- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/88 - Investigating the presence of flaws, defects or contamination
Patent holdings for IPC class G01N 21/88
Total number of patents in this class: 5254
10-year publication summary
|
278
|
349
|
391
|
486
|
520
|
621
|
636
|
618
|
579
|
113
|
| 2014 | 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA-Tencor Corporation | 2608 |
287 |
| KLA Corporation | 1001 |
158 |
| FUJIFILM Corporation | 25752 |
79 |
| Hitachi High-Tech Corporation | 3948 |
76 |
| Omron Corporation | 6693 |
73 |
| The Boeing Company | 20387 |
68 |
| ASML Netherlands B.V. | 6475 |
66 |
| Samsung Electronics Co., Ltd. | 120977 |
54 |
| Koh Young Technology Inc. | 321 |
48 |
| NEC Corporation | 30398 |
46 |
| Panasonic Intellectual Property Management Co., Ltd. | 26394 |
40 |
| General Electric Company | 25481 |
33 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 32800 |
33 |
| KLA-Tencor Technologies Corporation | 433 |
33 |
| Boe Technology Group Co., Ltd. | 32470 |
31 |
| KEYENCE Corporation | 347 |
31 |
| Canon Inc. | 36860 |
30 |
| Applied Materials Israel, Ltd. | 538 |
30 |
| Screen Holdings Co., Ltd. | 2141 |
28 |
| Krones AG | 1912 |
26 |
| Other owners | 3984 |