DERIVING METROLOGY DATA FOR AN INSTANCE OF AN OBJECT
| Register | USPTO Patent |
|---|---|
| Application Number | 17786624 |
| Status | Pending |
| Filing Date | 2020-01-07 |
| First Publication Date | 2023-02-02 |
| Publication Date | 2023-02-02 |
| Owner | Hewlett-Packard Development Company, L.P. (USA) |
| Inventor |
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Abstract
A method is described in which a three-dimensional polygon mesh model of an object is analysed to identify a sub-mesh representing a predefined geometric shape. The polygon mesh model is aligned with three-dimensional scan data of an instance of the object. Based on the alignment, the position of the predefined geometric shape is identified in the three-dimensional scan data. Using the position of the predefined geometric shape, metrology data for the instance of the object is derived from the three-dimensional scan data.IPC Classes ?
- G06T 19/20 - Editing of 3D images, e.g. changing shapes or colours, aligning objects or positioning parts
- G06T 17/20 - Wire-frame description, e.g. polygonalisation or tessellation
- B29C 64/393 - Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes