimicrobial particle detectors

      
Application Number 17063797
Grant Number 11215546
Status In Force
Filing Date 2020-10-06
First Publication Date 2021-04-08
Grant Date 2022-01-04
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Maclaughlin, Scott
  • Skuba, Jon

Abstract

The invention generally provides systems and methods for particle detection for minimizing microbial growth and cross-contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. In some embodiments, systems of the invention incorporate a housing having an outer surface being a first antimicrobial surface and a touchscreen being a second antimicrobial surface. In some embodiments, substantially all of the outer surfaces of the system are antimicrobial surfaces. In some embodiments, the first antimicrobial surface may comprise an Active Screen Plasma alloyed layer. In some embodiments, the housing may comprise a molded polymer substrate and a metal coating layer bonded to the molded polymer substrate such that at least some exterior surfaces of the housing are metal coated surfaces.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

26.

Particle detectors with remote alarm monitoring and control

      
Application Number 17063779
Grant Number 10997845
Status In Force
Filing Date 2020-10-06
First Publication Date 2021-04-08
Grant Date 2021-05-04
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Maclaughlin, Scott
  • Michaelis, Matt

Abstract

The invention generally provides devices and methods for particle detection for minimizing human-caused contamination in manufacturing environments requiring low levels of microbes, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Methods of the invention may incorporate wirelessly transmitting an alarm signal from a particle detector to a remote device, replicating a graphical user interface of the particle detector on an electronic display of the remote device, and passing one or more user instructions from the remote device to the particle detector via the replicate graphical interface of the remote device.

IPC Classes  ?

  • G08B 21/14 - Toxic gas alarms
  • G08B 27/00 - Alarm systems in which the alarm condition is signalled from a central station to a plurality of substations
  • G08B 21/18 - Status alarms

27.

Triggered sampling systems and methods

      
Application Number 17002441
Grant Number 11268930
Status In Force
Filing Date 2020-08-25
First Publication Date 2021-03-04
Grant Date 2022-03-08
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Rodier, Daniel
  • Knollenberg, Brian
  • Sanchez, Isidro

Abstract

Described herein are monitoring systems and methods, including for airborne molecular contamination (AMC), that combine a sampler, such as an impinger or sorbent tube with a real time analyzer, such as an ion mobility spectrometer (IMS) or optical particle counter. The system may allow for selective sampling in which the sampler is only exposed to the target fluid during periods in which the real time analyzer detects analytes, such as molecular contamination or particles, meeting particular criteria such the composition and/or concentration of analytes. The invention also includes impinger systems having a sampler reservoir comprising an anion leaching resistant material characterized by low anion leach rates in the presence of deionized water.

IPC Classes  ?

  • G01N 27/622 - Ion mobility spectrometry
  • H01J 49/14 - Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
  • H01J 49/16 - Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission

28.

User access-restrictive systems and methods for operating particle sampling devices

      
Application Number 16987682
Grant Number 11576045
Status In Force
Filing Date 2020-08-07
First Publication Date 2021-02-11
Grant Date 2023-02-07
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Michaelis, Matt
  • Pandolfi, Daniele
  • Haley, Brett

Abstract

Systems, methods, devices and software for operating particle sampling devices in a user-restrictive manner include a tag and a particle sampling device. The device includes a tag reader and a processor in communication with the tag reader. The processor: receives device configuration data and reads operational and/or user data from the tag having that data encoded thereon. Based on the data read from the tag, the processor may either grant or deny access to a user for performing device operations. Alternatively, for a headless particle sampling device configured for minimal user interaction during operation, the device is removably attached to a supporting structure proximate the tag positioned in or on the supporting structure. In the headless configuration, the processor reads device configuration parameters including network communication information from the tag following device power up. Embodiments of the disclosure facilitate various efficiency improvements for manufacturing operations reliant on particle sampling devices.

IPC Classes  ?

  • H04W 12/08 - Access security
  • H04W 12/06 - Authentication
  • H04W 12/00 - Security arrangements; Authentication; Protecting privacy or anonymity
  • H04W 12/033 - Protecting confidentiality, e.g. by encryption of the user plane, e.g. user’s traffic
  • H04W 12/47 - Security arrangements using identity modules using near field communication [NFC] or radio frequency identification [RFID] modules
  • H04W 12/63 - Location-dependent; Proximity-dependent

29.

Particle detection systems and methods for on-axis particle detection and/or differential detection

      
Application Number 16857678
Grant Number 11237095
Status In Force
Filing Date 2020-04-24
First Publication Date 2020-11-12
Grant Date 2022-02-01
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Rodier, Daniel
  • Lumpkin, James
  • Sehler, Dwight
  • Knollenberg, Brian

Abstract

Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.

IPC Classes  ?

  • G01N 15/14 - Electro-optical investigation
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

30.

System and method for particles measurement

      
Application Number 16652653
Grant Number 11781965
Status In Force
Filing Date 2018-10-25
First Publication Date 2020-07-30
Grant Date 2023-10-10
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Karasikov, Nir
  • Weinstein, Ori
  • Shwartz, Shoam
  • Moghaddam, Mehran Vahdani
  • Dubin, Uri

Abstract

An optical system for particle size and concentration analysis, includes: at least one laser that produces an illuminating beam; a focusing lens that focuses the illuminating beam on particles that move relative to the illuminating beam at known or pre-defined angles to the illuminating beam through the focal region of the focusing lens; and at least two forward-looking detectors, that detect interactions of particles with the illuminating beam in the focal region of the focusing lens. The focusing lens is a cylindrical lens that forms a focal region that is: (i) narrow in the direction of relative motion between the particles and the illuminating beam, and (ii) wide in a direction perpendicular to a plane defined by an optical axis of the system and the direction of relative motion between the particles and the illuminating beam. Each of the two forward-looking detectors is comprised of two segmented linear arrays of detectors.

IPC Classes  ?

31.

Particle sampling systems and methods for robotic controlled manufacturing barrier systems

      
Application Number 16678687
Grant Number 11255760
Status In Force
Filing Date 2019-11-08
First Publication Date 2020-05-21
Grant Date 2022-02-22
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Scialo, Giovanni
  • Recchia, Davide

Abstract

Provided herein are systems and methods allowing for automated sampling and/or analysis of controlled environments, for example, to determine the presence, quantity, size, concentration, viability, species or characteristics of particles within the environment. The described systems and methods may utilize robotics or automation or remove some or all of the collection or analysis steps that are traditionally performed by human operators. The methods and systems described herein are versatile and may be used with known particle sampling and analysis techniques and particle detection devices including, for example, optical particle counters, impingers and impactors.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

32.

Slurry monitor coupling bulk size distribution and single particle detection

      
Application Number 16682314
Grant Number 10908059
Status In Force
Filing Date 2019-11-13
First Publication Date 2020-05-21
Grant Date 2021-02-02
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Knollenberg, Brian A.
  • Rodier, Daniel

Abstract

Provided herein are particle detection systems, and related methods configured to characterize a liquid sample, comprising: a first probe configured to determine a first parameter set of a plurality of first particles in a liquid sample, the first particles characterized by a size characteristic selected from a first size range; wherein the first parameter set comprises a first size distribution and a first concentration; and a second probe configured to determine a second parameter set of one or more second particles in the liquid sample, the second particles being characterized by a size characteristic selected from a second size range; wherein the second parameter set comprises a second size distribution and a second concentration.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/06 - Investigating concentration of particle suspensions

33.

Calibration verification for optical particle analyzers

      
Application Number 16678968
Grant Number 11181455
Status In Force
Filing Date 2019-11-08
First Publication Date 2020-05-14
Grant Date 2021-11-23
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Bates, Thomas A.
  • Michaelis, Matt
  • Haley, Brett

Abstract

Provided are particle analyzers and related methods for verifying calibration status of the particle analyzer. The method includes the steps of providing an optical particle analyzer and modulating a power applied to a source of EMR. The method includes the steps of, in response to the modulating step, inducing a detector signal waveform and analyzing the detector signal waveform to determine a value of at least one diagnostic parameter associated with one or more of the source of EMR, an optical assembly, a chamber, a detector, and an optical collection system of the optical particle analyzer. The method includes the step of determining a calibration status of the optical particle analyzer based on the one or more determined values of the at least one diagnostic parameter.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/06 - Investigating concentration of particle suspensions
  • H01S 3/00 - Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range

34.

Fluid refractive index optimizing particle counter

      
Application Number 16556692
Grant Number 11320360
Status In Force
Filing Date 2019-08-30
First Publication Date 2020-03-05
Grant Date 2022-05-03
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Lumpkin, James M.
  • Knollenberg, Brian A.
  • Mitchell, John R.

Abstract

Provided herein are systems and methods of optical particle counters which account and adjust for the refractive index of the carrier fluid being analyzed. The provided systems are robust and may be implemented in a variety of optical particle counters including obscured light, reflected light, emitted light and scattered light particle counters. The described systems may be useful with any fluid, including gases or liquids. In some cases, the system can account for the differences in refractive index between two liquids, for example, ultrapure water and an acid, such as sulfuric, hydrochloric, hydrofluoric, acetic, phosphoric, chromic phosphoric, and the like. By accounting for the refractive index of the carrier fluid, the described systems and methods are also more sensitive and able to more accurately detect and characterize smaller particles, including nanoscale sized particles.

IPC Classes  ?

35.

Detecting nanoparticles on production equipment and surfaces

      
Application Number 16559074
Grant Number 10928293
Status In Force
Filing Date 2019-09-03
First Publication Date 2020-03-05
Grant Date 2021-02-23
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Knollenberg, Brian A.
  • Rodier, Daniel Robert

Abstract

Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 21/05 - Flow-through cuvettes
  • B82Y 35/00 - Methods or apparatus for measurement or analysis of nanostructures
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

36.

Microbial air sampler integrating media plate and sample collection device

      
Application Number 16421227
Grant Number 11231345
Status In Force
Filing Date 2019-05-23
First Publication Date 2019-11-14
Grant Date 2022-01-25
Owner
  • PARTICLE MEASURING SYSTEMS, S.R.L. (Italy)
  • PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Scialo, Giovanni
  • Adkins, Ronald W.
  • Recchia, Davide

Abstract

The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/06 - Investigating concentration of particle suspensions
  • C12M 1/22 - Petri dishes
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/12 - Apparatus for enzymology or microbiology with sterilisation, filtration, or dialysis means
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

37.

Automatic power control liquid particle counter with flow and bubble detection systems

      
Application Number 16292869
Grant Number 10859487
Status In Force
Filing Date 2019-03-05
First Publication Date 2019-10-24
Grant Date 2020-12-08
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Knollenberg, Brian
  • Lumpkin, Jim
  • Haley, Brett
  • Soappman, Matt
  • Rodier, Dan
  • Lilly, Mark

Abstract

The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.

IPC Classes  ?

  • G01N 15/14 - Electro-optical investigation
  • G01F 1/704 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow using marked regions or existing inhomogeneities within the fluid stream, e.g. statistically occurring variations in a fluid parameter
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/02 - Investigating particle size or size distribution
  • H05B 47/105 - Controlling the light source in response to determined parameters
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

38.

Firmware design for facility navigation, and area and location data management of particle sampling and analysis instruments

      
Application Number 16394931
Grant Number 11416123
Status In Force
Filing Date 2019-04-25
First Publication Date 2019-08-15
Grant Date 2022-08-16
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Pandolfi, Daniele
  • Michaelis, Matt
  • Hartigan, Paul B.
  • Ketcham, Cliff

Abstract

Provided herein are methods and devices that allow for efficient management of many different sampling locations within a facility. A method for operating a biological sampler, a particle counter, and like air sampling, analysis, and/or monitoring equipment or instrumentation is described, such as by sampling an environment at a sampling position with the biological sampler and storing sample data and other useful information in memory in association with unique identifier(s) including sampling location(s) for the samples. Also provided are associated devices for carrying out the methods.

IPC Classes  ?

  • G06F 3/0484 - Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range
  • G06F 3/0482 - Interaction with lists of selectable items, e.g. menus
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • G01C 21/20 - Instruments for performing navigational calculations
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G06F 3/0488 - Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser using a touch-screen or digitiser, e.g. input of commands through traced gestures
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups ; Handling materials therefor
  • G01N 1/02 - Devices for withdrawing samples
  • G06F 3/04842 - Selection of displayed objects or displayed text elements

39.

Condensation apparatus

      
Application Number 15867672
Grant Number 10792694
Status In Force
Filing Date 2018-01-10
First Publication Date 2018-05-17
Grant Date 2020-10-06
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Gorbunov, Boris Zachar
  • Gnewuch, Harald Wilhelm Julius

Abstract

Apparatuses for increasing the effective size of gas-entrained particles in a particle detector are disclosed. In one embodiment, an apparatus comprises an evaporation chamber, a condenser in fluid communication with the evaporation chamber, and an inlet in fluid communication with the condenser for receiving a stream of sample gas containing gas-entrained particles. The evaporation chamber includes a heating element and a porous support surrounding the heating element. The porous support carries thereon a working fluid, and the heating element vaporizes the working fluid to form vapor within the evaporation chamber. The porous support may include a portion which extends into a working fluid reservoir.

IPC Classes  ?

  • B05C 3/00 - Apparatus in which the work is brought into contact with a bulk quantity of liquid or other fluent material
  • G01N 15/02 - Investigating particle size or size distribution
  • B01D 5/00 - Condensation of vapours; Recovering volatile solvents by condensation
  • G01N 15/06 - Investigating concentration of particle suspensions
  • B05C 3/02 - Apparatus in which the work is brought into contact with a bulk quantity of liquid or other fluent material the work being immersed in the liquid or other fluent material
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

40.

Automatic power control liquid particle counter with flow and bubble detection systems

      
Application Number 15600418
Grant Number 10371620
Status In Force
Filing Date 2017-05-19
First Publication Date 2017-12-14
Grant Date 2019-08-06
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Knollenberg, Brian
  • Lumpkin, Jim
  • Haley, Brett
  • Soappman, Matt
  • Rodier, Dan
  • Lilly, Mark

Abstract

The systems and methods provided herein relate generally to the improvement of data quality in optical liquid particle counters and control of optical particle counters to achieve longer expected lifetime, for example by avoiding damage caused by electromagnetic radiation and heat. The systems and methods incorporate sensors which characterize the fluid flowing through the flow cell, thereby enhancing accuracy and reducing the number of false positives.

