|
G01Q 10/00
|
Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe |
|
G01Q 10/02
|
Coarse scanning or positioning |
|
G01Q 10/04
|
Fine scanning or positioning |
|
G01Q 10/06
|
Circuits or algorithms therefor |
|
G01Q 20/00
|
Monitoring the movement or position of the probe |
|
G01Q 20/02
|
Monitoring the movement or position of the probe by optical means |
|
G01Q 20/04
|
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezoelectric gauge |
|
G01Q 30/00
|
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices |
|
G01Q 30/02
|
Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope |
|
G01Q 30/04
|
Display or data processing devices |
|
G01Q 30/06
|
Display or data processing devices for error compensation |
|
G01Q 30/08
|
Means for establishing or regulating a desired environmental condition within a sample chamber |
|
G01Q 30/10
|
Thermal environment |
|
G01Q 30/12
|
Fluid environment |
|
G01Q 30/14
|
Liquid environment |
|
G01Q 30/16
|
Vacuum environment |
|
G01Q 30/18
|
Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields |
|
G01Q 30/20
|
Sample handling devices or methods |
|
G01Q 40/00
|
Calibration, e.g. of probes |
|
G01Q 40/02
|
Calibration standards or methods of fabrication thereof |
|
G01Q 60/00
|
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof |
|
G01Q 60/02
|
Multiple-type SPM, i.e. involving two or more SPM techniques |
|
G01Q 60/04
|
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] |
|
G01Q 60/06
|
SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] |
|
G01Q 60/08
|
MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy] |
|
G01Q 60/10
|
STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes |
|
G01Q 60/12
|
STS [Scanning Tunnelling Spectroscopy] |
|
G01Q 60/14
|
STP [Scanning Tunnelling Potentiometry] |
|
G01Q 60/16
|
Probes, their manufacture or their related instrumentation, e.g. holders |
|
G01Q 60/18
|
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes |
|
G01Q 60/20
|
Fluorescence |
|
G01Q 60/22
|
Probes, their manufacture or their related instrumentation, e.g. holders |
|
G01Q 60/24
|
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes |
|
G01Q 60/26
|
Friction force microscopy |
|
G01Q 60/28
|
Adhesion force microscopy |
|
G01Q 60/30
|
Scanning potential microscopy |
|
G01Q 60/32
|
AC mode |
|
G01Q 60/34
|
Tapping mode |
|
G01Q 60/36
|
DC mode |
|
G01Q 60/38
|
Probes, their manufacture or their related instrumentation, e.g. holders |
|
G01Q 60/40
|
Conductive probes |
|
G01Q 60/42
|
Functionalisation |
|
G01Q 60/44
|
SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes |
|
G01Q 60/46
|
SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes |
|
G01Q 60/48
|
Probes, their manufacture or their related instrumentation, e.g. holders |
|
G01Q 60/50
|
MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes |
|
G01Q 60/52
|
Resonance |
|
G01Q 60/54
|
Probes, their manufacture or their related instrumentation, e.g. holders |
|
G01Q 60/56
|
Probes with magnetic coating |
|
G01Q 60/58
|
SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes |
|
G01Q 60/60
|
SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes |
|
G01Q 70/00
|
General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group |
|
G01Q 70/02
|
Probe holders |
|
G01Q 70/04
|
Probe holders with compensation for temperature or vibration induced errors |
|
G01Q 70/06
|
Probe tip arrays |
|
G01Q 70/08
|
Probe characteristics |
|
G01Q 70/10
|
Shape or taper |
|
G01Q 70/12
|
Nanotube tips |
|
G01Q 70/14
|
Particular materials |
|
G01Q 70/16
|
Probe manufacture |
|
G01Q 70/18
|
Functionalisation |
|
G01Q 80/00
|
Applications, other than SPM, of scanning-probe techniques |
|
G01Q 90/00
|
Scanning-probe techniques or apparatus not otherwise provided for |