IPC Classes  ?

  • G01N 15/14 - Electro-optical investigation
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/02 - Investigating particle size or size distribution
  • G01F 1/704 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow using marked regions or existing inhomogeneities within the fluid stream, e.g. statistically occurring variations in a fluid parameter
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • H05B 37/02 - Controlling

41.

Systems and methods for isolating condensate in a condensation particle counter

      
Application Number 15611497
Grant Number 10197487
Status In Force
Filing Date 2017-06-01
First Publication Date 2017-12-07
Grant Date 2019-02-05
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Knollenberg, Brian
  • Pavone, Stephen
  • Ketcham, Cliff
  • Thompson, Rebecca

Abstract

The systems and methods provided herein relate generally to the prevention of migration of condensate in a condensation particle counter between components designed to handle condensate (e.g. saturator, condenser, condensate reservoir) and components which may be damaged by the condensate (e.g. detection and flow control devices).

IPC Classes  ?

  • G01N 1/00 - Sampling; Preparing specimens for investigation
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/14 - Electro-optical investigation

42.

Active filtration system for controlling cleanroom environments

      
Application Number 15615590
Grant Number 09808760
Status In Force
Filing Date 2017-06-06
First Publication Date 2017-09-21
Grant Date 2017-11-07
Owner
  • PARTICLE MEASURING SYSTEMS, INC. (USA)
  • PARTICLE MEASURING SYSTEMS, S.R.L. (Italy)
Inventor
  • Gromala, Gerald
  • Adkins, Ronald W.
  • Dalmaso, Gilberto
  • Knollenberg, Brian A.
  • Rodier, Daniel

Abstract

This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.

IPC Classes  ?

  • A61L 2/00 - Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor
  • B01D 53/82 - Solid phase processes with stationary reactants
  • A61L 9/12 - Apparatus, e.g. holders, therefor
  • B01D 53/72 - Organic compounds not provided for in groups , e.g. hydrocarbons
  • B01D 53/32 - Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases or aerosols by electrical effects other than those provided for in group
  • A61L 9/00 - Disinfection, sterilisation or deodorisation of air
  • B01D 53/46 - Removing components of defined structure
  • B01D 53/44 - Organic components

43.

Detection scheme for particle size and concentration measurement

      
Application Number 15440287
Grant Number 10921229
Status In Force
Filing Date 2017-02-23
First Publication Date 2017-06-22
Grant Date 2021-02-16
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor Shamir, Joseph

Abstract

The present invention provides a system and method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, structured laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/14 - Electro-optical investigation
  • G01N 15/06 - Investigating concentration of particle suspensions

44.

Method for obtaining aerosol particle size distributions

      
Application Number 14898934
Grant Number 09638665
Status In Force
Filing Date 2014-06-17
First Publication Date 2016-12-22
Grant Date 2017-05-02
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor Gorbunov, Boris Zachar

Abstract

max. Also provided are a DMA, SMPS or Fast Mobility Particle Sizer (FMPS) apparatus set up to perform the method.

IPC Classes  ?

  • G01N 15/10 - Investigating individual particles
  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 27/62 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode

45.

Laser noise detection and mitigation in particle counting instruments

      
Application Number 15088679
Grant Number 09989462
Status In Force
Filing Date 2016-04-01
First Publication Date 2016-12-08
Grant Date 2018-06-05
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Lumpkin, James
  • Melton, Matthew

Abstract

This invention relates to optical particle counters and methods capable of effectively distinguishing signals generated from particle light scattering from sources of noise. Embodiments of the invention, for example, use multisensory detector configurations for identifying and distinguishing signals corresponding to fluctuations in laser intensity from signals corresponding to particle light scattering for the detection and characterization of submicron particles. In an embodiment, for example, methods and systems of the invention compare signals from different detector elements of a detector array to identify and characterize noise events, such as noise generated from laser intensity instability, thereby allow for the detection and characterization of smaller particles. The system and methods of the present invention, thus, provide an effective means of reducing false positives caused by noise or interference while allowing for very sensitive particle detection.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N 21/53 - Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
  • G01N 15/14 - Electro-optical investigation
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/10 - Investigating individual particles

46.

Method of treating a cleanroom enclosure

      
Application Number 14793500
Grant Number 09682345
Status In Force
Filing Date 2015-07-07
First Publication Date 2016-01-14
Grant Date 2017-06-20
Owner
  • PARTICLE MEASURING SYSTEMS, INC. (USA)
  • PARTICLE MEASURING SYSTEMS, S.R.L. (Italy)
Inventor
  • Gromala, Gerald
  • Adkins, Ronald W.
  • Dalmaso, Gilberto
  • Knollenberg, Brian A.
  • Rodier, Daniel

Abstract

This invention is in the field of systems and methods for controlling contamination in high purity environments. This invention relates generally to particulate filtering and treatment of molecular contamination and process gases in enclosures, such as cleanrooms, contamination controlled manufacturing environments, mini-environments, isolators, glove boxes and restricted air barrier systems (RABS). The invention is capable of chemically transforming molecular contamination and process gases into less reactive or inert reaction products while at the same time decreasing the level of biological and nonbiological particulates.

IPC Classes  ?

  • B01D 53/82 - Solid phase processes with stationary reactants
  • A61L 9/12 - Apparatus, e.g. holders, therefor
  • B01D 53/44 - Organic components
  • B01D 53/46 - Removing components of defined structure
  • A61L 2/00 - Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor
  • A61L 9/00 - Disinfection, sterilisation or deodorisation of air
  • B01D 53/32 - Separation of gases or vapours; Recovering vapours of volatile solvents from gases; Chemical or biological purification of waste gases, e.g. engine exhaust gases, smoke, fumes, flue gases or aerosols by electrical effects other than those provided for in group
  • B01D 53/72 - Organic compounds not provided for in groups , e.g. hydrocarbons

47.

Filter and blower geometry for particle sampler

      
Application Number 14645857
Grant Number 09631222
Status In Force
Filing Date 2015-03-12
First Publication Date 2016-01-07
Grant Date 2017-04-25
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Ketcham, Cliff
  • Hartigan, Paul B.
  • Adkins, Ronald W.

Abstract

The invention provides devices and methods for sampling, detecting and/or characterizing particles. Devices and methods of the invention, including particle samplers, impactors and counters, include a filter component for removing particles in the exhaust flow of the device, for example, to eliminate or minimize the potential for the device itself to provide source of particles in an environment undergoing particle monitoring. This aspect of the present devices and methods is particularly useful for monitoring particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products.

IPC Classes  ?

  • C12Q 1/24 - Methods of sampling, or inoculating or spreading a sample; Methods of physically isolating an intact microorganism
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 1/14 - Suction devices, e.g. pumps; Ejector devices
  • G01N 15/14 - Electro-optical investigation
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 1/24 - Suction devices

48.

Pressure-based airflow sensing in particle impactor systems

      
Application Number 14656170
Grant Number 09810558
Status In Force
Filing Date 2015-03-12
First Publication Date 2015-12-10
Grant Date 2017-11-07
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Bates, Thomas
  • Ketcham, Cliff
  • Hartigan, Paul B.
  • Adkins, Ronald W.

Abstract

Provided are systems and methods for accurate sensing of particle concentrations in fluids by employing a particle impactor system that allows for collection, growth and analysis of biological particles. The disclosed systems and methods make use of a pressure based flow sensor which permits the particle impactor system systems to accurately and reliably provide measurements of biological particle concentrations in the ambient environment. By incorporation of pressure sensors and pressure measurements into the flow measurement techniques, embodiments provide for the ability to use a particle impactor system to accurately measure environmental biological particle concentrations at a variety of atmospheric pressure conditions, such as at high altitude or with minimal perturbation from atmospheric weather conditions, without requiring recalibration or other adjustment of the sensors and control systems.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01F 1/34 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure
  • G01F 1/28 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by detection of dynamic effects of the flow by drag-force, e.g. vane type or impact flowmeter
  • G01F 1/76 - Devices for measuring mass flow of a fluid or a fluent solid material
  • G01F 1/36 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure the pressure or differential pressure being created by the use of flow constriction
  • G01F 1/42 - Orifices or nozzles
  • G01F 1/74 - Devices for measuring flow of a fluid or flow of a fluent solid material in suspension in another fluid

49.

Particle impactor with selective height adjustment

      
Application Number 14645753
Grant Number 09885640
Status In Force
Filing Date 2015-03-12
First Publication Date 2015-09-17
Grant Date 2018-02-06
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Ketcham, Cliff
  • Hartigan, Paul B.
  • Lakshmanan, Chandrasekar

Abstract

Provided are impactors for detecting biologics having an adjustable separation distance between an impact surface and the intake aperture, including the exit of the intake aperture. The impactor has a sampling head having at least one intake aperture and an exit, an impactor base comprising an impact surface, wherein the impact surface opposibly faces the sampling head exit and is separated from the exit by a separation distance. The separation distance is continuously adjustable between a minimum separation distance and a maximum separation distance and can accommodate impact surfaces having different heights by positioning the impact surface, irrespective of height of the impact surface, at an optimal separation distance from the sample intake aperture, such as by a rotation-type mechanism with a change in distance indication provided to a user by a separation distance step indicator.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials

50.

Microbial air sampler integrating media plate and sample collection device

      
Application Number 14338615
Grant Number 10345200
Status In Force
Filing Date 2014-07-23
First Publication Date 2015-03-19
Grant Date 2019-07-09
Owner
  • PARTICLE MEASURING SYSTEMS, S.R.L. (Italy)
  • PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Scialo, Giovanni
  • Adkins, Ronald W.
  • Recchia, Davide

Abstract

The invention generally provides devices and methods for sampling, detecting and/or characterizing particles, for example, via collection, growth and analysis of viable biological particles such as microorganisms. Devices and methods of the invention include particle samplers and impactors for collecting and/or analyzing biological particles in manufacturing environments requiring low levels of particles, such as cleanroom environments for electronics manufacturing and aseptic environments for manufacturing pharmaceutical and biological products, such as sterile medicinal products. Devices and methods of the invention incorporate an integrated sampler and impact surface, such as the receiving surface of a growth media, in a manner to minimize, or entirely eliminate, risks associated with user handling, such as the occurrence of false positive determinations due to contamination of the impact surface during particle sampling, growth or analysis processes.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
  • C12M 1/22 - Petri dishes
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/12 - Apparatus for enzymology or microbiology with sterilisation, filtration, or dialysis means

51.

Flow monitored particle sensor

      
Application Number 13392057
Grant Number 08800383
Status In Force
Filing Date 2010-08-24
First Publication Date 2012-09-06
Grant Date 2014-08-12
Owner Particle Measuring Systems, Inc. (USA)
Inventor Bates, Thomas

Abstract

Provided are devices and methods for monitoring flow rate in aerosol particle counters. The particle sensor has a particle counter, a flow measurement orifice comprising a differential pressure sensor for measuring differential pressure (DP) across the flow measurement orifice during particle sensor operation and a critical flow orifice. A vacuum source pulls ambient gas through each of the particle counter, flow measurement orifice and critical flow orifice. An atmospheric pressure sensor measures atmospheric pressure (AP) and a bench pressure sensor measures pressure in the particle sensor (BP). The output from the sensors is used to identify a flow condition, such as by a monitor operably connected to each of the differential pressure sensor, atmospheric pressure sensor and bench pressure sensor. In this manner, deviation in flow rate from a target flow rate is readily monitored without the need for expensive sensors or other flow-controlling components.

IPC Classes  ?

52.

Two-dimensional optical imaging methods and systems for particle detection

      
Application Number 13396393
Grant Number 08427642
Status In Force
Filing Date 2012-02-14
First Publication Date 2012-06-07
Grant Date 2013-04-23
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Mitchell, John
  • Sandberg, Jon
  • Sehler, Dwight A.
  • Williamson, Michael
  • Rice, David

Abstract

The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

53.

Non-orthogonal particle detection systems and methods

      
Application Number 13245366
Grant Number 08174697
Status In Force
Filing Date 2011-09-26
First Publication Date 2012-01-19
Grant Date 2012-05-08
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Mitchell, John
  • Sandberg, Jon
  • Sehler, Dwight A.

Abstract

Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

54.

Non-orthogonal particle detection systems and methods

      
Application Number 13043305
Grant Number 08027035
Status In Force
Filing Date 2011-03-08
First Publication Date 2011-06-30
Grant Date 2011-09-27
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Mitchell, John
  • Sandberg, Jon
  • Sehler, Dwight A.

Abstract

Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

55.

Condensation apparatus

      
Application Number 12991535
Grant Number 08869593
Status In Force
Filing Date 2009-05-08
First Publication Date 2011-03-10
Grant Date 2014-10-28
Owner Particle Measuring Systems Inc. (USA)
Inventor
  • Gorbunov, Boris Zachar
  • Gnewuch, Harald Wilhelm Julius

Abstract

The invention provides an apparatus for increasing the size of gas-entrained particles in order to render the gas-entrained particles detectable by a particle detector, the apparatus comprising an evaporation chamber (2) and a condenser (7); the apparatus is configured so that vapour-laden gas from the evaporation chamber can flow into the condenser and condensation of the vaporisable substance onto gas-entrained particles in the condenser takes place to increase the size of the particles so that they are capable of being detected by a particle detector.

IPC Classes  ?

  • G01N 37/00 - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES - Details not covered by any other group of this subclass
  • C23C 16/442 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition (CVD) processes characterised by the method of coating using fluidised bed processes
  • F15D 1/00 - Influencing the flow of fluids
  • B01D 5/00 - Condensation of vapours; Recovering volatile solvents by condensation
  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 15/00 - Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

56.

Two-dimensional optical imaging methods and systems for particle detection

      
Application Number 12326577
Grant Number 08154724
Status In Force
Filing Date 2008-12-02
First Publication Date 2009-10-01
Grant Date 2012-04-10
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Mitchell, John
  • Sehler, Dwight A.
  • Williamson, Michael
  • Rice, David
  • Sandberg, Jon

Abstract

The present invention provides methods and systems for particle detection and analysis using two-dimensional optical imaging to access enhanced detection sensitivity and expanded sensing functionality relative to conventional point and array detection-based optical particle counters. Methods and systems of the present invention provide a two-dimensional optical imaging-based particle sensing platform wherein system components and specifications are selected to generate reproducible and readily identifiable signals, including particle detection signatures, from optical scattering or emission from particles provided to the system. Systems and methods of the present invention are capable of accurately and sensitively detecting, identifying, and characterizing (e.g., determining the size of) particles in liquid phase or gas phase samples.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

57.

Non-orthogonal particle detection systems and methods

      
Application Number 12326335
Grant Number 07916293
Status In Force
Filing Date 2008-12-02
First Publication Date 2009-09-03
Grant Date 2011-03-29
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Mitchell, John
  • Sandberg, Jon
  • Sehler, Dwight A.

Abstract

Described herein is a particle detection system capable of spatially resolving the interaction of particles with a beam of electromagnetic radiation. Using a specific electromagnetic beam cross sectional shape and orientation, the detection sensitivity of a particle detection system can be improved. Also provided are methods for detecting and sizing particles in a manner that has low background signal and allows for spatially resolving the scattering or emission of electromagnetic radiation from particles.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

58.

System and method for calibration verification of an optical particle counter

      
Application Number 12271565
Grant Number 07973929
Status In Force
Filing Date 2008-11-14
First Publication Date 2009-05-21
Grant Date 2011-07-05
Owner Particle Measuring Systems, Inc. (USA)
Inventor Bates, Thomas

Abstract

Described herein is a portable, low power consuming optical particle counter calibration verification system and reliable and sensitive methods for verifying the calibration status of a gas or liquid particle counter. The calibration verification systems described herein are useful for quickly determining the calibration status of an optical particle counter at its point of use, as well as for allowing the end user to determine if an optical particle counter is in need of a recalibration before the recommended calibration schedule suggests.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

59.

Detection of analytes using ion mobility spectrometry

      
Application Number 12182324
Grant Number 07985949
Status In Force
Filing Date 2008-07-30
First Publication Date 2009-02-05
Grant Date 2011-07-26
Owner Particle Measuring Systems, Inc. (USA)
Inventor Rodier, Dan

Abstract

Methods and systems are provided for detecting analytes in a gas phase sample. An ion mobility spectrometer is provided for detecting analytes having an excess amount of dopant in its separation region. In an embodiment, the dopant is added directly to the separation region, such as with a drift gas or by diffusion, thereby providing excess dopant that dominates subsequent cluster formation and maintenance. Excess dopant in the separation region minimizes or reduces interfering signals associated with unwanted substances, such as water vapor, that are introduced to the IMS. In an aspect, the invention provides IMS systems and methods having increased sensitivity and reliability for analyte detection.

IPC Classes  ?

  • B01D 59/44 - Separation by mass spectrography
  • H01J 49/00 - Particle spectrometers or separator tubes

60.

Optical particle sensor with exhaust-cooled optical source

      
Application Number 12052923
Grant Number 07796255
Status In Force
Filing Date 2008-03-21
First Publication Date 2008-10-09
Grant Date 2010-09-14
Owner Particle Measuring Systems, Inc. (USA)
Inventor Miller, Rick

Abstract

The invention relates to particle sensors that are capable of passively cooling high-powered optical sources within the sensor, thereby extending the optical source lifetime without requiring additional power. The sensor detects particles within a sample fluid by optical interaction of the optical source with flowing sample fluid in the sample chamber. Sample fluid that exits the sample chamber is directed into thermal contact with the optical source, thereby cooling the optical source. Sample fluid that has come into thermal contact with the optical source is continuously removed from the sensor to ensure the optical source is adequately cooled. A variety of elements are used to facilitate thermal contact between the optical source and sample fluid including plenums, heat sinks, and airflow cavities. Provided are related methods for cooling a one or more heat-producing device within a particle sensor.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state

61.

Portable nanoparticle size classifier

      
Application Number 11994081
Grant Number 08109129
Status In Force
Filing Date 2006-06-29
First Publication Date 2008-08-21
Grant Date 2012-02-07
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor Gorbunov, Boris Zachar

Abstract

A nanoparticle size classifier comprising a variable flow rate system with a single diffusion element 3 placed inside a cell 2 containing inlet 1 and outlets 6 and 7, an aerosol filter 8, flow meter 9, pump 10 and pump controller 11, which enables a plurality of measurements to be obtained by means of passing an aerosol through the diffusion element 3 at various flow rates. Preferably, outlet of the diffusion cell is connected to a particle counter 5 via a three-way valve 6. The diffusion element has a net or screen that permit air through but capture some particles. In a preferred embodiment, the nanoparticle size classifier is connected to a PC 12 (a notebook or a palm-size computer) to acquire and process data.

IPC Classes  ?

62.

Method for particle size and concentration measurement

      
Application Number 10563662
Grant Number 07746469
Status In Force
Filing Date 2004-07-08
First Publication Date 2008-02-14
Grant Date 2010-06-29
Owner PARTICLE MEASURING SYSTEMS, INC. (USA)
Inventor
  • Shamir, Joseph
  • Karasikov, Nir

Abstract

The present invention provides a system and method of particle size and concentration measurement based on providing a focused, synthesized, non-Gaussian laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration. The particles are fluid borne, airborne, or on a surface and have a size ranging from sub-micron to thousands of microns. In an embodiment of the invention, the focused, synthesized, non-Gaussian laser beam is a dark beam. The measurements can be made using the duration of interaction with a scanning beam, including dark field.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

63.

Aerosol particle sensor with axial fan

      
Application Number 11393475
Grant Number 07667839
Status In Force
Filing Date 2006-03-30
First Publication Date 2007-10-04
Grant Date 2010-02-23
Owner Particle Measuring Systems, Inc. (USA)
Inventor Bates, Thomas

Abstract

A particle sensor for optically detecting an unconstrained particle suspended in a flowing gas includes a sample chamber having a gas inlet and a gas outlet; a gas flow system for flowing said gas from said gas inlet through said sample chamber to said gas outlet, a source of light; an optical system directing said light through said sample chamber, an optical collection system located to collect light scattered by said particles in the gas, and a detection system located to detect the collected light. The total pressure drop through said gas flow system is 3 inches of water or less. The gas flow system includes an axial fan, which may be a high static pressure fan or a counter-rotating fan. In a 1.0 CFM system, the gas inlet nozzle has an area of 25 square millimeters or more.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

64.

Particle counter with improved image sensor array

      
Application Number 11273865
Grant Number 07456960
Status In Force
Filing Date 2005-11-15
First Publication Date 2006-12-07
Grant Date 2008-11-25
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Cerni, Todd A.
  • Sehler, Dwight A.

Abstract

2, the sensing area having an area of 0.5 square mm or more. The detector has thirty or more detector array elements. In the preferred embodiment, the laser optical system reflects and refocuses the laser beam to effect multiple passes of the same laser beam through the sensing area.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

65.

Particle counter with self-concealing aperture assembly

      
Application Number 11141453
Grant Number 07088447
Status In Force
Filing Date 2005-05-31
First Publication Date 2006-08-08
Grant Date 2006-08-08
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Bates, Thomas
  • Miller, Richard O.
  • Alexander, Richard A.

Abstract

A particle measurement system using a single component light collecting system with an aperture having a portion within direct view of the light detector. An aperture assembly extending into a sample may be self-concealing by having an extended portion to block light from directly illuminating the light detector. Alternatively, a smooth, reflective inside surface of the aperture assembly provides for self-concealment by causing spontaneous emitted light to have low angles of reflection. In either case, spontaneously emitted light is substantially prevented from reflecting directly into the light detector, thereby reducing light noise to the level of molecular noise.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

66.

Diode pumped intracavity laser particle counter with improved reliability and reduced noise

      
Application Number 11025759
Grant Number 07030980
Status In Force
Filing Date 2004-12-29
First Publication Date 2006-04-18
Grant Date 2006-04-18
Owner Particle Measuring Systems, Inc. (USA)
Inventor
  • Sehler, Dwight A.
  • Cerni, Todd A.

Abstract

A fluid particle counter comprising an intracavity diode pumped solid state laser having a solid state lasing material having a non-reflective coating and a concave mirror having a reflective coating, with the coatings isolated from the sample flow by Brewster windows. The laser beam is apertured by an aperture assembly including an inner aperture closest to the inlet nozzle assembly and an outer aperture farther from the inlet nozzle assembly, with the outer aperture significantly farther from the inner aperture than the inner aperture is from the inlet nozzle assembly.

IPC Classes  ?

  • G01N 21/00 - Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light

67.

Optical measurement of the chemical constituents of an opaque slurry

      
Application Number 10749995
Grant Number 07088446
Status In Force
Filing Date 2003-12-31
First Publication Date 2005-07-07
Grant Date 2006-08-08
Owner Particle Measuring Systems, Inc. (USA)
Inventor Cerni, Todd A.

Abstract

An opaque slurry chemical constituent measurement system includes a cross-flow or membrane filter having a porous filter element connected between a global slurry loop and a spectrometer. The opaque slurry particles cannot pass through the filter element but pass through the filter cartridge into the day tank, while the chemical constituent to be measured permeates through the filter element to the spectrometer, where it is measured, and thence to a reservoir. About once every five minutes the porous filter element is reverse flushed for less than a second to clear the filter pores. One to several times per hour, the reservoir is emptied into the day tank. The system provides essentially continuous measurement of the slurry chemical composition, does not consume reagent chemicals, does not create a chemical waste stream, and provides high reliability and low maintenance by preventing the abrasive slurry particles from contacting the fluidic sampling valves.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01J 3/28 - Investigating the spectrum